JPS60198747A - Vertical conveyor for wafer in vacuum - Google Patents

Vertical conveyor for wafer in vacuum

Info

Publication number
JPS60198747A
JPS60198747A JP5359984A JP5359984A JPS60198747A JP S60198747 A JPS60198747 A JP S60198747A JP 5359984 A JP5359984 A JP 5359984A JP 5359984 A JP5359984 A JP 5359984A JP S60198747 A JPS60198747 A JP S60198747A
Authority
JP
Japan
Prior art keywords
wafer
vertical
substrate holder
wafers
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5359984A
Other languages
Japanese (ja)
Inventor
Yoshiyuki Mihashi
善之 三橋
Toshiaki Fujioka
藤岡 俊昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ulvac Inc
Original Assignee
Ulvac Inc
Nihon Shinku Gijutsu KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ulvac Inc, Nihon Shinku Gijutsu KK filed Critical Ulvac Inc
Priority to JP5359984A priority Critical patent/JPS60198747A/en
Publication of JPS60198747A publication Critical patent/JPS60198747A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67748Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67751Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Manipulator (AREA)

Abstract

PURPOSE:To carry a wafer without contaminating the surface of the wafer under a vertical state by mounting a vertical wafer gripping section having a pawl connected to the outer circumferential section of the wafer and an operating piece operating a wafer holding mechanism for a substrate holder to the nose of a wafer transfer arm. CONSTITUTION:A substrate holder mechanism 7 is mounted into a process chamber 4. A wafer lifting gear 8, a wafer transfer arm 10, a nose thereof has a wafer vertical gripping section 9, a wafer carrier 11 and a carrier pitch-feed mechanism 12 are fitted into a spare chamber 5. Wafers in the wafer carrier 11 are transferred in the vertical direction in succession by the wafer lifting gear 8. The wafer lifting gear 8 has an arcuate wafer receiving section 8a reciving the lower sections of the outer circumferential sections of the wafers, and is moved vertically so as to transport the wafers in the vertical direction. The wafer vertical gripping section 9 mounted to the nose of the arm 10 has a plurality of pawls 13 connected to the outer circumferential sections of the wafers and an operating pin 16 cooperating with a wafer holding mechanism 15 for a substrate holder 14.

Description

【発明の詳細な説明】 本発明はエツチング装置やスパッタリング装置の真空プ
ロセス装置におけるウェハの垂直搬送装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a vertical wafer transfer device in a vacuum process device such as an etching device or a sputtering device.

〔発明の技術的背景およびその問題点〕一般に、ウェハ
を取扱う際には、゛機械系の摺動部等の可動部から発生
するダストがウニ八表面に付着しないようにウェハ搬送
系の設計上、機構の空間上のレイアウトが重要な問題と
なる0この九め、・ウェハの搬送前或いは搬送途中で表
裏を反転してウェハ処理面を下向きとして搬送する方法
やウェハを垂直にした状態で搬送する方法が考えられる
。前者の方法では搬送機構が複雑となったり、また比較
的大′p5カ径のウェハでは表裏反転のため搬送系に相
当な空間が心壁とされる。一方後者の方法としてはドラ
イエツチング装置において真空チャックを利用して基板
ホルダに対して大気中で垂直に搬蓬するものや添附回向
の第1図に示すようにウェハ1を回転移送ロータ2によ
って摺動案内部部材6に沿って搬送するスパッタリング
装置のウェハ搬送装置がある。しかしこの方式ではウェ
ハ1が摺動案内部材3に接触摺動するため搬送系内にダ
ストを発生させやすく、またウェハ1の両面を処理する
場合には摺動案内側の面にダストによる汚染中指動接触
によるきすが付きやすいため使用できない。
[Technical background of the invention and its problems] In general, when handling wafers, it is important to take care in the design of the wafer transport system to prevent dust generated from moving parts such as sliding parts of the mechanical system from adhering to the surface of the wafer. , The spatial layout of the mechanism is an important issue. 9th point: ・ Before or during the transfer of the wafer, the wafer is turned over and transferred with the wafer processing side facing downwards, or the wafer is transferred vertically. There are ways to do this. In the former method, the transport mechanism becomes complicated, and in the case of a wafer having a relatively large diameter, a considerable space is required as a core wall in the transport system because the wafer is turned over. On the other hand, the latter method uses a vacuum chuck in a dry etching apparatus to transport the wafer vertically to the substrate holder in the atmosphere, or as shown in FIG. There is a wafer transport device for a sputtering device that transports a wafer along a sliding guide member 6. However, in this method, the wafer 1 slides in contact with the sliding guide member 3, which tends to generate dust in the transport system, and when processing both sides of the wafer 1, the surface on the sliding guide side is contaminated with dust. It cannot be used because it is prone to scratches due to dynamic contact.

〔発明の概要〕[Summary of the invention]

そこで本発明の目的は、真空中においてウェハキャリア
と基板ホルダとの間でウェハを垂直状態でしかもウニへ
表匍の実質的に汚染なしに搬送できるウェハ垂直搬送装
置、を提供することにある。
SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a vertical wafer transfer device that can transfer a wafer vertically between a wafer carrier and a substrate holder in a vacuum without substantially contaminating the surface of the wafer.

この目的を達成するために、本発明による真空中のウェ
ハ垂直搬送装置は、ウェハを垂直方向に上下させるウェ
ハ昇降装置、ウェハ保持機構を備えた基板ホルダ、およ
びウェハ昇降装置と基板ホルダとの間で往復動でき、上
記ウェハ昇降装置で持上げられたウェハの外周部に係止
する爪と基板ホルダのウェハ保持機構を作動する作動子
とをもつウェハ垂直握持部を先端に装着したウェハ移送
アームから成シ、ウェハを常に垂直の状態で搬送できる
ようにしたことを特徴としている。
To achieve this objective, the wafer vertical transfer device in vacuum according to the present invention includes a wafer lifting device that vertically moves the wafer up and down, a substrate holder equipped with a wafer holding mechanism, and a link between the wafer lifting device and the substrate holder. a wafer transfer arm equipped with a wafer vertical gripping part at its tip, which can reciprocate with the wafer lifting device, and has a claw that locks on the outer periphery of the wafer lifted by the wafer lifting device and an actuator that operates the wafer holding mechanism of the substrate holder; It is characterized by the ability to transport wafers in a vertical position at all times.

〔発明の実施例〕[Embodiments of the invention]

以下、添附図面の第2〜4図を参照して本発明の一実施
例について説明する。
Hereinafter, one embodiment of the present invention will be described with reference to FIGS. 2 to 4 of the accompanying drawings.

第2図には本発明によるウェハ垂直搬送装置を備えた真
空プロセス装置を示し、4はプロセス室、5は予備室で
これらの室の間には仕切バルブ6が設けられている。プ
ロセス室4内には基板ホルダ機構7が示されている。ま
た予備室5内にはウェハ昇降装置8および先端にウェハ
垂直握持部9を備えたウェハ移送アーム10が示されて
おシ、このウェハ移送アーム10はウェハ昇降装置8に
相対した位置とプロセス室4内の基板ホルダに相対した
位置との間で仕切バルブ6の開放による開口部を通って
往復動するように構成されている。そして予備室5には
ウェハキャリア11およびキャリアピッチ送シ機構12
が取付けられている。
FIG. 2 shows a vacuum processing apparatus equipped with a wafer vertical transfer device according to the present invention, in which numeral 4 is a process chamber, 5 is a preliminary chamber, and a partition valve 6 is provided between these chambers. A substrate holder mechanism 7 is shown within the process chamber 4 . Also shown in the preliminary chamber 5 is a wafer lifting device 8 and a wafer transfer arm 10 equipped with a wafer vertical gripping portion 9 at its tip. It is configured to reciprocate between a position in the chamber 4 and a position opposite to the substrate holder through an opening formed by opening of the partition valve 6. The preliminary chamber 5 includes a wafer carrier 11 and a carrier pitch feed mechanism 12.
is installed.

ウェハキャリア11内のウェハは第3図に示すようにウ
ェハ昇降装置8によって順次垂直方向に移送される。ウ
ェハ昇降装置8#′i、ウェハの外周部の下方部分を受
ける円弧状のウェハ受は部8aを備え、ウェハを垂直方
向に移送するように上下に動くようにされる。ウェハ移
送アーム10の先端に取付けられたウェハ垂直握持部9
はウェハの外周部に係止する複数個の爪16および基板
ホルダ14のウェハ保持機構15(第4図〕と共動する
作動ピン16を備えてお)、各爪13体開閉できまた作
動ピン16はその軸線方向に動くようにされる。
The wafers in the wafer carrier 11 are sequentially transferred vertically by the wafer lifting device 8, as shown in FIG. The wafer elevating device 8#'i, an arcuate wafer receiver for receiving the lower part of the outer circumference of the wafer, has a portion 8a and is configured to move up and down so as to vertically transfer the wafer. Wafer vertical grip part 9 attached to the tip of the wafer transfer arm 10
is equipped with a plurality of claws 16 that lock onto the outer periphery of the wafer and an actuation pin 16 that cooperates with the wafer holding mechanism 15 (FIG. 4) of the substrate holder 14. Each of the claws 13 can be opened and closed, and the actuation pin 16 is made to move in the direction of its axis.

第4図にはウェハ垂直握持部9と基板ホルダ14との連
動機構を示す。
FIG. 4 shows an interlocking mechanism between the wafer vertical gripping section 9 and the substrate holder 14. As shown in FIG.

このように構成した図示装置の動作について以下説明す
る。
The operation of the illustrated apparatus configured in this way will be described below.

ウェハキャリア11から基板ホルダ14ヘウエノ1を搬
送する場合について説明すると、まずウェハキャリア1
1内のウェハをウェハ昇降装置8によって上方位置へ垂
直に持上げる。次にウニI・移送アーム10を作動して
その先端のウェハ垂直握持部9を爪13の開・いた状態
で、持上げられたウェハに対向する位置に接近させ、爪
13を閉じてウェハ外局部を保持する。その後ウェハ昇
降装置8を下降し、ウェハはウェハ垂直握持部9の爪1
3だけで保持される。こうして保持されたウェハはウェ
ハ搬送・アーム10の回動によりプロセス室4内の基板
ホルダ14に対向した位置に運ばれる(第4図a)。そ
して第4図す、′9に示すようにウェハ垂直握持部9の
作動ピン16が駆動されて基板ホルダ14のウェハ保持
機構15をばね15aに抗して押し開く。ウェハ保持機
構15の開いた基板ホルダ14は第4図dに示すように
ウェハに向って駆動され、ウェハを受ける。その後ウェ
ハ垂直握持部9の作動ピン16は第4図fに示すように
戻され、また基板ホルダ14はウェハを保持して元の位
置へ戻される(第4図g)。こうして一連の搬送動作が
行なわれる。また基板ホルダ14から処理済のウェハを
取シはすす際も逆の順序で同様にして行なわれる。
To explain the case of transferring the wafer 1 from the wafer carrier 11 to the substrate holder 14, first, the wafer carrier 1
The wafer in 1 is lifted vertically to an upper position by a wafer lifting device 8. Next, the urchin I/transfer arm 10 is operated to bring the wafer vertical gripping section 9 at its tip close to the position facing the lifted wafer with the claws 13 open, and the claws 13 are closed to remove the wafer. Hold the local area. After that, the wafer lifting device 8 is lowered, and the wafer is held in the claw 1 of the wafer vertical gripping part 9.
Only 3 is retained. The wafer thus held is transported to a position facing the substrate holder 14 in the process chamber 4 by rotation of the wafer transport arm 10 (FIG. 4a). Then, as shown at '9 in FIG. 4, the operating pin 16 of the wafer vertical gripping section 9 is driven to push the wafer holding mechanism 15 of the substrate holder 14 open against the spring 15a. The open substrate holder 14 of the wafer holding mechanism 15 is driven toward and receives the wafer as shown in FIG. 4d. Thereafter, the actuating pin 16 of the wafer vertical gripper 9 is returned as shown in FIG. 4f, and the substrate holder 14 is returned to its original position holding the wafer (FIG. 4g). In this way, a series of conveyance operations are performed. Further, when removing a processed wafer from the substrate holder 14, the same procedure is performed in reverse order.

〔発明の作用〕[Action of the invention]

このように本発明において、ウェハは常に垂直状態でハ
ンドリングすることができ、また基板ホルダはウェハを
機械的にクランプして保持できる。
In this way, in the present invention, the wafer can always be handled in a vertical state, and the substrate holder can mechanically clamp and hold the wafer.

ウェハの搬送中ウェハはその外周部だけで保持され、こ
れによりウェハ面への汚染を最少に保つことができる。
During wafer transport, the wafer is held only at its outer periphery, thereby keeping contamination of the wafer surface to a minimum.

さらに本発明においてはウェハの寸法に応じてウェハ垂
直握持部は寸法法めされ、従っていかなる寸法のウェハ
にも容易に適用することができる。
Further, in the present invention, the wafer vertical gripping portion is sized according to the size of the wafer, and therefore can be easily applied to wafers of any size.

〔発明の効果〕〔Effect of the invention〕

以上説明してきたように本発明によれば、ウェハを常に
垂直状態でハンドリングするように構成しているので、
ウェハ面へのダスト付着が少なく、またウェハの搬送中
はその外周部のみで保持しているので、上述のようにウ
ェハ面の汚染は少なく、しかも機械的連動クランプ機構
を用いているのでウェハの受渡しが確実に行なわれる。
As explained above, according to the present invention, the wafer is always handled vertically, so
There is less dust adhering to the wafer surface, and since the wafer is held only at its outer periphery during transportation, there is less contamination on the wafer surface as mentioned above.Furthermore, the mechanical interlocking clamp mechanism is used, so the wafer Delivery is ensured.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の垂直搬送方式に示す概略図、第2図は本
発明の一実施例を示す概略斜視図、第3図は本発明の装
置の要部を示す斜視図、第4図は動作説明図である・。 図中、8:ウェハ昇降装置、 9:ウエノ・垂直握持部
、 10:ウェハ移送アーム、’ 13:爪。 14:基板ホルダ、 15:ウェハ保持機構。 16:作動ビン。 第3図
Fig. 1 is a schematic diagram showing a conventional vertical conveyance system, Fig. 2 is a schematic perspective view showing an embodiment of the present invention, Fig. 3 is a perspective view showing main parts of the device of the present invention, and Fig. 4 is This is a diagram explaining the operation. In the figure, 8: wafer lifting device, 9: wafer vertical gripping section, 10: wafer transfer arm, 13: claw. 14: Substrate holder, 15: Wafer holding mechanism. 16: Working bin. Figure 3

Claims (1)

【特許請求の範囲】[Claims] ウェハを垂直方向に上下させるウェハ昇降装置、ウェハ
保持機構を備えた基板ホルダ、およびウェハ昇降装置と
基板ホルダとの間で往復動でき、上記ウェハ昇降装置で
持上げられたウェハの外周部に係止する爪と基板ホルダ
のウェハ保持機構を作動する作動子とをもつウェハ垂直
握持部を先端に装着したウェハ移送アームから成シ、ウ
ェハを常に垂直の状態で搬送できるようにしたことを特
徴とする真空中におけるウェハ垂直搬送装置。
A wafer lifting device that vertically moves the wafer up and down, a substrate holder equipped with a wafer holding mechanism, and a device that can reciprocate between the wafer lifting device and the substrate holder and locks onto the outer periphery of the wafer lifted by the wafer lifting device. It consists of a wafer transfer arm equipped with a wafer vertical gripping part at its tip, which has a claw for holding the wafer and an actuator for operating the wafer holding mechanism of the substrate holder, so that the wafer can be transferred in a vertical state at all times. Wafer vertical transfer device in vacuum.
JP5359984A 1984-03-22 1984-03-22 Vertical conveyor for wafer in vacuum Pending JPS60198747A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5359984A JPS60198747A (en) 1984-03-22 1984-03-22 Vertical conveyor for wafer in vacuum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5359984A JPS60198747A (en) 1984-03-22 1984-03-22 Vertical conveyor for wafer in vacuum

Publications (1)

Publication Number Publication Date
JPS60198747A true JPS60198747A (en) 1985-10-08

Family

ID=12947340

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5359984A Pending JPS60198747A (en) 1984-03-22 1984-03-22 Vertical conveyor for wafer in vacuum

Country Status (1)

Country Link
JP (1) JPS60198747A (en)

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