JPS6038665A - Wiring testing apparatus of printed wiring board - Google Patents

Abstract

PURPOSE:To reduce a number of probes while reducing cost, by controlling a scanner part, a control part and an external memory part from a central processing part. CONSTITUTION:The control part 22 of a wiring testing apparatus can move probe holders 21a, 21b over an arbitrary distance respectively independintly in parallel on the basis of the order of a central processing part 10. A scanner part 4 is electrically connected to the probes 2a, 2b of the probe holders 21a, 21b by wiring cables 3 and applied voltage to the probes 2a, 2b by the order of the central processing part 10 on the basis of continuity and discontinuity data stored in an external memory part 11 or detects voltages generated in the probes 2a, 2b and compares the continuity and discontinuity data of a wiring boad 8 to judge the quality of said wiring board 8. By this method, because a number of probes can be reduced, cost can be reduced.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a wiring testing device for detecting disconnections and bridging locations in printed wiring board circuit patterns.

As shown in FIG. 1, in the conventional printed wiring board wiring test device, gloves 2 are placed at predetermined pitch intervals on the underside of a plate-shaped glove holder 1 placed horizontally above a printed wiring board 8 to be inspected. Planted in a grid pattern and hanging down.

Further, one end of the glove 2 is connected to a scanner section 4 via a wiring cable 3. On the other hand, the printed wiring board to be inspected 8
(A pressure table is horizontally arranged below υ via a positioning adapter 7. This pressure table 5 is vertically moved vertically by a pressure mechanism 6 connected below it. The positioning adapter 7 on the top surface of the pressure table 5 is configured to be removably fixed.The positioning adapter 7 has a printed wiring board to be inspected (hereinafter referred to as wiring board) 8.
A pilot pin 9 for positioning and fixing is installed, and when the wiring board 8 is placed on the positioning adapter 7, the position of the pilot pin 9 is between the through-hole land 8a of the wiring board 8 and the globe 2 of the probe holder 1. is determined to correspond.

In order to perform a wiring test on a wiring board using such a conventional wiring testing apparatus, a pyro and a 9ft bin are inserted into the positioning hole 8b of the wiring board 8, fixed on the positioning adapter 7, and the pressurizing mechanism 6 is activated to raise the pressure table 5 and bring the glove 2 into contact with the through-hole land 8a of the wiring board 8. Next, the scanner section 4 is operated to perform a wiring test on the wiring board 8.

After the wiring test is completed, the pressure mechanism 6 is activated to lower the pressure table 5, and the wiring board 8 is taken out to complete the wiring test.

However, the conventional wiring test equipment has the following drawbacks: (7) Since the probes hanging from the globe holder are planted in accordance with the maximum external shape of the wiring board, the number of probes/c increases, and the globe holder The cost of the probe and its wiring increases, and the cost of the A product increases.For example, if the outer diameter of the probe holder is 600mrnX
In the case of probes with a grid spacing of 600 mm and a pitch of 2.54 mm, approximately 55,800 probes are required.

(a) As the number of probes increases, a large pressing force is required as a whole, and the number of wiring cables also increases, making the structure of the pressing mechanism and the entire device complicated.

(1) If the external shape of the wiring board is larger than the planned area and the number of probes is insufficient, divide the area of the wiring board into several areas for the wiring test and wire each area independently. However, with this divided wiring test method, it is not possible to perform a wiring test on all 9 lines of a wiring pattern divided into separate areas.

It is an object of the present invention to provide a complete line testing device for printed wiring boards that eliminates the above-mentioned drawbacks of the prior art.

According to the present invention, a probe protrudes at predetermined pitch intervals in a grid pattern, a plurality of probe holders that suspend the probe and move parallel to each other, a support that hangs down the probe holder, and a pilot under the probe. A pressure table on which a removable positioning adapter with pins is placed, a pressure mechanism that contacts the pressure table and moves the pressure table up and down, and a scanner section electrically connected to the probe by wiring. , a printed wiring board wiring test device comprising: a control unit that controls movement of a support and a pressure table; and a central processing unit that controls a scanner unit, a control unit, and an external storage unit. is obtained.

Hereinafter, an example of "misfire" will be described with reference to FIGS. 2(a), (b), and 3(al, (b), (C)).

FIG. 2(al) is a side sectional view of a schematic configuration showing one embodiment of the present invention, and FIG. 21XI(b) is a side sectional view of FIG.
- It is a sectional view of the A' part.

Probes 2a, 2 protrude in a grid pattern at predetermined pitch intervals.
b The probe holders 21 are all planted and hanging down.
．． a, 21b U, is suspended by a rail 23 provided on the lower surface side of the support body 20. Furthermore, probe holder 2
1a, 21b The beams have a built-in near motor (not shown), and an fB stone (not shown) built in the support body 20.
The support member 20 is provided so as to be movable in a direction parallel to the lower surface of the support body 20 (in the direction of the arrow) by a repulsive action and an attraction action. The control unit 22 of the wiring test device can independently move the probe holders 21a, 21bt in parallel by an arbitrary distance according to a command from the central processing unit 10. The scanner unit 4 is electrically connected to the probe holders 21a, 21b (ci) and the respective gloves 2a, 2b through the wiring cable 3, and stores conductive and non-conductive data stored in the external storage unit 11 at the center. A voltage is applied to the probes 2a, 2b according to a command from the processing section, and the voltage generated in the probes 2a, 2b is detected, and compared with conduction/non-conduction data of the wiring board 8 to determine whether it is good or bad. The pressure mechanism 6 moves the force 11 pressure table 5 up and down in a direction perpendicular to the plate surface of the force 11 pressure table 5 according to a command from the control section 22 . Note that the control unit 22 has probe holders 21a, 2
1b and the pressure mechanism 6, the glove holder 21a.

21b moves left and right in the arrow directions and stops at IJt, the pressurizing mechanism 6 is attached to the probe holder 21a.

Probe holders 21a and 21b in conjunction with 21b
It moves up and down so that it can be moved.

Next, a wiring testing method for a printed wiring board using an uninvented wiring testing device will be explained.

FIGS. 3A to 3C are drawings for fully explaining the relationship between the wiring board 8 and the two movable probe holders 21a and 21b. First, when the probe holder 21b is in contact with the left glove holder 21a as in i31g (al) or when the scanner unit 4 (not shown) is operated, the effective area of the probes 2a and 2b of the glove holders 21a and 21b (molten water omitted) ).In other words, the wiring pattern y on the wiring board 8 can be tested.
30a, 30b, aoa can be tested for wiring, but other wiring patterns 30G, 306.30
f is excluded from the wiring test.

Next, as shown in FIG. 3 (tb), the probe holder 21b is moved to the right position and the scanner section is operated.

A wiring test can be performed on a wiring pattern included in the effective area (not shown) of the probes 2a and 2b spanning the spaced apart probe holders 21a and 21b. That is, the wiring patterns 30a and 30C on the wiring board 8.

30e can be used for wiring testing, but other wiring patterns 30b, 30d, and 30f are excluded from wiring testing. Move the probe holder 21b
When the scanner section 4 is fully operated by contacting with the probe holders 21a and 21b, a wiring test can be performed on the wiring patterns included in the probe effective areas (not shown) of the probe holders 21a and 21b. That is, the wiring patterns 30b, 3 on the wiring board 8
0C and 30f can perform a wiring test, but other wiring patterns 30a.

30d and 30e are excluded from the wiring test.

Therefore, by combining the three operations shown in FIGS. 3(a) to 3(c), wiring tests can be performed on all wiring patterns on the wiring board 8. In addition, in the embodiment of the present invention, FIG. 3 (al~
Although the method of performing a wiring test on the entire wiring board 8 using a combination of the three operations shown in (C) has been shown, it is also possible to divide the wiring test into more combinations of operations.

The present invention has the following effects.

(:) There is no need to implant the probes of the probe holder in accordance with the maximum external shape of the wiring board, and the total number of gloves can be reduced, resulting in lower probe and wiring costs.

(11) Since the number of probes is reduced, the pressing force can be reduced. Therefore, the number of wiring cables is also small, so
The structure of the pressure machine groove and the entire device becomes simple.

+rrr+ By combining a number of DJ'Wt type probe bolters, it is possible to perform all wiring tests for all wiring patterns on the wiring board, so even when the wiring board is thick and the number of re-globes is less than 9, Can perform wiring tests for all wiring patterns on wiring boards.

[Brief explanation of drawings]

Fig. 1 is a side sectional view of a schematic configuration of a conventional thin wire testing device;
Figure 2 (al is a side sectional view of the configuration of the wiring test device according to the uninvented example, Figure 2 Cblt, 1jl1 (al A-
The cross-sectional view of part A' and FIGS. 3 ta) to fc) are plan views illustrating the entire wiring test method in the non-inventive embodiment. 1...Glove holder, 2a, 2b...Glove, 3...Wiring cable, 4...Scanner part, 5-...Pressure table, 6... Pressure mechanism,
7...Positioning adapter %8...Printed wiring board to be inspected, 8a,...Through hole land, Bb...
...Positioning hole, 9...Pyro, Topin, 1o
... Central processing section, 11 ... External storage section, 2
0...Support body, 21a, 21b...Globe holder, 22...System ("IIWB-23...Rail b3Qa~3Qf...Wiring pattern. Agent Patent attorney Circle i M,””””;(,゛ i

Claims (1)

[Claims] Gloves protruding at predetermined pitch intervals in a grid pattern, and the front d
A pressurization system that places a glove holder that suspends the pilot glove and moves parallel to each other, a support that hangs down the glove holder, and a removable positioning adapter that has a pilot pin planted under the glove. a table, a pressure mechanism that makes contact with the pressure table and moves the pressure table completely up and down, a scanner section that is electrically connected to the probe, and controls movement of the support and the pressure table. A wiring testing device for a printed wiring board, comprising: a control section for controlling the scanner section; a central processing section for controlling the scanner section, the control section, and the external storage section.