JPS60234288A - Evaluation system of magnetic bubble memory - Google Patents

Abstract

PURPOSE:To detect the access frequencies and error generating frequencies up to the generation time of an error in relation to the error generating positions when an error occurs or a test is through, by using a system control means to monitor the ambient temperatures and the power supply voltage of a memory device. CONSTITUTION:The working ambient conditions of a magnetic bubble memory MBM101 are set according to an indication given from a system control means 140. The inside temperature of a cooling tank 123 is controlled toward a target level by a refrigerator 122 of a temperature control means 120. The output signal of a temperature detecting element 124 is sent to the means 140 and displayed through an A/D converter 126. When a target level of temperature is set at a voltage control part 131 of a power supply voltage control means 130, the output voltage of a DC power supply device 132 is controlled toward a target level. The output of a voltage detecting element 134 is sent to the means 140 and displayed 143 via an A/D converter 136. The means 140 detects the error positions and access frequencies up to the error generation of the MBM101 and displays 143 and points 144 or types 147 them.

Description

Detailed Description of the Invention (Industrial Application Field) The present invention provides a method for changing the operating environment of a magnetic bubble memory board or a memory device mounted with the same, such as the ambient temperature and the power supply voltage used, and The present invention relates to a magnetic puzzle evaluation system that automatically measures whether a read/write operation for test data in a device is correctly executed.

(Problems with the prior art) Conventional magnetic bubble memories (hereinafter abbreviated as MBM) have been evaluated using a memory exerciser that executes the "AIJ operation" in the MBM and compares read data with written data. The number of accesses from the start of the W operation until the time an error occurred, or the number of errors occurring and the position of error occurrence after a certain number of accesses, were output and used as reliability data.

In such MBM evaluation, there is a problem in that it is difficult to analyze the cause of error occurrence, and it is suspected under what operating environment the error occurred.

In particular, since MBM is accompanied by a temperature rise as it operates,
The operating temperature of the MBM cannot be determined simply by placing the M device in an inexpensive constant temperature layer. The power supply voltage is also cheaperC
If only a power supply device is used, the power supply voltage supplied to the MBM makes it difficult to analyze changes in load.

Considering this, conventional MBM evaluation systems, in addition to memory exercisers, are capable of keeping the temperature and power supply voltage stable for a long time at set values, and are
This required an expensive thermostat with an air conditioner that could be changed at high speed, and a DC power supply with a programmable controller.

In addition, when the cause of an error is not clear from the evaluation data it outputs, the memory exerciser uses a large computer to process the measurement data obtained by successively changing the operating environment into evaluation data that indicates the cause of the error. It was necessary to borrow the processing power of This also applies to conventional MB
M's evaluation system is expensive and evaluation data processing.

It increased the time and made the system difficult to use.

Therefore, commercially available memory exerciser (semiconductor LSI)
The conventional bubble evaluation system, which is based on a tester that can also be used to evaluate memory, requires an expensive constant temperature bath, DC power supply, and backup of a large computer, making it expensive.

(Objective of the present invention) The present invention solves the above-mentioned defects, and its purpose is to sample and store detection data of the MBM operating environment during the test period, and when an error occurs or the test ends. The purpose is to provide an evaluation technique that can output the number of accesses until an error occurs, the number of errors occurring, and the position of error occurrence in a single digit.

Another object of the present invention is to provide a technique for realizing a thermostatic chamber at a low cost and a technique for monitoring output signals of a large number of operating environment detection elements.

Therefore, according to the present invention, the following magnetic bubble evaluation system freezes. That is, a bubble operation control means that controls the interface between the magnetic bubble memory and the external system;
Temperature control means including a thermostat containing a magnetic bubble memory and one or more temperature detection elements; a temperature control means containing an air conditioner for the thermostatic oven; power supply control means containing a DC power supply and one or more voltage detection elements; The control means is connected to W via the data bus.
1. A magnetic bubble memory evaluation system, comprising: a system control means for controlling the temperature detection element and the voltage detection element, said system control means monitoring outputs of said temperature detection element and said voltage detection element at least during a test period.

The following is a more detailed explanation of the present invention 5- with reference to the drawings. Do this.

(Detailed Description of the Invention) FIG. 1 shows one embodiment of the present invention and is a block diagram of a system. A magnetic bubble memory (MBM) 101 including a magnetic bubble memory device 104 and its peripheral circuit 105 includes a control data input/output circuit 102 having registers and decoders.
Bubble operation control means 100 comprising test data input/output means 103 having a DMA function is connected to system control means 140 via a data bus 110.

MBMIOI is a cooling tank 123 in the temperature control means 120
The internal temperature of the cooling tank 123 is the same as that of the refrigerator 12.
Adjusted by 2. By giving the target value to the temperature control section 121, the internal temperature is set to the target value. Magnetic bubble memory device 104 inside cooling bath 123
The operating temperature of the converter 1 is detected by the temperature detection element 124, and the operating temperature of the converter 1 is detected one by one via the switching selection circuit 125.
26 into a digital signal. It is assumed that the switching selection circuit 125 is subject to sequence control 6- of the temperature control section 121.

The reason why the cooling bath 123 is used instead of a constant temperature bath for the MBMIOI is that the peripheral circuit 105 and the magnetic bubble memory device 104 of the MBMIOI are heat generating elements. That is, if the refrigerator 122 is not operated, the internal temperature of the cooling tank 123 rises to several tens of degrees.

Therefore, by controlling the period during which the refrigerator 122 is turned on, the internal temperature can be set to the target value.

The power supply voltage control means 130 supplies the power supply voltage presented from the system control means 140 to the MBMIOl using the voltage control section 131 and the DC power supply device 132. Although the voltage detection element 134 is shown as being located outside the cooling tank 123 in FIG. Connected to each power supply voltage terminal. The outputs of this voltage detection element 134 are converted one by one into digital signals by an A/1) converter 136 via a switching selection circuit 135. It is assumed that the switching selection circuit 135 is subject to sequence control by the voltage control section 131.

The system control means 14o is a microcomputer 141
, keyboard 142, display 143
, a printer 144, a file memory 145, a main memory 146, and a plotter 147. keyboard 142
Specifies the operating environment conditions for MBMIOl, and specifies a test program. The display 143 is used to display test results and confirm test conditions. Printer 144 and plotter 147 are used to type out test results. File memory 145 and main memory 146
is used to store test programs, test conditions, and test results.

(Explanation of operation) The test operation of a magnetic bubble memory system configured as shown below is described below. First, magnetic bubble memo IJ (M
BM) The operating environment conditions of 101 are the system control means 14.
It is set according to the instructions from 0. In the embodiment shown in FIG. 1, the internal temperature of the cooling tank is specified first, and then the power supply voltage is specified. That is, when a target value is set in the temperature control unit 121 in the temperature control means 120, MBMIOl is tested.

Regardless of whether the refrigerator 122 is present or not, the internal temperature of the cooling tank 123 moves toward the target value due to the function K of the refrigerator 122. The output signals of the plurality of temperature detection elements 124 are sent to the system control means 140 via the width converter 126 only during the test period when the MBMIOI operates. The measured temperature is sampled and stored at regular intervals during the test period, and is displayed or displayed when an error occurs, and at the end of the test as data indicating the change in the operating temperature of the magnetic bubble memory device 104 during the test period. Typed out or displayed. Furthermore, K can also be used to indicate the target value of the internal temperature of the cooling tank 123 during the next test based on the measurement result of the operating temperature. Note that the switching selection circuit 125 is introduced to save the high precision '/D converter 126, and can be realized by a reed relay switch.

On the other hand, the voltage control section 131 in the power supply voltage control means 130
When the target value is set, the output voltage of the DC power supply 132 (for example, ±5V, ±12V, ±24V).

9-40V, etc.) gradually move toward the target value. Voltage detection element 13
The output signal No. 4 is sent to the system control means 140 via the power converter 136 only during the test period when the MBM is in operation. The actually measured power supply voltage is sampled at regular time intervals during the test period and stored in the main memory 146 or file memory 145. This data may be typed out from printer 144 or displayed on display 1 in the event of an error.
43 is displayed. Further, at the end of the test, data is typed out or displayed as data indicating changes in the power supply voltage applied to the MBMIQ1 peripheral circuit 105 during the test period. This data will be applied to the DC power supply 13 during the next test.
It can be used to indicate the target value of the power supply voltage to 2. Note that the switching selection circuit 135 is used for the same purpose as the switching selection circuit 125 and is implemented in the same manner.

Temperature control means 120 and power supply voltage control means 13 in Motosugi Akira
0 controls the operating environment instructed by the system control means 140 to a certain extent, but it places more emphasis on sending data indicating changes in the operating environment to the system control means 140.

After preparations for setting and monitoring the operating environment conditions are completed, the test operation is executed via the bubble operation control means 100 according to instructions from the system control means 140. The bubble operation control means 100 consists of a control data input/output means 102 and a test data input/output means 103, the former being used for passing commands instructing the operation of MBMIol, and the latter
It is used for passing test data written to MBMIOl and data read from MBMIOl.

The system control means 140 discovers the error location by comparing the read data and write data of each address of MBMIOl, and records the number of accesses until the error occurs or the number of errors for a fixed number of accesses together with the error location information, based on changes in the operating environment. The data is stored in the main memory 146 in correspondence with the data shown. The memorized contents will be displayed on display 1 as the test result when an error occurs or when the test ends.
43, printer 144 or plotter 147
It's typed out.

Execution of such test operations by the system control means 140 and processing of test results are easily executed by the microcomputer 141.

FIG. 2 shows an example of test results output by the magnetic nomipul evaluation system of the present invention. The first column 210 from the left end of the test results in table format shows the number of accesses from the start of the test until the error occurred, the second column 220 shows the address of the data that caused the error, and the third column 230 shows the error. The position of the error bit in the data is shown in the fourth column 24.
0, the fifth column 250, and the sixth column 260 are the power supply voltages V, , V, , VB used by MBMIOl, and the seventh column
Column 270 gives the operating temperature T of the magnetic bubble memory device 104 in MBMIO1 or the temperature in the immediate vicinity of the device.

According to the test results in this table, each time an error occurs, the power supply voltage and operating temperature at that time are specified in columns 4 to 7, so it is easy to infer the causal relationship between the error occurrence event and the operating environment. .

This makes it possible to confirm whether the error occurred due to a momentary fluctuation in the power supply voltage or a change in operating temperature caused by stopping the operation of the MBMIOl to output the test result.

The features of the embodiment of the present invention shown in FIG. 1 can be summarized as follows. First, the ambient temperature and power supply voltage of the MBMIOl move toward the target value according to instructions from the system control means 140, but the test can be started even if the temperature is not close enough to the target value. Data indicating changes in the temperature is monitored and stored in correspondence with information on the error position and time of occurrence, and since MBMlol is a heating element, the ambient temperature can be controlled inexpensively using a cooling tank (a type of refrigerator). The point is that an inexpensive female switching selection circuit is introduced that allows an expensive A/P converter to be shared by many detection elements even if changes in the operating environment of the MBMIOl are to be detected at as many observation points as possible.

The first feature is that the temperature and voltage control device can be small and economical, and the waiting time for setting the temperature to the target value can be shortened. The second feature facilitates analysis of the causes of errors.

13- The third and fourth features reduce the hardware cost included in the evaluation system.

It is preferable to start the test even if the temperature and voltage do not match the target values because such a situation can occur during actual use and allows for more practical evaluation.

(Effects of the Invention) As stated above, according to the present invention, it is possible to easily solve the defects that make it difficult to analyze the causes of errors in the evaluation of conventional magnetic bubble memories, and to greatly reduce the hardware cost of the evaluation system. It can be seen that the width can be reduced significantly.

In addition, in the above description of the embodiment, it has been explained that the system control means 140 is based on a microcomputer, but it may also be a minicomputer, and the above description does not limit the scope of the claims of the present invention. isn't it.

[Brief explanation of the drawing]

FIG. 1 is an explanatory diagram of an embodiment of the present invention, and FIG. 2 is a diagram showing an example of displaying test results according to the present invention. In FIG. 1, 100...bubble operation control means, 1
01...Magnetic Bubble Memo IJ (MBM), 102
...Control data input/output means, 103...Test data input/output means, 104...Magnetic bubble memory device, 105...Peripheral circuit, 110...Data bus, 12
0...Temperature control means, 121...Temperature control section, 12
2... Refrigerator, 123-- Cooling tank, 124... Temperature detection element, 125, 135... Switching selection circuit, 12
6°136...~width converter, 130... Power supply control means, 131... Voltage control unit, 132... DC power supply device, 134... Voltage detection element, 140... System control means, 141...Microcomputer, 1
42...Keyboard, 143...Display, 1
44--Printer, 145--File memory, 1
46... Main memory, 147... Plotter. In FIG. 2, 210...first column, 220...second column, 230...third column, 240...fourth column, 250...fifth column, 260...second column Column 6, 27
0... Xu 1 figure

Claims (3)

[Claims] (1) a bubble operation control means that controls the interface between the magnetic bubble memory and an external system; a temperature control means that includes a thermostatic chamber including a magnetic bubble memory and one or more temperature detection elements; and an air conditioner for the thermostatic chamber; A DC power supply device, a power supply control means including one or more voltage detection elements, and a system control means for managing the above three control means via a data bus. A magnetic bubble memory evaluation system characterized in that the output of the voltage detection element is monitored by the system control means. (2) The constant temperature chamber and evaluation system included in the temperature control means. (3) The output signals of the plurality of temperature detection elements and the plurality of voltage detection elements are connected to the switching selection circuit.