JPS603564A - 共振器特性測定選別装置 - Google Patents

共振器特性測定選別装置

Info

Publication number
JPS603564A
JPS603564A JP58111255A JP11125583A JPS603564A JP S603564 A JPS603564 A JP S603564A JP 58111255 A JP58111255 A JP 58111255A JP 11125583 A JP11125583 A JP 11125583A JP S603564 A JPS603564 A JP S603564A
Authority
JP
Japan
Prior art keywords
resonator
frequency
positive feedback
measured
feedback oscillator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58111255A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0452414B2 (enExample
Inventor
Mitsuo Makimoto
三夫 牧本
Sadahiko Yamashita
山下　貞彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP58111255A priority Critical patent/JPS603564A/ja
Publication of JPS603564A publication Critical patent/JPS603564A/ja
Publication of JPH0452414B2 publication Critical patent/JPH0452414B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP58111255A 1983-06-20 1983-06-20 共振器特性測定選別装置 Granted JPS603564A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58111255A JPS603564A (ja) 1983-06-20 1983-06-20 共振器特性測定選別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58111255A JPS603564A (ja) 1983-06-20 1983-06-20 共振器特性測定選別装置

Publications (2)

Publication Number Publication Date
JPS603564A true JPS603564A (ja) 1985-01-09
JPH0452414B2 JPH0452414B2 (enExample) 1992-08-21

Family

ID=14556545

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58111255A Granted JPS603564A (ja) 1983-06-20 1983-06-20 共振器特性測定選別装置

Country Status (1)

Country Link
JP (1) JPS603564A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101598751B (zh) 2008-06-03 2012-09-05 优仪半导体设备(深圳)有限公司 高功率射频模块动态阻抗的一种测量方法及其测量装置
CN104950202A (zh) * 2015-06-16 2015-09-30 珠海许继电气有限公司 一种基于无功-频率正反馈的孤岛检测方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5282276A (en) * 1975-12-27 1977-07-09 Pioneer Electronic Corp Resonance frequency automatic measuring device
JPS5557155A (en) * 1978-10-20 1980-04-26 Murata Mfg Co Ltd Resonant frequency measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5282276A (en) * 1975-12-27 1977-07-09 Pioneer Electronic Corp Resonance frequency automatic measuring device
JPS5557155A (en) * 1978-10-20 1980-04-26 Murata Mfg Co Ltd Resonant frequency measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101598751B (zh) 2008-06-03 2012-09-05 优仪半导体设备(深圳)有限公司 高功率射频模块动态阻抗的一种测量方法及其测量装置
CN104950202A (zh) * 2015-06-16 2015-09-30 珠海许继电气有限公司 一种基于无功-频率正反馈的孤岛检测方法及系统

Also Published As

Publication number Publication date
JPH0452414B2 (enExample) 1992-08-21

Similar Documents

Publication Publication Date Title
Tobar et al. High-Q thermoelectric-stabilized sapphire microwave resonators for low-noise applications
JPH0213873A (ja) 非結合のｒｆコイルによる磁気共鳴装置
JPS61296276A (ja) 周波数弁別器
French et al. High‐Q Fabry‐Perot Resonator for Nitric Oxide Absorption Measurements at 150 GHz
JPS603564A (ja) 共振器特性測定選別装置
CA1087688A (en) Method and apparatus for testing crystal elements
JPS61278767A (ja) 共振周波数測定方法
RU2059229C1 (ru) Способ измерения свойств анизотропного диэлектрического материала и устройство для его осуществления
US4136313A (en) Apparatus for measuring q-quality of oscillatory circuit components
US5594354A (en) Method for measuring selected frequencies of a coupled-dual resonator crystal
Mizan et al. Determination of the limiting factors in the absolute phase noise of an L-band dielectric resonator oscillator
RU2110805C1 (ru) Способ определения входной проводимости антенны
US2784375A (en) Circuit resonance indicator
US2973476A (en) Test circuit for distributed capacity of inductances
Khanna et al. Direct Measurement of the Nonlinear MIC Oscillator Characteristics Using Injection Locking Polar Diagram.
Husten et al. Microwave frequency measurements and standards
Smith 6-Measuring the Electrical Characteristics of Piezoelectric Devices
SU1415201A1 (ru) Измеритель резонансной частоты последовательного LC-контура
George et al. Precision Measurement of Electrical Characteristics of Quartz-Crystal Units
Ghosh et al. Method of measuring loaded Q‐factor of single‐ended cavity resonators using reflection bridge
Yuan et al. Design, Implementation, and Performance Analysis of a Broad-Band V-Band Network Analyzer (Short Papers)
SU857888A2 (ru) Автогенераторный отбраковщик кварцевых резонаторов по моночастотности
JPS5836311B2 (ja) 機械振動子定数測定法
Szekely et al. Reducing the effect of local oscillator phase noise on the frequency stability of passive frequency standards
SU415604A1 (enExample)