JPS6085836U - Infrared heat treatment equipment for semiconductor substrates - Google Patents
Infrared heat treatment equipment for semiconductor substratesInfo
- Publication number
- JPS6085836U JPS6085836U JP17882083U JP17882083U JPS6085836U JP S6085836 U JPS6085836 U JP S6085836U JP 17882083 U JP17882083 U JP 17882083U JP 17882083 U JP17882083 U JP 17882083U JP S6085836 U JPS6085836 U JP S6085836U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrate
- heat treatment
- infrared
- infrared heat
- treatment equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Resistance Heating (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来のウェハの赤外線熱処理装置の構成側断面
図、第2図は熱放射によるウェハ周辺部への熱放散の説
明図、第3図は従来の別なウェハの赤外線熱処理装置の
構成側断面図、第4図は従来の赤外線ランプ群への電力
供給回路図、第5図および第6図は本考案を実施したウ
ェハの赤外線熱処理装置の互に直角方向の構成側断面図
、第7図は本考案に用いる赤外線ランプ群への電力供給
回路の一例図、第8図は本考案の実施によって得られる
ウェハ面の放射照度特性側図、第9図は赤外線ランプの
タングステンフィラメントの巻き方の一例図である。
1・・・半導体基板(ウェハ)、2・・・赤外線ランプ
、3・・・反射鏡(板)、4・・・石英壁、5・・・棒
状赤外線放射源、6・・・サセプタ、7.7’、7“・
・・制御器付電源、8,9・・・上側、下側の各赤外線
放射源、10.10’・・・金属体シャッタ、11,1
1′・・・石英壁シャッタ、12.12’・・・反射壁
、13・・・タングステンフィラメント、14・・・石
英管、15・・・赤外線ランプの電極。Figure 1 is a side sectional view of the configuration of a conventional infrared heat treatment apparatus for wafers, Figure 2 is an explanatory diagram of heat dissipation to the periphery of the wafer by thermal radiation, and Figure 3 is the configuration of another conventional infrared heat treatment apparatus for wafers. 4 is a diagram of a conventional power supply circuit for a group of infrared lamps, and FIGS. 5 and 6 are side sectional views of a wafer infrared heat treatment apparatus according to the present invention taken in mutually perpendicular directions. Figure 7 is an example of the power supply circuit for the infrared lamp group used in the present invention, Figure 8 is a side view of the irradiance characteristics of the wafer surface obtained by implementing the present invention, and Figure 9 is the winding of the tungsten filament of the infrared lamp. FIG. DESCRIPTION OF SYMBOLS 1... Semiconductor substrate (wafer), 2... Infrared lamp, 3... Reflector (plate), 4... Quartz wall, 5... Rod-shaped infrared radiation source, 6... Susceptor, 7 .7', 7"・
...Power supply with controller, 8,9...Each upper and lower infrared radiation source, 10.10'...Metal shutter, 11,1
1'...Quartz wall shutter, 12.12'...Reflecting wall, 13...Tungsten filament, 14...Quartz tube, 15...Infrared lamp electrode.
Claims (2)
板および底板と、一対の対向側面の前記半導体基板搬入
、搬出用反射鏡付シャッタと、これらの側面と直角方向
の一対の反射鏡付の壁にて囲まれた箱と、前記上板およ
び底板にそれぞれ接近して箱の外部に設けられ並べる方
向が上板側と底板側では互に直交する分散配置の複数本
の棒状赤外線ランプとそのそれぞれの反射鏡よりなる赤
外線熱源各群と、これらの各棒状赤外線ランプのあらか
じめ定めた群毎に任意の電力を供給できるようにした電
源部とを具備したらとを特徴とする半導体基板の赤外線
熱処理装置。(1) A top plate and a bottom plate that house a semiconductor substrate therein and are made of an infrared transparent material, a pair of shutters with reflecting mirrors for loading and unloading the semiconductor substrate on opposite side surfaces, and a pair of reflecting mirrors that are perpendicular to these sides. A box surrounded by a wall, and a plurality of rod-shaped infrared lamps disposed outside the box in close proximity to the top plate and the bottom plate, and arranged in a distributed manner so that the directions of arrangement are orthogonal to each other on the top plate side and the bottom plate side. and each group of infrared heat sources made up of their respective reflectors, and a power supply unit capable of supplying arbitrary power to each predetermined group of these rod-shaped infrared lamps. Infrared heat treatment equipment.
り噴出させて浮上回転させる複数の不活性ガス噴出孔を
設けたことを特徴とする実用新案登録請求の範囲第1項
記載の半導体基板の赤外線熱処理装置。(2) The semiconductor substrate according to claim 1, which is a utility model registration, characterized in that a plurality of inert gas ejection holes are provided to eject the semiconductor substrate inside the semiconductor substrate storage box from the lower part thereof and float and rotate the semiconductor substrate. Infrared heat treatment equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17882083U JPS6085836U (en) | 1983-11-21 | 1983-11-21 | Infrared heat treatment equipment for semiconductor substrates |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17882083U JPS6085836U (en) | 1983-11-21 | 1983-11-21 | Infrared heat treatment equipment for semiconductor substrates |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6085836U true JPS6085836U (en) | 1985-06-13 |
Family
ID=30388139
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17882083U Pending JPS6085836U (en) | 1983-11-21 | 1983-11-21 | Infrared heat treatment equipment for semiconductor substrates |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6085836U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0269932A (en) * | 1988-09-05 | 1990-03-08 | Hitachi Ltd | Device for heat treatment of semiconductor wafer and heat treating method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5424990A (en) * | 1977-07-26 | 1979-02-24 | Toyo Soda Mfg Co Ltd | Gas phase polymerization of vinyl chloride and/or vinyl chlroide analogue |
JPS58118112A (en) * | 1981-12-30 | 1983-07-14 | ア−ノン・エマニエル・ガツト | Heat treating device for semiconductor material |
-
1983
- 1983-11-21 JP JP17882083U patent/JPS6085836U/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5424990A (en) * | 1977-07-26 | 1979-02-24 | Toyo Soda Mfg Co Ltd | Gas phase polymerization of vinyl chloride and/or vinyl chlroide analogue |
JPS58118112A (en) * | 1981-12-30 | 1983-07-14 | ア−ノン・エマニエル・ガツト | Heat treating device for semiconductor material |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0269932A (en) * | 1988-09-05 | 1990-03-08 | Hitachi Ltd | Device for heat treatment of semiconductor wafer and heat treating method |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3215155B2 (en) | Method for rapid heat treatment of semiconductor wafer by irradiation | |
TW457532B (en) | Lamp unit and light radiating type heating device | |
JP2006059931A (en) | Rapid thermal process device | |
TW201250850A (en) | Heat treatment method and heat treatment apparatus | |
JPS6085836U (en) | Infrared heat treatment equipment for semiconductor substrates | |
JP3528042B2 (en) | Light heating device | |
JPS59178718A (en) | Semiconductor substrate processing apparatus | |
JP4057158B2 (en) | Substrate transport apparatus and substrate processing apparatus having the same | |
TW466562B (en) | Lamp unit for light radiating type heating device | |
JP2007184625A (en) | Heat treatment apparatus | |
JP2000068222A (en) | Substrate heat treatment device | |
JP2002208466A (en) | Heating lamp and heat treatment device | |
JP2515883B2 (en) | Lamp annealing equipment for semiconductor device manufacturing | |
JP3422500B2 (en) | Heat treatment method for semiconductor wafer | |
TW423064B (en) | Substrate cooling apparatus and semiconductor fabrication apparatus | |
JP4215881B2 (en) | Substrate heat treatment equipment | |
US4803095A (en) | Chemical vapor reaction process by virtue of uniform irradiation | |
JP2000199688A (en) | Substrate heat treatment device | |
JPS6114724A (en) | Irradiation of semiconductor wafer by ultraviolet ray | |
JPH0356045Y2 (en) | ||
JP2003234304A (en) | Heat treatment device | |
JPS59145482A (en) | Irradiating heating furnace | |
JPH0572096B2 (en) | ||
JPS59176768A (en) | Liquid crystal display | |
JPS6364865B2 (en) |