JPS6085836U - Infrared heat treatment equipment for semiconductor substrates - Google Patents

Infrared heat treatment equipment for semiconductor substrates

Info

Publication number
JPS6085836U
JPS6085836U JP17882083U JP17882083U JPS6085836U JP S6085836 U JPS6085836 U JP S6085836U JP 17882083 U JP17882083 U JP 17882083U JP 17882083 U JP17882083 U JP 17882083U JP S6085836 U JPS6085836 U JP S6085836U
Authority
JP
Japan
Prior art keywords
semiconductor substrate
heat treatment
infrared
infrared heat
treatment equipment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17882083U
Other languages
Japanese (ja)
Inventor
日浦 和夫
雅行 鈴木
Original Assignee
株式会社日立国際電気
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社日立国際電気 filed Critical 株式会社日立国際電気
Priority to JP17882083U priority Critical patent/JPS6085836U/en
Publication of JPS6085836U publication Critical patent/JPS6085836U/en
Pending legal-status Critical Current

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  • Resistance Heating (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のウェハの赤外線熱処理装置の構成側断面
図、第2図は熱放射によるウェハ周辺部への熱放散の説
明図、第3図は従来の別なウェハの赤外線熱処理装置の
構成側断面図、第4図は従来の赤外線ランプ群への電力
供給回路図、第5図および第6図は本考案を実施したウ
ェハの赤外線熱処理装置の互に直角方向の構成側断面図
、第7図は本考案に用いる赤外線ランプ群への電力供給
回路の一例図、第8図は本考案の実施によって得られる
ウェハ面の放射照度特性側図、第9図は赤外線ランプの
タングステンフィラメントの巻き方の一例図である。 1・・・半導体基板(ウェハ)、2・・・赤外線ランプ
、3・・・反射鏡(板)、4・・・石英壁、5・・・棒
状赤外線放射源、6・・・サセプタ、7.7’、7“・
・・制御器付電源、8,9・・・上側、下側の各赤外線
放射源、10.10’・・・金属体シャッタ、11,1
1′・・・石英壁シャッタ、12.12’・・・反射壁
、13・・・タングステンフィラメント、14・・・石
英管、15・・・赤外線ランプの電極。
Figure 1 is a side sectional view of the configuration of a conventional infrared heat treatment apparatus for wafers, Figure 2 is an explanatory diagram of heat dissipation to the periphery of the wafer by thermal radiation, and Figure 3 is the configuration of another conventional infrared heat treatment apparatus for wafers. 4 is a diagram of a conventional power supply circuit for a group of infrared lamps, and FIGS. 5 and 6 are side sectional views of a wafer infrared heat treatment apparatus according to the present invention taken in mutually perpendicular directions. Figure 7 is an example of the power supply circuit for the infrared lamp group used in the present invention, Figure 8 is a side view of the irradiance characteristics of the wafer surface obtained by implementing the present invention, and Figure 9 is the winding of the tungsten filament of the infrared lamp. FIG. DESCRIPTION OF SYMBOLS 1... Semiconductor substrate (wafer), 2... Infrared lamp, 3... Reflector (plate), 4... Quartz wall, 5... Rod-shaped infrared radiation source, 6... Susceptor, 7 .7', 7"・
...Power supply with controller, 8,9...Each upper and lower infrared radiation source, 10.10'...Metal shutter, 11,1
1'...Quartz wall shutter, 12.12'...Reflecting wall, 13...Tungsten filament, 14...Quartz tube, 15...Infrared lamp electrode.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)半導体基板を内部に収容し赤外線透過性材料の上
板および底板と、一対の対向側面の前記半導体基板搬入
、搬出用反射鏡付シャッタと、これらの側面と直角方向
の一対の反射鏡付の壁にて囲まれた箱と、前記上板およ
び底板にそれぞれ接近して箱の外部に設けられ並べる方
向が上板側と底板側では互に直交する分散配置の複数本
の棒状赤外線ランプとそのそれぞれの反射鏡よりなる赤
外線熱源各群と、これらの各棒状赤外線ランプのあらか
じめ定めた群毎に任意の電力を供給できるようにした電
源部とを具備したらとを特徴とする半導体基板の赤外線
熱処理装置。
(1) A top plate and a bottom plate that house a semiconductor substrate therein and are made of an infrared transparent material, a pair of shutters with reflecting mirrors for loading and unloading the semiconductor substrate on opposite side surfaces, and a pair of reflecting mirrors that are perpendicular to these sides. A box surrounded by a wall, and a plurality of rod-shaped infrared lamps disposed outside the box in close proximity to the top plate and the bottom plate, and arranged in a distributed manner so that the directions of arrangement are orthogonal to each other on the top plate side and the bottom plate side. and each group of infrared heat sources made up of their respective reflectors, and a power supply unit capable of supplying arbitrary power to each predetermined group of these rod-shaped infrared lamps. Infrared heat treatment equipment.
(2)半導体基板収容箱内部の半導体基板をその下部よ
り噴出させて浮上回転させる複数の不活性ガス噴出孔を
設けたことを特徴とする実用新案登録請求の範囲第1項
記載の半導体基板の赤外線熱処理装置。
(2) The semiconductor substrate according to claim 1, which is a utility model registration, characterized in that a plurality of inert gas ejection holes are provided to eject the semiconductor substrate inside the semiconductor substrate storage box from the lower part thereof and float and rotate the semiconductor substrate. Infrared heat treatment equipment.
JP17882083U 1983-11-21 1983-11-21 Infrared heat treatment equipment for semiconductor substrates Pending JPS6085836U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17882083U JPS6085836U (en) 1983-11-21 1983-11-21 Infrared heat treatment equipment for semiconductor substrates

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17882083U JPS6085836U (en) 1983-11-21 1983-11-21 Infrared heat treatment equipment for semiconductor substrates

Publications (1)

Publication Number Publication Date
JPS6085836U true JPS6085836U (en) 1985-06-13

Family

ID=30388139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17882083U Pending JPS6085836U (en) 1983-11-21 1983-11-21 Infrared heat treatment equipment for semiconductor substrates

Country Status (1)

Country Link
JP (1) JPS6085836U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269932A (en) * 1988-09-05 1990-03-08 Hitachi Ltd Device for heat treatment of semiconductor wafer and heat treating method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5424990A (en) * 1977-07-26 1979-02-24 Toyo Soda Mfg Co Ltd Gas phase polymerization of vinyl chloride and/or vinyl chlroide analogue
JPS58118112A (en) * 1981-12-30 1983-07-14 ア−ノン・エマニエル・ガツト Heat treating device for semiconductor material

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5424990A (en) * 1977-07-26 1979-02-24 Toyo Soda Mfg Co Ltd Gas phase polymerization of vinyl chloride and/or vinyl chlroide analogue
JPS58118112A (en) * 1981-12-30 1983-07-14 ア−ノン・エマニエル・ガツト Heat treating device for semiconductor material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269932A (en) * 1988-09-05 1990-03-08 Hitachi Ltd Device for heat treatment of semiconductor wafer and heat treating method

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