JPS6040904A - Length measuring device - Google Patents

Length measuring device

Info

Publication number
JPS6040904A
JPS6040904A JP14904683A JP14904683A JPS6040904A JP S6040904 A JPS6040904 A JP S6040904A JP 14904683 A JP14904683 A JP 14904683A JP 14904683 A JP14904683 A JP 14904683A JP S6040904 A JPS6040904 A JP S6040904A
Authority
JP
Japan
Prior art keywords
value
measured
length
image sensor
peak value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14904683A
Other languages
Japanese (ja)
Inventor
Isao Hishikari
功 菱刈
Toshihiko Ide
敏彦 井手
Toshifusa Suzuki
鈴木 利房
Kensaku Katayama
片山 憲作
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP14904683A priority Critical patent/JPS6040904A/en
Publication of JPS6040904A publication Critical patent/JPS6040904A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To make it possible to perform correct measurement of length all the time even if radiation energy and the like are changed, by receiving the radiation energy and the like from a material to be measured, and adequately correcting the set value in correspondence with a peak value. CONSTITUTION:Radiation energy L corresponding to a length W from a body 1, which is changed by wavelength and temperature, is received by an image sensor 4. A peak value VP of the light is detected by a peak value detecting circuit 5. A set value VT, which is corrected in correspondence with the peak value VP through a setting device 6, is determined as VT=alphaVP. The number of picture elements (a) of the value of the received light, which is higher than the set value, from the image sensor is counted by a counter 9 through a comparator circuit 8. Thus the length W is measured. In this constitution, the set value is corrected in correspondence with the peak value. Therefore, the correct length measurement can be performed all the time, even though radiation energy is changed due to temperature change and the like and the magnitude of signal leakage is changed due to mutual interference among the picture elements of the sensor. When light is received from a light source, which is shielded by the material to be measured, the same procedure can be used.

Description

【発明の詳細な説明】 (1)発明の分野 この発明は、CODのようなイメージセンサを用いた長
さ測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (1) Field of the Invention The present invention relates to a length measuring device using an image sensor such as a COD.

(2)従来技術 従来、第1図、第2図で示すように、被測定物体1の長
さWを測定するのに、1台または2台のCCDのような
イメージセンサを用いた検出器2によシ行っていた。た
とえば、第1図では、イメージセンサの全画素数をNo
、これに対応する長さををNとすれば、そのときの被測
定物体1の長さWは、 W−Wo ” N/Noでまる
(2) Prior Art Conventionally, as shown in FIGS. 1 and 2, a detector uses one or two image sensors such as CCDs to measure the length W of an object to be measured 1. I went to 2. For example, in Figure 1, the total number of pixels of the image sensor is No.
, the corresponding length is N, then the length W of the object to be measured 1 is calculated by W-Wo''N/No.

しかしながら、第4図で示すように1画素数Nに対する
被測定物体1の放射エネルギーL(A、T)は(>、:
波長、T:温度)、測定温度Tによシレベルが大きく変
化し、イメージセンサの画素間の相互干渉に起因する信
号リークの太きさも変化する。このため、設定値vT′
を低い一定値としておくと、リーク分まで被測定物体1
の長さと見てしまい、実際の画素数Nよシも大きい画素
数N′から長さw’を測定してしまい誤差を招くもので
あった。
However, as shown in FIG. 4, the radiant energy L (A, T) of the measured object 1 for one pixel number N is (>,:
The wavelength (T: temperature) and the measured temperature (T) greatly change the signal level, and the thickness of signal leakage caused by mutual interference between pixels of the image sensor also changes. Therefore, the set value vT'
If the value of the measured object 1 is set to a low constant value, the measured object 1 will be
However, the length w' is measured from the number of pixels N' which is larger than the actual number N of pixels, which leads to an error.

また、逆に設定値vT“を高い一定値にしておくと。Conversely, if the set value vT" is set to a high constant value.

被測定物体の温度変化または被測定物体によシしセへい
される光源の光景変化があると、実際の長さよりも短く
測定してしまうことになる。
Changes in the temperature of the object to be measured or changes in the sight of the light source directed to the object to be measured will result in a measurement shorter than the actual length.

(3)発明の目的 この発明の目的は2以上の点に鑑み、被測定物体からの
放射エネルギーまたは光源の出力光が変化しても、當に
正しい測定を可能とした長さ測定装置を提供することで
ある。
(3) Purpose of the Invention In view of two or more points, the purpose of the present invention is to provide a length measuring device that can accurately measure even if the radiant energy from the object to be measured or the output light of the light source changes. It is to be.

(4)発明の実施例 第5図は、この発明の一実施例を示す構成説明図である
(4) Embodiment of the Invention FIG. 5 is an explanatory diagram showing an embodiment of the invention.

図において、1は放射エネルギーL (入、T)。In the figure, 1 is the radiant energy L (on, T).

幅Wの被測定物体、3は、被測定物体重からの放射エネ
ルギーをCCDのようなイメージセンサ4に入射さぜる
光学系、5は、イメージセンサ4の出力のピーク値を検
出ブるピーク検出回路、6はピーク検出回路5のピーク
値■Pを所定倍α(α〈1)して設定値αVpとする可
変抵抗器のような設定器。
An object to be measured has a width W. 3 is an optical system that makes radiant energy from the weight of the object to be measured incident on an image sensor 4 such as a CCD. 5 is a peak that detects the peak value of the output of the image sensor 4. A detection circuit 6 is a setting device such as a variable resistor that multiplies the peak value ■P of the peak detection circuit 5 by a predetermined value α (α<1) to obtain a set value αVp.

7は、設定器6の出力αVpと放射エネルギーのレベル
がきわめて小となったときに用いる下限設定値(一定値
) VZとのうち大きい方を選択するレベル選択回路、
8はレベル選択回路7の設定値vT(通常はavP)と
イメージセンサ4の出力とを比較し、イメージセンサ4
の出力が大のとき例えば出ナログ信号に変換するD−A
変換器である。
7 is a level selection circuit that selects the larger of the output αVp of the setting device 6 and the lower limit setting value (constant value) VZ used when the level of radiant energy becomes extremely small;
8 compares the set value vT (usually avP) of the level selection circuit 7 and the output of the image sensor 4, and
For example, when the output of D-A is large, it is converted into an output analog signal.
It is a converter.

動作は次の通りである。The operation is as follows.

被測定物体1からの長さWに相当する放射エネルギーは
光学系3を介してイメージセンサ4で受光され、イメー
ジセンサ4は、第4図で示すような出力を発生する。こ
のイメージセンサ4のピーク値vPはピーク検出回路5
により検出され、設定器6によシ所定倍αされてαVp
となシ、レベ哨択回路7によシ下限設定値VZと比較さ
れ2通常はVZよシαVpが犬なので、長さ測定用の設
定値vT=αVpとされる。比較回路8は、この設定値
VTとイメージセンサ4の出力の大小比較を行い、イメ
ージセンサ4の出力が設定値vTよυも犬のとき出力を
発生する。この出力をカウンタ9によりカウントし。
Radiant energy corresponding to the length W from the object to be measured 1 is received by the image sensor 4 via the optical system 3, and the image sensor 4 generates an output as shown in FIG. The peak value vP of this image sensor 4 is determined by the peak detection circuit 5.
is detected by the setter 6 and multiplied by a predetermined value α to obtain αVp.
Then, the level selection circuit 7 compares it with the lower limit setting value VZ, and since αVp is normally equal to VZ, the setting value for length measurement is set as vT=αVp. The comparison circuit 8 compares the set value VT with the output of the image sensor 4, and generates an output when the output of the image sensor 4 is equal to the set value vT. This output is counted by a counter 9.

このカウント値Nが、被測定物体1の長さWとして測定
が行われる。カウンタ9の出力は必要に応じてD−A変
換器10によルアナログ信号として出力される。
Measurement is performed using this count value N as the length W of the object to be measured 1. The output of the counter 9 is outputted as an analog signal by a DA converter 10 as required.

このように、イメージセンサ4のピーク値Vpに応じて
、長さ測定用の設定(しきい)値をavPに変更し、ピ
ーク値Vpが変化し、リーク値も変化しても、常に設定
値がリーク値以上となり、誤測定を招くことがない。
In this way, the setting (threshold) value for length measurement is changed to avP according to the peak value Vp of the image sensor 4, and even if the peak value Vp changes and the leakage value also changes, the set value is always maintained. is greater than the leakage value and will not cause erroneous measurements.

第5図で示す、ピーク検出手段、比較回路8゜カウンタ
9等の長さ測定手段は、イメージセンサ出力をA−D変
換してマイクロコンピュータのような中央処理装置で演
算処理してもよい。
The length measuring means such as the peak detecting means, the comparison circuit 8 and the counter 9 shown in FIG. 5 may perform A-to-D conversion of the image sensor output and perform arithmetic processing using a central processing unit such as a microcomputer.

第6図は、光源を用いた他の実施例を示し、被測定物体
1に一部分じゃへいされた光源11からの光は光学系3
によシイメージセンザ4に入射され。
FIG. 6 shows another embodiment using a light source, in which the light from the light source 11 partially blocked by the object to be measured 1 is transmitted to the optical system 3.
The light is incident on the image sensor 4.

第7図で示すような出力信号を得る。測定回路は第5図
とほぼ同様でイメージセンサ4の全画素数Noに対し、
設定値VT=αVp以上の画素数をNI、 Noとすれ
ば、被測定物体1の長さはN = No (N l十N
t)よ請求まる。この場合、光源iiの光景が劣化等に
よシ変動しても、−そのピーク値Vpの所定倍した値α
Vpを設定値VTとして用いているので、光量変化の影
響はなくなシ、常に正しい測定が可能となる。
An output signal as shown in FIG. 7 is obtained. The measurement circuit is almost the same as that shown in Fig. 5, and for the total number of pixels of the image sensor 4,
If the number of pixels above the set value VT = αVp is NI and No, then the length of the object to be measured 1 is N = No (N l + N
t) Please ask. In this case, even if the sight of the light source ii changes due to deterioration or the like, - a predetermined times the peak value Vp, α
Since Vp is used as the set value VT, there is no effect of changes in the amount of light, and accurate measurement is always possible.

(5)発明の要約 以上述べたように、この発明は、被測定物体からの放射
エネルギーまだは被測物体に一部分じゃへいされた光を
受光するイメージセンサのピーク値をピーク検出手段で
検出し、このピーク検出手段の出力を所定倍した設定値
に基いて測定手段は被測定物の長さを測定するようにし
た長さ測定装置である。
(5) Summary of the Invention As described above, the present invention uses a peak detection means to detect the peak value of an image sensor that receives radiant energy from an object to be measured and light that is partially blocked by the object to be measured. The measuring means is a length measuring device that measures the length of the object based on a set value obtained by multiplying the output of the peak detecting means by a predetermined value.

(6)発明の効果 常に、設定値は、ピーク値に応じて最適な値となるよう
補正しているので、リーク等の影響を受けす、常に正し
い長さ測定が可能となる。
(6) Effects of the Invention Since the set value is always corrected to the optimum value according to the peak value, it is possible to always measure the correct length regardless of the influence of leakage, etc.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図、第5図、第6図は、この発明に係る実
施例を示す構成説明図、第3図、第4図。 第7図は、動作説明用波形図である。 工・・・被測定物体、4・・・イメージセンサ、5・・
・ピー、つ□あ、6.1.ゎ定。、401.比□2.溝
1.。 δ カウンタ 特許出願人 株式会社 千野製作所
FIG. 1, FIG. 2, FIG. 5, and FIG. 6 are configuration explanatory diagrams, FIG. 3, and FIG. 4 showing an embodiment according to the present invention. FIG. 7 is a waveform diagram for explaining the operation. Engineering...Object to be measured, 4...Image sensor, 5...
・P, T, 6.1. Definitely. , 401. Ratio□2. Groove 1. . δ Counter patent applicant Chino Seisakusho Co., Ltd.

Claims (1)

【特許請求の範囲】 1、被測定物体からの放射エネルギーまたは被測定物体
に一部分し中へいされた光源からの光を受光するイメー
ジセンサと、とのイメージセンサのピーク値を検出する
ピーク検出手段と、とのピーク検出手段の出力を所定倍
した設定値に基いて被測定物体の長さを測定する測定手
段とを備えたことを特徴とする長さ測定装置。 2、 前記測定手段は、ピーク検出手段出力と一定値の
うちいずれか大きい方を選択して使用することを特徴と
する特許請求の範囲第1項記載の長さ測定装置。
[Claims] 1. An image sensor that receives radiant energy from an object to be measured or light from a light source that is partially inserted into the object to be measured, and a peak detection means for detecting the peak value of the image sensor. A length measuring device comprising: and a measuring means for measuring the length of an object to be measured based on a set value obtained by multiplying the output of the peak detecting means by a predetermined value. 2. The length measuring device according to claim 1, wherein the measuring means selects and uses the larger of the output of the peak detecting means and a constant value.
JP14904683A 1983-08-15 1983-08-15 Length measuring device Pending JPS6040904A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14904683A JPS6040904A (en) 1983-08-15 1983-08-15 Length measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14904683A JPS6040904A (en) 1983-08-15 1983-08-15 Length measuring device

Publications (1)

Publication Number Publication Date
JPS6040904A true JPS6040904A (en) 1985-03-04

Family

ID=15466460

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14904683A Pending JPS6040904A (en) 1983-08-15 1983-08-15 Length measuring device

Country Status (1)

Country Link
JP (1) JPS6040904A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62180204A (en) * 1986-02-05 1987-08-07 Furukawa Electric Co Ltd:The Size measuring method by camera image pickup
JPH01171680A (en) * 1987-12-28 1989-07-06 Taiyo Seiko Kk Production of precoated galvanized sheet with paint having high nonvolatile matter content
JPH03500739A (en) * 1987-11-03 1991-02-21 エイベリ デニソン コーポレイション Application method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54128361A (en) * 1978-03-28 1979-10-04 Sumitomo Metal Ind Optical measuring device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54128361A (en) * 1978-03-28 1979-10-04 Sumitomo Metal Ind Optical measuring device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62180204A (en) * 1986-02-05 1987-08-07 Furukawa Electric Co Ltd:The Size measuring method by camera image pickup
JPH03500739A (en) * 1987-11-03 1991-02-21 エイベリ デニソン コーポレイション Application method
JPH01171680A (en) * 1987-12-28 1989-07-06 Taiyo Seiko Kk Production of precoated galvanized sheet with paint having high nonvolatile matter content
JPH0426911B2 (en) * 1987-12-28 1992-05-08 Taiyo Seiko Kk

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