JPS6089732A - Automatic sample feeder of diffuse reflection device - Google Patents

Abstract

PURPOSE:To replace a sample on a sample holding table in a short time by moving the sample continuously so that the sample surface passes the focus of a diffuse reflection device, and stopping the movement temporarily at the focus position. CONSTITUTION:The diffuse reflection device 9 consisting of a concave mirror 24, plane mirrors 27 and 28, a mirror holding plate 30, and a rack 31 is placed on an optical bench 29. The whole device 9 is convered with a box type cover 32. A belt 35 is extended between rollers 33 and 34 in the optical bench 29 and the holding base 36 on which plural sample containers 37 are mounted is placed on the belt 35. The sample 25 in a container 37 enters a polarization chamber through a hole 38 of the cover 32 and stops at the focus of the concave mirror 24. The movement is carried on until the next sample 25 comes to the focus after an infrared absorption spectrum is measured, and samples are moved successively and discharged out through a hole 39 of the cover 32.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an automatic sample feeder for a diffuse reflector that is applied to a diffuse reflector that analyzes compound samples using infrared spectroscopy.

Infrared spectroscopy is a method of irradiating a sample with infrared rays and measuring absorption caused by vibrations that cause changes in the dipole moment of molecular vibrations. Generally, compounds have their own unique vibrational spectra in the infrared region, so qualitative analysis can be performed by measuring the infrared absorption wavelength, and quantitative analysis can be performed by determining the intensity of the absorption.

A block diagram of a general Fourier transform type infrared spectrometer with four variables is shown in FIG. The infrared light 2 emitted from the light source 1 is restricted in area and solid angle by the entrance aperture 3.

The light is reflected by the concave mirror 4 and becomes a parallel beam, which enters the Michelson interferometer 5. The Michelson interferometer 5 consists of a semitransparent beam splitter 6, a fixed mirror 7, and a movable mirror 8. Half of the incident light beam is reflected by the beam splitter 6 and goes towards the fixed mirror 7, and the other half is reflected by the movable mirror 8, and is combined again into parallel light beams, which pass through the diffuse reflector 9 loaded with the sample. The light is then condensed by a concave mirror 10, passes through an exit diaphragm 11, and is focused onto a detector 12. At this point, the beam splitter 6 and the fixed mirror 7. If there is a difference in the distance of the movable mirror 8,
An optical path difference occurs between the light wave reflected by the fixed mirror 7 and the light wave reflected by the movable mirror 8, so that the composite waves cancel each other out or strengthen each other. The output from detector 12 is thus a function of the optical path difference. When the output from this detector 12 is Fourier-transformed, the energy distribution of infrared light for each wave number can be obtained. Therefore, the output of the detector 12 is amplified by the amplifier 13 as shown below with the electric signal line indicated by a thick line.
The D converter 14 converts the signal into a digital value, and the FFT analyzer 15 performs a Fourier transform. The results obtained by this FFT analyzer 15 are outputted to the output device 16 either directly or after being calculated by the calculation device 17. FFT analyzer 15. Arithmetic device +7. and output device 16 are both controlled by a control device 18, which further receives commands from an input device 19. Further, the drive device 20 that drives the movable mirror 8 is also controlled by the control device 1.
8.

A side view of the interior of the diffuse reflection device 9 used is shown in FIG. Here, the incident infrared light 21 of the diffuse reflection device 9 is reflected by the plane mirror 2.
2.28, reflected by the concave mirror 24, and focused on the surface of the sample 25. The infrared light diffusely reflected by the sample 25 is reflected and condensed by a concave mirror 26, reflected by plane mirrors 27 and 28, and sent to the detector 12 shown in FIG.

In FIG. 1, among the above configurations, a light source 12 a Michelson interferometer 5. Expansion #I1. Reflector9. Detector 12. The concave mirrors 4, 10, etc. are entirely covered with a box-shaped cover.

(This box-shaped cover is not shown.) This box-shaped cover is installed inside the 1-minute chamber to protect the hygroscopic materials such as the beam splitter 6 and to prevent measurement interference components (water, carbon dioxide, etc.) from entering the 1-minute chamber. This is because it is necessary to constantly flow dry air from which carbon dioxide gas has been removed.

Since the infrared spectrophotometer has the above-described configuration, the sample loading door provided on the box-shaped cover is opened to load a sample into the diffuse reflection device 9 used therein. (The box cover and sample loading door are not shown.) The sample loading door is large enough to allow the sample to be easily attached to a predetermined position on the diffuse reflector 9. As described above, since the purge inside the spectroscopic chamber is broken when the sample is replaced, it is necessary to wait until the purge is completely restored before the next sample measurement, which takes time.

The present invention provides a diffuse reflection device used for infrared spectroscopy, etc.
This was done with the purpose of making it possible to perform the time-consuming sample exchange as mentioned above in a short time and without breaking the purge of the spectroscopic chamber. (In, a sample holding table on which a sample is placed.

Sample movement configured such that the sample surface of a plurality of samples placed on the holding stand is placed on the sample O'1 holding stand and that the sample surfaces of the plurality of samples placed on the holding stand are successively passed through the focal point of the above-mentioned diffuse reflection device so that the samples can be continuously measured. and a drive circuit that stops the drive of the sample moving means when the sample reaches the focal point to enable measurement, drives the sample moving means again after the measurement is completed, and repeats this sequentially thereafter.

In order to solve the above-mentioned inconveniences, we provide an automatic sample feeding device for a diffuse reflection device characterized in that it is equipped with a control for controlling the driving circuit. The sample is continuously supplied through this operation.

FIG. 8 is a side view showing an apparatus according to an embodiment of the present invention. In the figure, 29 is an optical bench, on which is a concave mirror 24.
．． Plane mirrors 27, 28, etc. and mirror holding plates 30. A diffuse reflection device 9 made up of a pedestal 81 is mounted. Furthermore, a box-shaped cover 82 is provided to cover the entire diffuse reflection device Pr9.
is provided.

Two rollers 88, 84 are installed inside the optical bench 29, and a belt 8 is attached to these rollers 88, 84.
It is multiplied by 5. A sample container holding stand 86 is placed on the belt 85, and further on the sample container holding stand 86 is placed the sample container 37 loaded with the sample 25. These sample container holding stand 36 and sample container 87 pass through minute holes 38 and 89 made in the box-shaped cover 32ζ.
It is configured to move on the belt 35 in the order of the outside of the spectroscopic chamber, the inside of the spectroscopic chamber, and the outside of the spectroscopic chamber by rotation of the rollers 88 and 84. During this movement, the surface of the sample 25 in the sample container 37 is placed so as to pass through the focal point of the concave mirror 24. Auxiliary stands 40.degree. 41 are arranged on the left and right sides of the optical bench 29 so that the sample container holding stand 86 moving on the belt 85 can be easily attached and removed. Further, as shown by the electrical system shown in bold below, one of the rollers 33 is connected to a pulse motor 42.
is connected to a drive circuit 43, and the drive circuit 43 is further connected to a control device 44.

Next, the operation of the apparatus having the configuration described in section 2 will be explained.

After loading the sample 25 into the sample container 37, a large number of samples 25 are placed on the sample container holding stand 36. The sample container holding stand 36 is placed on the belt 35, and the belt 85 is gradually moved by sending a signal from the control device 44 to the drive circuit 43 to rotate the pulse motor 42 and rollers 83, 84. When the sample container holding stand 86 moves toward the diffuse reflection device 9 through a small hole 38 opened in the box-shaped cover 32 and the surface of the first sample 25 reaches the focal point of the concave mirror 24, the belt 85 stop moving. In this state, the infrared absorption spectrum of the first sample 25 is measured. After lubrication, the belt 35 is driven to scan the surface of the second sample 25 with the concave mirror 2.
Move to focus point 4. In this state, the second sample 25
Measure the infrared absorption spectrum of

By repeating the above operations, the third and fourth samples 25 are measured one after another.

The measured samples 25 are sequentially sent out onto the auxiliary table 41 through the other hole 39 of the box-shaped cover 82.

According to the automatic sample feeding device H of the diffuse reflector of the present invention described below in 1-1, when measuring a sample with a diffuse reflector, it was conventionally necessary to break the purge state in the spectroscopic chamber each time the sample was replaced. Because there was.

A waiting time was required to recover the purge before the next sample measurement.

According to the apparatus of the present invention, the sample is automatically transported through minute holes (inlet and outlet) provided in a part of the box-shaped cover that forms the two-spectrum chamber, so the purge as described above is possible. There is no need for waiting time for recovery, and the specimen can now be easily centered.

[Brief explanation of the drawing]

Figure 1 is a block diagram of a general Fourier transform type infrared spectrometer with four variables, Figure 2 is an explanatory diagram showing the state of light ray reflection in a side view of the inside of a general diffuse reflection device, and Figure 3 is a diagram of the book. 1 shows a side view of an apparatus and a diagram of a control section, respectively, showing an embodiment of the invention. 25... Sample, 29... Optical bench, 30... Holding plate, 81... Frame, 32... Box-shaped cover, 88
．． 84...Roller. 35... Belt, 36... Sample container holding stand, 87...
...Sample volume rd+ 38.39...Minute hole, 40
．． 41... Auxiliary stand, 42... Pulse motor, 43.
...Drive circuit, 44...Control device.

Claims (1)

[Claims] In a diffuse reflection device used for red-sight spectroscopy. A sample holding table on which a sample is placed, and the sample surfaces of a plurality of samples placed on the sample holding table and placed on the holding table sequentially pass through the focal point of the diffuse reflection device, so that the samples can be measured continuously. A sample moving means configured as above, and a drive such that the drive of the sample moving means is stopped when the sample reaches the two focal points to enable measurement, is driven again after the measurement is completed, and is repeated sequentially thereafter. An automatic sample feeding device for a diffuse reflection device, comprising a drive circuit and a control device for controlling the drive circuit.