JPS6063866A - Objective lens movable diaphragm device of electron microscope - Google Patents

Objective lens movable diaphragm device of electron microscope

Info

Publication number
JPS6063866A
JPS6063866A JP17114483A JP17114483A JPS6063866A JP S6063866 A JPS6063866 A JP S6063866A JP 17114483 A JP17114483 A JP 17114483A JP 17114483 A JP17114483 A JP 17114483A JP S6063866 A JPS6063866 A JP S6063866A
Authority
JP
Japan
Prior art keywords
lens
movable diaphragm
objective lens
magnetic pole
lens mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17114483A
Other languages
Japanese (ja)
Inventor
Tsutomu Kimura
力 木村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17114483A priority Critical patent/JPS6063866A/en
Publication of JPS6063866A publication Critical patent/JPS6063866A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/09Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Abstract

PURPOSE:To obtain an optimum angular aperture on the back side focal surface of each of a high resolving power lens mode and an extremely low power lens mode by arranging a plurality of objective lens movable diaphragms in the upper and lower sides, along an optical axis, of each corresponding lens mode. CONSTITUTION:A sample 2 set in a sample holder 1 is fixed in an optical axis within an objective lens comprising an upper magnetic pole 3 and a lower magnetic pole 4. A movable diaphragm 6 having a plurality of stop holes 5 with different diameters is arranged in a lens space between the upper and lower magnetic poles. A movable diaphragm 9 having a plurality of stop holes 8 with different diameters is arranged in a through hole 7 installed in the lower magnetic pole 4. The back side focal surface in a high resolving power lens mode exists in the lens space, and an optimum angular aperture to obtain good contrast with small stop holes 5 is selected using the movable diaphragm 6. The back side focal surface in an extremely low power lens mode exists in the lower magnetic pole 4, and an optimum angular aperture to obtain good contrast with stop holes 8 is selected using te movable diaphragm 9.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は電子顕微鏡等の対物レンズの可動絞りに係り、
特に、高分解能レンズモード、極低倍率レンズモードに
おける最適な開口角を得るに好適な対物レンズ可動絞り
装置に関する。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a movable aperture of an objective lens of an electron microscope, etc.
In particular, the present invention relates to an objective lens movable diaphragm device suitable for obtaining an optimal aperture angle in high resolution lens mode and extremely low magnification lens mode.

〔発明の背景〕[Background of the invention]

電子顕微鏡の対物絞りは、像のコントラスト等に関連す
る開口角を最適に設定するうえから、一般に対物レンズ
の上下磁極間のレンズ間隙に3〜4個の異った絞り孔径
(20mμφ〜100mμφ)を備えた可動絞り装置を
装着しておき、検鏡時に、倍率あるいはし7ズモード等
に会わせてこれらを選択し、最適の条件にして使用する
ことが行なわれている。
In order to optimally set the aperture angle related to image contrast, etc., the objective aperture of an electron microscope generally has 3 to 4 different aperture diameters (20 mμφ to 100 mμφ) in the lens gap between the upper and lower magnetic poles of the objective lens. A movable diaphragm device equipped with a diaphragm device is installed, and when examining the microscope, the user selects one of these depending on the magnification, zoom mode, etc., and uses it under optimal conditions.

しかしながらこの方式では、高分解能し/ズモードと極
低倍率レンズモードの様に、対物レンズの焦点距離が大
きく異なる場合には、いずれか一方(主として高分解能
レンズモード)のレンズモードでは後側焦点面に可動絞
り装置が装着されているので、小さな絞り孔径をもって
、視野径をカットすること無く良好なコノトラストを得
る最適な開口角が設定できるが、他の一方のレンズモー
ドでは困難である。
However, with this method, when the focal lengths of the objective lenses are significantly different, such as the high-resolution lens mode and the extremely low magnification lens mode, in one of the lens modes (mainly the high-resolution lens mode), the rear focal plane is Since the lens is equipped with a movable aperture device, it is possible to set the optimum aperture angle with a small aperture diameter to obtain a good conotrast without cutting the field of view, but this is difficult in the other lens mode.

ざらに、開口角の微調整できるようにしたものとして実
用新案登録第873672号があるが、これは1個の絞
り板(複数の絞り孔を有するi上下方向に移動して開口
角を微調整できる可動絞り装置1をもってしても、レン
ズ間隙外の後側焦点面に最適の絞り孔を入れることによ
る視野径カットなしで良好なコントラストを得る最適な
開口角を得る絞り孔を設定することはできない。
Roughly speaking, there is a utility model registration No. 873672 that allows fine adjustment of the aperture angle, but this is based on a single aperture plate (with multiple aperture holes) that moves up and down to finely adjust the aperture angle. Even with the movable diaphragm device 1, it is impossible to set the diaphragm hole to obtain the optimum aperture angle and obtain good contrast without cutting the field of view by placing the optimum diaphragm hole in the rear focal plane outside the lens gap. Can not.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、高分解能レンズモードおよび極低倍率
し/ズモードの各々の後側焦点面に適正な開口角を得る
ことのできる電子顕微鏡等の対物レンズ可動絞り装置全
提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a complete objective lens movable diaphragm device for an electron microscope, etc., which can obtain an appropriate aperture angle at the rear focal plane in each of the high-resolution lens mode and extremely low magnification lens mode.

〔発明の概費ゴ 本発明は、高分解能レンズモードおよび極低倍率レンズ
モードの各レンズモードに対応し、光軸に沿って上下に
複数個の対物レノズ可動絞vを配置することによって、
高分解能し/ズモードおよヒ極低倍率レンズモードの各
々の後側焦点面に適正な開口角を得ようというものでめ
る。
[Overview of the invention] The present invention corresponds to each lens mode of high resolution lens mode and extremely low magnification lens mode, and by arranging a plurality of objective lens movable diaphragms v above and below along the optical axis,
The objective is to obtain an appropriate aperture angle at the rear focal plane of each of the high-resolution lens mode and ultra-low magnification lens mode.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の実施例について説明する。 Examples of the present invention will be described below.

第1図、第2図には、本発明の一実施例が示されている
An embodiment of the present invention is shown in FIGS. 1 and 2. FIG.

図において、試料ホールダ1に装填された試料2は上磁
極3および下磁極4から構成される対物レンズ内の光軸
に装着されている。該対物レンズの上下磁極間のレンズ
間隙には、複数個の径の異った絞り孔5(10mμφ〜
70mμφ)を備えた可動絞り6が設けられている。ま
た、下磁極4に設けられた貫通孔7内には、複数個の異
った絞り孔8tlOmμφ〜70mμφ)を備えた可動
絞り9が装着されている。
In the figure, a sample 2 loaded in a sample holder 1 is mounted on the optical axis within an objective lens composed of an upper magnetic pole 3 and a lower magnetic pole 4. In the lens gap between the upper and lower magnetic poles of the objective lens, there are a plurality of aperture holes 5 (from 10 mμφ to
A movable aperture 6 with a diameter of 70 mμφ) is provided. Furthermore, a movable aperture 9 having a plurality of different aperture holes (8tlOmμφ to 70mμφ) is installed in the through hole 7 provided in the lower magnetic pole 4.

次に本実施例の動作を説明する。Next, the operation of this embodiment will be explained.

第1図は高分解能レンズモードの状態を示している。こ
のj!6会、対物レンズは強励磁fIN/v’fi〉1
6)で対物レンズの焦点距離は2簡以下である。したが
って該レンズモードにおける後側焦点面はレンズ間隙(
通常4■程度)内にあり、該後側焦点面の近傍に装着さ
れている可動絞り6を使用して、その小さな絞り孔5で
良好なコントラストを得る最適な開口角を選択すること
ができる。
FIG. 1 shows the state of the high-resolution lens mode. This j! 6, the objective lens is strongly excited fIN/v'fi〉1
In 6), the focal length of the objective lens is 2 mm or less. Therefore, the back focal plane in this lens mode is the lens gap (
By using the movable diaphragm 6 mounted near the rear focal plane, it is possible to select the optimum aperture angle to obtain good contrast with the small aperture 5. .

第2図は、極低倍率レンズモードの状態?示している対
物レンズは弱励磁(IN/V″PJ< i o )で対
物レンズの焦点距離は8餌以上でめる。したがって該レ
ンズモードにおける後側焦点面はレンズ間隙をはずれ下
磁極4内となる。この場合は、可動絞り6の絞り孔5で
は視野のカッドなどを含めると最適な開き角を選択する
ことが困難であるため、該レンズモードの後側焦点面の
近傍に、図の如く備えた貫通孔7内の可動絞り9を使用
して、その小さな孔り孔8で、良好なコントラストを得
る最適な開口角を選択することができる。
Is Figure 2 in extremely low magnification lens mode? The objective lens shown is weakly excited (IN/V''PJ < i o ) and the focal length of the objective lens is set to 8 or more. Therefore, the rear focal plane in this lens mode is outside the lens gap and inside the lower magnetic pole 4. In this case, it is difficult to select the optimum aperture angle for the aperture 5 of the movable diaphragm 6 if the quad of the field of view is included, so the By using the movable diaphragm 9 in the through hole 7 provided in this manner, it is possible to select the optimum aperture angle for obtaining good contrast with the small aperture 8.

したがって、本実施例によれば各し/ズモードの後側焦
点面に対応し、光軸にそって上下に複数個の可動絞り全
配置する本考案の構成において、レンズモードに合わせ
て可動絞V+使用することにより、視野径のカットなし
で良好なコントラストを得る最適な開口角を設定でき、
実用上の効果は極めて大きい。
Therefore, according to this embodiment, in the configuration of the present invention in which a plurality of movable apertures are all arranged up and down along the optical axis, corresponding to the rear focal plane of each lens mode, the movable aperture V + By using this, you can set the optimal aperture angle to obtain good contrast without cutting the field of view.
The practical effects are extremely large.

また、本実施例によれば可動絞り6、可動絞り9は、対
物レンズ励磁粂件を変えるレンズモード切換スイッチと
連動して、交互に着脱することは容易でるり、検鏡時の
操作性にも効果がある。
Furthermore, according to this embodiment, the movable diaphragm 6 and the movable diaphragm 9 can be easily attached and detached alternately in conjunction with the lens mode changeover switch that changes the excitation condition of the objective lens, which improves operability during microscopy. is also effective.

尚、各レンズモードに対応して上下に配置する可動絞仄
装置として、実用新案(873,672)’Th用いれ
ば、各々のし/ズモードにおいて、加速電圧試料に対応
した開口角を微調整することができ、更に、効果的であ
ることは言うまでもない。
In addition, if the utility model (873, 672)'Th is used as a movable diaphragm device placed up and down corresponding to each lens mode, the aperture angle corresponding to the accelerating voltage sample can be finely adjusted in each lens mode. Needless to say, it is possible and moreover, it is effective.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明によれば高分解能レンズモ
ードおよび極低倍率レンズモートノ各々の後側焦点面に
適正な開口角を得ることができる。
As described above, according to the present invention, an appropriate aperture angle can be obtained at the rear focal plane in each of the high resolution lens mode and the extremely low magnification lens mode.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例を示す高分解能レンズモード図
、第2図は極低倍率レンズモード図である。
FIG. 1 is a high resolution lens mode diagram showing an embodiment of the present invention, and FIG. 2 is an extremely low magnification lens mode diagram.

Claims (1)

【特許請求の範囲】[Claims] 1、上磁極と下磁極とによって構成される対物レンズ内
の光軸に試料ホールダに装填された試料を装着し複数の
レンズモードを有するものにおいて、上記各レンズモー
ドに対応し光軸に沿って上下に複数個の可動絞りを設け
た仁とを特徴とする電子顕微鏡等の対物レンズ可動絞り
装置。
1. In an objective lens consisting of an upper magnetic pole and a lower magnetic pole, in which a sample loaded in a sample holder is attached to the optical axis and has multiple lens modes, a An objective lens movable aperture device for an electron microscope, etc., characterized by having a plurality of movable apertures located above and below.
JP17114483A 1983-09-19 1983-09-19 Objective lens movable diaphragm device of electron microscope Pending JPS6063866A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17114483A JPS6063866A (en) 1983-09-19 1983-09-19 Objective lens movable diaphragm device of electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17114483A JPS6063866A (en) 1983-09-19 1983-09-19 Objective lens movable diaphragm device of electron microscope

Publications (1)

Publication Number Publication Date
JPS6063866A true JPS6063866A (en) 1985-04-12

Family

ID=15917798

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17114483A Pending JPS6063866A (en) 1983-09-19 1983-09-19 Objective lens movable diaphragm device of electron microscope

Country Status (1)

Country Link
JP (1) JPS6063866A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0513333U (en) * 1992-05-01 1993-02-23 幸和エンジニアリング株式会社 Automatic iron plate cleaning device for grilled meat using water jet
EP2073250A3 (en) * 2007-12-21 2011-09-14 JEOL Ltd. Transmission electron microscope
WO2018189850A1 (en) * 2017-04-13 2018-10-18 株式会社 日立ハイテクノロジーズ Electron microscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0513333U (en) * 1992-05-01 1993-02-23 幸和エンジニアリング株式会社 Automatic iron plate cleaning device for grilled meat using water jet
EP2073250A3 (en) * 2007-12-21 2011-09-14 JEOL Ltd. Transmission electron microscope
WO2018189850A1 (en) * 2017-04-13 2018-10-18 株式会社 日立ハイテクノロジーズ Electron microscope

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