JPS6033501A - Production of blazed grating - Google Patents
Production of blazed gratingInfo
- Publication number
- JPS6033501A JPS6033501A JP14256583A JP14256583A JPS6033501A JP S6033501 A JPS6033501 A JP S6033501A JP 14256583 A JP14256583 A JP 14256583A JP 14256583 A JP14256583 A JP 14256583A JP S6033501 A JPS6033501 A JP S6033501A
- Authority
- JP
- Japan
- Prior art keywords
- grating
- film
- polymer film
- layer
- organic polymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 16
- XKRFYHLGVUSROY-UHFFFAOYSA-N argon Substances [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 239000001301 oxygen Substances 0.000 claims abstract description 11
- 229910052760 oxygen Inorganic materials 0.000 claims abstract description 11
- 238000010884 ion-beam technique Methods 0.000 claims abstract description 10
- 229910052786 argon Inorganic materials 0.000 claims abstract description 9
- 238000005530 etching Methods 0.000 claims abstract description 5
- 238000000992 sputter etching Methods 0.000 claims description 18
- 239000010410 layer Substances 0.000 claims description 17
- 229920000620 organic polymer Polymers 0.000 claims description 17
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- 239000002344 surface layer Substances 0.000 claims description 2
- 239000010931 gold Substances 0.000 abstract description 16
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 abstract description 14
- 229910052737 gold Inorganic materials 0.000 abstract description 14
- 230000005540 biological transmission Effects 0.000 abstract description 4
- 229920006254 polymer film Polymers 0.000 abstract 3
- 238000010894 electron beam technology Methods 0.000 description 8
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 6
- 239000004926 polymethyl methacrylate Substances 0.000 description 6
- -1 argon ion Chemical class 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical compound [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 3
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- 230000001133 acceleration Effects 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229920006324 polyoxymethylene Polymers 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- 229930182556 Polyacetal Natural products 0.000 description 1
- 238000002508 contact lithography Methods 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- SDIXRDNYIMOKSG-UHFFFAOYSA-L disodium methyl arsenate Chemical compound [Na+].[Na+].C[As]([O-])([O-])=O SDIXRDNYIMOKSG-UHFFFAOYSA-L 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- OCVXZQOKBHXGRU-UHFFFAOYSA-N iodine(1+) Chemical compound [I+] OCVXZQOKBHXGRU-UHFFFAOYSA-N 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000012047 saturated solution Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1847—Manufacturing methods
- G02B5/1857—Manufacturing methods using exposure or etching means, e.g. holography, photolithography, exposure to electron or ion beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、分光器の波長分散素子やホログラム素子と
して使われるブレーズド格子の製造方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a blazed grating used as a wavelength dispersion element or hologram element in a spectrometer.
回折格子は、分光器の波長分散素子やホログラム素子と
して種々の応用、例えば、ホログラフィックスキャナや
、ホログラフィックレンズ等力するが、一般に回折効率
が低く実用上問題である。Diffraction gratings are used in various applications, such as in holographic scanners and holographic lenses, as wavelength dispersion elements in spectrometers and hologram elements, but they generally have low diffraction efficiency, which poses a practical problem.
ブレーズド格子は特定の回折次数へ理論上100%の光
を回折できる特徴があるが、格子溝の形状を制御して製
作しなければならないため製作が困難である。現在量も
現実的と思われるのは、あらかじめ作ったレリーフ格子
をシャドウマスクとし、て基板を斜め方向からイオンビ
ームでイオンエツチングする方法である。この手法で現
在知られているのは、基板をガリウム砒素、又はガラス
板上に塗布したポリメチルメタクリレート(PMMA)
としたものであるが、前者は、結晶であるため高価で、
又、不透明のため透過型格子にはできない欠点がある。A blazed grating has the characteristic that it can theoretically diffract 100% of light to a specific diffraction order, but it is difficult to manufacture because the shape of the grating grooves must be controlled. The method currently considered to be practical is to ion-etch the substrate with an ion beam from an oblique direction using a relief grating made in advance as a shadow mask. Currently known methods for this technique include substrates made of gallium arsenide or polymethyl methacrylate (PMMA) coated on a glass plate.
However, the former is expensive because it is a crystal;
Furthermore, it has the disadvantage that it cannot be used as a transmission type grid because it is opaque.
一方、後者は、ガラス板上に塗布したPMMAを十分に
乾燥しても、塗膜上にホトレジストでレリーフ格子を形
成する際に、ホトレジストの溶剤でPMMA膜が溶解し
、相溶しやすいため、レリーフ格子自体が良質なものが
できず、したがって良質なブレーズド格子が製作できな
い欠点があった。On the other hand, in the latter case, even if the PMMA coated on the glass plate is sufficiently dried, when forming a relief grid with photoresist on the coating film, the PMMA film is easily dissolved and compatible with the photoresist solvent. There was a drawback that the relief grating itself could not be made of high quality, and therefore a high quality blazed grating could not be manufactured.
この発明の目的は、上述の欠点を除去した、透過型の高
品質のブレーズド格子の製造方法を提供することにある
。The object of the invention is to provide a method for producing a high-quality blazed grating of the transmission type, which eliminates the above-mentioned drawbacks.
この発明のブレーズド格子の製造方法は、基板に有機高
分子膜を塗布する工程と、塗布された前記有機高分子膜
に前記有機高分子膜よりも酸素イオンエツチング速度の
遅い金属層をコートする工程と、前記金属層に前記金属
層よりもアルゴンイオンエツチング速度の遅いホトレジ
スト膜を塗布する工程と、塗布されたホトレジスト膜を
レリーフ型の回折格子に形成する工程と、前記回折格子
をマスクとして、アルゴンイオンビームで前記金属層を
イオンエツチングして、金属層に矩形断面の回折格子を
形成する工程と、前記矩形断面の回折格子をマスクとし
て、酸素イオンビームで前記有機高分子膜をイオンエツ
チングして、有機高分子膜の表層に矩形断面の回折格子
を形成する工程′1と、前記金属層を除去した後、基板
に対して斜め方向からイオンエツチングする工程とを含
むことを特徴とするブレーズド格子の製造方法である。The method for manufacturing a blazed grating of the present invention includes the steps of applying an organic polymer film to a substrate, and coating the applied organic polymer film with a metal layer whose oxygen ion etching rate is slower than that of the organic polymer film. a step of applying a photoresist film having a slower argon ion etching rate than the metal layer to the metal layer; a step of forming the applied photoresist film into a relief-type diffraction grating; ion etching the metal layer with an ion beam to form a diffraction grating with a rectangular cross section on the metal layer; and ion etching the organic polymer film with an oxygen ion beam using the rectangular diffraction grating as a mask. , a blazed grating comprising the steps of forming a diffraction grating with a rectangular cross section on the surface layer of an organic polymer film; and after removing the metal layer, performing ion etching from an oblique direction to the substrate. This is a manufacturing method.
次に図面を参照して、この発明の詳細な説明する。第1
図から第6図までは、この発明の一実施例を、工程の順
に説明するための断面図である。Next, the present invention will be described in detail with reference to the drawings. 1st
The drawings to FIG. 6 are cross-sectional views for explaining one embodiment of the present invention in the order of steps.
第1図は、基板1に有機高分子膜2を塗布した後、その
上に金属層3をコードン、さらにその上にホトレジスト
4を塗布した状態を示す断面図である。FIG. 1 is a cross-sectional view showing a state in which an organic polymer film 2 is coated on a substrate 1, a metal layer 3 is coated thereon with a cordon, and a photoresist 4 is further coated thereon.
基板としてはガラス板及びアクリル板を用いた。A glass plate and an acrylic plate were used as the substrate.
有機高分子膜としては、種々実験した結果、イオンエッ
チレグ速度の早いソマール工業製の電子線レジストIL
−NタイプAを用いた。5EL−NタイプAはメタクリ
ル酸グリシジルとアクリル酸エチルの共重合体である。As an organic polymer film, as a result of various experiments, we used electron beam resist IL manufactured by Somar Industries, which has a fast ion etch leg speed.
-N type A was used. 5EL-N Type A is a copolymer of glycidyl methacrylate and ethyl acrylate.
基板にはスピナーで回転塗布した。塗布厚は約1.5μ
mである。その後、ガラス基板の時は80℃で30分間
焼きしめを行なった。アクリル基板の時は50゛Cで6
0分間焼きしめを行なった。次に、電子線レジスト膜2
の表面に電子線レジスト膜2よシも酸素イオンエツチン
グ速度の遅い金属として金(Au)3を約1000オン
グストロームの厚さスパッタリングでコートした。続い
て、金3の表面にホトレジスト膜4を塗布した。ホトレ
ジストとしてはシップル−社製AZ−1350Vを使用
し、スピナーで回転塗布した。焼きしめは、電子線レジ
ストと同じ条件で行なう。塗布厚は0.3μm〜0.5
μInとした。The coating was applied to the substrate using a spinner. Coating thickness is approximately 1.5μ
It is m. Thereafter, in the case of a glass substrate, baking was performed at 80° C. for 30 minutes. 6 at 50°C for acrylic board
Baking was performed for 0 minutes. Next, the electron beam resist film 2
The surface of the resist film 2 was coated with gold (Au) 3 to a thickness of about 1000 angstroms by sputtering as a metal having a slower oxygen ion etching rate than the electron beam resist film 2. Subsequently, a photoresist film 4 was applied to the surface of the gold 3. As the photoresist, AZ-1350V manufactured by Sipple Co., Ltd. was used and spin coating was performed using a spinner. Baking is performed under the same conditions as for electron beam resist. Coating thickness is 0.3 μm to 0.5
It was called μIn.
次に、ホトレジストにレリーフ格子を形成するために、
He−Cdレーザを光源とする干渉計で干渉ホ
縞を←トレジスト膜に露光し、現像液で現像した。第2
図は、現像後の状態を示す断面図である。Next, to form a relief grating in the photoresist,
The interference fringes were exposed onto the resist film using an interferometer using a He-Cd laser as a light source, and the resist film was developed with a developer. Second
The figure is a sectional view showing the state after development.
レーザ干渉計を用いるかわりに乳剤マスクを用いて密着
焼付によっても、第2図に示すようなレリーフ格子を形
成できる。次に、第2図に示すよう5−
な試料をイオンエツチング装置を用いて、アルゴンイオ
ンビームでイオンエツチングした。イオンエツチング条
件はアルゴンガス圧10’)−ル、加速電圧500vと
した。ホトレジストAZ−1350Jのイオンエッチレ
グ速度は1 mA/cyy/’ のアルゴンイオンに対
し300 A/分であるのに対し、金は、約1000
A/分であった。この工、チング速度の差を利用するこ
とで、第3図に示すように、レリーフ格子4をマスクと
して、金層3にほぼ矩形断面の格子を製作できる。次に
、第3図の金層3の格子をマスクとして、電子線レジス
ト層2を酸素イオンビームでイオンエツチングした。イ
オンエツチング条件は、酸素ガス圧2X10’)−I゛
ル、加速電圧500Vとした。金のイオンエッチレグ速
度は1mA/m2の酸素イオンに対して約1000オン
グストローム/分であるのに対し、電子線レジストSE
L/N−Aは、5330オンゲスト四−ム/分、ホトレ
ジストAZ−1350Jは3000オングストロ一ム/
分であった。このエツチング速度の差を利用することで
、第4図に示6一
ト4が残っているが、次の金の除去工程で、金を溶かす
ことで除去できる。金の除去には、ヨウ化カリ(KI
)とヨウ素(I) の飽和溶液で金を溶解することで行
なった。第5図は、金を除去した後の断面図を示す。次
に、第5図に示す矩形格子を矢印5で示す方向からアル
ゴンイオン又は酸素イオンでイオンエツチングすると、
格子自身がイオンビームに対してシャドウマスクとして
作用し、第6図に示すようなブレーズド格子が得られる
。Instead of using a laser interferometer, a relief grating as shown in FIG. 2 can also be formed by contact printing using an emulsion mask. Next, as shown in FIG. 2, the 5-mm sample was ion-etched with an argon ion beam using an ion etching apparatus. The ion etching conditions were an argon gas pressure of 10') and an acceleration voltage of 500V. The ion etch leg rate of photoresist AZ-1350J is 300 A/min for 1 mA/cyy/' argon ion, whereas gold is approximately 1000 A/min.
It was A/min. By utilizing this difference in the cutting speed, a grating with a substantially rectangular cross section can be fabricated on the gold layer 3 using the relief grating 4 as a mask, as shown in FIG. Next, using the lattice of the gold layer 3 shown in FIG. 3 as a mask, the electron beam resist layer 2 was ion-etched with an oxygen ion beam. The ion etching conditions were an oxygen gas pressure of 2×10')-I and an acceleration voltage of 500V. The ion etch leg rate for gold is about 1000 Å/min for oxygen ions at 1 mA/m2, whereas for electron beam resist SE
L/N-A is 5330 angstroms/min, photoresist AZ-1350J is 3000 angstroms/min.
It was a minute. By utilizing this difference in etching speed, the remaining dots 4 shown in FIG. 4 can be removed by melting the gold in the next gold removal process. Potassium iodide (KI) is used to remove gold.
) and iodine (I) by dissolving the gold in a saturated solution. FIG. 5 shows a cross-sectional view after gold has been removed. Next, when the rectangular lattice shown in FIG. 5 is ion-etched with argon ions or oxygen ions from the direction shown by arrow 5,
The grating itself acts as a shadow mask for the ion beam, resulting in a blazed grating as shown in FIG.
、この時イオンエツチング時間が短いと矩形格子の一部
が残り、時間が長すぎるとブレーズド格子の角がまるく
なってしまうので、イオンエツチング時間の制御が重要
である。At this time, if the ion etching time is short, a portion of the rectangular lattice will remain, and if the ion etching time is too long, the corners of the blazed lattice will become rounded, so it is important to control the ion etching time.
1本実施例では、有機高分子膜として5EL−Nり、1
□・1イブAを用いた場合を説明したが、本方法に適す
6他の有機高分子膜材料としては、8BL−Nタイ1
ブAと同じ様な電子線レジストBBR−9、又は、メタ
クリの2つのメチル基をC1およびCH2CF37−
で置換した重合体(電子線レジス)COP)、r 又は
、ポリメチルメタアクリレート(PMMA) 、又はポ
リビニルアルコール(PVA)、又はポリビニルホルマ
ール(PVF)、又は、ポリアセタール(POM )が
ある。これらは、いずれも金(Au )よりも、酸素イ
オンエツチング速度が早いので、本方法でブレーズド格
子を製造できる。1 In this example, the case where 5EL-N and 1 □ 1 Eve A were used as the organic polymer film was explained.6 Other organic polymer film materials suitable for this method include 8BL-N type. 1 Electron beam resist BBR-9 similar to BBR-9, or a polymer (electron beam resist) COP) in which the two methyl groups of methacrylate are substituted with C1 and CH2CF37-, r or polymethyl methacrylate (PMMA) , polyvinyl alcohol (PVA), polyvinyl formal (PVF), or polyacetal (POM). Since these materials all have a faster oxygen ion etching rate than gold (Au), a blazed lattice can be manufactured using this method.
以上述べた様に本発明により、透過型の高品質のブレー
ズド格子が得られる。As described above, according to the present invention, a transmission type blazed grating of high quality can be obtained.
に示す断面図である。図において、lは基板、2は有機
高分子膜、3は金属層、4はホトレジスト、5の矢印は
イオンビームの入射方向を各々表わす。FIG. In the figure, l represents a substrate, 2 an organic polymer film, 3 a metal layer, 4 a photoresist, and an arrow 5 the direction of incidence of the ion beam.
8−8-
Claims (1)
前記有機高分子膜に前記有機高分子膜よりも酸素イオン
エツチング速度の遅い金属層をコートする工程と、前記
金属層に前記金属層よりもアルゴンイオンエツチング速
度の遅いホトレジスト膜を塗布する工程と、塗布された
ホトレジスト膜をレリーフ型の回折格子に形成する工程
と、前記回折格子をマスクとして、アルゴンイオンビー
ムで前記金属層をイオンエツチングして、金属層に矩形
断面の回折格子を形成する工程と、前記矩形断面の回折
格子をマスクとして、酸素イオンビームで前記有機高分
子膜をイオンエツチングして、有機高分子膜の表層に矩
形断面の回折格子を形成する工程と、前記金属層を除去
した後、基板に対して斜め方向からイオンエツチングす
る工程とを含むことを特徴とするブレーズド格子の製造
方法。1. A step of applying an organic polymer film to a substrate, a step of coating the applied organic polymer film with a metal layer having a slower oxygen ion etching rate than the organic polymer film, and a step of coating the applied organic polymer film with a metal layer having a slower oxygen ion etching rate than the organic polymer film. A step of applying a photoresist film whose argon ion etching rate is slower than that of the metal layer, a step of forming the applied photoresist film into a relief-type diffraction grating, and a step of ionizing the metal layer with an argon ion beam using the diffraction grating as a mask. etching to form a diffraction grating with a rectangular cross section on the metal layer, and using the diffraction grating with the rectangular cross section as a mask, ion etching the organic polymer film with an oxygen ion beam to form a surface layer of the organic polymer film. A method for manufacturing a blazed grating, comprising the steps of forming a diffraction grating with a rectangular cross section, and after removing the metal layer, performing ion etching from an oblique direction on the substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14256583A JPS6033501A (en) | 1983-08-05 | 1983-08-05 | Production of blazed grating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14256583A JPS6033501A (en) | 1983-08-05 | 1983-08-05 | Production of blazed grating |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6033501A true JPS6033501A (en) | 1985-02-20 |
Family
ID=15318280
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14256583A Pending JPS6033501A (en) | 1983-08-05 | 1983-08-05 | Production of blazed grating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6033501A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004088764A3 (en) * | 2003-04-03 | 2005-01-20 | Microemissive Displays Ltd | Ion beam method for removing an organic light emitting material |
JP2006259325A (en) * | 2005-03-17 | 2006-09-28 | Shimadzu Corp | Method for manufacturing holographic grating |
CN102360093A (en) * | 2011-10-19 | 2012-02-22 | 苏州大学 | Holographic blazed grating manufacturing method |
WO2013056627A1 (en) * | 2011-10-19 | 2013-04-25 | 苏州大学 | Method for manufacturing holographic bi-blazed grating |
CN110244395A (en) * | 2019-06-28 | 2019-09-17 | 中国科学技术大学 | A kind of production method of the double angle balzed grating,s of plane |
WO2021031111A1 (en) * | 2019-08-16 | 2021-02-25 | 诚瑞光学(常州)股份有限公司 | Method for manufacturing surface relief grating structure |
-
1983
- 1983-08-05 JP JP14256583A patent/JPS6033501A/en active Pending
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2004088764A3 (en) * | 2003-04-03 | 2005-01-20 | Microemissive Displays Ltd | Ion beam method for removing an organic light emitting material |
US7731860B2 (en) | 2003-04-03 | 2010-06-08 | Microemissive Displays Limited | Ion beam method for removing an organic light emitting material |
JP2006259325A (en) * | 2005-03-17 | 2006-09-28 | Shimadzu Corp | Method for manufacturing holographic grating |
JP4507928B2 (en) * | 2005-03-17 | 2010-07-21 | 株式会社島津製作所 | Holographic grating manufacturing method |
CN102360093A (en) * | 2011-10-19 | 2012-02-22 | 苏州大学 | Holographic blazed grating manufacturing method |
WO2013056627A1 (en) * | 2011-10-19 | 2013-04-25 | 苏州大学 | Method for manufacturing holographic bi-blazed grating |
US9075194B2 (en) | 2011-10-19 | 2015-07-07 | Soochow University | Method for manufacturing holographic bi-blazed grating |
US9864113B2 (en) | 2011-10-19 | 2018-01-09 | Soochow University | Method for manufacturing holographic blazed grating |
CN110244395A (en) * | 2019-06-28 | 2019-09-17 | 中国科学技术大学 | A kind of production method of the double angle balzed grating,s of plane |
CN110244395B (en) * | 2019-06-28 | 2020-10-27 | 中国科学技术大学 | Method for manufacturing plane double-angle blazed grating |
WO2021031111A1 (en) * | 2019-08-16 | 2021-02-25 | 诚瑞光学(常州)股份有限公司 | Method for manufacturing surface relief grating structure |
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