JPS6074183A - Magnetic bubble memory element - Google Patents

Magnetic bubble memory element

Info

Publication number
JPS6074183A
JPS6074183A JP58180282A JP18028283A JPS6074183A JP S6074183 A JPS6074183 A JP S6074183A JP 58180282 A JP58180282 A JP 58180282A JP 18028283 A JP18028283 A JP 18028283A JP S6074183 A JPS6074183 A JP S6074183A
Authority
JP
Japan
Prior art keywords
generator
hair
heating state
resistance value
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58180282A
Other languages
Japanese (ja)
Inventor
Shinzo Matsumoto
信三 松本
Minoru Hiroshima
実 広島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58180282A priority Critical patent/JPS6074183A/en
Publication of JPS6074183A publication Critical patent/JPS6074183A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements

Abstract

PURPOSE:To decide the reliability of wiring by providing a voltage measuring terminal to the wiring pattern of a magnetic bubble generator to detect the heating state of a hair-pin part of the generator. CONSTITUTION:The temperature rise is calculated from a resistance value of the hair-pin part to recognize the heating state of the said part. The resistance value is calculated by measuring the voltage of the hair-pin part. For example, a generator current flows to the part of a conductor part 5 to generate magnetic bubbles. Since the line width of the pair-pin part 6 is nearly 1-4mum, which is narrower than other parts, a current is concentrated on this part and the life of wire of the hair-pin part 6 is decreased because of heat dissipation or electromigration, thereby reducing the reliability of the generator. Thus, the heating state is recognized by measuring the voltage of the part and calculating the resistance value. Thus, the resistance value of the hair-pin part 6 is calculated by measuring the voltage of each terminal pair and the heating state is evaluated, then it is possible to estimate the service life of the wire not by the actual heating state of the generator or open wire test.

Description

【発明の詳細な説明】 速データ転送レートを必要とする書込み数の多いないた
め、との部分の発熱状態を知ることができず、通常、寿
命推定は断線試験を用いて行ってい態を知り配線の信頼
性を判定することができる磁抵抗値変化から温度上昇を
計算できる。このため、木５ｇ、明ではへ了ピン舞の雪
ｍ冬泪Ｉφ１址片イ古か竹園において１，２，３．４は
電圧測定端子である。[Detailed Description of the Invention] Due to the large number of writes that require a high data transfer rate, it is not possible to know the state of heat generation in the parts.Usually, life estimation is performed using a disconnection test to know the state. The temperature rise can be calculated from the change in magnetic resistance value, which can determine the reliability of the wiring. For this reason, 1, 2, and 3.4 are voltage measurement terminals in Wood 5g, Ming, Winter, Winter, Iφ1, Old, and Takeen.

導体部５は発生器の配線パターンの一例を示し、この部
分に発生器電流を流し磁気バブルを発生させる。ヘアピ
ン部６は線幅が他の部分に比べて約１〜４μｍと狭いた
め、この部分で電流が集中し、発熱やエレクトロマイグ
レーションによりこノヘアピン部６で配線寿命が短かく
なり、発生器の信頼性が低下する。このため、この部分
の電圧を測定し抵抗値を算出して発熱状態を知ることに
した。The conductor portion 5 represents an example of the wiring pattern of the generator, and a generator current is passed through this portion to generate a magnetic bubble. Since the line width of the hairpin section 6 is narrower at approximately 1 to 4 μm compared to other sections, current concentrates in this section, resulting in heat generation and electromigration, which shortens the wiring life in the hairpin section 6, reducing the reliability of the generator. Sexuality decreases. For this reason, we decided to measure the voltage at this part and calculate the resistance value to determine the state of heat generation.

この例では、４つの電圧測定端子１，２，３．４を設け
ているが、このうち２対を選んでも充分である。In this example, four voltage measurement terminals 1, 2, 3.4 are provided, but it is sufficient to select two pairs of these terminals.

本発明によれば、各端子対の電圧を測定することでヘア
ピン部６の抵抗値を算出でき、発熱状態も評価できるた
め、発生器の発熱状態や断時試験配線部の抵抗値がわか
るのでこの部分の発熱状態や配線寿命を簡単に知ること
ができるという効果がある。According to the present invention, the resistance value of the hairpin section 6 can be calculated by measuring the voltage of each terminal pair, and the heating state can also be evaluated, so the heating state of the generator and the resistance value of the disconnection test wiring section can be determined. This has the effect of allowing you to easily know the heat generation state of this part and the lifespan of the wiring.

【図面の簡単な説明】[Brief explanation of drawings]

図は本発明による磁気バブルメモリ素子の発生器のパタ
ーン図である。 １〜４・・・・電圧測定端子、５・・・・導体部、６・
・・・ヘアピン部。 ２The figure is a pattern diagram of a generator of a magnetic bubble memory device according to the present invention. 1-4...Voltage measurement terminal, 5...Conductor part, 6...
...Hairpin section. 2

Claims (1)

【特許請求の範囲】[Claims] 磁気バブルの発生器の配線パターンに電圧測定端子を設
けたことを特徴とする磁気バブルメモリ素子。A magnetic bubble memory element characterized in that a voltage measurement terminal is provided in the wiring pattern of a magnetic bubble generator.
JP58180282A 1983-09-30 1983-09-30 Magnetic bubble memory element Pending JPS6074183A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58180282A JPS6074183A (en) 1983-09-30 1983-09-30 Magnetic bubble memory element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58180282A JPS6074183A (en) 1983-09-30 1983-09-30 Magnetic bubble memory element

Publications (1)

Publication Number Publication Date
JPS6074183A true JPS6074183A (en) 1985-04-26

Family

ID=16080487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58180282A Pending JPS6074183A (en) 1983-09-30 1983-09-30 Magnetic bubble memory element

Country Status (1)

Country Link
JP (1) JPS6074183A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016201194A3 (en) * 2015-06-10 2017-01-12 Qualcomm Incorporated Method and apparatus for integrated circuit monitoring and prevention of electromigration failure

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016201194A3 (en) * 2015-06-10 2017-01-12 Qualcomm Incorporated Method and apparatus for integrated circuit monitoring and prevention of electromigration failure
US10591531B2 (en) 2015-06-10 2020-03-17 Qualcomm Incorporated Method and apparatus for integrated circuit monitoring and prevention of electromigration failure

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