JPS6086907U - Electron beam display device - Google Patents
Electron beam display deviceInfo
- Publication number
- JPS6086907U JPS6086907U JP17838683U JP17838683U JPS6086907U JP S6086907 U JPS6086907 U JP S6086907U JP 17838683 U JP17838683 U JP 17838683U JP 17838683 U JP17838683 U JP 17838683U JP S6086907 U JPS6086907 U JP S6086907U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- display device
- matching
- cursor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図及び第２図は、従来装置におけるマーカとカーソ
ルを示す図、第３図はζ本考案の一実施例のシステム構
成を示す図、第４図は、第３図に示したマーカとカーソ
ル制御回路の一具体例を示す図、第５図は、第３図の実
施例において陰極線管に表示されたマーカとカーソルを
示す図、第６図は実施例の動作の説明の補助に用いた図
、第７図及び第８図は、夫々陰極線管に表示されたマー
カとカーソルを示す図である。
１１・・・電子銃、１４・・・偏向コイル、１５・・・
被測長材料、１６・・・コンピュータ、１７・・・走査
信号発生回路、１８・・・電子線検出器、１９・・・陰
極線管、２０・・・マーカ及びカーソル制御回路、２１
・・・マーカ位置設定回路、２２・・・第１のカーソル
位置設定ンー横工鱈
↑
１つ” −４１アシ
ン八）１イ４ら
本−ｍ＝−
」1 and 2 are diagrams showing a marker and a cursor in a conventional device, FIG. 3 is a diagram showing a system configuration of an embodiment of the present invention, and FIG. 4 is a diagram showing the marker and cursor shown in FIG. 3. FIG. 5 is a diagram showing a specific example of the cursor control circuit, and FIG. 5 is a diagram showing the marker and cursor displayed on the cathode ray tube in the embodiment of FIG. 3. FIG. 6 is used to assist in explaining the operation of the embodiment. 7 and 8 are diagrams showing markers and cursors displayed on the cathode ray tube, respectively. 11... Electron gun, 14... Deflection coil, 15...
Material to be measured, 16... Computer, 17... Scanning signal generation circuit, 18... Electron beam detector, 19... Cathode ray tube, 20... Marker and cursor control circuit, 21
...Marker position setting circuit, 22...First cursor position setting - Yokogakuma ↑ 1" - 41 Ashin 8) 1 A 4 Ra Hon - m = - "
Claims (3)
査に基づいて得られた試料からの情報信号に基づいて、
表示装置上に試料像を表示すると共に、該表示装置上に
１本のマーカと、該マーカに直角方向に２本のカーソル
きを表示するようにした装置において、該表示装置上に
マーカとカーソルを表示する手段は、以下の構成より成
ることを特徴とする電子線像表示装置；’（Ａ）Ｙ方向
の走査信号とマーカ位置信号との一致回路、 （Ｂ） マーカ位置信号とカーソル長さ信号との差信
号を得るための減算回路、 （Ｃ） マーカ位置信号とカーソル長さ信号との加算
信号を得るための加算回路、 （Ｄ） Ｘ方向の走査信号と第１のカーソル位置信号
との一致回路、 （Ｅ） Ｘ方向の走査信号と第２カーソル信号と分一
致回路、 （Ｆ） 該減算回路の出力信号とＹ方向の走査信号と
の一致回路、 （Ｇ） 該加算回路の出力信号とＹ方向の走査信号と
の一致回路、 圓 該一致回路（Ｆ）の一致信号が得られてから、該一
致回路（Ｇ）の一致信号が得られるまでの間、該一致回
路囚、一致回路（Ｄ）及び一致回路（Ｅ）の出力信号を
該表示装置に供給するようにした信号選択手段。(1) Scan an electron beam two-dimensionally on the material to be measured, and based on the information signal from the sample obtained based on the scanning,
In an apparatus that displays a sample image on a display device and also displays one marker and two cursors perpendicular to the marker on the display device, the marker and the cursor are displayed on the display device. The means for displaying is an electron beam image display device characterized by comprising the following configuration; (A) a matching circuit for a scanning signal in the Y direction and a marker position signal; (B) a marker position signal and a cursor length. (C) An addition circuit to obtain an addition signal of the marker position signal and the cursor length signal; (D) A scanning signal in the X direction and the first cursor position signal. (E) A circuit that matches the scanning signal in the X direction and the second cursor signal, (F) A circuit that matches the output signal of the subtraction circuit and the scanning signal in the Y direction, (G) An output of the addition circuit. A matching circuit between the signal and the Y-direction scanning signal, a circle. From when the matching signal of the matching circuit (F) is obtained until the matching signal of the matching circuit (G) is obtained, the matching circuit is connected to the matching circuit. Signal selection means adapted to supply the output signals of the circuit (D) and the matching circuit (E) to the display device.
さ信号とを比較する比較回路が設けられており、該カー
ソル長さ信号が該マーカ位置信号より大きい場合には、
該比較回路からの信号に基づき、該一致回路（Ｆ）から
の一致信号に代えて、Ｙ方向ブランキング信号を用い、
Ｙ方向ブランキング信号が得られてから、該一致回路（
Ｇ）の一致信号が得られるまでの間、各一致回路囚、
（Ｄ）、、及び（Ｅ）の出力信号を該表示装置に供給す
るようにした実用新案登録請求の範囲第１項記載の電子
線像表示装置。(2) The signal selection means is provided with a comparison circuit that compares the marker position signal and the cursor length signal, and when the cursor length signal is larger than the marker position signal,
Based on the signal from the comparison circuit, a Y-direction blanking signal is used instead of the coincidence signal from the coincidence circuit (F),
After the Y-direction blanking signal is obtained, the matching circuit (
Until the matching signal of G) is obtained, each matching circuit prisoner,
An electron beam image display device according to claim 1, wherein the output signals of (D), and (E) are supplied to the display device.
得られてから、該一致回路（Ｇ）の一致信号とＹ方向ブ
ランキング信号とのいずれかが得られるまでの間、各一
致回路（Ａ）、 （Ｄ＞、′及び（Ｅ）の出力信号を該
表示装置に供給するようにした実用新案登録請求の範囲
第１項記載の電子線像表示装置。(3) The signal selection circuit is configured to: from when the coincidence signal from the coincidence circuit (F) is obtained to when either the coincidence signal from the coincidence circuit (G) or the Y-direction blanking signal is obtained; An electron beam image display device according to claim 1, wherein the output signals of the matching circuits (A), (D>, ', and (E) are supplied to the display device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17838683U JPS6086907U (en) | 1983-11-18 | 1983-11-18 | Electron beam display device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17838683U JPS6086907U (en) | 1983-11-18 | 1983-11-18 | Electron beam display device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6086907U true JPS6086907U (en) | 1985-06-14 |
| JPH0219682Y2 JPH0219682Y2 (en) | 1990-05-30 |
Family
ID=30387306
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17838683U Granted JPS6086907U (en) | 1983-11-18 | 1983-11-18 | Electron beam display device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6086907U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61290641A (en) * | 1985-06-18 | 1986-12-20 | Akashi Seisakusho Co Ltd | Magnifying power display device for sample image |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5434673A (en) * | 1977-08-23 | 1979-03-14 | Hitachi Ltd | Micro-distance measuring device for scan-type electronic microscope |
| JPS58117404A (en) * | 1982-01-05 | 1983-07-13 | Jeol Ltd | Pattern measuring method |
-
1983
- 1983-11-18 JP JP17838683U patent/JPS6086907U/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5434673A (en) * | 1977-08-23 | 1979-03-14 | Hitachi Ltd | Micro-distance measuring device for scan-type electronic microscope |
| JPS58117404A (en) * | 1982-01-05 | 1983-07-13 | Jeol Ltd | Pattern measuring method |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61290641A (en) * | 1985-06-18 | 1986-12-20 | Akashi Seisakusho Co Ltd | Magnifying power display device for sample image |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0219682Y2 (en) | 1990-05-30 |
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