JPS60236513A - Protection circuit of transistor - Google Patents

Protection circuit of transistor

Info

Publication number
JPS60236513A
JPS60236513A JP7943184A JP7943184A JPS60236513A JP S60236513 A JPS60236513 A JP S60236513A JP 7943184 A JP7943184 A JP 7943184A JP 7943184 A JP7943184 A JP 7943184A JP S60236513 A JPS60236513 A JP S60236513A
Authority
JP
Japan
Prior art keywords
transistor
voltage
base
emitter
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7943184A
Other languages
Japanese (ja)
Inventor
Yuji Hamada
浜田 雄司
Yukio Uchida
幸夫 内田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP7943184A priority Critical patent/JPS60236513A/en
Publication of JPS60236513A publication Critical patent/JPS60236513A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/26Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar transistors with internal or external positive feedback
    • H03K3/28Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar transistors with internal or external positive feedback using means other than a transformer for feedback
    • H03K3/281Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar transistors with internal or external positive feedback using means other than a transformer for feedback using at least two transistors so coupled that the input of one is derived from the output of another, e.g. multivibrator
    • H03K3/282Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar transistors with internal or external positive feedback using means other than a transformer for feedback using at least two transistors so coupled that the input of one is derived from the output of another, e.g. multivibrator astable
    • H03K3/2823Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of bipolar transistors with internal or external positive feedback using means other than a transformer for feedback using at least two transistors so coupled that the input of one is derived from the output of another, e.g. multivibrator astable using two active transistor of the same conductivity type

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)

Abstract

PURPOSE:To prevent the deterioration and destruction of a transistor (TR) due to application of the adverse bias by connecting a constant voltage diode having the breakdown voltage higher than the power supply voltage in the forward direction of the base of the TR together with a resistance connected between the base and the emitter. CONSTITUTION:Constant voltage diodes ZD1, ZD2 are connected forward to the bases of TRs Q1 and Q2 respectively. Furthermore a resistance R7 or R8 is connected between the base and the emitter of the TRs Q1 and Q2 respectively. When the TRQ2 conducts, the charging voltage (power supply voltage V) of a capacitor C2 is impressed as the adverse bias between the base and the emitter of the TRQ1 as well as to a series circuit of the ZD1. The drop voltage of a resistance R7 due to a leakage current is impressed between the base and the emitter of the TRQ1 as the adverse bias. Thus the voltage can be kept at a low level to avoid the deterioration of the TRQ1.

Description

【発明の詳細な説明】 (a) 発明の技術分野 本発明はトランジスタの逆バイアス印加による破壊劣化
を防止するトランジスタの保護回路に関す。
DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a protection circuit for a transistor that prevents destructive deterioration due to application of a reverse bias to the transistor.

(b) 技術の背景 トランジスタを開閉素子に使用する場合に、ベースとエ
ミッタとの間に高電圧の逆バイアスが印加されると、ト
ランジスタが破壊或いは劣化する恐れがある。
(b) Background of the Technology When a transistor is used as a switching element, if a high voltage reverse bias is applied between the base and the emitter, the transistor may be destroyed or deteriorated.

(C1従来技術と問題点 第1図は従来あるマルチバイブレータ回路の一例を示す
図であり、第2図は第1図におけるトランジスタの等価
回路を示す図である。第1図におけるトランジスタQl
およびC2の入力インピーダンスRiは第2図から明ら
かな如り(1)式で示される。
(C1 Prior Art and Problems Figure 1 is a diagram showing an example of a conventional multivibrator circuit, and Figure 2 is a diagram showing an equivalent circuit of the transistor in Figure 1.Transistor Ql in Figure 1
As is clear from FIG. 2, the input impedance Ri of C2 is expressed by equation (1).

Ri=rb+ (1+β) r e ・”(1)(但し
βはトランジスタの電流増幅率)第1図において、トラ
ンジスタQ1が導通状態、トランジスタQ2が遮断状態
にあるとすると、コンデンサC2は抵抗R2を介して充
電され、a電極側が電源電圧■に、b電極側が地電位E
となる。
Ri=rb+ (1+β) r e ・”(1) (where β is the current amplification factor of the transistor) In Fig. 1, assuming that transistor Q1 is in a conductive state and transistor Q2 is in a cutoff state, capacitor C2 connects resistor R2. The a electrode side is charged to the power supply voltage ■, and the b electrode side is charged to the earth potential E.
becomes.

一方コンデンサC1も抵抗R3を介して充電されること
によりトランジスタQ2のベース電位が上昇し、トラン
ジスタQ2が導通状態となるとコンデンサC2のa電極
がトランジスタQ2を介して地電位Eとなる為、トラン
ジスタQ1のベースとエミッタとの間にはコンデンサC
2の充電電圧(=電源電圧■)が逆バイアスとして印加
されることとなり、電源電圧Vが高い場合にはトランジ
スタQ1が破壊或いは劣化する恐れがある。従って電源
電圧Vは充分低電圧(例えば数ボルト乃至十数ボルト)
に維持される必要がある。
On the other hand, as the capacitor C1 is also charged via the resistor R3, the base potential of the transistor Q2 increases, and when the transistor Q2 becomes conductive, the a electrode of the capacitor C2 becomes the ground potential E via the transistor Q2, so the transistor Q1 There is a capacitor C between the base and emitter of
The charging voltage V2 (=power supply voltage ■) is applied as a reverse bias, and if the power supply voltage V is high, there is a risk that the transistor Q1 will be destroyed or deteriorated. Therefore, the power supply voltage V is a sufficiently low voltage (for example, several volts to more than ten volts)
need to be maintained.

以上の説明から明らかな如く、従来あるトランジスタ回
路においては、トランジスタのベースとエミッタとの間
に電源電圧が逆バイアスに印加される場合にも、トラン
ジスタを破壊或いは劣化から保護する為に電源電圧を充
分低電圧に維持する必要があり、トランジスタ回路専用
の電源を準備する必要がある等の欠点があった。かかる
欠点を除去する方法として、第3図に示す如く、トラン
ジスタQ1およびQ2のベースに直列抵抗R5およびR
6をそれぞれ接続し、且つベースとエミッタとの間にダ
イオードD1およびD2をそれぞれ接続することも考慮
される。かかる方法によれば、トランジスタQ1または
Q2のベースとエミッタとの間に逆バイアスが印加され
た場合には、ダイオードD1またはD2が順方向となり
、トランジスタQ1およびQ2を保護する。然しトラン
ジスタQ1およびQ2のベースとエミッタとの間が逆バ
イアス状態において低抵抗となる。またトランジスタ(
例えばQl)の入力インピーダンスRi1は(2)式に
より示される。
As is clear from the above explanation, in conventional transistor circuits, even when a reverse bias power supply voltage is applied between the base and emitter of the transistor, the power supply voltage is applied to protect the transistor from destruction or deterioration. There were drawbacks such as the need to maintain a sufficiently low voltage and the need to prepare a dedicated power source for the transistor circuit. As a method to eliminate this drawback, as shown in FIG. 3, series resistors R5 and R are connected to the bases of transistors Q1 and Q2.
It is also conceivable to connect diodes D1 and D2 between base and emitter respectively. According to this method, when a reverse bias is applied between the base and emitter of transistor Q1 or Q2, diode D1 or D2 becomes forward-oriented and protects transistors Q1 and Q2. However, the resistance between the base and emitter of transistors Q1 and Q2 is low in a reverse bias state. Also, the transistor (
For example, the input impedance Ri1 of Ql) is expressed by equation (2).

R1@=R5+rb+ (1+β) r e ・・・(
2)なお抵抗R5はトランジスタQ1のベース電流を制
限するに充分な高抵抗(通常抵抗rbの10乃至20倍
程度)に設定される為、第1図におけるトランジスタQ
1の入力インピーダンスRiに比し大きくなり、マルチ
バイブレータの発振周波数に影響を与え、かかる保護回
路は不適当である。
R1@=R5+rb+ (1+β) r e...(
2) Since the resistor R5 is set to a sufficiently high resistance (normally about 10 to 20 times the resistor rb) to limit the base current of the transistor Q1, the transistor Q in FIG.
The input impedance Ri is large compared to the input impedance Ri of 1, which affects the oscillation frequency of the multivibrator, and such a protection circuit is inappropriate.

(d) 発明の目的 本発明の目的は、前述の如き従来あるトランジスタの保
護回路の欠点を除去し、トランジスタの入力インピーダ
ンス等の回路常数に変化を与えること無く、ベースとエ
ミッタとの間に逆バイアスが印加される場合にトランジ
スタの破壊或いは劣化を防止する手段を実現することに
在る。
(d) Purpose of the Invention The purpose of the present invention is to eliminate the drawbacks of conventional transistor protection circuits as described above, and to eliminate the inverse relationship between the base and emitter without changing the circuit constants such as the input impedance of the transistor. The object of the present invention is to realize a means for preventing destruction or deterioration of a transistor when a bias is applied.

(e) 発明の構成 この目的は、トランジスタのベースに順方向に電源電圧
以上の降伏電圧を有する定電圧ダイオードを接続し、且
つベースとエミッタとの間に抵抗を接続することにより
、逆バイアス印加によるトランジスタの破壊劣化を防止
することにより達成される。
(e) Structure of the Invention The purpose of this invention is to apply a reverse bias by connecting a constant voltage diode having a breakdown voltage higher than the power supply voltage in the forward direction to the base of the transistor, and connecting a resistor between the base and the emitter. This is achieved by preventing the destruction and deterioration of transistors due to

即ち本発明によれば、トランジスタのベースとエミッタ
との間に電源電圧に達する逆バイアスが印加された場合
にも定電圧ダイオードにより保護され、且つ定電圧ダイ
オードを含む入力インピーダンスはトランジスタ単体の
場合と殆ど変わらない。
That is, according to the present invention, even if a reverse bias reaching the power supply voltage is applied between the base and emitter of the transistor, the voltage regulator diode protects the transistor, and the input impedance including the voltage regulator diode is equal to that of a single transistor. Almost no change.

(f) 発明の実施例 以下、本発明の一実施例を図面により説明する。(f) Examples of the invention An embodiment of the present invention will be described below with reference to the drawings.

第5図は本発明の一実施例によるマルチバイブレーク回
路を示す図であり、第6図は第5図におけるトランジス
タの等価回路を示す図である。なお、全図を通じて同一
符号は同一対象物を示す。第5図においては、トランジ
スタQ1およびQ2のベースに、それぞれ定電圧ダイオ
ードZDIまたは−ZD2が順方向に接続され、またト
ランジスタQlおよびQ2のベースとエミッタとの間に
それぞれ抵抗R7またはR8が接続されている。第5図
において、トランジスタQlが導通状態、トランジスタ
Q2が遮断状態にあるとすると、コンデンサC2は抵抗
R2を介して充電され、a電極側が電源電圧Vに、b電
極側が地電位Eとなる。一方コンデンサCIも抵抗R3
を介して充電されることによりトランジスタQ2のベー
ス電位が上昇し、トランジスタQ2が導通状態となると
コンデンサC2のa極がトランジスタQ2を介して地電
位Eとなる為、トランジスタQlのベースとエミッタと
の間、および定電圧ダイオードZDIの直列回路にはコ
ンデンサC2の充電電圧(=電源電圧■)が逆バイアス
として印加されることとなる。然し該充電電圧は定電圧
ダイオードZDIの降伏電圧以下である為、前記直列回
路には定電圧ダイオードZDIの漏洩電流のみが流れる
こととなり、トランジスタQ1のベースとエミッタとの
間には該漏洩電流による抵抗R7の電圧降下が逆バイア
スとして印加されることとなり、トランジスタQ1が劣
化する恐れの無い充分低電圧に維持される。
FIG. 5 is a diagram showing a multi-bye break circuit according to an embodiment of the present invention, and FIG. 6 is a diagram showing an equivalent circuit of the transistor in FIG. 5. Note that the same reference numerals indicate the same objects throughout the figures. In FIG. 5, a constant voltage diode ZDI or -ZD2 is connected in the forward direction to the bases of transistors Q1 and Q2, respectively, and a resistor R7 or R8 is connected between the bases and emitters of transistors Q1 and Q2, respectively. ing. In FIG. 5, when the transistor Ql is in a conductive state and the transistor Q2 is in a cut-off state, the capacitor C2 is charged through the resistor R2, and the a-electrode side becomes the power supply voltage V and the b-electrode side becomes the ground potential E. On the other hand, capacitor CI is also resistor R3
When the transistor Q2 becomes conductive, the a-pole of the capacitor C2 becomes the ground potential E through the transistor Q2, so that the base potential of the transistor Q2 increases. The charging voltage of the capacitor C2 (=power supply voltage ■) is applied as a reverse bias to the voltage regulator diode ZDI and the series circuit of the constant voltage diode ZDI. However, since the charging voltage is lower than the breakdown voltage of the voltage regulator diode ZDI, only the leakage current of the voltage regulator diode ZDI flows through the series circuit, and there is a voltage between the base and emitter of the transistor Q1 due to the leakage current. The voltage drop across the resistor R7 is applied as a reverse bias, and the voltage is maintained at a sufficiently low level that there is no risk of deterioration of the transistor Q1.

トランジスタQ2に対しても、定電圧ダイオードZD2
および抵抗R8が同様の効果を発揮する。
Also for transistor Q2, constant voltage diode ZD2
and resistor R8 exhibit a similar effect.

なお例えば定電圧ダイオードZDIおよび抵抗R7を含
むトランジスタQ1の入力インピーダンスRillは(
3)式に示される。
For example, the input impedance Rill of the transistor Q1 including the constant voltage diode ZDI and the resistor R7 is (
3) It is shown in Eq.

Ri”=rd+R7x (rb+ (1+β)re)÷
(R7+rb+(1+β)re) =rd+rb+ (1+β) r e ・+31(但し
rdは定電圧ダイオードZDIの順方向抵抗) (3)式において、抵抗rdは二項以下に対し無視可能
な程小さい為、(4)式が成立する。
Ri”=rd+R7x (rb+ (1+β)re)÷
(R7+rb+(1+β)re) =rd+rb+ (1+β)re ・+31 (where rd is the forward resistance of the constant voltage diode ZDI) In equation (3), the resistance rd is so small that it can be ignored compared to the two terms or less, so Equation (4) holds true.

Ri # Ri ・・・(4) 従って、定電圧ダイオードZDIおよびZn2、並びに
抵抗R7およびR8はマルチバイブレーク回路の発振に
影響を殆ど与えない。
Ri # Ri (4) Therefore, the constant voltage diodes ZDI and Zn2 and the resistors R7 and R8 have little effect on the oscillation of the multi-byte break circuit.

以上の説明から明らかな如く、本実施例によれば、マル
チバイブレータの発振に殆ど影響を与えること無く、ト
ランジスタQ1およびQ2を逆バイアスによる破壊或い
は劣化から保護することが可能となり、電源電圧■に制
限を与える必要が無くなる。桝えば自動交換機に併用さ
れるマルチバイブレーク回路においては、自動交換機の
主電源である直流−48ボルトがその侭電源電圧として
使用可能となり、マルチバイブレーク回路専用の電源を
設ける必要が無(なる。
As is clear from the above description, according to this embodiment, it is possible to protect transistors Q1 and Q2 from destruction or deterioration due to reverse bias, with almost no effect on the oscillation of the multivibrator, and the power supply voltage There is no need to impose restrictions. In other words, in a multi-bye break circuit used in conjunction with an automatic exchange, -48 volts DC, which is the main power supply of the automatic exchange, can be used as the secondary power supply voltage, and there is no need to provide a power supply exclusively for the multi-bye break circuit.

なお、第5図および第6図はあく迄本発明の一実施例に
過ぎず、例えば本発明の対象となるトランジスタ回路は
マルチバイブレーク回路に限定されることは無く、他に
幾多の変形が考慮されるが、何れの場合にも本発明の効
果は変らない。
Note that FIGS. 5 and 6 are only one embodiment of the present invention, and for example, the transistor circuit to which the present invention is applied is not limited to a multi-bye break circuit, and many other modifications may be considered. However, the effects of the present invention do not change in either case.

(gl 発明の効果 以上、本発明によれば、トランジスタの入力インピーダ
ンス等の回路常数に変化を与えること無く、トランジス
タを逆バイアスの印加による破壊或いは劣化から保護す
ることが可能となる。
(gl) Effects of the Invention As described above, according to the present invention, it is possible to protect a transistor from destruction or deterioration due to application of a reverse bias without changing circuit constants such as the input impedance of the transistor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来あるマルチバイブレータ回路の一例を示す
図、第2図は第1図におけるトランジスタの等価回路を
示す図、第3図は従来あるマルチバイブレーク回路の他
の一例を示す図、第4図は第3図におけるトランジスタ
の等価回路を示す図、第5図は本発明の一実施例による
マルチバイブレーク回路を示す図、第6図は第5図にお
けるトランジスタの等価回路を示す図である。 図において、aおよびbはコンデンサの電極、C1およ
びC2はコンデンサ、DIおよびD2はダイオード、E
は地電位、R1乃至R8は抵抗、QlおよびQ2はトラ
ンジスタ、■は電源電圧、ZDIおよびZn2は定電圧
ダイオード、を示す。 隼 ! 因 #2因 革3図 集4図 第6図 第にじ
FIG. 1 is a diagram showing an example of a conventional multivibrator circuit, FIG. 2 is a diagram showing an equivalent circuit of the transistor in FIG. 1, FIG. 3 is a diagram showing another example of a conventional multivibrator circuit, and FIG. 5 is a diagram showing an equivalent circuit of the transistor in FIG. 3, FIG. 5 is a diagram showing a multi-bye break circuit according to an embodiment of the present invention, and FIG. 6 is a diagram showing an equivalent circuit of the transistor in FIG. 5. In the figure, a and b are capacitor electrodes, C1 and C2 are capacitors, DI and D2 are diodes, and E
indicates a ground potential, R1 to R8 are resistors, Ql and Q2 are transistors, ■ is a power supply voltage, and ZDI and Zn2 are constant voltage diodes. Hayabusa! Cause #2 Cause and Revolution 3 Figure Collection 4 Figure 6 Rainbow

Claims (1)

【特許請求の範囲】[Claims] トランジスタのベースに順方向に電源電圧以上の降伏電
圧を有する定電圧ダイオードを接続し、且つベースとエ
ミッタとの間に抵抗を接続することにより、逆バイアス
印加によるトランジスタの破壊劣化を防止することを特
徴とするトランジスタの保護回路。
By connecting a constant voltage diode with a breakdown voltage higher than the power supply voltage in the forward direction to the base of the transistor, and connecting a resistor between the base and emitter, it is possible to prevent the transistor from being destroyed or deteriorated due to reverse bias application. Characteristic transistor protection circuit.
JP7943184A 1984-04-20 1984-04-20 Protection circuit of transistor Pending JPS60236513A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7943184A JPS60236513A (en) 1984-04-20 1984-04-20 Protection circuit of transistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7943184A JPS60236513A (en) 1984-04-20 1984-04-20 Protection circuit of transistor

Publications (1)

Publication Number Publication Date
JPS60236513A true JPS60236513A (en) 1985-11-25

Family

ID=13689686

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7943184A Pending JPS60236513A (en) 1984-04-20 1984-04-20 Protection circuit of transistor

Country Status (1)

Country Link
JP (1) JPS60236513A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54114164A (en) * 1978-02-27 1979-09-06 Teac Corp Free running multivibrator

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54114164A (en) * 1978-02-27 1979-09-06 Teac Corp Free running multivibrator

Similar Documents

Publication Publication Date Title
US4151425A (en) Voltage sequencing circuit for sequencing voltages to an electrical device
US4319179A (en) Voltage regulator circuitry having low quiescent current drain and high line voltage withstanding capability
JPH10163423A (en) Static electricity protecting circuit
US10511262B2 (en) High speed, high voltage, amplifier output stage using linear or class D topology
US5568345A (en) Overvoltage protection circuit
US4808845A (en) High voltage pulse generating semiconductor circuit with improved driving arrangement
US5031066A (en) DC isolation and protection system and circuit
GB2070876A (en) Latch-up prevention circuit for power output devices using inductive loads
US5157571A (en) Circuit arrangement for protecting an input of an integrated circuit fed from a supply voltage source from overvoltages
JPS60236513A (en) Protection circuit of transistor
TW478230B (en) Overvoltage protector
US4339669A (en) Current ramping controller circuit
JPH02117211A (en) Semiconductor device
US4068278A (en) Overload protection circuit for amplifiers
JPS61176205A (en) Operational amplifier
US3989997A (en) Absolute-value circuit
JP2563259B2 (en) Switching circuit
US4977340A (en) Device for protecting an electrical circuit against interference pulses
US4096400A (en) Inductive load driving amplifier
KR20030048040A (en) Charge pump circuit
US4347482A (en) Amplifier equipped with circuit for preventing electrostatic breakdown
US4240042A (en) Bandwidth limited large signal IC amplifier stage
JPH0127286Y2 (en)
JPH0555839A (en) Semiconductor integrated circuit
JPS62109296A (en) Transistor circuit