JPS6031285A - Semiconductor laser with built-in monitor - Google Patents

Semiconductor laser with built-in monitor

Info

Publication number
JPS6031285A
JPS6031285A JP58139011A JP13901183A JPS6031285A JP S6031285 A JPS6031285 A JP S6031285A JP 58139011 A JP58139011 A JP 58139011A JP 13901183 A JP13901183 A JP 13901183A JP S6031285 A JPS6031285 A JP S6031285A
Authority
JP
Japan
Prior art keywords
light
semiconductor laser
heat sink
monitor
projection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58139011A
Other languages
Japanese (ja)
Inventor
Toshihiro Mitsunari
光成 敏博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP58139011A priority Critical patent/JPS6031285A/en
Publication of JPS6031285A publication Critical patent/JPS6031285A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/02208Mountings; Housings characterised by the shape of the housings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/0233Mounting configuration of laser chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/023Mount members, e.g. sub-mount members
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/022Mountings; Housings
    • H01S5/0235Method for mounting laser chips
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/02Structural details or components not essential to laser action
    • H01S5/024Arrangements for thermal management

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To prevent the noise by a method wherein the semiconductor laser is placed at the projection of a heat sink process to an L-shape, and a minitoring light receiving element is provided so that the light receiving surface may be positioned at a level lower than the surface of the projection of the heat sink. CONSTITUTION:The semiconductor laser 1 is placed at the projection of the heat sink 3 processed to an L-shape. Then, the monitoring light receiving semiconductor element 2 is set up so that the light receiving surface may be positioned at a level lower than the extended plane of the surface of the projection of the heat sink 3. These are provided inside a cap 4, which is provided with a glass 5. Besides, a non-reflection coating 6 is applied on the cap 4 in order to prevent the reflection of monitor light from a stem, thereby preventing the noise due to the reflection of monitor light.

Description

【発明の詳細な説明】 本発明は、モニター付半導体レーザに関するものである
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor laser with a monitor.

一般に、半導体レーザを使用する際には、パッケージの
外へ放出される光ビームを主光ビームとし、パッケージ
の内側へ放出される光ビーム(以下モニター光と呼ぶ)
を光出力の監視用とするために同一パンケージ内に受光
半導体素子を内蔵する方式が採られている。
Generally, when using a semiconductor laser, the light beam emitted outside the package is the main light beam, and the light beam emitted inside the package (hereinafter referred to as monitor light).
In order to monitor the optical output, a method has been adopted in which a light-receiving semiconductor element is built into the same pancake.

従来は、第1図に示すように、モニター光の進行方向の
延長上に受光半導体素子を設置し、光出力を監視する方
式が採用されていたが、この方式では、モニター光の一
部が受光半導体素子の表面で反射し、その反射光が主光
ビームに重畳され、雑音の原因となシ、特に雑音をきら
うビデオ・ディスクでは画像が飛ぶという不具合が生じ
る。
Conventionally, as shown in Figure 1, a method was adopted in which a light-receiving semiconductor element was installed on the extension of the monitor light in the traveling direction and the light output was monitored. The light is reflected by the surface of the light-receiving semiconductor element, and the reflected light is superimposed on the main light beam, causing noise, and especially in video discs where noise is a problem, images may be skipped.

また、半導体レーザは、受光半導体素子に対して90°
ずれて設置しであるので、電極を取るためボンディング
する際も、半導体レーザ側をボンディングした後ステム
を90°回転してから受光半導体素子側のボンディング
を行なうという手間がかかった。
In addition, the semiconductor laser is 90° with respect to the light receiving semiconductor element.
Since they are installed offset, even when bonding to remove the electrodes, it takes time and effort to bond the semiconductor laser side, rotate the stem 90 degrees, and then bond the light-receiving semiconductor element side.

本発明の目的は、従来のこのような欠点を解決すること
のできるモニタ・−封手導体レーザを提供することにあ
る。
SUMMARY OF THE INVENTION An object of the present invention is to provide a monitor/seal conductor laser that can overcome these conventional drawbacks.

本発明によれば、5字をに加工したヒートシンクの凸部
に半導体レーザを設置し、そのヒートシンクの凸部の表
面よシ低い面に受光面が位置するようにモニター用の受
光半導体素子を設置したことを特徴とするモニター付半
導体レーザが得られる。
According to the present invention, a semiconductor laser is installed on the convex part of a heat sink processed into a 5-shaped shape, and a light-receiving semiconductor element for monitoring is installed so that the light-receiving surface is located on a surface lower than the surface of the convex part of the heat sink. A semiconductor laser with a monitor is obtained.

以下、本発明を図面を用いて詳細に説明する。Hereinafter, the present invention will be explained in detail using the drawings.

第1図は従来のパッケージ内部の断面図である。FIG. 1 is a sectional view of the inside of a conventional package.

第2図は本発明によるパッケージ内部の断面図の1例で
ある。第3図はヒートシンク部分の拡大図である。第3
図に示すように、L字賊に加工したヒートシンク3の凸
部に半導体レーザ1を設置しヒートシンク3の凸部の表
面の延長面よシ下面に受光面が位置するようにモニター
用の受光半導体素子2を設置し、従来の受光半導体素子
2の設置場所である第2図の6の箇所にモニター光のス
テムからの反射を防止するために無反射コートをほどこ
すことによシモニター光の反射による雑昔を防ぐことが
できる。
FIG. 2 is an example of a sectional view of the inside of the package according to the present invention. FIG. 3 is an enlarged view of the heat sink portion. Third
As shown in the figure, the semiconductor laser 1 is installed on the convex part of the heat sink 3 which is processed into an L shape, and the light receiving semiconductor for monitoring is placed so that the light receiving surface is located below the extension surface of the convex part of the heat sink 3. By installing the element 2 and applying a non-reflective coating to the location 6 in Fig. 2, which is the installation location of the conventional light-receiving semiconductor element 2, to prevent the monitor light from being reflected from the stem, the monitor light can be reduced. It can prevent clutter caused by reflection.

なお、半導体レーザlの垂直方向の光ビームの放射角は
、30°〜50°の広がりをもつので。
Note that the radiation angle of the vertical light beam of the semiconductor laser l has a spread of 30° to 50°.

受光半導体素子の受光面がヒートシンク3の凸部の表面
よシ下方に位置していれば、十分にモニター光を受光で
きるので、従来と同様に光出力の監視も可能である。
If the light-receiving surface of the light-receiving semiconductor element is located below the surface of the convex portion of the heat sink 3, sufficient monitor light can be received, so that the light output can be monitored as in the conventional method.

また、半導体レーザと、−受光半導体素子が同一ヒート
シンク上の同一方向の面に設置しであるので電極を取る
ためのボンディングをステムを回転することなく一度に
行なうことができる。
Further, since the semiconductor laser and the light-receiving semiconductor element are installed on the same surface on the same heat sink in the same direction, bonding for removing the electrodes can be performed at once without rotating the stem.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のパッケージ内の断面図である。 第2図は本発明によるモニター付半導体レーザのパッケ
ージ内の断面図である。第3図はヒートシンク部分の拡
大図である。 l・・・・・・半導体レーザ、2・・・・・・受光半導
体素子、3・・・・・・ヒートシンク、4・・・・・・
キャップ、5・・・・・°ガラス、6・・・・・・ステ
ム(無反射コートをほどこす場所) 代理人 弁理士 内 原 −′、=’:)+>:停・“
(ぐ、、゛
FIG. 1 is a cross-sectional view of the inside of a conventional package. FIG. 2 is a sectional view of the inside of a package of a semiconductor laser with a monitor according to the present invention. FIG. 3 is an enlarged view of the heat sink portion. 1...Semiconductor laser, 2...Photodetector semiconductor element, 3...Heat sink, 4...
Cap, 5...°Glass, 6...Stem (place where anti-reflective coating is applied) Agent Patent attorney Uchihara −', =':)+>:Stop・“
(Gu,,゛

Claims (1)

【特許請求の範囲】[Claims] り字型に加工したヒートシンクの凸部に半導体レーザを
設置し、前記ヒートシンクの凸部の表面よシ低い面に受
光面が位置するようにモニター用の受光半導体素子を設
置したことを特徴とするモニター付半導体レーザ。
A semiconductor laser is installed on a convex part of a heat sink processed into an L-shape, and a light-receiving semiconductor element for monitoring is installed so that the light-receiving surface is located on a surface lower than the surface of the convex part of the heat sink. Semiconductor laser with monitor.
JP58139011A 1983-07-29 1983-07-29 Semiconductor laser with built-in monitor Pending JPS6031285A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58139011A JPS6031285A (en) 1983-07-29 1983-07-29 Semiconductor laser with built-in monitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58139011A JPS6031285A (en) 1983-07-29 1983-07-29 Semiconductor laser with built-in monitor

Publications (1)

Publication Number Publication Date
JPS6031285A true JPS6031285A (en) 1985-02-18

Family

ID=15235391

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58139011A Pending JPS6031285A (en) 1983-07-29 1983-07-29 Semiconductor laser with built-in monitor

Country Status (1)

Country Link
JP (1) JPS6031285A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675597A (en) * 1994-11-16 1997-10-07 Mitsubishi Denki Kabushiki Kaisha Semiconductor laser device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS543660U (en) * 1977-06-13 1979-01-11
JPS5474687A (en) * 1977-11-26 1979-06-14 Sharp Corp Monitor construction for photo semiconductor
JPS55148482A (en) * 1979-05-08 1980-11-19 Canon Inc Semiconductor laser device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS543660U (en) * 1977-06-13 1979-01-11
JPS5474687A (en) * 1977-11-26 1979-06-14 Sharp Corp Monitor construction for photo semiconductor
JPS55148482A (en) * 1979-05-08 1980-11-19 Canon Inc Semiconductor laser device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5675597A (en) * 1994-11-16 1997-10-07 Mitsubishi Denki Kabushiki Kaisha Semiconductor laser device

Similar Documents

Publication Publication Date Title
JPH0122746B2 (en)
JPH0524071Y2 (en)
JPS6088486A (en) Semiconductor laser device
JPS6031285A (en) Semiconductor laser with built-in monitor
JPS6086887A (en) Semiconductor laser
JPH03188680A (en) Solid image pick-up device
JP3865852B2 (en) Photodetector
JP2738347B2 (en) Semiconductor laser device
JPH09270566A (en) Semiconductor laser device
JPH05327122A (en) Semiconductor laser device
JPS58207689A (en) Semiconductor laser apparatus
JPS6167971A (en) Dhd light emitting diode
JPH01123493A (en) Semiconductor laser device
JPS63102387A (en) Package for semiconductor laser device
JPH0459799B2 (en)
JPH0799786B2 (en) Light transmitting cap and method of manufacturing the same
JPH06164071A (en) Semiconductor laser
JPS58111387A (en) Laser diode
JPH0111189Y2 (en)
JPH0214592A (en) Semiconductor laser
JPS63124485A (en) Semiconductor device
JPH05829Y2 (en)
JPS62196888A (en) Package for semiconductor laser element
JPS61156784A (en) Submount for semiconductor laser
JPH05136446A (en) Semiconductor photodetector