JPS6057239B2 - Amorphous semiconductor switch element - Google Patents

Amorphous semiconductor switch element

Info

Publication number
JPS6057239B2
JPS6057239B2 JP51096632A JP9663276A JPS6057239B2 JP S6057239 B2 JPS6057239 B2 JP S6057239B2 JP 51096632 A JP51096632 A JP 51096632A JP 9663276 A JP9663276 A JP 9663276A JP S6057239 B2 JPS6057239 B2 JP S6057239B2
Authority
JP
Japan
Prior art keywords
voltage
semiconductor
amorphous semiconductor
switch element
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP51096632A
Other languages
Japanese (ja)
Other versions
JPS5320778A (en
Inventor
雅和 梅谷
雅博 吉野
三千年 大西
幸徳 柔野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP51096632A priority Critical patent/JPS6057239B2/en
Publication of JPS5320778A publication Critical patent/JPS5320778A/en
Publication of JPS6057239B2 publication Critical patent/JPS6057239B2/en
Expired legal-status Critical Current

Links

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)

Description

【発明の詳細な説明】 本発明は非晶質半導体スイッチ素子に関する。[Detailed description of the invention] The present invention relates to an amorphous semiconductor switching element.

非晶質半導体、たとえはSi12、α1O、AS3O、
Te48の如きは、第1図に示す様な電流−電圧特性、
いす)ゆるスイッチ特性を持つていることは良く知られ
ている。このスイッチ現象でスイッチを開始する電圧、
即ち閾値電圧は第2図に示す様に温度上昇と共にその値
が低くなることも又知られており、斯る閾値電圧の温度
依存性は、非晶質半導体を一般のスイッチ素子として使
用する場合の大きな障害となつている。従つて本発明目
的は、周囲温度に影響されずに一定の電圧でスイッチす
ることのできる非晶質半導体スイッチ素子を提供するに
ある。
Amorphous semiconductors, such as Si12, α1O, AS3O,
Te48 has current-voltage characteristics as shown in Figure 1,
It is well known that the chair has a loose switch characteristic. The voltage that starts the switch in this switch phenomenon,
In other words, it is also known that the value of the threshold voltage decreases as the temperature rises, as shown in Figure 2, and the temperature dependence of the threshold voltage is similar to that when an amorphous semiconductor is used as a general switching element. has become a major obstacle. SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide an amorphous semiconductor switching element that can be switched at a constant voltage without being affected by ambient temperature.

第4図は本発明実施例を示し、1は非晶質半導体、2、
3は該半導体を挾持する電極、4、5は電極2、3に夫
々接続されたリード端子、6は非晶質半導体1、電極2
、3及びリード端子4、5を保護し固定するためのガラ
スなどからなるケース、7はケース6内面全面に被着さ
れ、ケース6の両端にてリード端子4、5と結合せる非
線形抵抗発熱体である。
FIG. 4 shows an embodiment of the present invention, in which 1 is an amorphous semiconductor, 2,
3 is an electrode that holds the semiconductor; 4 and 5 are lead terminals connected to the electrodes 2 and 3, respectively; 6 is the amorphous semiconductor 1 and the electrode 2;
, 3 and a case made of glass for protecting and fixing the lead terminals 4 and 5; 7 is a nonlinear resistance heating element that is attached to the entire inner surface of the case 6 and is connected to the lead terminals 4 and 5 at both ends of the case 6; It is.

ここに1対のリード端子4、3間に非晶質半導体1と非
線形抵抗発熱体7とが並列接続されていることになる。
上記非線形抵抗発熱体1は、例えば酸化亜ユ■)を主成
分とし、第3図の電圧−電流特性に示ず如く、ある電圧
VD付近に於いて電流が急激に増加し、その大電流領域
にて強く発熱する性質を有し、又この様な電圧−電流特
性はほとんど温度によつて変化しない。尚斯る非線形抵
抗発熱体自身は周知である。上記スイッチ素子に於いて
、非晶質半導体1の閾値電圧はスイッチ素子の使用温度
範囲の−れ限温度以上に於ける値に設定されている。
Here, the amorphous semiconductor 1 and the nonlinear resistance heating element 7 are connected in parallel between the pair of lead terminals 4 and 3.
The nonlinear resistance heating element 1 has, for example, aluminum oxide as its main component, and as shown in the voltage-current characteristics in FIG. It has the property of generating strong heat at temperatures, and its voltage-current characteristics hardly change with temperature. The nonlinear resistance heating element itself is well known. In the above-mentioned switch element, the threshold voltage of the amorphous semiconductor 1 is set to a value higher than the limit temperature of the operating temperature range of the switch element.

例えば使用温度範囲を00C〜700Cとし、希望する
門値電圧を”100Vとすると、温度70゜Cに於ける
半導体1の閾値電圧が100Vになるべく設定される。
即ち半導体1の閾値電圧は70℃より低い温度て100
Vより高い値となる。尚斯る閏値電圧の設定は電極2、
3間の距離や半導体1の組成を選択することによ・り行
ない得る。更に上記スイッチ素子に於いて、非線形抵抗
発熱体7の大電流動作電圧■Dは上記半導体の閾値電圧
とほぼ同程度に設定されており、又発熱体7はその大電
流動作時に半導体1の温度を高め、その閾値電圧を低下
せしめるのであるが、上記使用温度範囲内の周囲温度に
於いて、半導体1の温度を70゜C以上まで上昇てき、
その閾値電圧を100V以下の低下せしめる様に発熱体
7の発熱量が設定されている。
For example, if the operating temperature range is 00C to 700C and the desired gate voltage is 100V, the threshold voltage of the semiconductor 1 at a temperature of 70C is set to 100V as much as possible.
That is, the threshold voltage of semiconductor 1 is 100°C at a temperature lower than 70°C.
The value is higher than V. In addition, the setting of such a leap value voltage is performed using electrode 2,
This can be done by selecting the distance between 3 and the composition of the semiconductor 1. Furthermore, in the switch element, the large current operating voltage D of the nonlinear resistance heating element 7 is set to be approximately the same as the threshold voltage of the semiconductor, and the heating element 7 lowers the temperature of the semiconductor 1 during its large current operation. In order to raise the temperature of the semiconductor 1 and lower its threshold voltage, the temperature of the semiconductor 1 is raised to 70°C or more at an ambient temperature within the above operating temperature range.
The amount of heat generated by the heating element 7 is set so as to reduce the threshold voltage to 100V or less.

尚斯る発熱量の設定は発熱体7の抵抗値、形状更にはス
イッチ素子全体の熱容量などから行い得る。従つて上記
スイッチ素子によれば、100Vより低い電圧がリード
端子4,5間に印加されても、非線形抵抗発熱体7は小
電流領域にあるため半導体1を加熱することはできず、
従つて上記使用温度範囲内てある限り周囲温度に関係な
くスイッチ素子は導通することがなく、又100V以上
の電圧が印加されると、非線形抵抗発熱体7は大電流領
域に入り、上記使用温度内である限り周囲温度に関係な
く半導体1の温度が70℃以上に上昇してその開値電圧
が100V以下に低下し、従つて例えは印加電圧が10
0■の時には70゜Cに達した時点でスイッチ素子が導
通する。
The amount of heat generated can be set based on the resistance value and shape of the heating element 7, as well as the heat capacity of the entire switch element. Therefore, according to the above switch element, even if a voltage lower than 100V is applied between the lead terminals 4 and 5, the semiconductor 1 cannot be heated because the nonlinear resistance heating element 7 is in the small current region.
Therefore, as long as the operating temperature is within the above operating temperature range, the switching element will not conduct, regardless of the ambient temperature, and if a voltage of 100 V or more is applied, the nonlinear resistance heating element 7 will enter the large current region, and the above operating temperature will be exceeded. As long as the temperature of the semiconductor 1 rises above 70°C and its open voltage falls below 100V, regardless of the ambient temperature, as long as the applied voltage is within 10V.
At 0■, the switch element becomes conductive when the temperature reaches 70°C.

即ちスイッチ素子としての開値電圧は周囲温度によらず
常に100■一定となる。更に、スイッチ素子が一旦通
過すると半導体1両端の電圧が低下するので非線形抵抗
発熱体一7は小電流領域に入り、従つてスイッチ素子の
導通中は発熱体7で電力消費は著しく小さい。上記発熱
体7の大電流動作時の抵抗が非常に小さくて十な発熱量
を得られない場合、第5図の他の実施例に示す如く、ケ
ース6内面のほぼ中央の環状に金属薄膜などからなる抵
抗発熱体8が設けられ、更にケース6内面の残り全面に
第3図に示す特性を有する非線形抵抗体9が設けられる
。即ち非線形抵抗体9と抵抗発熱体8との直列接続とな
り、この場合も第4図の場合と同様の動作をなすことは
明らかてある。かくして本発明によれは、2端子型非晶
質半導体スイッチ素子に於いて、周囲温度によらず閥値
電圧を一定にすることができ高い信頼性を得ることがて
き、且閾値電圧を一定にするための制御電力も閥値電圧
が印加されてスイッチ素子が導通するまでの間だけ消費
されるのみであつて極めて有利てある。
That is, the open value voltage as a switching element is always constant at 100 cm regardless of the ambient temperature. Furthermore, once the switching element passes, the voltage across the semiconductor 1 drops, so the nonlinear resistance heating element 17 enters a small current region, and therefore, the power consumption in the heating element 7 is extremely small while the switching element is conducting. If the resistance of the heating element 7 during high current operation is very small and a sufficient amount of heat cannot be obtained, as shown in another embodiment of FIG. A nonlinear resistor 9 having the characteristics shown in FIG. 3 is further provided on the remaining entire surface of the inner surface of the case 6. That is, the nonlinear resistor 9 and the resistance heating element 8 are connected in series, and it is clear that the same operation as in the case of FIG. 4 is achieved in this case as well. Thus, according to the present invention, in a two-terminal type amorphous semiconductor switching element, the threshold voltage can be made constant regardless of the ambient temperature, and high reliability can be obtained, and the threshold voltage can be kept constant. The control power for controlling the switching element is also consumed only until the switching element becomes conductive after the threshold voltage is applied, which is extremely advantageous.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及ひ第2図は非晶質半導体の特性曲線図、第3図
は非線形抵抗体の特性曲線図、第4図及び第5図は本発
明の異なる実施例の断面図てある。 1・・・非晶質半導体、4,5・・・リード端子、7・
・・非線形抵抗発熱体、8・・・抵抗発熱体、9・・・
非線形抵抗体。
1 and 2 are characteristic curve diagrams of an amorphous semiconductor, FIG. 3 is a characteristic curve diagram of a nonlinear resistor, and FIGS. 4 and 5 are sectional views of different embodiments of the present invention. 1... Amorphous semiconductor, 4, 5... Lead terminal, 7.
...Nonlinear resistance heating element, 8...Resistance heating element, 9...
Nonlinear resistor.

Claims (1)

【特許請求の範囲】[Claims] 1 1対のリード端子間に非晶質半導体を含む第1回路
と抵抗発熱作用及び非線形抵抗作用をなす第2回路とを
並列接続してスイッチ素子を構成し、上記半導体の閾値
電圧を上記スイッチ素子の使用温度範囲の上限以上の所
定温度に於ける値に設定すると共に、上記第2回路の非
線形抵抗作用に於ける大電流動作電圧を上記閾値電圧に
ほぼ一致せしめ、更に上記第2回路の大電流動作時に上
記半導体の温度を上記所定温度以上に高めてなる非晶質
半導体スイッチ素子。
1. A switch element is configured by connecting in parallel a first circuit including an amorphous semiconductor between a pair of lead terminals and a second circuit having a resistance heating action and a nonlinear resistance action, and the threshold voltage of the semiconductor is set to the switch element. In addition to setting the value at a predetermined temperature above the upper limit of the operating temperature range of the element, the large current operating voltage in the nonlinear resistance action of the second circuit is made to almost match the threshold voltage, and furthermore, the voltage of the second circuit is An amorphous semiconductor switch element in which the temperature of the semiconductor is increased to above the predetermined temperature during large current operation.
JP51096632A 1976-08-10 1976-08-10 Amorphous semiconductor switch element Expired JPS6057239B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP51096632A JPS6057239B2 (en) 1976-08-10 1976-08-10 Amorphous semiconductor switch element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP51096632A JPS6057239B2 (en) 1976-08-10 1976-08-10 Amorphous semiconductor switch element

Publications (2)

Publication Number Publication Date
JPS5320778A JPS5320778A (en) 1978-02-25
JPS6057239B2 true JPS6057239B2 (en) 1985-12-13

Family

ID=14170201

Family Applications (1)

Application Number Title Priority Date Filing Date
JP51096632A Expired JPS6057239B2 (en) 1976-08-10 1976-08-10 Amorphous semiconductor switch element

Country Status (1)

Country Link
JP (1) JPS6057239B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0520021Y2 (en) * 1988-03-07 1993-05-26

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499274A (en) * 1972-05-12 1974-01-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS499274A (en) * 1972-05-12 1974-01-26

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0520021Y2 (en) * 1988-03-07 1993-05-26

Also Published As

Publication number Publication date
JPS5320778A (en) 1978-02-25

Similar Documents

Publication Publication Date Title
US4045763A (en) Sealed thermostatic heater
CA1231361A (en) Varistor fuse element
US3846767A (en) Method and means for resetting filament-forming memory semiconductor device
JPS564290A (en) Superconductive element
JPS6057239B2 (en) Amorphous semiconductor switch element
US2110690A (en) Electric circuit interrupter
US3936790A (en) Temperature sensitive resistor having a critical transition temperature of about 140°C
US3629155A (en) Electronic bistable semiconductor switching element and method of making same
US3571669A (en) Current controlling device utilizing sulphur and a transition metal
JPS6057238B2 (en) Amorphous semiconductor switch element
US2978618A (en) Semiconductor devices and method of making the same
US4028591A (en) Relay contact protector
US12021138B2 (en) Thyristor assembly
DE2741186C3 (en) Electrical circuit through which the voltage at a consumer rises with a delay after switching on
JPS6341731Y2 (en)
US3875547A (en) Current surge eliminator
JPS59136818A (en) Temperature switch
SU440773A1 (en) Trigger
JPS6024663B2 (en) Circuit used for heat-sensitive thyristor
US1836509A (en) Ballast resistance
US3774084A (en) Electronic switch
SU1424055A1 (en) Method of controlling a switching device
JPS5915042Y2 (en) surge absorber
JPS582003Y2 (en) Thick film varistor device
JPS5866304A (en) Metallic oxide varistor capable of controlling breakdown voltage and capacity and method of controlling same