JPS6037714A - Method for marking defective dice - Google Patents

Method for marking defective dice

Info

Publication number
JPS6037714A
JPS6037714A JP14576683A JP14576683A JPS6037714A JP S6037714 A JPS6037714 A JP S6037714A JP 14576683 A JP14576683 A JP 14576683A JP 14576683 A JP14576683 A JP 14576683A JP S6037714 A JPS6037714 A JP S6037714A
Authority
JP
Japan
Prior art keywords
defective
color
dice
die
mark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14576683A
Other languages
Japanese (ja)
Inventor
Akira Harada
明 原田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Priority to JP14576683A priority Critical patent/JPS6037714A/en
Publication of JPS6037714A publication Critical patent/JPS6037714A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Apparatuses And Processes For Manufacturing Resistors (AREA)

Abstract

PURPOSE:To effect positive and rapid discrimination of defective dice in a probing process or a process of classifying defective and non-defective dice, by putting a mark on a dice determined as defective, the mark being of a color complementary to the color reflected from the dice, and by detecting the difference in chroma of these colors. CONSTITUTION:In a proving process or a process of classifying defective and non-defective dice, dice determined as defective are marked with ink of a predetermined color which is complementary or approximately complementary to the color of reflection produced depending on the surface condition of the dice. For example, if reflected light is blue, a ink color will be red or the like. In such a manner, a color factor is introduced into discrimination of defective and non-defective dice to make calssification thereof positive and easy.

Description

【発明の詳細な説明】 (技術分野〕 本発明は、IC製造工程中のブロービング工程又はダイ
スの良、不良を選択する工程において行なわれる不良ダ
イスのマーキング法に関する。
DETAILED DESCRIPTION OF THE INVENTION (Technical Field) The present invention relates to a method for marking defective dies, which is carried out in the blobbing process or the process of selecting good or defective dies during the IC manufacturing process.

(背景技術) 従来の不良ダイスのマーキング法としては、例えばダイ
スの表面色と不良マークに着けられた不良マークとの反
射率の差に基づいたものが知られている。第1図ないし
第5図はこの一例である。
(Background Art) As a conventional marking method for defective dice, one is known that is based on, for example, the difference in reflectance between the surface color of the die and the defective mark attached to the defective mark. Figures 1 to 5 are examples of this.

第1図において、1はダイス、2はバンプパターンであ
る。このようなダイスは、ダイスの上部に設けられたダ
イスの位置を認識するテレビカメラで撮像され、ダイス
の表面1とパターン2とが第2図に示すように2値化さ
れる。同図において、1′は2値化された情報のうち黒
を表わし、lは白を表わず。ここで、ダイスが不良であ
ると判定されたときは第3図に示すように、不良マーク
3をパターン2の表面に付ける。不良マーク3の径は隣
接するダイスへの影響を避けるため、可能な限り小さい
方が良い。このように付された不良マーク3は2値化さ
れ第4図に示すように1より、2値化画面で明らかに不
良マーク3′をとらえることができ、不良マーク3′の
反射率とパターン2′の反射率との差が検出され、これ
により不良マーク:3が付されたダイスは選別されない
In FIG. 1, 1 is a die and 2 is a bump pattern. Such a die is imaged by a television camera that recognizes the position of the die provided above the die, and the surface 1 and pattern 2 of the die are binarized as shown in FIG. In the figure, 1' represents black in the binarized information, and l does not represent white. Here, when it is determined that the die is defective, a defective mark 3 is placed on the surface of the pattern 2, as shown in FIG. The diameter of the defective mark 3 is preferably as small as possible in order to avoid affecting adjacent dies. The defective mark 3 attached in this way is binarized, and as shown in FIG. The difference with the reflectance of 2' is detected, and as a result, the dice marked with a defective mark: 3 are not selected.

しかしながら、不良マーク4がずれてダイス表面2上に
伺されたとぎは、第5図に示すように2値化画面ではマ
ークの周囲の反射率と不良マーク4との反射率の差が大
きくとれず、不良品が良品として判定されダイスがビッ
クアンプされてしまう。このように、従来のマーキング
法では不良ダイスの自動選別を目ざしたものであっても
、ダイス表面との反射率の違いを検出することを主とl
〜でおり、丁Cパターンと不良マークの位置関係によっ
ては不良マ〜りが検出できないという問題点があった。
However, when the defective mark 4 is shifted and placed on the die surface 2, as shown in FIG. Otherwise, the defective product will be judged as a good product and the die will be big-amped. In this way, although conventional marking methods aim to automatically sort out defective dies, they mainly focus on detecting the difference in reflectance from the die surface.
There was a problem in that defective marks could not be detected depending on the positional relationship between the C pattern and the defective mark.

(発明のl」的) 本発明は、このような従来の問題点を解決J″ることを
目的とし、その特徴はダイスの良、不良の判別基準に色
の次元を導入したことにある。
(Objective of the Invention) The purpose of the present invention is to solve these conventional problems, and its feature lies in the introduction of a color dimension as a criterion for determining whether a die is good or bad.

歩、下、本発明を実施例に基づいて説明する・)(発明
の構成及び作用〕 本発明は、ブロービング工程又はダイスの良、不良を選
別する工程において、不良品として判定されたダイスに
不良マークを着けるときに、所定の色(インクの色)の
不良マークを選定して用いる。ここで、所定の色とは不
良品として判定されたダイスの表面状態によって生ずる
反射色に対(〜、補色関係又は補色に近い色であること
が好ましい1、反射色はダイスの種類によって異なるの
で、不良マークの色もこれp)に対応して種々設けるこ
とが好」シい。例えば反射色が青であるときは、不良マ
ークの色とt7ては赤又は赤に近い色を選択づ−る。。
Step 2: The present invention will be explained based on examples.) (Structure and operation of the invention) The present invention provides a method for handling dies that have been determined to be defective in the blobbing process or the process of sorting out good and defective dies. When attaching a defective mark, a defective mark of a predetermined color (ink color) is selected and used.Here, the predetermined color is the color (~ It is preferable that the colors be complementary colors or colors close to complementary colors1.Since the reflective color differs depending on the type of die, it is preferable to provide various colors for the defect mark corresponding to this.For example, if the reflective color is If it is blue, select red or a color close to red as the defective mark color t7.

また、所定の色として赤、宵、緑の原色又はこれら11
こ近い色を選定することも好まLい。
In addition, the primary colors of red, evening, and green or 11 of these may be used as predetermined colors.
It is also preferable to select colors that are close to each other.

このようにして不良ダイスの表面に着けられた不良マー
クは、不良ダイスσ)表面状態によって生ずる反射色に
対しほぼ補色関係又は原色に近い色となっているので、
丁Cパターンの如何にかかわらず、周囲と明確に区別¥
ることかできる。従って、例えばカラーセンザンンズ及
びカラーセンザヘツドから成るカラーセンサ等を用いて
不良マーりの色を抽出し、これを不良ダイスの周囲の色
と比較演算し、これらの間に予め設定された彩度力差が
あるときは不良であると判定して不良信号を出力し、こ
れにより不良ダイスはダイスピックアップされない。
In this way, the defect mark placed on the surface of the defective die has a color that is almost complementary to the reflected color caused by the surface condition of the defective die σ), or a color that is close to the primary color.
Regardless of the pattern, clearly distinguish it from the surroundings.
I can do that. Therefore, for example, a color sensor consisting of a color sensor and a color sensor head is used to extract the color of the defective mark, and this is compared and calculated with the color around the defective die, and a preset value is set between them. When there is a difference in saturation power, it is determined that the die is defective and a defect signal is output, so that the defective die is not picked up.

(発明の効果) 以上説明したように、本発明によればダイスの良、不良
の判別基準に色の次元を導入したことにより、従来の白
黒2元と異なる情報での判断が可能となり、ICチップ
内部のパターン又はマーキングの位置にかかわらず良、
不良を確笑に判別づ−ることかできる。また、判別基準
として従来性なわれていたパターン認識技術を用いない
ので良、不良の判別が高速にできるという利点がある。
(Effects of the Invention) As explained above, according to the present invention, by introducing the color dimension into the criterion for determining whether a die is good or bad, it is possible to make a judgment based on information different from the conventional binary black and white, and the IC Good regardless of the pattern or marking position inside the chip.
It is possible to identify defects with certainty. Furthermore, since conventional pattern recognition technology is not used as a discrimination criterion, there is an advantage that it is possible to quickly discriminate between good and bad products.

【図面の簡単な説明】[Brief explanation of drawings]

第1図ないし第5図は従来のマーキング法を説明するた
めの図である。 J・・・ダイス 、 2・・・パターン3・・・不良マ
ーク 1′・・・2値什画面に弯拗さ、itたダイス12′・
・・2値化画面に変換されたパターン23′、4・・2
値化画面に変換された不良マーク3特許出願人 沖′1[;気工業(1、式会社 特許出願代理人 弁理士 山 本 恵 − 第1図 第2図 第3図 第5図
1 to 5 are diagrams for explaining conventional marking methods. J... Dice, 2... Pattern 3... Defective mark 1'... Binary screen is curved, it was die 12'.
...Patterns 23', 4...2 converted to binarized screen
Defective mark converted to value screen 3 Patent applicant Oki'1

Claims (3)

【特許請求の範囲】[Claims] (1)ブロービング工程又はダイスの良、不良を選別す
る工程において、不良として判定された不良ダイス上に
所定の色の不良マークを着け、該不良マークと前記反射
色との彩度の差を検出し、不良ダイスを選別することを
特徴とする不良ダイス□ のマーキング法。
(1) In the blobbing process or the process of sorting out good and defective dies, a defective mark of a predetermined color is placed on the defective die determined as defective, and the difference in saturation between the defective mark and the reflected color is calculated. A method for marking defective dice□, which is characterized by detecting and sorting defective dice.
(2)前記所定の色が、不良ダイスの表面状態によって
生ずる反射色に対してほぼ補色関係にある色であること
を特徴とする特許請求の範囲第」項に記載の不良ダイス
のマーキング法。
(2) The method for marking a defective die according to claim 1, wherein the predetermined color is a color that is substantially complementary to a reflected color caused by the surface condition of the defective die.
(3)前記所定の色が、はぼ原色であることを特徴とす
る特許請求の範囲第1項に記載の不良ダイスのマーキン
グ法。
(3) The method for marking defective dice according to claim 1, wherein the predetermined color is a primary color.
JP14576683A 1983-08-11 1983-08-11 Method for marking defective dice Pending JPS6037714A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14576683A JPS6037714A (en) 1983-08-11 1983-08-11 Method for marking defective dice

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14576683A JPS6037714A (en) 1983-08-11 1983-08-11 Method for marking defective dice

Publications (1)

Publication Number Publication Date
JPS6037714A true JPS6037714A (en) 1985-02-27

Family

ID=15392662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14576683A Pending JPS6037714A (en) 1983-08-11 1983-08-11 Method for marking defective dice

Country Status (1)

Country Link
JP (1) JPS6037714A (en)

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