JPS60181627A - Tension measurement of thin film - Google Patents
Tension measurement of thin filmInfo
- Publication number
- JPS60181627A JPS60181627A JP3594584A JP3594584A JPS60181627A JP S60181627 A JPS60181627 A JP S60181627A JP 3594584 A JP3594584 A JP 3594584A JP 3594584 A JP3594584 A JP 3594584A JP S60181627 A JPS60181627 A JP S60181627A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- light
- tension
- external force
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/04—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
- G01L5/10—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means
- G01L5/107—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means for measuring a reaction force applied on an element disposed between two supports, e.g. on a plurality of rollers or gliders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/04—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands
- G01L5/10—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means
- G01L5/105—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring tension in flexible members, e.g. ropes, cables, wires, threads, belts or bands using electrical means using electro-optical means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、ＶＴＲテープ等の薄膜の張力を走行中におい
ても測定できる薄膜の張力測定方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a method for measuring the tension of a thin film such as a VTR tape, which can measure the tension of a thin film even while the tape is running.
従来、ビデオに装着されているＶＴＲテープ等の薄膜の
張力は、テンションゲージを薄膜に接触させて測定して
いた。Conventionally, the tension of a thin film such as a VTR tape attached to a video camera has been measured by bringing a tension gauge into contact with the thin film.
ところが、上記テンションゲージを利用した測定におり
）ては、このテンションゲージの測定圧が大きく、測定
のときに生ずる誤差も大きい。However, in the measurement using the above tension gauge, the pressure measured by the tension gauge is large, and the error that occurs during measurement is also large.
したがって、上記薄膜の張力をグラムオーダの分解能で
測定するのは不可能である。また、上記薄膜に直接テン
ションゲージが接触しているため、走行中のＶＴＲテー
プ等を測定することは固着であった。Therefore, it is impossible to measure the tension of the thin film with a resolution on the order of grams. Furthermore, since the tension gauge was in direct contact with the thin film, it was difficult to measure a running VTR tape or the like.
本発明は、上記の拳情に着目してなされたもダの分解能
でも精度高く測定でき、しかも上記ＶＴＲテープの走行
中においても張力の測定ができる薄膜の張力測定方法を
提供することにある。The object of the present invention is to provide a thin film tension measuring method that can measure the tension with high accuracy even with the above-mentioned resolution, and can also measure the tension even while the VTR tape is running.
本発明は、ＶＴＲテープ等の薄膜に垂直方向から微小な
外力を加えることにより生ずる折れまがり角を、レーデ
による光てこ方式により計測し、その折れまがり角より
上記薄膜の張力を測定することにある。。The present invention is to measure the bending angle caused by applying a minute external force from the vertical direction to a thin film such as a VTR tape using a Rede optical lever method, and to measure the tension of the thin film from the bending angle. . .
以下、本発明の一実施例を図面にもとづいて説明する。 Hereinafter, one embodiment of the present invention will be described based on the drawings.
第１図ないし第３図に示す１は、ビデオに装着されたＶ
ＴＲテープ等の薄膜１であり、この薄膜１には、ポール
２，２間で張力Ｔがかけられている、この薄膜１の垂直
方向から既知の微小な外力Ｆを加えて、その時の薄膜１
の張力をＴとする。また１、Ｆ記外力Ｆを加えた時に生
ずる上記薄膜１の傾斜角をθ８．θ２とし、折れまがり
角をθ（θ−θ１＋０２）とすると、上記傾斜角θ１
、θ２が小さい場合には、上記下
張ね近似的に次式（１）で表わせる。1 shown in FIGS. 1 to 3 is a V mounted on a video
A thin film 1 such as a TR tape is applied with a tension T between poles 2, 2, and a known minute external force F is applied from the vertical direction of the thin film 1.
Let T be the tension. 1. The inclination angle of the thin film 1 that occurs when the external force F is applied is θ8. If θ2 and the bending angle are θ(θ-θ1+02), then the above inclination angle θ1
, θ2 is small, the above-mentioned underlay can be approximately expressed by the following equation (1).
Ｔ勾Ｔ１ζＴ ２ ＃ Ｆ ／θ （１）上式（１）中
の折れまがり角θがまれば、張力Ｔをめることができる
。そこで光てこ方式を用−いて上記折れまがり角θを計
測し、上記張力Ｔを測定する。T slope T1ζT 2 # F /θ (1) If the bending angle θ in the above equation (1) is equalized, the tension T can be reduced. Therefore, the above-mentioned bending angle θ is measured using an optical lever method, and the above-mentioned tension T is measured.
ここで光てこ方式について説明すれば、第３図に示すよ
うにレーザ装置３が設けられ、このレーザ装置３から照
射したレーデ光４を曲ケるためのスキャナ５、スキャナ
５からのレーデ光４を平行な走査光とするレンズ７が設
けられている。さらに、レーデ光４を反射させる八−フ
ミラー６で反射されたレーデ光４の光点を検出する光点
位置検出器８が設けられ、光てこ方式の全体を構成して
いる。そして、上記レンズ７の焦点距離をｆとすれば、
このレンズ７の中心より両端側の距離ｆの位置に、上記
レーデ装置３、および上記折れまがり角θを測定するた
めに上記薄膜１が設けられる。To explain the optical lever system here, as shown in FIG. A lens 7 is provided which converts the light into parallel scanning light. Further, a light spot position detector 8 for detecting a light spot of the Rade light 4 reflected by the eight-finger mirror 6 that reflects the Rade light 4 is provided, and constitutes the entire optical lever system. And if the focal length of the lens 7 is f, then
At a distance f from the center of the lens 7 on both ends thereof, the radar device 3 and the thin film 1 for measuring the bending angle θ are provided.
この光てこ方式を使用し、上記折れまがり角θを計測す
る場合について説明すれば、第３図に示すように上記レ
ーデ装置３より照射されたレーザ光４は、上記スキャナ
５により曲げられ、上記ハーフミラ−６を透過して上記
レンズ７にへ′射し、平行な走査光となる。この時、平
行な走査光となった上記レーデ光４が上記薄膜１と直交
すれば、このレーザ光４は、薄膜１に入射した時と同じ
経路を通って反射し、上記レンズ７を透過して上記ハー
フミラ−６に達する。そして、このハーフミラ−６によ
って反射された上記レーザ光４は、上記光点位置検出器
８に集光して検出される。この場合は、集光された光点
は１つであるが、上記薄１１Δ１が上記外力Ｆにより折
れまがり角θが生じている場合には、上記光点は第４図
（二示すような２つの光点９ａ。To explain the case where the above-mentioned bending angle θ is measured using this optical lever method, as shown in FIG. The light passes through the half mirror 6 and enters the lens 7, where it becomes parallel scanning light. At this time, if the laser beam 4, which has become a parallel scanning beam, crosses the thin film 1 at right angles, the laser beam 4 will be reflected through the same path as when it entered the thin film 1, and will pass through the lens 7. and reaches the half mirror 6. The laser beam 4 reflected by the half mirror 6 is focused on the light spot position detector 8 and detected. In this case, there is only one focused light spot, but if the thin film 11Δ1 is bent at a bending angle θ due to the external force F, the light spot is two as shown in FIG. Two light spots 9a.
９ｂとなる。そして、これら２つの光点９ａ。It becomes 9b. And these two light spots 9a.
９ｂは、上記薄膜１と上記レーザ光４が直交する時に生
ずる１つの光点の位置より、それぞれ２ｆｏ１，２ｆθ
２だけずれ、光点ｇａ、９ｂ間の距離りは、
Ｄ＝２’ｆθ１＋２ｆθ。9b are 2fo1 and 2fθ, respectively, from the position of one light spot that occurs when the thin film 1 and the laser beam 4 are perpendicular to each other.
The distance between light points ga and 9b is D=2'fθ1+2fθ.
＝２ｆθ （θ；０１＋０２） ・・・＋２１となる。=2fθ (θ;01+02)...+21.
したがって
となり、（３）式を上記の（１）式に代入するとＴ ＝
２ ｆ Ｆ／Ｄ ・・・（４）となる。Therefore, by substituting equation (3) into equation (1) above, T =
2 f F/D (4).
上記薄膜１のＴは、上記外力Ｆを加える位置Ｃ１無関係
に、元てこ方式でめた距離りにより上記張力Ｔが測定さ
れる。The tension T of the thin film 1 is measured by the distance determined by the original lever method, regardless of the position C1 where the external force F is applied.
そして、上記薄膜の測定方法は、レーザ光による元てこ
方式を利用しているためＶＴＲビデオ等に加える上記外
力Ｆが微少で、測定に生ずる誤差も小さく、上記張力Ｔ
は１００Ｗオーダの分解能でも精度の高い値をめること
ができる。Since the thin film measurement method uses a laser beam-based lever method, the external force F applied to the VTR video etc. is minute, the error in measurement is small, and the tension T
can obtain highly accurate values even with a resolution on the order of 100W.
なお、上記外力Ｆは、流体ノズルからの空気圧を利用し
てもよく、この場合には走行中のＶＴＲテープ等の張力
Ｔが測定でき、しかも、傷を付けることがなく、時間的
な変化に伴う張力Ｔの測定もできる。Note that the external force F may be generated by using air pressure from a fluid nozzle. In this case, the tension T of the VTR tape, etc. during running can be measured, and it will not cause any damage and will not be affected by changes over time. The accompanying tension T can also be measured.
以上説明したように本発明によれば、ＶＴＲテープ等の
薄）漠に外力を加えることにより生ずる折れまがり角を
レーザ元による元てこ方式により測定し、上記薄膜の張
力をめたことにより、張力が１００ ＠ｌオーダの分解
能でも精度よく測定され、また、走行中においても上記
薄膜が測定できるという効果を奏する１゜As explained above, according to the present invention, the bending angle caused by applying an external force to a thin film such as a VTR tape is measured by the original lever method using a laser source, and the tension of the thin film is determined. can be measured accurately even at a resolution of 100@l order, and the thin film can be measured even while driving.
第１図は張力がかけられている薄膜を示す側面図、第２
図は同じく薄）模に外力Ｆが加えられた状態を示す側面
図、第３図は本発明の一実施例の概略を示す構成図、第
４図は同じく薄膜の測定方法による死点間の距離を示す
正面図である。
Ｆ・・・外力、Ｔ・・・張力、θ・・・折れまがり角、
１・・・薄膜、４・・・レーザ尤。
第３図
Ｔ ＴFigure 1 is a side view showing the membrane under tension;
The figure is a side view showing a state in which an external force F is applied to the same thin film, FIG. 3 is a configuration diagram showing an outline of an embodiment of the present invention, and FIG. It is a front view showing distance. F...External force, T...Tension, θ...Bending angle,
1...Thin film, 4...Laser layer. Figure 3 T T
Claims (2)
外力を加えるとともに、その薄膜にレーザ光を照射し、
上記外力を加えた時に生ずる薄膜の折れまがり角を元て
こ方式により計測し、その折れまがり角より上記薄膜の
張力を測定することを特徴とするＷ５１！ｖの張力測定
方法１゜(1) Applying a known external force from the vertical direction to the thin film under tension, and irradiating the thin film with laser light,
W51! characterized in that the bending angle of the thin film that occurs when the external force is applied is measured by a lever method, and the tension of the thin film is measured from the bending angle. v tension measurement method 1゜
を特徴とする特許請求の範囲第１項に記載の薄膜の張力
測定方法３．(2) The thin film tension measuring method according to claim 1, wherein the external force is a constricted air pressure from a fluid nozzle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3594584A JPS60181627A (en) | 1984-02-29 | 1984-02-29 | Tension measurement of thin film |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3594584A JPS60181627A (en) | 1984-02-29 | 1984-02-29 | Tension measurement of thin film |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60181627A true JPS60181627A (en) | 1985-09-17 |
Family
ID=12456125
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3594584A Pending JPS60181627A (en) | 1984-02-29 | 1984-02-29 | Tension measurement of thin film |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60181627A (en) |
-
1984
- 1984-02-29 JP JP3594584A patent/JPS60181627A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2913984B2 (en) | Tilt angle measuring device | |
| JPH0363001B2 (en) | ||
| US5202740A (en) | Method of and device for determining the position of a surface | |
| US4482803A (en) | Optical sensor for focusing control | |
| CN100437023C (en) | Device and method for measuring the thickness of a transparent sample | |
| JPS60181627A (en) | Tension measurement of thin film | |
| JPS6341402B2 (en) | ||
| JP3192461B2 (en) | Optical measuring device | |
| JPS6315812Y2 (en) | ||
| JPH0729445Y2 (en) | Transparent object thickness measuring device | |
| JPH0615972B2 (en) | Distance measuring method and device | |
| JP2522191B2 (en) | IC lead height measuring device | |
| JPS6120849B2 (en) | ||
| JPH04130239A (en) | Apparatus for measuring outward position and inward position of dynamic surface | |
| JP2735020B2 (en) | Focused Beam Spot Diameter | |
| JP2591143B2 (en) | 3D shape measuring device | |
| JPH0661115A (en) | Gap detection and setting device | |
| JPH03252513A (en) | Parabolic antenna surface measuring instrument | |
| JPH01233310A (en) | Optical method and optical probe for measuring shape of surface | |
| JPS62212508A (en) | Method for measuring surface deflection | |
| JP2550872Y2 (en) | Sheet material online measuring device | |
| JPH0545895B2 (en) | ||
| JPS60181626A (en) | Tension measurement of thin film | |
| JPS59138916A (en) | Range finder | |
| JPS6239692B2 (en) |