JPS60239161A - Test call generating system - Google Patents

Abstract

PURPOSE:To change the test setting condition during the generation of a test call by reading periodically normally even during the generation of a test call the test condition set by a test condition setting section via an input section corresponding to each setting section. CONSTITUTION:Input sections 12-1-12-n corresponding to test condition set sections 11-1-11-n are provided and the test setting condition is read from the setting section. A control section 1 reads periodically and normally the test setting condition data set to the setting section via the input section even during generation of the test call and stores it to a memory section 2. Thus, the control section 1 controls an interface section 3 of an exchange based on the said test setting condition data of the memory section 2 and generates the test call to the exchange.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a test call generation method in a test call generation device for confirming the normality of an exchange.

Conventionally, this type of test call generation device, as shown in FIG. The interface unit 3, test condition setting units 7-1 to 7-n for setting test conditions, and this test condition setting unit 7-
An input section 4 for reading the test setting conditions of 1 to 7-n, and a test condition setting section K-1 to 7-n. -n data, and an output section 5 that controls the switching of this switching section 6.
The data in the test condition setting units 7-1 to 7-n was switched and read by the test condition setting units 7-1 to 7-n.

In such conventional test call generation devices, reading the test setting conditions is complicated and requires processing time, so it is difficult to set the test conditions while the test call is being generated, and the test conditions can only be set at the beginning of the test. could not be set or changed. However, it had the disadvantage that it required a switching section to switch and read the data in the test condition setting section, and an output section to control the switching of this switching section.

The present invention has been made in view of the above drawbacks, and includes a control section, a memory section, an exchange interface section controlled by the control section, a test condition setting section, and one pair for this test condition setting section. 1 and an input section that is controlled by the control section and sends test condition setting data to the control section; The purpose of the present invention is to provide a test call generation method that makes it possible to change test setting conditions while a test call is being generated by constantly and periodically reading data through the input section corresponding to each test condition setting section even while a test call is being generated. .

The present invention will be explained below based on the embodiment shown in FIG. In the block diagram of the test call generation device in FIG. 2, l is a control unit and 2 is a program.

The system section 3 stores station data and test conditions, and 3 is an interface of the exchange that generates a test call to the exchange, and these can be the same as conventional ones. 11-1 to 11-n are test condition setting sections for setting test conditions, and 12-i to 12-n are test condition setting sections 11-n.
Input sections provided corresponding to 4 to 11-n, respectively,
Read the test setting conditions from the corresponding test condition setting section.

In the test call generation device configured as described above, the control section 1 controls the test condition setting section 1 through the input sections 12-n to 12-n in accordance with the program stored in the memory section 2.
Test setting condition data set in 1-1 to 11-n,
Even while a test call is being generated, it is constantly and periodically read and stored in the memory section 2. Thereby, the control section 1 controls the interface section 3 of the exchange based on the test setting condition data stored in the memory section 2, and generates a test call to the exchange.

As described above, according to the present invention, the input sections for reading the test setting conditions of the test condition setting section are provided in a one-to-one correspondence with each of the test condition setting sections. In addition, a switching section and an output section that controls this switching section are provided to eliminate the need for switching processing to read the test setting conditions; this makes it easy to read and process the test setting conditions. At the same time, the processing time for one reading is shortened, and the test setting conditions can be changed even during the generation of the test call without stopping the generation of the test call.

[Brief explanation of the drawing]

Figure 1 is a block diagram showing a conventional test call generation device;
The figure is a block diagram of an embodiment of a test call generation device according to the present invention. l...Control unit 2...Memory unit 3...Interface unit 11-1 to 11-11...Test condition setting unit 12-1 to
Thickness 2-n...Input section applicant: Memoto Electric Co., Ltd.

Claims (1)

[Claims] A control section, a memory section, an interface section of an exchange controlled by the control section, a test condition setting section, and a one-to-one correspondence with the test condition setting section, and controlled by the control section. A test call generation device is configured by an input section that sends the test condition setting data to the control section, and an input section that transmits the test conditions set by the test condition setting section to the respective test condition setting sections. A test call generation method that makes it possible to change the test setting conditions while a test call is being generated by constantly and periodically reading data through the test call.