JPS60261105A - Method of producing thick film positive temperature coefficient semiconductor element - Google Patents

Method of producing thick film positive temperature coefficient semiconductor element

Info

Publication number
JPS60261105A
JPS60261105A JP11701984A JP11701984A JPS60261105A JP S60261105 A JPS60261105 A JP S60261105A JP 11701984 A JP11701984 A JP 11701984A JP 11701984 A JP11701984 A JP 11701984A JP S60261105 A JPS60261105 A JP S60261105A
Authority
JP
Japan
Prior art keywords
thick film
positive temperature
semiconductor element
batio3
temperature coefficient
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11701984A
Other languages
Japanese (ja)
Other versions
JPH0534804B2 (en
Inventor
野井 慶一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP11701984A priority Critical patent/JPS60261105A/en
Publication of JPS60261105A publication Critical patent/JPS60261105A/en
Publication of JPH0534804B2 publication Critical patent/JPH0534804B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Thermistors And Varistors (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は機器の保温、刀口熱などに用いられる面状発熱
体のなかで、ガラスフリットを必要としない厚膜型正特
性半導体素子の製造方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a method for manufacturing a thick-film positive temperature coefficient semiconductor element that does not require a glass frit, which is a sheet heating element used for heat insulation of equipment, knife heating, etc. It is something.

従来例の構成とその問題点 BaTiO3系半導体からなる素子は所定温度以上で急
激に抵抗値が増大するスイッチング特性およびスイッチ
ング後の自己発熱特性を有し、昇温特性が速く自己温度
制御機能を有し、外部の制御回路を必要としないため広
く利用されている。
Conventional configuration and problems Elements made of BaTiO3-based semiconductors have switching characteristics in which the resistance value increases rapidly above a certain temperature and self-heating characteristics after switching, and have fast temperature rise characteristics and self-temperature control functions. However, it is widely used because it does not require an external control circuit.

従来の正特性サーミスタ発熱体はB a T i O5
系半導体粉末を加圧成形した後、焼成して得ていたが、
実用可能な厚膜状の正特性サーミスタ発熱体を得ること
は困難であるとされていた。
The conventional positive temperature coefficient thermistor heating element is B a T i O5
It was obtained by press-molding a semiconductor powder and then firing it.
It has been considered difficult to obtain a practical thick-film positive temperature coefficient thermistor heating element.

従来、BaTiO3系半導体を膜状に加工する方法とし
ては、次のようなものが知られている。
Conventionally, the following methods are known for processing BaTiO3-based semiconductors into a film.

■ ディスク形に成形qた後、焼成したものを薄片に研
磨する。
■ After forming into a disk shape, the fired product is polished into thin pieces.

■ 真空蒸着法により基板上に薄膜を形成する。■ Form a thin film on the substrate by vacuum evaporation.

■ BaTiO3系半導体粉末に導電性の添加剤とガラ
スフリットを加えてペースト状とし、基板上にスクリー
ン印刷した後、焼成する。
(2) Conductive additives and glass frit are added to BaTiO3-based semiconductor powder to form a paste, which is screen printed on a substrate and then fired.

しかし、前記■の方法ではBaTiO3系半導体の結晶
粒子径が大きくもろいため、膜状にま−で研磨すること
は甚だ困難である。また、前記■の方法では操作が面倒
であり1発熱体に適した大電力を得ることがむつかしい
。さらに、前記■の方法では面積抵抗が高くな9易く制
御が困難であり、発熱体には適さず、またあらかじめガ
ラスフリットを調合、焼成しておかなければならず、面
倒であると共にガラスフリットの材質によってはBaT
iO3系半導体の持つスイッチング特性および自己発熱
特性を劣化させる。そして、ガラスフリットを加えるこ
とにより BaTiO3系半導体とガラスフリットの耐
熱性、熱膨張係数の差から熱衝撃に弱く、熱伝導が妨げ
られる。さらに、導電性の添加剤とガラスフリットを均
一に混合することは困難であり、特性にばらつきを生じ
る原因の一つとなっている。
However, in the method (2) above, since the crystal grain size of the BaTiO3 semiconductor is large and brittle, it is extremely difficult to polish it into a film. Furthermore, in the method (2), the operation is troublesome and it is difficult to obtain a large amount of electric power suitable for one heating element. Furthermore, method (1) has a high sheet resistance and is difficult to control, is not suitable for heating elements, and requires preparing and firing the glass frit in advance, which is troublesome and difficult to control. BaT depending on the material
It deteriorates the switching characteristics and self-heating characteristics of iO3-based semiconductors. Adding glass frit makes it vulnerable to thermal shock due to the difference in heat resistance and coefficient of thermal expansion between the BaTiO3 semiconductor and the glass frit, which impedes heat conduction. Furthermore, it is difficult to uniformly mix conductive additives and glass frit, which is one of the causes of variations in properties.

発明の目的 そこで本発明では前記従来技術の欠点であった製造上の
繁雑さを解決し、ガラスフリットを用いずに厚膜状にす
ることによシ熱衝撃性、熱伝導性に優れ、均一な特性を
持つ厚膜型正特性半導体素子を容易に製造できる方法を
提供することを目的・ とじている。
Purpose of the Invention Therefore, the present invention solves the drawback of the prior art, which is the complexity of manufacturing, and creates a film with excellent thermal shock resistance, thermal conductivity, and uniformity by forming a thick film without using glass frit. The purpose and goal of this invention is to provide a method for easily manufacturing thick film type positive temperature semiconductor devices with such characteristics.

発明の構成 本発明の厚膜型正特性半導体素子の製造方法は、BaT
t(j、系半導体粉末にCa B6を1.0〜60.○
重量係加えてペースト状にした混合物を基板上に塗布し
て厚膜状とした後、焼成することによシ厚膜型正特性半
導体素子を得ようとするものである。
Structure of the Invention The method for manufacturing a thick film type positive temperature semiconductor device of the present invention includes
t(j, 1.0 to 60.○ of Ca B6 to the based semiconductor powder
The purpose is to obtain a thick film type positive characteristic semiconductor element by coating a paste-like mixture on a substrate to form a thick film and then firing it.

従来の導電性添加剤とガラスフリットを用いる方法では
BaTiO3系半導体粉末同志の電気的接続のために導
電性添加剤が必要であり、BaTiO3系粉末同志を物
理的に接続するのにガラスフリットが必要であった。
In the conventional method of using a conductive additive and glass frit, a conductive additive is required for electrical connection between BaTiO3-based semiconductor powders, and a glass frit is required to physically connect BaTiO3-based powders together. Met.

しかし、本発明によれば導電性添加剤とガラスフリット
の両方の役割をはだすものとして、Oa B6を用いた
ところに特徴を有している。このCa B 6は常温で
は導体であシ、1000〜1100℃以上の温度になる
と一部分が分解して粒子表面にB2O5が析出するが、
粒子内部は元のままで表面のB2O3膜により分解が阻
止される。従って、B a T i O5系半導体粉末
と、Ca B 6粉末を混合して焼成すると、Cj a
B 6の表面に析出するB2O3がガラスフリットと同
じ役割をし、粒子内部が導電性添加剤の役割をするため
、Ca B 6を添加するだけでガラスフリットを必要
としない厚膜型正特性半導体素子が得られる。
However, the present invention is characterized in that Oa B6 is used as a material that functions as both a conductive additive and a glass frit. This CaB6 is not a conductor at room temperature, but at temperatures above 1000-1100℃, a portion decomposes and B2O5 is precipitated on the particle surface.
The inside of the particle remains intact and decomposition is prevented by the B2O3 film on the surface. Therefore, when B a Ti O5 based semiconductor powder and Ca B 6 powder are mixed and fired, Cj a
B2O3 precipitated on the surface of B6 plays the same role as a glass frit, and the inside of the particle plays the role of a conductive additive, so it is a thick film type positive temperature semiconductor that does not require a glass frit just by adding CaB6. An element is obtained.

また、導電性金属を添加することにより、熱伝導性が悪
いガラスフリットに較べ熱伝導性が良くなり、熱衝撃性
も向上する。
Furthermore, by adding a conductive metal, the thermal conductivity becomes better than that of glass frit, which has poor thermal conductivity, and the thermal shock resistance is also improved.

実施例の説明 以下に本発明の実施例をあげて第1図と共に具体的に説
明する。
DESCRIPTION OF EMBODIMENTS Below, embodiments of the present invention will be specifically explained with reference to FIG.

実施例1 BaTi05に1.o−t=ニルのNb2O5を加え1
300℃で焼成した後、粉砕してBaTiO3系半導体
粉末を得る。前記BaTiO3系半導体粉末に全重量に
対して5.0重量%のCaB6粉末を刃口え均一に混合
し、さらにα−テルピネオールを加えてペースト状混合
物1を作る。
Example 1 1. Add Nb2O5 of ot=nil and 1
After firing at 300°C, it is pulverized to obtain BaTiO3-based semiconductor powder. A paste-like mixture 1 is prepared by uniformly mixing 5.0% by weight of CaB6 powder with respect to the total weight of the BaTiO3-based semiconductor powder and adding α-terpineol.

一方、AQ20.などからなる基板2上にあらかじめ一
対のAqなどの導電性物質からなる電極3゜4を設けて
おき、前記電極3,4上にその電極3゜4の一部が残る
ように前記ペースト状混合物1をスクリーン印刷などに
より塗布し、室温から10℃/minの昇温速度で13
60℃まで昇温し、1時間保持した後、炉内放冷する。
On the other hand, AQ20. A pair of electrodes 3.4 made of a conductive material such as Aq are provided in advance on a substrate 2 made of Aq, etc., and the paste-like mixture is placed so that a part of the electrodes 3.4 remains on the electrodes 3, 4. 1 by screen printing, etc., and heated at a heating rate of 10°C/min from room temperature to 13°C.
After raising the temperature to 60° C. and maintaining it for 1 hour, it was left to cool in the furnace.

このようにして厚膜型正特性半導体素子を得た。In this way, a thick film type positive characteristic semiconductor device was obtained.

実施例2 実施例1と同様にしてBaTiO3に3.0モル係のY
2O3を加え1250℃で焼成した後、粉砕してBaT
iO3系半導体粉末を得る。前記BaTiO3系半導体
粉末に全重量に対して24.0重量%のCaB6粉末を
加え均一に混合し、さらにα−テルピネオールを加えて
ペースト状混合物1にする。ついア、実施例1と同様に
前記基板2上にあらかじめ前記電極3,4を設けておき
、前記電極3,4の一部が残るように前記ペースト状混
合物1をスクリーン印刷などにより塗布し、室温から1
0℃/ minの昇温速度で1300’C’!で昇温し
、30分間保持した後、炉内放冷する。このようにして
厚膜型半導体素子を得た。
Example 2 In the same manner as in Example 1, 3.0 mol of Y was added to BaTiO3.
After adding 2O3 and firing at 1250℃, it is crushed to form BaT.
An iO3-based semiconductor powder is obtained. 24.0% by weight of CaB6 powder based on the total weight is added to the BaTiO3-based semiconductor powder and mixed uniformly, and α-terpineol is further added to form paste mixture 1. Next, as in Example 1, the electrodes 3 and 4 are provided on the substrate 2 in advance, and the paste mixture 1 is applied by screen printing or the like so that a portion of the electrodes 3 and 4 remains. 1 from room temperature
1300'C' at a heating rate of 0°C/min! After raising the temperature at , and holding it for 30 minutes, it was left to cool in the furnace. In this way, a thick film semiconductor device was obtained.

こうして得た厚膜型半導体素子の室温での面積抵抗は実
施例1の場合6.1にΩ/ Caであり、実施例2の場
合2.8にΩ/ Caであり、各々の温度と抵抗値の関
係は第2図に示した通りであった。第2図でAは実施例
1によシ得られた素子の特性、Bは実施例2の場合の特
性である。
The sheet resistance at room temperature of the thick film semiconductor device thus obtained was 6.1 Ω/Ca in Example 1, and 2.8 Ω/Ca in Example 2, and the resistance depended on each temperature. The relationship between the values was as shown in FIG. In FIG. 2, A shows the characteristics of the device obtained in Example 1, and B shows the characteristics in Example 2.

発明の効果 以上のように本発明の製造方法によれば、CaB6粉末
が従来の導電性添加剤とガラスフリットの両方の役割を
はたし、電気的接続、物理的接続に十分な効果があり、
ガラスフリットなしで厚膜状正特性半導体素子が得られ
ることとなる。
Effects of the Invention As described above, according to the manufacturing method of the present invention, CaB6 powder plays the role of both a conventional conductive additive and a glass frit, and has sufficient effects for electrical connection and physical connection. ,
A thick film positive characteristic semiconductor element can be obtained without a glass frit.

捷だ、ガラスフリットという熱伝導の悪いものにかわっ
て熱伝導のよい導電性金属のCa B6を用いることに
よシ、熱伝導が良くなシ熱衝撃性も向上する。さらに、
スクリーン印刷などによシ製造できることから作業が容
易で量産が可能である。
However, by using CaB6, a conductive metal with good heat conduction, instead of glass frit, which has poor heat conduction, not only good heat conduction but also improved thermal shock resistance can be achieved. moreover,
Since it can be manufactured by screen printing, etc., it is easy to work with and mass production is possible.

なお、本発明においてBaTiO3系半導体粉末として
はBaTiO3に各種の添加剤を加えて半導体化したも
のであればなんでもよい。また、Ca B6粉末の添加
量を全重量に対して1〜60重量係と規定したのは、1
重量%未満では面積抵抗が大きくなりすぎ発熱体に不適
当であり、BaTiO3粉末同志の物理的固定もできな
く、一方60重#俤を越えると面積抵抗が小さくなυす
ぎ、自己制御特性(PTC特性)が小さクナク発熱体に
不適当になるためである。さらに、13aTi03系半
導体粉末とCa B6粉末をペースト状にするのに有機
溶剤(実施例ではα−テルピネオール)を用いたが、ペ
ースト状にできるものであればなんでもよい。
In the present invention, any BaTiO3-based semiconductor powder may be used as long as it is made into a semiconductor by adding various additives to BaTiO3. In addition, the amount of Ca B6 powder added was defined as 1 to 60% by weight based on the total weight.
If it is less than 60% by weight, the area resistance becomes too large, making it unsuitable for use as a heating element, and it is impossible to physically fix the BaTiO3 powders together. This is because the characteristics) are unsuitable for small Kunaku heating elements. Further, although an organic solvent (α-terpineol in the example) was used to make the 13aTi03-based semiconductor powder and Ca B6 powder into a paste, any solvent may be used as long as it can be made into a paste.

以上述べたように本発明によれば、ガラスフリノI・を
必要としない厚膜型正特性半導体素子が容易に製造でき
、その実用上の効果は大きいものである。
As described above, according to the present invention, it is possible to easily manufacture a thick film type positive characteristic semiconductor element that does not require glass frino I, and its practical effects are great.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明方法により得られる厚膜型正特性半導体
素子を示す一部切欠斜視図、第2図は本発明の実施例に
よる素子の温度と抵抗値の関係を示す図である。 1 ・・・ペースト状混合物、2 ・基板、3,4・・
・・電極。
FIG. 1 is a partially cutaway perspective view showing a thick film positive temperature coefficient semiconductor device obtained by the method of the present invention, and FIG. 2 is a diagram showing the relationship between temperature and resistance value of the device according to an embodiment of the present invention. 1... Paste mixture, 2 - Substrate, 3, 4...
··electrode.

Claims (1)

【特許請求の範囲】[Claims] BaTiO3系半導体粉末にCa B 6を1.0〜6
0.0重量%加え、ペースト状にした混合物を基板上に
塗布して厚膜状とした後、焼成してなることを特徴とす
る厚膜型正特性半導体素子の製造方法。
Adding CaB6 to BaTiO3-based semiconductor powder from 1.0 to 6
1. A method for manufacturing a thick-film type positive characteristic semiconductor element, comprising: applying 0.0% by weight of a paste-like mixture onto a substrate to form a thick film, and then firing the mixture.
JP11701984A 1984-06-07 1984-06-07 Method of producing thick film positive temperature coefficient semiconductor element Granted JPS60261105A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11701984A JPS60261105A (en) 1984-06-07 1984-06-07 Method of producing thick film positive temperature coefficient semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11701984A JPS60261105A (en) 1984-06-07 1984-06-07 Method of producing thick film positive temperature coefficient semiconductor element

Publications (2)

Publication Number Publication Date
JPS60261105A true JPS60261105A (en) 1985-12-24
JPH0534804B2 JPH0534804B2 (en) 1993-05-25

Family

ID=14701429

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11701984A Granted JPS60261105A (en) 1984-06-07 1984-06-07 Method of producing thick film positive temperature coefficient semiconductor element

Country Status (1)

Country Link
JP (1) JPS60261105A (en)

Also Published As

Publication number Publication date
JPH0534804B2 (en) 1993-05-25

Similar Documents

Publication Publication Date Title
JPS61101008A (en) Manufacture of thick film type positive temperature coefficient semiconductor element
JPS60261105A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6012702A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6158209A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS60261109A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6012701A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6158208A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS60260103A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS60260102A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPH0534807B2 (en)
JPS60206103A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6158204A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6158207A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS6158210A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS61101007A (en) Manufacture of thick film type positive temperature coefficient semiconductor element
JPS60206102A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS60206105A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS61101004A (en) Manufacture of thick film type positive temperature coefficient semiconductor element
JPS59111302A (en) Method of producing thick film type temperature coefficient semiconductor element
JPS6158211A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPS61101003A (en) Manufacture of thick film type positive temperature coefficient semiconductor element
JPS60261107A (en) Method of producing thick film positive temperature coefficient semiconductor element
JPH04565B2 (en)
JPH0534802B2 (en)
JPS61101009A (en) Manufacture of thick film type positive temperature coefficient semiconductor element