JPS60245247A - Replacement device for semiconductor substrate - Google Patents

Replacement device for semiconductor substrate

Info

Publication number
JPS60245247A
JPS60245247A JP10224584A JP10224584A JPS60245247A JP S60245247 A JPS60245247 A JP S60245247A JP 10224584 A JP10224584 A JP 10224584A JP 10224584 A JP10224584 A JP 10224584A JP S60245247 A JPS60245247 A JP S60245247A
Authority
JP
Japan
Prior art keywords
wafer
pedestal
holding jig
carrier
semiconductor substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10224584A
Other languages
Japanese (ja)
Inventor
Katsuharu Kitajima
北嶋 勝春
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP10224584A priority Critical patent/JPS60245247A/en
Publication of JPS60245247A publication Critical patent/JPS60245247A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve the manufacturing yield by preventing scratches by a method wherein a wafer holding jig supporting a semiconductor substrate on the upper surface is placed on a pedestal provided on the device main unit, so as to move between both pedestals, and a wafer carrier is furnished so as to move up and down. CONSTITUTION:The holding jig 4 with standing wafers is horizontally slid over the top surface of the pedestal 3 by pushing its one end and then fitted into the guide groove 6 of an adjacent pedestal 2, thus replacing the jig 4 from the pedestal 3 to the pedestal 2. Then, a wafer carrier 8 is pulled up along the pedestal 2. A wafer is made to stand by fitting its bottom to the groove of the holding jig 4. When both plates 8a, 8a of the carrier 8 pass through both side edges of the holding jig 4, both sides of a semiconductor substrate are held by fitting to the groove 9 of the side plate 8a, and the substrate is replaced from the jig 4 to the carrier 8. This manner can avoid the contact of wafers with one another during the replacement work and can improve the decrease in yield caused by scratches on the wafer surface and that caused by wafer drops and the like.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は拡散用ボートとウェハースキャリアとの間で半
導体基板を移替える装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for transferring semiconductor substrates between a diffusion boat and a wafer carrier.

〔従来技術〕[Prior art]

半導体基板(以下、ウェハースという)へ不純物を拡散
する工程や、酸化膜を形成する工程等にオイては、例え
ば拡散用ボート(ウェハースキャリア)とウェハースキ
ャリアとの間でウェハースを移替える必要がある。
In processes such as the process of diffusing impurities into a semiconductor substrate (hereinafter referred to as a wafer) or the process of forming an oxide film, it is necessary to transfer the wafer between a diffusion boat (wafer carrier) and a wafer carrier, for example. .

従来、半導体基板の拡散工程における拡散用ボートから
ウニ2ハースキヤリアへ又はその逆のウェハース立て替
えはビンセットを用いて1枚1枚おこなっていた。この
立て替え方法では、拡散用ボートやウェハースキャリア
のウェハース立て溝間中が狭いため、立て替え作業中に
ウェハースどうしの接触を起し易く、これがウェハー表
面の傷発生となり、選択不純物拡散用マスクとしての酸
化膜に傷をつけて異常拡散となったり、酸化膜形成後に
酸化膜に傷をつけることが起こり易く、製造歩留低下の
原因となっていた。さらには、立て替え作業工数も製造
原価増の一大要因となっていた。
Conventionally, in the diffusion process of semiconductor substrates, wafers have been transferred one by one from a diffusion boat to a two-pass carrier or vice versa using a bin set. In this repositioning method, because the space between the wafer stand grooves of the diffusion boat and wafer carrier is narrow, wafers tend to come into contact with each other during the repositioning process, which causes scratches on the wafer surface and the oxidation mask used as a mask for selective impurity diffusion. This tends to cause damage to the film, resulting in abnormal diffusion, or damage to the oxide film after it has been formed, resulting in a decrease in manufacturing yield. Furthermore, the number of man-hours required for rebuilding was also a major factor contributing to the increase in manufacturing costs.

〔発明の目的〕[Purpose of the invention]

本発明の目的はかかる欠点を除去し、前記ウェハース表
面に傷が発生するのを防止して製造歩留を向上し、かつ
ウェハース立て替え工数を削減できるようにした半導体
基板の移替装置を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a semiconductor substrate transfer device that eliminates such drawbacks, prevents scratches from occurring on the wafer surface, improves manufacturing yield, and reduces the number of man-hours required for wafer replacement. There is a particular thing.

〔発明の構成〕[Structure of the invention]

本発明は装置本体に一対の台座を設け、該台座上に半導
体基板を上面に支持させるウェハース保持治具を両台座
間に渡って移動可能に設置し、各々の台座にそれぞれ前
記台座上のウエノ)−ス保持治具よシ半導体基板を授受
させるウエノ・−スキャリアを上下動可能に装備したこ
とを特徴とする半導体基板の移替装置である。
In the present invention, a pair of pedestals is provided in the apparatus main body, and a wafer holding jig for supporting a semiconductor substrate on the upper surface is movably installed between the two pedestals. ) This is a semiconductor substrate transfer device characterized by being equipped with a space holding jig and a space carrier capable of vertical movement for transferring and receiving semiconductor substrates.

〔実施例〕〔Example〕

以下に、本発明の一実施例を図により説明する。 An embodiment of the present invention will be described below with reference to the drawings.

第1図において、装置本体1上に2つの台座2゜3を隣
接させて設置し、各台座2,3の頂面長さ方向に、ウェ
ハース保持治具4を誘導案内する案内溝5,6を同一軸
線上に設ける。
In FIG. 1, two pedestals 2 and 3 are installed adjacent to each other on the apparatus main body 1, and guide grooves 5 and 6 for guiding the wafer holding jig 4 are installed in the longitudinal direction of the top surface of each pedestal 2 and 3. are placed on the same axis.

第2図は半導体基板の拡散工程に用いるウエノ・−キャ
リアとしての石英製拡・散用ボート7を示し、第3図は
工程内で半導体基板を搬送するテフロン製ウェハースキ
ャリア8を示すものである・拡散用ボート7は一対の側
板7 (L + 7cL、ロッド7b、 7bを有し、
一方ウエハースキャリア8は裾部8bが内側に彎曲した
一対の側板8α+8aを有し、各対をなす側板7a+8
aの間隔は前記ウェハース保持治具4の横巾より広く設
定されており、拡散用ボート7及びウェハースキャリア
8は7対の側板が保持治具4を跨いだ状態で装置本体1
に着座させられるものである。
Figure 2 shows a quartz diffusion/diffusion boat 7 as a wafer carrier used in the semiconductor substrate diffusion process, and Figure 3 shows a Teflon wafer carrier 8 that transports the semiconductor substrate within the process.・The diffusion boat 7 has a pair of side plates 7 (L + 7cL, rods 7b, 7b,
On the other hand, the wafer carrier 8 has a pair of side plates 8α+8a whose skirt portions 8b are curved inward, and each pair of side plates 7a+8
The distance a is set wider than the width of the wafer holding jig 4, and the diffusion boat 7 and wafer carrier 8 are mounted on the apparatus main body 1 with seven pairs of side plates straddling the holding jig 4.
It is something that you can sit on.

さらに、保持治具4の上面4α、ボート7の側板7(L
I7cL及びロッド7b、7b 、 ’7 エバー、X
 キーY !J 78の側板8α、8a、に半導体基板
を立掛けてこれを保持するウェハース保持溝9.・・・
・・・を、同一のピッチで設ける。
Further, the upper surface 4α of the holding jig 4, the side plate 7 (L) of the boat 7
I7cL and rod 7b, 7b, '7 Ever, X
Key Y! A wafer holding groove 9 for leaning and holding a semiconductor substrate on the side plates 8α, 8a of J78. ...
... are provided at the same pitch.

例えば、拡散用ボート7に搭載されたウェハースをウェ
ハースキャリア8に移し替える場合について説明する。
For example, a case where wafers loaded on the diffusion boat 7 are transferred to the wafer carrier 8 will be described.

まず、第1図に示すようにウェハースキャリア8を一方
の台座2の上方から垂直におろし、該台座2を跨いでウ
ェハースキャリア8を着座させる。次に他方の台座3の
案内溝6に保持治具4を差込む。
First, as shown in FIG. 1, the wafer carrier 8 is vertically lowered from above one of the pedestals 2, and the wafer carrier 8 is seated across the pedestal 2. Next, the holding jig 4 is inserted into the guide groove 6 of the other pedestal 3.

そして、保持治具6の溝9と拡散用ボート7の溝9とを
目合せして、拡散用ボート7を他方の台座3の上方から
垂直におろし、保持治具6の外側にボート7の溝付きロ
ッド7b、7b (側板7a、7a )を通過させる。
Then, align the grooves 9 of the holding jig 6 with the grooves 9 of the diffusion boat 7, lower the diffusion boat 7 vertically from above the other pedestal 3, and place the boat 7 on the outside of the holding jig 6. The grooved rods 7b, 7b (side plates 7a, 7a) are allowed to pass through.

半導体基板はその両側部分が側板7a、ロンドアbの溝
9に嵌合してポ二ト7に立掛けられているため、ボート
7の対をなす側板、ロッドが定置された保持治具6の両
側縁を通過する際に、保持治具6及びボート7の溝9は
同一ピッチであるため、ボート7に保持されたウェハー
スはその下部が保持治具4の溝9に受け止められる。
Since the semiconductor substrate is hung on the pointer 7 with its both sides fitted into the grooves 9 of the side plate 7a and the round door b, the pair of side plates of the boat 7 and the holding jig 6 in which the rods are fixed are attached. When passing through both side edges, the grooves 9 of the holding jig 6 and the boat 7 have the same pitch, so the lower part of the wafer held by the boat 7 is received by the grooves 9 of the holding jig 4.

ボート7が垂直に下降して一方の台座3に跨って着座さ
せられる途中に、ウエノ・−スはボート7から保持治具
4に移し替えられる。
While the boat 7 is being vertically lowered and seated astride one of the pedestals 3, the uenose is transferred from the boat 7 to the holding jig 4.

次に、ウェハースが立て掛けられた保持治具4の一端部
を押して台座3の頂面を水平方向にスライドさせ、隣接
した台座2の案内溝6内に保持治具4を嵌入して台座3
から台座2に移し替える。
Next, push one end of the holding jig 4 on which the wafer is propped up, slide the top surface of the pedestal 3 in the horizontal direction, fit the holding jig 4 into the guide groove 6 of the adjacent pedestal 2, and remove the pedestal 3.
Transfer from to pedestal 2.

その際、予じめ台座2に跨らせて着座させられたウェハ
ースキャリア8の溝9と保持治具4の溝9とを目合せす
る。そして、ウェハースキャリア8を台座2に沿って上
方に向けて引き上げる。ウェハースはその下部が保持治
具4の溝に嵌合して立掛けられており、キャリア8の側
板8a、、8αが保持治具4の両側縁を通過する際、半
導体基板の両側が側板あの溝9に嵌合、保持され、キャ
リア8を上方に引き上げる際に基板が保持治具4からキ
ャリア8に移し替えられる。
At this time, the grooves 9 of the wafer carrier 8 seated on the pedestal 2 in advance and the grooves 9 of the holding jig 4 are aligned. Then, the wafer carrier 8 is pulled upward along the pedestal 2. The wafer is suspended with its lower part fitted into the groove of the holding jig 4, and when the side plates 8a, 8α of the carrier 8 pass through both side edges of the holding jig 4, both sides of the semiconductor substrate are fitted into the grooves of the holding jig 4. The substrate is fitted into the groove 9 and held, and the substrate is transferred from the holding jig 4 to the carrier 8 when the carrier 8 is pulled upward.

尚、ウェハースキャリアから拡散用ボート(ウェハース
キャリア)へ半導体基板を移し替えるには前述した動作
を逆に行なえば良い。
Incidentally, in order to transfer the semiconductor substrate from the wafer carrier to the diffusion boat (wafer carrier), the above-described operation may be performed in reverse.

〔発明の効果〕〔Effect of the invention〕

本発明は以上説明したように、ウェハース保持治具を跨
いでウェハースキャリアを上下動させる途中にウェハー
スの移し替えを行なうようにし庭ので、ウェハース立替
え作業にウェハース同士が接触するのを回避することが
でき、ウェハース表面の傷発生による歩留低下を改善で
き、かつ従来のピンセットによる移し替え時のウェハー
ス落下等による歩留低下も改善できる。また、ウェハー
スの立て替え工数も大巾に削減出来るなど効果は大であ
る。
As explained above, the present invention transfers wafers while moving the wafer carrier up and down across the wafer holding jig, thereby avoiding contact between wafers during wafer transfer work. This makes it possible to improve the yield loss caused by the occurrence of scratches on the wafer surface, and also improve the yield loss caused by falling wafers during transfer using conventional tweezers. It also has great effects, such as greatly reducing the number of man-hours required for wafer replacement.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示す斜視図、第2図は一般
に用いられている石英製拡散用ポートの斜視図、第3図
はテフロン製ウェハースキャリアの斜視図である。 1・・・装置本体、2,3・・・台座、4・・・ウェハ
ース保持治具、7・・・拡散用ポート(ウェハースキャ
リア)、8・・・ウェハースキャリア、9・・・ウェハ
ース保持用溝 特許出願人 日本電気株式会社
FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a perspective view of a generally used quartz diffusion port, and FIG. 3 is a perspective view of a Teflon wafer carrier. 1... Device body, 2, 3... Pedestal, 4... Wafer holding jig, 7... Diffusion port (wafer carrier), 8... Wafer carrier, 9... Wafer holding Mizo patent applicant NEC Corporation

Claims (1)

【特許請求の範囲】[Claims] (1)装置本体に一対の台座を設け、該台座上に半導体
基板を上面に支持させるウェハース保持治具を両台座間
に渡って移動可能に設置し、各々の台座にそれぞれ前記
台座上のウェハース保持治具より半導体基板を授受させ
るウェハースキャリアを上下動可能に装備したことを特
徴とする半導体基板の移替装置。
(1) A pair of pedestals is provided in the apparatus main body, and a wafer holding jig for supporting a semiconductor substrate on the upper surface is movably installed between the two pedestals, and each pedestal is provided with a wafer holding jig that supports the semiconductor substrate on the upper surface. A semiconductor substrate transfer device characterized by being equipped with a wafer carrier that can be moved up and down to transfer semiconductor substrates from a holding jig.
JP10224584A 1984-05-21 1984-05-21 Replacement device for semiconductor substrate Pending JPS60245247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10224584A JPS60245247A (en) 1984-05-21 1984-05-21 Replacement device for semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10224584A JPS60245247A (en) 1984-05-21 1984-05-21 Replacement device for semiconductor substrate

Publications (1)

Publication Number Publication Date
JPS60245247A true JPS60245247A (en) 1985-12-05

Family

ID=14322224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10224584A Pending JPS60245247A (en) 1984-05-21 1984-05-21 Replacement device for semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS60245247A (en)

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