JPS6070373A - Test system - Google Patents

Test system

Info

Publication number
JPS6070373A
JPS6070373A JP58178604A JP17860483A JPS6070373A JP S6070373 A JPS6070373 A JP S6070373A JP 58178604 A JP58178604 A JP 58178604A JP 17860483 A JP17860483 A JP 17860483A JP S6070373 A JPS6070373 A JP S6070373A
Authority
JP
Japan
Prior art keywords
cpu
bif
test
address
ram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58178604A
Other languages
Japanese (ja)
Other versions
JPH0766032B2 (en
Inventor
Eiki Arasawa
荒沢 永樹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Hokushin Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hokushin Electric Corp filed Critical Yokogawa Hokushin Electric Corp
Priority to JP58178604A priority Critical patent/JPH0766032B2/en
Publication of JPS6070373A publication Critical patent/JPS6070373A/en
Publication of JPH0766032B2 publication Critical patent/JPH0766032B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To make it possible to simply conduct a predetermined test within a relatively short time so as to be capable of easily corresponding to the alteration or addition of an object to be tested, by using a common condition setting means in setting the operational condition of each module. CONSTITUTION:CPU applies an address change-over signal S3 to BIF so as to apply an address to RAM from a bus interface (BIF). When a sequence number S1 for conducting a test is sent to a sequence bus SB, BIF applies a detection signal S4 for displaying data arrival to CPU. CPU applies a bus selecting signal S5 to RAM and a conversion address S6 is directly read from RAM according to the sequence number S1 applied from SB through BIF and read by the processor CPU according to the bus selecting signal S5. CPU conducts predetermined test operation according to thus read conversion address. By this mechanism, a test can be conducted within a short time by using a plurality of test modules TM.

Description

【発明の詳細な説明】 本梵明は、−デストシスjムに関するしのであって、詳
しく(、↓、所定のデスト機OLを有ゴる複数のテスト
モジコールを用いてテスト対象物に対づるテストを行う
ように溝成されたテストシステムに関Jるものであり、
各モジ=L−ルの動作条イ!1の設定が共通の条11設
定手段を用いることにより簡単に行え、デス1一対象物
の変更−)ゝ))0加に対して容易に対応でき、さらに
、比較的短時間で所定の一戸ス1へが実行−Cさる新し
いデストシスjムを提供りるものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a destination system, in detail (↓, a test on a test object using a plurality of test modules having a predetermined destination machine OL). It relates to a test system configured to perform
How each module works! 1 can be easily set by using a common article 11 setting means, it can easily respond to the change of object 1 -)゜)) This provides a new destination system for execution-C.

デス1へシステムの一種に、アナロタ1−81デス1へ
システムかある。一般に、このようなシステムで(J、
デストJべきLSIに応じて各アメ1−°シジーJ−ル
の動作条1!4が設定され、所定のデス(−11作が実
行される。ところで、従))4のシス−ツムにJ3りる
動作条(′1の1曳定(ま、各モジトルの機r1ヒit
1属性イ1どか配)小さ41′Cいる説明用を読みなが
ら〒1わな+J IL U % ラ−J−1I)Jft
条f’l 設’tL t=相当の1−数を要している。
One type of Death 1 System is the Analota 1-81 Death 1 System. Generally, in such a system (J,
The operating conditions 1!4 of each American 1-° system J-le are set according to the LSI to be used as the death J, and the predetermined death (-11 operation is executed. By the way, the slave)) 4 system-tsum is J3 The operating conditions ('1, 1 hit)
1 Attribute A 1 Doka Arrangement) Small 41'C While reading the explanation 〒1 Trap + J IL U % Ra - J - 1 I) Jft
Article f'l Set'tL t=1-number equivalent to required.

また、ラス1一対9!物の変更や追加に対しては、デス
トモジコールのみならづシスブム全体のjl−1グラム
も変更しな(Jればならず、簡単に行うことはできない
。一方、デスト実?1にあたっては、設定さ(また各デ
ストモジコーールの動作条件を予め共通の制御部に(8
納しcおき、その都度心数な設定データをルミ定のモジ
ュールに送り出Jように構成されCいるのC1このよう
な前処理に相当の時間を要し、7スト実?1時間の短縮
を阻害づる一囚となっている。
Also, last one against nine! When changing or adding things, you must change not only the destmodicor but also the jl-1 gram of the entire system (J, which cannot be done easily.On the other hand, for destmodicol?1, (Also, set the operating conditions of each desto module in advance in the common control unit (8
It is configured in such a way that it sends out the setting data to the Lumi constant module every time it is loaded.This kind of preprocessing takes a considerable amount of time, and it takes 7 strokes. This has become a hindrance to reducing the time to one hour.

木光明は、これらの従来の欠点を解決したしのCあって
、前jホのシステムにおいて、各デストモジコールには
−]二(tブに11?ッ→すから夕′・ンン]」−ドさ
れる複数のシークンス番号、制御コード、パラメータを
含む一連のデータかlうシーケンス番号をモジ−1−ル
が判断しやJ−いコード形式のアドレスに変換して格納
りるメー[りを設(プ、デスト実行時にtit七ジュー
ルのメモリをシーケンス番号によりビj接アクレスし−
Cメしりから送出される)Jドレスに(5Yっ(各モジ
、:1−ルを駆動しC所定の一7ストを行5J、)にし
たことを14徴と・Jるbの(゛ある。。
Kokumei solved these conventional shortcomings, and in the previous system, each destomodicoll had -]2 - A series of data including multiple sequence numbers, control codes, and parameters to be coded. When executing the process, the memory of 7 joules is accessed by the sequence number.
The 14th characteristic is that (5Y-(each module, :1-le is driven and the C predetermined 17th stroke is set to row 5J,) to the J dress (sent from the C meter). be..

IS4ド、図面を用いC訂柵に説明づる。IS4 card, explain the C correction fence using drawings.

図面(J、本発明の一実施例の要部を示すブロツウ(]
(ル)って、SB(よシステムパス、l−Mはテストモ
ジュール、BIFはパスインタフェース、RA M G
、1ランダムノツクセスメモリ、CPUはブロレツナで
ある。
Drawings (J, Brochure showing essential parts of an embodiment of the present invention)
(Le) is SB (Yo system path, l-M is test module, BIF is path interface, RAM G
, 1 random access memory, and the CPU is a block.

バスインタフェースBIFにはシステムバスSBから例
えば16ピツhのシーツ7ンス番@S1が加えられ、プ
1コセッサCP jJから例えば゛16ビ自ットのアド
レスS2及びランタムアクセスメモリRA Mに加える
アドレスをシステムパスSB又はプロセッサCPUに切
り換えるアドレス切換信号S3が加えられる。バスイン
タフェースBIFからランタムアクセスメモリRAMに
はこれら1Gピツ1〜のシークンス?It号$1または
71−レスS2が加えられ、ブロセッリCPUにはシス
テムバス3 B1.s rらのデータ到来を示づ検出信
号S、1が加えられる。
For example, the 16-bit sheet number @S1 of 16 bits is added to the bus interface BIF from the system bus SB, and the 16-bit address S2 and the address added to the random access memory RAM are added from the processor CP jJ to the bus interface BIF. An address switching signal S3 is applied to switch the address to the system path SB or the processor CPU. From the bus interface BIF to the random access memory RAM, these 1G bits 1~ sequence? The system bus 3 B1. A detection signal S,1 indicating the arrival of data such as s r is applied.

ランダムアクセスメモリR△11にtよランタムアクセ
スメモリRA lvlからブ]−11?ツリCPUに加
えられる16ヒツ1〜のア1−レスを8ピッ1− +4
i位C’にみ取るためにアドレスの」二位8ヒッ1〜ど
十位8ビットとを選択づるハイ1〜選択信号S5がゾ1
コレツリCPUから加えられる。そして、ランタムアク
セスメモリI’< A fvlとブ1コセツナCPUと
の間C゛は8ビット単位で変換アドレスデータS6の授
受が行4つ4′する。
t to random access memory R△11 Random access memory RA lvl to b] -11? 8 bits 1- +4 for 16 hits 1 to 1-areas added to the tree CPU
The high 1 to selection signal S5 selects the second 8th bit to the tenth 8 bits of the address in order to read it to the i position C'.
It is added from the CPU. Then, between the random access memory I'<A fvl and the CPU, the converted address data S6 is exchanged in 8-bit units in 4 rows 4'.

このにうに(1も成される装防の動作について説明Jる
I will explain the operation of the defense that is done in this case.

、1.2J゛、j−λ1〜動作の実1jに先立ら、シス
テムバスSBを介し−C十位ブ1コセツリ〈図示Vず)
から各iスト七ジ、1−ルに複数のシーケンス番号、制
御I+ −1・、パラメータを含む一連のデータがダウ
ンロードされる。ここC゛、シーケンス番号はデストの
順番を表わJものCあり、制御コードはそのシーケンス
番号にAj f、Iる処理の内容(例えば測定糸(q設
定、測定、設定解除など)を表ねりものCあり、パラメ
ータは例えはU体向’c′に条(’I段設定)C1を表
ねづしのである3、各5ス1へ[シ1−ル(まこれら−
池のノータからシーケンス番号をデストモジ゛l−ルが
判断し一\ゝ)りい1−1〜形式の7トレスに変換しく
シンク11アク[!スメしりRA Mに格納りる。
, 1.2J゛, j-λ1 ~ Prior to the actual operation 1j, the -C tenth position block 1 is set via the system bus SB (V not shown)
A series of data including a plurality of sequence numbers, control I+-1, and parameters are downloaded to each iStore from I+ to I-1. Here, the sequence number indicates the order of the dest, and the control code indicates the content of the process (for example, measurement thread (q setting, measurement, setting cancellation, etc.) in the sequence number. For example, the parameters are 3, each of the 5 lines 1, and the parameters are 3 and 5, respectively.
The destination module determines the sequence number from the pond node and converts it to a 7-trace format of 1-1 to 1-1. Stored in Sumeshiri RAM.

これにより、同じシーケンス番号による異4「る処理の
す\ゝ)、異4するシーツ7ンスm号による同じ処理の
要求に対処づ゛ることかできる。ランダムアクセスメモ
リRA〜1への変換アドレスS6の格納にあたってはラ
ンダムアクセスメモリRAMへのアドレスがプロセッサ
CPtJから加えられるようにバスインタフェースBI
Fに対しアドレス切換信号S3を加える。このようにし
てランダムアクセスメモリRAMへの変換アドレスS6
の格納が完了したら、フ“ロレツ9− CP Uはラン
ダムアクヒスメモリRA N4へのアドレスがパスイン
タフ1−スBIFから加えられるようにバスインタフェ
ースBIFに対しアドレス切換信号$3を加える。シス
テムバスSBにテスト実iテのIご(V)のシーケンス
番号S1か送られてくると、ハスインタフ■−スBIF
はデータ到来を表わづ検出信号S4をブ1」レッリ−C
P LJに加える。プロセツリc p u Ll、ハイ
I−選択信号Ssをランタム7ノク[Zスメし1.J 
RA N−1にIJI+える。イして、ランダムノ7ク
レスメしりRAMからはハスインタフ[−スBiFを介
してシステムバスS 13から加えらIIるシーノノン
スWfiQ 31に従って変換アドレスS6が直])(
読み出され、バイ1〜選択信号S5に従っC8ピッ1〜
fつブ[1けツリCP Uに読み取られる。ブLルッリ
−CPUはこのJ、うにしC読み取った2換アドレスS
6に従って所定のテスト動作を実行Jる。
As a result, it is possible to handle requests for the same processing due to different sheet number m with the same sequence number and requests for the same processing due to different sheet number m.Conversion address to random access memory RA~1 When storing S6, the bus interface BI is used so that the address to the random access memory RAM is added from the processor CPtJ.
Add address switching signal S3 to F. In this way, the translation address S6 to the random access memory RAM
When storage is completed, the CPU applies an address switching signal $3 to the bus interface BIF so that the address to the random access memory RAN4 is added from the path interface BIF.System bus SB When the sequence number S1 of the I (V) of the test actual I is sent, the Hass interface BIF
indicates the arrival of data and turns on the detection signal S4.
Add to P LJ. Processor reset c p u Ll, high I-selection signal Ss by random 7 [Z recommendation 1. J
IJI+ will be added to RA N-1. Then, the converted address S6 is sent from the random number 7 message RAM to the system bus S13 via the bus interface BiF according to the second synonym WfiQ31) (
C8 pin 1~ according to the selection signal S5
f [1 bit read by CPU. BLURRI-CPU reads this J, sea urchin C, and reads the binary address S.
Execute a predetermined test operation according to 6.

このような(t!1成にJ、れば、シーケンス番号によ
り直接各デス1へモジュールのランダムアクヒスメモリ
[く△Mをj!クレスして変換アドレスを読み出すこと
かでさるのて、ソフトウエノ2により検索覆る場合に比
べC読J)出しに要する時間を大幅に短縮することか(
きる。特に、16ビツ1〜のデータから8ピッ1−のプ
ロヒッリCP Uで必要な1Gヒツ1〜のデータを検素
・jる場合には相当の演紳時間か必要と41−るか、こ
のように組成Jることにより検索のI:めの滴り)04
間を零にづることが(きる11、した、7スト実行時に
は、上位プロレッリCP Uからはシーケンス番号を送
り出すたりてよく、より一層の7スト実tjll、目1
11の短縮が図れる。また、このよう4c描成によれ(
、■、−jスト刻客物の変更や追加に対し−(は必要な
−1−スミ−モジコールの動作条+1を例えばターミナ
ルを用いて変更づ″ればよく、容易に対処することがで
きる。
If J enters t!1 in this way, the sequence number can be used to directly transfer the module's random access memory [△M to j! and read the translation address. Compared to the case of retrieving with Ueno 2, the time required to retrieve C reading J) can be significantly shortened (
Wear. In particular, when analyzing 1GB of data required by an 8-bit high-performance CPU from 16 bits of data, a considerable amount of operating time is required. Search by composition J: Drips of eyes) 04
It is possible to set the interval to zero (when executing the 11th, 7th, and 7th strokes, the sequence number may be sent from the upper level CPU), making the 7th stroke even more difficult.
11 can be shortened. Also, according to the 4c depiction like this (
,■, -j -j -j -j -j -j -j -j -j -J -j -j - -j - - ( - - - j - It is possible to easily deal with changes or additions by simply changing the operation conditions + 1 of Sumy Mojikor using the terminal, for example. .

以上説明したように、本発明によれば、各デストモジユ
ールの動作時の動作条19の設定が比較的短時間で簡単
に行え、テスト対象物の変更や追加に容易に対応でき、
さらに、デストし短時間で実行できる複数のデストモジ
ユールを用いたテストシステムが実現でき、LSIのみ
ならず、各種の対象物のテストシステムとして実用上の
効果は大きい。
As described above, according to the present invention, the setting of the operating conditions 19 during the operation of each dest module can be easily performed in a relatively short time, and changes and additions to test objects can be easily accommodated.
Furthermore, it is possible to realize a test system using a plurality of dest modules that can be destabilized and executed in a short time, which has a great practical effect as a test system not only for LSIs but also for various types of objects.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の一実施例を示タフロック図である。 S B・・・システムバス、T M・・・デストモジコ
ール、[31F・・・バスインタフェース、RA M・
・・ランタムノックセスメモリ、CP Ll・・・ブ[
ルッリ゛。
The drawing is a block diagram showing one embodiment of the present invention. S B... System bus, T M... Desto module, [31F... Bus interface, RAM.
... Random knock access memory, CP Ll...B[
Ruri.

Claims (1)

【特許請求の範囲】 所定のテスト機OLをイラする複数のデスト七ジコール
を用い【デストタ・1象物に対づるデス]〜を行うよう
に’A /戊されたテストシステムにおいて、各デスI
・モジコールに(,1十位)1」セックからタウンロー
1〜される複数のンーノ7ンス番号、制ill 、、J
−ド。 ハラメータを占む−)虫のデータl)+ tろシーケン
ス番号を−しジー1−ルが判断しヤ】ηいロー1〜形式
の11〜レスに変換して格納りるメモリを設置、−’z
’ス[・実1j11.’i M ILL Eシ1−ルの
メしりをシー17ンス番号にJ、すll’l接)7り(
イスしCヌ七りから送出される)21−レスに従ノC8
[シl−ルを駆動し・(所定のjスト4−1」)J、−
Jにしlどことを1!酉マタとり<)デストシスノ/1
.。
[Scope of Claims] In a test system designed to perform [death for one object] using a plurality of desujicols that irritate a predetermined test machine OL, each death I
・Mojikor (, 10th place) 1" sec to town low 1 ~ multiple nno 7th numbers, control ill,, J
-Do. -) Insect data occupying the Harameter -) + t sequence number -, G1-le judges] η I set up a memory to convert it to 11-res in the format and store it, - 'z
'su [・actual 1j11. 'iMILL
21-Response to C8
[Drive the seal (predetermined j strike 4-1) J, -
J and where and 1! Torimatatori <) Destosino/1
.. .
JP58178604A 1983-09-27 1983-09-27 Test system Expired - Lifetime JPH0766032B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58178604A JPH0766032B2 (en) 1983-09-27 1983-09-27 Test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58178604A JPH0766032B2 (en) 1983-09-27 1983-09-27 Test system

Publications (2)

Publication Number Publication Date
JPS6070373A true JPS6070373A (en) 1985-04-22
JPH0766032B2 JPH0766032B2 (en) 1995-07-19

Family

ID=16051354

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58178604A Expired - Lifetime JPH0766032B2 (en) 1983-09-27 1983-09-27 Test system

Country Status (1)

Country Link
JP (1) JPH0766032B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01152380A (en) * 1987-09-14 1989-06-14 Texas Instr Inc <Ti> Function array sequential system for vlsi test system
JPH0288113U (en) * 1988-12-26 1990-07-12

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55126842A (en) * 1979-03-26 1980-10-01 Hitachi Ltd Automatic testing equipment for vehicle
JPS5698302A (en) * 1979-12-29 1981-08-07 Mitsubishi Electric Corp Test station for monitoring system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55126842A (en) * 1979-03-26 1980-10-01 Hitachi Ltd Automatic testing equipment for vehicle
JPS5698302A (en) * 1979-12-29 1981-08-07 Mitsubishi Electric Corp Test station for monitoring system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01152380A (en) * 1987-09-14 1989-06-14 Texas Instr Inc <Ti> Function array sequential system for vlsi test system
JPH0288113U (en) * 1988-12-26 1990-07-12

Also Published As

Publication number Publication date
JPH0766032B2 (en) 1995-07-19

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