JPS6080A - Socket for mounting integrated circuit - Google Patents

Socket for mounting integrated circuit

Info

Publication number
JPS6080A
JPS6080A JP10803583A JP10803583A JPS6080A JP S6080 A JPS6080 A JP S6080A JP 10803583 A JP10803583 A JP 10803583A JP 10803583 A JP10803583 A JP 10803583A JP S6080 A JPS6080 A JP S6080A
Authority
JP
Japan
Prior art keywords
socket
integrated circuit
holding unit
electrode
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10803583A
Other languages
Japanese (ja)
Inventor
坂上 直人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP10803583A priority Critical patent/JPS6080A/en
Publication of JPS6080A publication Critical patent/JPS6080A/en
Pending legal-status Critical Current

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  • Connecting Device With Holders (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 本発明は集積回路装置用ソケット(以下ICソケット)
に係り、%にバーンインテスト(以″′FBTと記す)
のように一度に多数のIC2扱う必要のあるlにソケッ
MCIJするものである。
[Detailed Description of the Invention] The present invention relates to a socket for an integrated circuit device (hereinafter referred to as an IC socket).
% burn-in test (hereinafter referred to as FBT)
This is a socket MCIJ that needs to handle a large number of IC2s at once.

一般′/cBTの工うl工程(おいては1枚に数百側の
ICソケット?有するバーンインテストボード(以下B
Tボードと記す)vc被測定lす?装填し恒温槽に挿入
して雰囲気温度を高温/CL I Uの環境、ライフタ
イム加速試験を行なう。現在前記BTボードのICソケ
ットに被測定1c2装填する工程はfil:業者が1つ
ずつ手作業により行なうがあるいは専用のIC装填ロボ
ット金用いて行lゎわている。しかしながら前者の手段
[、J:ゎは作業能率が悪く所用工数も多大なものとな
り、又後者の手段1’(よねは高額な設備投資が必要と
なり又設備の稼′!JJ推持も容易でにない。
General/cBT manufacturing process (In the burn-in test board (hereinafter referred to as B), which has several hundred IC sockets on one board
(denoted as T board) VC under test? Load it, insert it into a constant temperature oven, and perform a lifetime acceleration test in a high ambient temperature/CLIU environment. Currently, the process of loading the IC sockets to be measured 1c2 into the IC sockets of the BT board is carried out manually by a trader one by one, or by using a dedicated IC loading robot. However, the former method [, J:ゎ has poor work efficiency and requires a large amount of man-hours, and the latter method 1' (Yone) requires a large amount of capital investment and is difficult to maintain. Not in.

本発明はかかる不具合全改良しHT vcおけるよジ効
率的なIC装填作業を目的とするものである〇不発8A
[よるICソケットは複数のIc奮〜連V′c冥装可能
であり複数の■ct保持する保持ユニットと、複数のI
Cの端子を電気信号と従続する為の電極子ユニットから
成り保持ユニットIdleの下面を保持する保持[+1
]VC相対して適当な間隙ケおいてICがその上面によ
り滑走する事の出来る滑走面金もつ構造となっている。
The purpose of the present invention is to improve all of these problems and achieve more efficient IC loading work in HT VC.
[The IC socket can hold multiple ICs and a holding unit that holds multiple ICs and multiple ICs.
The holding unit [+1
] The IC has a structure with a sliding surface plate that allows the IC to slide on the upper surface of the IC with an appropriate gap facing the VC.

該保持ユニツ)k滑走凹が下ICなる様保持し一端エク
復数のIc’(z収容マガジン等より流し込めばICi
滑走滑走子ってICの上面1’Cより滑走しICソケッ
ト内だ充填される。又、滑走凹に相対する面、すなわち
保持向は保持ユニットの底圓に対し一定角度を持ち、長
さが1個のICの長さに和尚する複数の斜口となってお
り前記ICの充填されたICンケッtf保持lが下vc
yる様に保持し、左右厄振WJ=与える等にエリICに
各々の斜面にそって各々斜めに保持さil、位置決めさ
れる。
The holding unit) K is held so that the sliding concave is the lower IC, and one end is Ic' of the number of extrusions (Z is ICi if poured from the storage magazine etc.)
The sliding slider slides from the top surface 1'C of the IC and fills the inside of the IC socket. In addition, the surface facing the sliding recess, that is, the holding direction, has a certain angle with respect to the bottom circle of the holding unit, and has a plurality of diagonal openings whose length corresponds to the length of one IC, so that it is easy to fill the IC. IC card tf holding l is lower vc
They are held diagonally along the respective slopes of the IC and positioned so as to give left and right swings.

更に本発明だよるICソケットの保持ユニット九にその
両側にその摺動向が底mに対して保持向と補角の関係全
持つ様な電極子が韮植されており該第1の電極すと前記
位置決めされたICの相対する端子と?電気的に後続す
る第2の電極子?持つ電極子ユニットを装着する手足よ
り複数の被6111定ICに一度lこ確実に固定される
と共に電気信号と電気的に阪続さjる。
Further, the holding unit 9 of the IC socket according to the present invention has electrodes planted on both sides thereof in such a manner that the sliding movement thereof has a relation of the holding direction and the supplementary angle with respect to the bottom m, and the first electrode The opposing terminal of the positioned IC? A second electrically following electrode? The electrode unit is once firmly fixed to the plurality of 6111 fixed ICs from the limbs on which the electrode unit is attached, and is electrically connected to the electric signal.

次九図?用いて本発明の一実施例を説明する。Next nine figures? An embodiment of the present invention will be described using the following.

第1図に本発明笑適例によるICソケットの保持ユニッ
トの1部汁の側面図であり、第2図に第1図のa−a’
における断面図である。滑走面1ヶ下にして保持された
保持ユニットの一端、l:v清走叩1と保持向3の聞く
流し込まねた被測定ICに滑走mt上?ICの上面によ
!7滑走し保持ユニットの閉じらf′1fC他端よ、り
順次保持ユニット内iC充填さり、る。次に保持ユニッ
ト?滑走[1]1が上YCなる様保持する事にエリ充填
さf+たる被測定IC汀保持ユニットの底面2 YC対
し一定の角度をもち、長さが1個のICの長さに和尚す
る保持[@] 3’/C各に斜めに保持2位置決めされ
る。さらに本保持ユニットの両fIlてばその摺動部4
が保持向3と面角VCなる工う(C第1の電極子5が必
要な個数韮植され。
FIG. 1 is a side view of a part of a holding unit of an IC socket according to a preferred embodiment of the present invention, and FIG.
FIG. One end of the holding unit held with the sliding surface 1 below, l:v sliding on the IC to be measured that has not been poured with clear stroke 1 and holding direction 3? On the top of the IC! 7. When the holding unit is closed, the holding unit is sequentially filled with iC from the other end. Next is the holding unit? Sliding [1] The bottom surface of the IC to be measured is held so that 1 is above YC. Bottom surface 2 of the IC holding unit to be measured is held so that 1 is on top YC. [@] 3'/C Two positions are held diagonally in each direction. Furthermore, the sliding portion 4 of both sides of the main holding unit is
is the holding direction 3 and the face angle VC (the required number of first electrode elements 5 are implanted).

ているΩ第3図は電極子ユニットlOであ!7第4内は
第3図のb −b’[おける断冊図である。電極子ユニ
ツ)10の両側にに前記第1+7J’FW極十5の摺動
部4と同等の角度をもって第2の電極+6が必要な個数
1植されてお!llll第5断丸断囲して示す如く前記
保持ユニットの上rmより嵌合させる事rcエク保持ユ
ニット7の第1の電極す5と被測定IC8の端子9とが
電極子ユニット10の第2の電極子61Cより電気的に
朕続される構造となっている。又、被測定ICを保持ユ
ニットLv収各マガジンへ移す場合′/cは保持ユニッ
ト7より電極子ユニット10全離脱させ滑走面lを下r
c保持する事丸エク被測定ICμ保持面3エリ滑走面l
上に落下しその上回(エフ滑走面l上を滑走させ収容マ
ガジン内に容易rc収容可能である。なお、電極子ユニ
ットlO!fcは通風孔11’に適当な数だけ設けるこ
2もできる。
Figure 3 shows the electrode unit lO! 7 The 4th part is a cutaway view taken along b-b'[ of Fig. 3. The required number of second electrodes +6 are placed on both sides of the electrode unit 10 at the same angle as the sliding part 4 of the first +7J'FW pole 15! As shown in the fifth cut-out circle, the first electrode 5 of the RC extender holding unit 7 and the terminal 9 of the IC to be measured 8 are fitted into the second electrode unit 10 from the upper rm of the holding unit. It has a structure in which it is electrically connected to the electrode element 61C. In addition, when transferring the IC to be measured to each magazine in the holding unit Lv, remove the entire electrode unit 10 from the holding unit 7 and lower the sliding surface l.
c To hold the IC μ holding surface 3 Eri sliding surface l
It is possible to drop the electrode unit 1O!fc above it and slide it on the sliding surface 1 and easily store it in the storage magazine.It is also possible to provide an appropriate number of electrode units 1O!fc in the ventilation holes 11'. .

以上の如く本発明九よるlCソケットt[Tボード等に
用いれは多数の工C全容易VCI Uソケットに装填し
電気信号と愛読可能であり、又BTテスト終了時1’c
もICを容易に抜去し収容マガジンに収容Tる事が可能
である。よって現在の作業と比較してはるか丸効率的な
作業が行な/を作業コスト低減に大いなる貢献が期待出
来る。
As described above, the IC socket according to the present invention can be easily loaded into the VCI U socket and read as an electrical signal, and can be used for a T board, etc.
It is also possible to easily remove the IC and store it in the storage magazine. Therefore, it is expected that the work will be far more efficient than the current work and will make a significant contribution to reducing work costs.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明笑施例によるlCソケットの保持ユニッ
トの一部分の側面図、第2肉は第1図においてa −a
’で切断した断面図である。第3Nは電極子ユニットの
一部分の側面図であり、第41勺に第3図においてb 
−b’で切断した断面図である。 第5図は前記保持ユニットとFJ記電極十ユニットを嵌
合させた時の断(2)図である。 なお図において、l[滑走面、2は保持ユニットの底口
、3に保持向、4に第1のTに極す5の摺動面、5は第
1の電極子、6に纂2のit(極子、7は保持ユニット
、8に被測定1に、9に被測定IC8の端子、1()は
電極子ユニット、である。 代理人 弁理士 ピタ 原 昔 寸 偽 2 第2図 一:’(63−= 第5図
FIG. 1 is a side view of a part of the holding unit of the IC socket according to the embodiment of the present invention, and the second body is a-a in FIG.
It is a sectional view taken at '. 3N is a side view of a part of the electrode unit;
It is a sectional view taken at -b'. FIG. 5 is a cross-sectional view (2) when the holding unit and the FJ electrode unit are fitted together. In the figure, 1 is the sliding surface, 2 is the bottom opening of the holding unit, 3 is the holding direction, 4 is the sliding surface of 5 facing the first T, 5 is the first electrode, and 6 is the sliding surface of the wire 2. it (pole, 7 is the holding unit, 8 is the device to be measured 1, 9 is the terminal of the IC 8 to be measured, 1 () is the electrode device unit. Agent Patent Attorney Pita Hara Old Size False 2 Figure 2 1: '(63-= Figure 5

Claims (1)

【特許請求の範囲】[Claims] 複数の集積回路装置を一連に保持し、該複数の集積回路
装置の各端子と電気信号との電気的な吸続が可能な集積
回路装置用ソケット[おいて、前記集積回路装置の下l
l0e保持する保持面が各々該集積回路装置用ソケット
の底面に対して一定の角度?もつ複数の斜面であり、前
記保持口く相対して平滑な面が設けられている事全特徴
とする集積回路装置用ソケット。
A socket for an integrated circuit device that holds a plurality of integrated circuit devices in series and is capable of electrically connecting each terminal of the plurality of integrated circuit devices to an electrical signal
Is each holding surface held at a constant angle with respect to the bottom surface of the integrated circuit device socket? 1. A socket for an integrated circuit device, characterized in that the socket has a plurality of sloped surfaces, and a smooth surface facing the holding opening is provided.
JP10803583A 1983-06-16 1983-06-16 Socket for mounting integrated circuit Pending JPS6080A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10803583A JPS6080A (en) 1983-06-16 1983-06-16 Socket for mounting integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10803583A JPS6080A (en) 1983-06-16 1983-06-16 Socket for mounting integrated circuit

Publications (1)

Publication Number Publication Date
JPS6080A true JPS6080A (en) 1985-01-05

Family

ID=14474293

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10803583A Pending JPS6080A (en) 1983-06-16 1983-06-16 Socket for mounting integrated circuit

Country Status (1)

Country Link
JP (1) JPS6080A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4478130A (en) * 1981-03-19 1984-10-23 Sundstrand Corporation Arrangement for slipper cavitation erosion control and impact reduction

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4478130A (en) * 1981-03-19 1984-10-23 Sundstrand Corporation Arrangement for slipper cavitation erosion control and impact reduction

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