JPS60214150A - Test method of data access unit - Google Patents

Abstract

PURPOSE:To test simply a data access unit (DAU) installed decentralizingly by utilizing a folded loop circuit incorporated in the DAU and transmitting a test data from a data subscriber line of an exchange. CONSTITUTION:An output terminal to a data terminal equipment DTE of an interface INT in the DAU is connected to an input terminal from the DTE so as to form a folded loop circuit and connected to a data subscriber circuit DLC via a main distribution fitting MDF of an exchange side. Then a test data is set to a transmission register REGt of the DLC, and this data is transmitted via a transmission selector SELt, a transmission section T and a transmission section L. The DAU receives the data, folded by the folded loop circuit formed in the INT and the test data is transmitted to the EX side from a LINE-T line termination section. The DLC stores it to a reception register REGr via a reception R and a reception selector SELr, the test data stored in the REGt and the data of the REGr are compared so as to decide the propriety of the DAU.

Description

Detailed Description of the Invention (a) 1 Technical Field of the Invention The present invention includes a data access unit that can connect a data subscriber circuit that transmits digital signals and various data terminals such as the V series specified by CCITT. The present invention relates to a test method for simplifying the construction test of data access units in electronic exchanges.

(b), Technology background Recently, there has been an increasing trend to connect data terminals to electronic exchanges, and from the international standard C1- by CCITT, V213 (20Kbit/s), VIO (1
00Kbit/s), Vll (10Kbit/s)
Data terminals that meet standards such as V35 and V35 (4 bits/s) have been developed and are in use, and for this reason, many data access units are being used to connect various data terminals to the electronic exchange C12. Rusama Otokona-
, I came.

ic), Prior Art and Problems FIG. 1 shows an example of a block diagram of a data access unit.

In the figure, DΔU is a data access unit, IN1' is an ink transfer unit with data terminal DTE,
is the signal processing section, LINE-1" is the line termination section, CON
T is a control unit.

i) A (1 is an interface with a connection function with the data terminal DTE, an interface with the connection function with the electronic exchange EX
Line termination section LINE-T, other month processing section I) ROl
and a control unit C0NT, the data terminal 1) i
't: has the role of connecting the electronic exchanger EX.

When testing such a system, traditional electronic exchange E
Most of the X tests were tests up to the main distribution board (MD) in the station.

On the other hand, on the data terminal SONG f) 'f' i8 side, the ink cartridge (SIN T) in the data access unit DAIJ is
As shown by the dotted line inside, the data terminal D"FE receives its own transmission data via the above-mentioned (return switch circuit), and combines this received data with the transmission (
Test L' was obtained by comparing the data.

Also, data access Unisol l-i) A LJ's test is the data terminal D TE of the interface INT? The corresponding output terminal is connected to the input terminal from the data terminal I) TE, and the output terminal for the electronic exchange EX of the line termination section +-I N E-T is connected to the input terminal from the electronic exchange 1iEX. Let's do a repeat test in our own device.

According to the conventional method, the data access unit hDAtJ connected to the data terminal DT) is installed in a distributed location away from the main body of the electronic exchange, so the two-way test is carried out in about 6 regions. This has the disadvantage that it becomes very complicated.

(d) 7 Object of the Invention The object of the present invention is to eliminate the drawbacks of the prior art described in (1) and (1) above, and to improve the testing of data access units installed in a distributed manner by using NGZ control of data subscriber circuits. It is an object of the present invention to provide a method for testing a 3D probe and a throat, which can be easily carried out by using control signals.

(e)0 The object of the present invention is to provide an electronic exchange equipped with a data access unit capable of connecting various data terminals to a data subscriber circuit point for transmitting digital data. Using the foldback 1-floop circuit built in the data access uni node, test data is sent from the data subscriber circuit of the exchange, and the data access uni 1-floop circuit is used to transmit test data from the data subscriber circuit of the exchange. This is achieved by providing a method for testing a data access unit that compares it with the test data returned from a computer.

Also, by using the return loop circuit built in each data access unit, 5 sends test data from the data subscriber circuit of the exchange to the first data access unit;
The return loop circuit receives the test data sent back from the first data access unit, sends the test data to the second data access unit, and the return loop circuit receives the test data sent back from the first data access unit. G receives the test data sent back from Xeno and Uni-Nodo, and compares the received test data with the first sent test data by repeating this operation one by one. This is achieved by providing a data access Unison I test method.

That is, according to the present invention, in an electronic exchange equipped with a data access unit that can connect a data subscriber circuit that transmits digital signals and a data terminal, a means is provided for not looping back the circuit that transmits digital signals and the data access unit. Gno, the data subscriber circuit to which the data access uni node is connected? ) The data access unit 71 can be easily accessed by sending and receiving control signals for call control several times.
- Since the function of - can be tested, it has the effect of being able to perform a simple and reliable test.

(f) 1 Examples of the invention FIG. 2 is a schematic diagram showing an embodiment according to the present invention.

In the diagram, LINE is the communication line, MDF is the main distribution board, and DLC
is a data subscriber circuit, LPR is a processor, L is a transmitting section, T is a transmitting section, R is a receiving section, 5ELt is a transmitting side selector, 5ELr is a receiving side selector, REGt and REGr are respectively a transmitting register and a receiving register, and CC is a receiving register. The central control unit, NW, is a network.

The present invention will be described in detail below with reference to the drawings. As shown in the figure, the data access unit DAU is connected to the exchange EX via a communication line LINE. In the exchange EX, the signal first passes through the main distribution board MDF and enters the data subscriber circuit DLC. The data subscriber circuit DLC is surrounded by a chain line in FIG. 2, and is controlled by the processor LPR, and performs data transmission in response to instructions from the central controller CC.

According to the present invention, first, the output terminal of the ink face INT in the data access unit DAU for the data terminal DTE is connected to the input terminal from the data terminal DTE to form a return loop circuit, and then the test data is transferred to the transmission register REGt. is set, and this test data is sent out via the transmitter selector 5ELt, the transmitter T, and the transmitter. The data access unit DAU receives this test data according to the normal data transmission procedure, loops it back through the return loop circuit created in the ink face INT, and transfers the test data from the LINE-T line terminal to the exchanger EX side. Send to.

The data subscriber circuit DLC on the exchange EX side operates as a transmitter according to the normal data transmission procedure, and stores the test data in the reception register REGr via the receiver R1 and the receiver selector 5ELr.

Next, the test data stored in the transmission register REGt and the data stored in the reception register REGr are compared, and if they match, it is determined that the device is operating normally.

FIG. 4 is a schematic diagram showing an embodiment in which two data access units are used.

In the figure, D A Uo and D A U 1 are the data access unit of the #0 line and the data access unit of the #1 line, respectively, and DLCo -DLC+ are the data subscriber circuit of the #0 line and the data subscriber circuit of the #1 line, respectively. It is a circuit.

In this case, as in the previous explanation, first, in the data access units DA Ua and DAUI, the output terminal of the ink face INT for the data terminal DTE is connected to the input terminal from the data terminal DTE, and a loop circuit is formed respectively. make. Next, the central controller CC drives the data subscriber circuit D L Co. That is, it controls the processor LPR in the data subscriber circuit DLCa to set test data in the transmission register REGt, and sends out the test data via the transmitter selector 5ELt, the transmitter T, and the transmitter. . Data access unit DA
U o receives this test data according to the normal data transmission procedure, loops it back through the return loop circuit created in the ink face INT, and sends the test data from the LINE-T line terminal to the exchange EX side. .

The data subscriber circuit DLCo on the exchange EX side transmits the test data to the data subscriber circuit DLC+ via the network NW via the transmitter L, the receiver R1 and the receiver selector 5ELr according to the normal data transmission procedure. input.

The data subscriber circuit DLC+ inputs the received test data to the transmitter selector 5ELt, and sends it to the data access unit DAU via the transmitter T and the transmitter. The data access unit D AU + receives this test data according to the normal data transmission procedure, loops it back through the loop circuit created in the interface INT, and sends the test data from the LINE-T line terminal. Send it to the exchange EX side.

The data subscriber circuit DLC+ on the exchange EX side transmits data according to the normal data transmission procedure, stores the test data in the receiving register REGr via the receiving section R1 and the receiving side selector 5ELr, and sends the data to the central controller CC1. Send-
do.

The central control unit CC is connected to the data access/R circuit D.
The test data sent to I-co and the data subscriber circuit 1) The test data sent from LC is stopped and transferred.
-7 people 1-2 match and 2", it is determined that the device is operating normally.

fg) Effect of invention 31-! According to the present invention, the minute 1
By using the control signals for ITJ' control of the data subscriber circuit to test the data access unit that is installed as a single unit, it is possible to easily test the data access unit. It has a big effect.

[Brief explanation of the drawing]

FIG. 1 is a schematic diagram of a data access unit according to an embodiment of the present invention, and FIG.
FIG. 2 is a schematic diagram showing an embodiment in which a data access controller I is used. In the figure, D A IJ is data access unit 1-1I
NT is a data terminal with DTI type, influenza, PR
○ is the signal processing part, LINE-T is the concave line terminal part,
0ONT is a control unit, 1. , I N ) E' is a communication line, M I) l-" is an il Y vA board, D L Cil
-, r 3' JJII enter M [jl aR1■-
1P R haburosesosa, L is the transmission section, '1゛ is the transmission section,
I is the receiving section, SELt is the transmitting side-Lζrec,
S FCI, ■ is the receiver 11° side selector, RKGt,, R
卜：(JT is the tempo sending register, reception 1/sisk, C
C is the central control unit, NW is the
o, D A U 1 is 2 μm. Line data access 1, Sunit, # ■ times kW (data access, node, DI-5C11, DL, CI
The number of data subscriber circuits is approximately 410, and the number of subscriber circuits is #1. Chilled/cold 3K

Claims (1)

[Claims] 1. In an electronic exchange equipped with a data access unit capable of connecting a data subscriber circuit that transmits digital signals and various data terminals, a return loop circuit built in the data access unit is used, A method for testing a data access unit, characterized in that test data is sent from a data subscriber circuit of the exchange and compared with the test data returned from the data access unit by the return loop circuit. 2. In an electronic exchange equipped with multiple data access units that can connect data subscriber circuits that transmit digital signals and various data terminals, the exchange The test data is sent from the data subscriber circuit to the first data access unit, the test data returned from the first data access unit is received by the return loop circuit, and the test data is transmitted to the second data access unit via the network. The test data is sent to the second data access unit, the return loop circuit receives the test data returned from the second data access unit, and the ratio is successively manipulated to combine the received test data and the test data sent first. The method described in claim 1 is characterized in that the test data is compared with the test data.