JPH04130239A - Apparatus for measuring outward position and inward position of dynamic surface - Google Patents

Apparatus for measuring outward position and inward position of dynamic surface

Info

Publication number
JPH04130239A
JPH04130239A JP25011490A JP25011490A JPH04130239A JP H04130239 A JPH04130239 A JP H04130239A JP 25011490 A JP25011490 A JP 25011490A JP 25011490 A JP25011490 A JP 25011490A JP H04130239 A JPH04130239 A JP H04130239A
Authority
JP
Japan
Prior art keywords
light
detector
reflected light
reflected
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP25011490A
Other languages
Japanese (ja)
Other versions
JPH0735988B2 (en
Inventor
Katsu Tashiro
克 田代
Iwao Sugizaki
杉崎 巖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Copal Electronics Co Ltd
Original Assignee
Copal Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Copal Electronics Co Ltd filed Critical Copal Electronics Co Ltd
Priority to JP25011490A priority Critical patent/JPH0735988B2/en
Publication of JPH04130239A publication Critical patent/JPH04130239A/en
Publication of JPH0735988B2 publication Critical patent/JPH0735988B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Testing Of Optical Devices Or Fibers (AREA)
  • Mechanical Optical Scanning Systems (AREA)

Abstract

PURPOSE:To make it possible to measure the outward position and the inward position of a surface highly accurately without the effect of the state of the reflecting surface of a polariscope by focusing an image which is conjugate with the focal point on a mirror on a reflected- light-position detector. CONSTITUTION:When the light from a light source 5 enters, a trigger detector 8 transmits a trigger signal. The light emitted from a light source 1 is reflected from the mirror surface of a polariscope 9. The reflected light is condensed on a beam-position detector 4 through an optical system 3. At the time of the trigger generation, the direction of the mirror surface is constant. Therefore, the fluctuation of the output from the detector 4 is caused by the outward and inward movements of the surface. Thus the outward and inward positions of the surface are measured. Namely, a focal point F1 of the incident light L1 is focused on the detector 4 through the optical system 3. When the surface is moved outward or inward, the reflected light is moved to a light path L3. The focal point on the detector which is conjugate with the apparent movement of the focal point is moved to F2. Therefore, the incident point becomes S1. The amount of the outward or inward movement (d) is obtained based on the distance X1 between F1 and S1. Even if an angular error occurs in the reflected light under the state of the mirror surface, the deviation of the optical incident point on the detector 4 is very small, and the highly accurate measurement can be performed.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、レーザプリンタ等に使用される回転多面鏡、
振動鏡等の光偏向器の評価装置に関するものである。
Detailed Description of the Invention (Industrial Application Field) The present invention relates to a rotating polygon mirror used in a laser printer, etc.
This invention relates to an evaluation device for an optical deflector such as a vibrating mirror.

(従来の技術) 従来、光偏向器では、その回転精度及び面の倒れがその
特性として重要視されてきたが、反射面の回転中心から
の位置が変動する(以下これを面出入りと称する)と、
これらの特性に影響を及ぼすので、この面出入りを回転
中に測定する方法として、第3図に示すように入射及び
反射光路を光偏向器28の回転軸を含む面内にあるよう
に構成された光源24、光学系25、ビームスプリッタ
26、トリガ検出器27とトリガ発生時点で光がミラー
に角度を持つように入射反射するように構成された光源
21、光学系22.ビーム位置検出器23を含む面位置
検出系とを備え、トリガ発生時点の検出器23の出力か
ら面出入りを測定する面出入り測定装置が提案されてい
た。
(Prior art) Conventionally, in optical deflectors, the rotational accuracy and the inclination of the surface have been considered important characteristics, but the position of the reflective surface from the center of rotation fluctuates (hereinafter referred to as surface entry and exit). and,
Since these characteristics are affected, as a method of measuring this in-plane entry and exit during rotation, the incident and reflected optical paths are configured to be in a plane containing the rotation axis of the optical deflector 28, as shown in FIG. A light source 24, an optical system 25, a beam splitter 26, a trigger detector 27, and a light source 21, an optical system 22, which are configured so that the light enters and reflects on the mirror at an angle when a trigger is generated. A surface entry/exit measuring device has been proposed that includes a surface position detection system including a beam position detector 23 and measures the entry/exit from the surface based on the output of the detector 23 at the time when a trigger is generated.

(発明が解決しようとする課題) 従来提案されている面出入り測定装置では、光源21か
ら出た光を直接検出器23上に集光するようになってい
た。このような構成では第4図に示すようにミラー面が
28aから28bに距離dだけ移動した時、ミラーから
の出射光の主光線はL22からL23に移動し、焦点位
置はF21がらF22に移動し、検出器への入射点はF
21から521へ移動し、その移動量X2がら面出入り
量を求めていた。ところがミラー面の表面は完全な平面
とはなり得ないため、表面状態のリップル等によりL2
4のようなミラーからの出射光の角度誤差が発生すると
入射点はS22となり、誤差Y2が発生してしまい、正
確な測定ができないという問題があった。
(Problems to be Solved by the Invention) In conventionally proposed surface entry and exit measuring devices, the light emitted from the light source 21 is directly focused on the detector 23. In such a configuration, when the mirror surface moves by a distance d from 28a to 28b as shown in Fig. 4, the chief ray of the light emitted from the mirror moves from L22 to L23, and the focal point moves from F21 to F22. And the point of incidence on the detector is F
It moved from 21 to 521, and the amount of surface entry and exit was calculated from the amount of movement X2. However, since the surface of the mirror surface cannot be a perfect plane, L2
If an angular error occurs in the light emitted from the mirror as shown in No. 4, the incident point becomes S22, resulting in an error Y2, which poses a problem in that accurate measurement cannot be performed.

(課題を解決するための手段) 本発明は、前記課題を解決すべくなされたもので実施例
に対応する第1図及び第2図で説明すると、本発明によ
る動的面出入り測定装置は、ミラーの回転により光を走
査する光偏向器9の回転中心軸を含む面内に入射及び反
射光路を含み、その反射光の通過時点を検出しトリガ信
号を発生するトリガ検出系5,6,7,8と、ミラー面
に垂直でない入射及び反射光路をもち前記トリガ検出系
によってトリガ信号が発生した時点の入射・反射光を含
む面内で、反射光にほぼ垂直方向の反射光の位置を検出
する面位置検出系1,2,3.4とを備えた動的面出入
り測定装置において、前記面位置検出系の光学系3とし
て、入射光LXはミラー面9a上に焦点を持ち、反射光
光学系3はミラー9a上の焦点o1と共役な像F1を反
射光位置検出器4上に結ぶ光学系としたことを特徴とす
る動的面出入り測定装置である。
(Means for Solving the Problems) The present invention has been made to solve the above problems, and will be explained with reference to FIGS. 1 and 2, which correspond to embodiments. Trigger detection systems 5, 6, and 7 that include incident and reflected optical paths in a plane that includes the rotation center axis of the optical deflector 9 that scans the light by rotating a mirror, and that detect the passing point of the reflected light and generate a trigger signal. , 8, and has incident and reflected optical paths that are not perpendicular to the mirror surface, and detects the position of the reflected light in a direction substantially perpendicular to the reflected light within a plane that includes the incident and reflected light at the time when the trigger signal is generated by the trigger detection system. In the dynamic surface entrance/exit measuring device equipped with surface position detection systems 1, 2, 3.4, the optical system 3 of the surface position detection system is such that the incident light LX has a focus on the mirror surface 9a, and the reflected light The optical system 3 is a dynamic surface entry/exit measuring device characterized in that it is an optical system that focuses an image F1 conjugate with the focal point o1 on the mirror 9a onto the reflected light position detector 4.

(作用) この場合ミラー面9a上の焦点01と検出器4上の像点
F1が共役であるので、ミラー面9aの表面状態によっ
て反射光の角度が変化しても、必ず反射光L2は検出器
4上の像点に集光する。また、面出入りがあったときに
は、ミラー面上の反射点が移動するため像点も移動する
ので移動量により面出入りが検出できる。
(Function) In this case, the focal point 01 on the mirror surface 9a and the image point F1 on the detector 4 are conjugate, so even if the angle of the reflected light changes depending on the surface condition of the mirror surface 9a, the reflected light L2 is always detected. The light is focused on an image point on the vessel 4. Furthermore, when the surface moves in and out, the reflection point on the mirror surface moves, so the image point also moves, so the surface movement can be detected based on the amount of movement.

(実施例) 第1図は本発明の一実施例であって、1,5は光源、2
はミラー面上に入射光を集光する光学系、3は出射光を
検出器上に集光する光学系、4はビーム位置検出器、6
はトリガ検出器8上に出射光を集光する光学系、7はビ
ームスプリッタ、8はトリガ検出器、9は回転多面鏡で
ある。光源5から出てトリガ検出器8に入る光は回転多
面鏡9の回転軸を含む面内にあるのでトリガ検出器8は
面出入りの影響を受けずトリガ信号を発生する。この時
光源1から出ている光は、ビーム位置検出器4に入射す
る構成になっている。光源1から出た光は光学系2でミ
ラー面上に集光され、その反射光は光学系3によりビー
ム位置検出器4上に集光され入射する。トリガ発生時点
でのミラー面の方向は一定であるのでそのときのビーム
位置検出器の出力の変動は面出入りによるものと考えら
れ。
(Embodiment) FIG. 1 shows an embodiment of the present invention, in which 1 and 5 are light sources, 2
3 is an optical system that focuses the incident light on a mirror surface, 3 is an optical system that focuses the output light on a detector, 4 is a beam position detector, and 6 is an optical system that focuses the incident light on a mirror surface.
is an optical system that focuses the emitted light onto a trigger detector 8, 7 is a beam splitter, 8 is a trigger detector, and 9 is a rotating polygon mirror. Since the light emitted from the light source 5 and entering the trigger detector 8 is within a plane that includes the rotation axis of the rotating polygon mirror 9, the trigger detector 8 generates a trigger signal without being affected by entering or exiting the plane. At this time, the light emitted from the light source 1 is configured to enter the beam position detector 4. Light emitted from a light source 1 is focused onto a mirror surface by an optical system 2, and its reflected light is focused by an optical system 3 onto a beam position detector 4 and enters the beam position detector 4. Since the direction of the mirror surface at the time of trigger generation is constant, the fluctuation in the output of the beam position detector at that time is considered to be due to the movement in and out of the surface.

これから面出入りを測定できる。From this, you can measure the surface entrance and exit.

次に第2図を用いて、光路を詳細に説明する。Next, the optical path will be explained in detail using FIG. 2.

入射光L1はミラー面9a上で焦点01を結び。The incident light L1 has a focal point 01 on the mirror surface 9a.

反射光L2は光学系3により検出器4上で焦点F1を結
ぶ、ここでミラー面9bに示すように面出入りが発生す
ると反射は光路L3に移動し、見かけの焦点は01から
02に移動しそれと共役な検出器4上の焦点はFlから
F2に移動する。そのことにより検出器4上の光入射点
はSlとなり。
The reflected light L2 is brought to a focus F1 on the detector 4 by the optical system 3. Here, when entry and exit from the surface occurs as shown on the mirror surface 9b, the reflection moves to the optical path L3, and the apparent focus moves from 01 to 02. The focal point on the detector 4 conjugate thereto moves from Fl to F2. As a result, the light incident point on the detector 4 becomes Sl.

FlとSlの距離x1から面出入り量dが求められる。The surface inflow/outflow amount d is determined from the distance x1 between Fl and Sl.

さらに、ミラー面の状態により反射光がL4のように角
度誤差を発生してもそのときの検出器4上の光入射点は
S2となり、SlとS2の差Y1は、従来の方法でのY
2に比べ極めて小さく高精度な測定ができる。
Furthermore, even if the reflected light causes an angular error like L4 due to the condition of the mirror surface, the light incident point on the detector 4 at that time is S2, and the difference Y1 between Sl and S2 is equal to Y in the conventional method.
Compared to 2, it is extremely small and can perform highly accurate measurements.

(発明の効果) 以上詳細に説明したように、本発明によれば従来の方法
に比べ、光偏向器の反射面の状態に影響されにくい高精
度な面出入り測定器を構成できる。
(Effects of the Invention) As described in detail above, according to the present invention, it is possible to construct a highly accurate surface entry/exit measuring instrument that is less affected by the state of the reflecting surface of an optical deflector than conventional methods.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の構成図、第2図は本発明の原理図、第
3図は従来例の構成図、第4図は従来例の原理図である
。 1.2,21,24・・・光源 2.3,6,22,25・・・集光光学系4.23・・
・ビーム位置検出器 7,26・・・ビームスプリッタ 8.27・・・トリガ検出器 9.28・・・光偏向器(回転多面鏡)9 a 、 9
 b 、 28 a 、 28 b−ミラー面LL、L
2.L3.L4.L21.L22゜L23.L24・・
・光路
FIG. 1 is a block diagram of the present invention, FIG. 2 is a principle diagram of the present invention, FIG. 3 is a block diagram of a conventional example, and FIG. 4 is a principle diagram of a conventional example. 1.2, 21, 24... Light source 2.3, 6, 22, 25... Condensing optical system 4.23...
・Beam position detector 7, 26... Beam splitter 8.27... Trigger detector 9.28... Optical deflector (rotating polygon mirror) 9 a, 9
b, 28 a, 28 b - mirror surfaces LL, L
2. L3. L4. L21. L22°L23. L24...
・Light path

Claims (1)

【特許請求の範囲】[Claims] ミラーの回転により光を走査する光偏向器の回転中心軸
を含む面内に入射及び反射光路を含み、その反射光の通
過時点を検出してトリガ信号を発生するトリガ検出系と
、ミラー面に垂直でない入射及び反射光路をもち前記ト
リガ検出系によってトリガ信号が発生した時点の入射・
反射光を含む面内で、反射光にほぼ垂直方向の反射光の
位置を検出する面位置検出系とを備えた動的面出入り測
定装置において、前記面位置検出系の光学系として、入
射光はミラー面上に焦点を持ち、反射光光学系はミラー
上の焦点と共役な像を反射光位置検出器上に結ぶ光学系
としたことを特徴とする動的面出入り測定装置。
A trigger detection system includes an incident and reflected optical path in a plane that includes the rotation center axis of an optical deflector that scans light by rotating a mirror, and a trigger detection system that generates a trigger signal by detecting the point at which the reflected light passes; It has non-perpendicular incident and reflected optical paths and the incident and reflected light paths at the time when the trigger signal is generated by the trigger detection system.
In a dynamic surface entry/exit measurement device equipped with a surface position detection system that detects the position of the reflected light in a direction substantially perpendicular to the reflected light within a plane containing the reflected light, the optical system of the surface position detection system detects the position of the reflected light in a direction substantially perpendicular to the reflected light. A dynamic surface entrance/exit measuring device having a focal point on a mirror surface, and a reflected light optical system that focuses an image conjugate with the focal point on the mirror onto a reflected light position detector.
JP25011490A 1990-09-21 1990-09-21 Dynamic surface access measuring device Expired - Lifetime JPH0735988B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25011490A JPH0735988B2 (en) 1990-09-21 1990-09-21 Dynamic surface access measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25011490A JPH0735988B2 (en) 1990-09-21 1990-09-21 Dynamic surface access measuring device

Publications (2)

Publication Number Publication Date
JPH04130239A true JPH04130239A (en) 1992-05-01
JPH0735988B2 JPH0735988B2 (en) 1995-04-19

Family

ID=17203039

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25011490A Expired - Lifetime JPH0735988B2 (en) 1990-09-21 1990-09-21 Dynamic surface access measuring device

Country Status (1)

Country Link
JP (1) JPH0735988B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006084331A (en) * 2004-09-16 2006-03-30 Matsushita Electric Ind Co Ltd Eccentricity measuring device of polygon mirror motor
JP2006132955A (en) * 2004-11-02 2006-05-25 Matsushita Electric Ind Co Ltd Device for measuring mirror eccentricity and surface irregularities of polygon mirror motor
JP2007127911A (en) * 2005-11-07 2007-05-24 Canon Inc Eccentricity measurement apparatus and eccentricity adjustment apparatus each for optical deflector, and scanning optical apparatus and image forming apparatus each using them

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006084331A (en) * 2004-09-16 2006-03-30 Matsushita Electric Ind Co Ltd Eccentricity measuring device of polygon mirror motor
JP2006132955A (en) * 2004-11-02 2006-05-25 Matsushita Electric Ind Co Ltd Device for measuring mirror eccentricity and surface irregularities of polygon mirror motor
JP4661167B2 (en) * 2004-11-02 2011-03-30 パナソニック株式会社 Measuring device for polygon mirror motor
JP2007127911A (en) * 2005-11-07 2007-05-24 Canon Inc Eccentricity measurement apparatus and eccentricity adjustment apparatus each for optical deflector, and scanning optical apparatus and image forming apparatus each using them
JP4745796B2 (en) * 2005-11-07 2011-08-10 キヤノン株式会社 Eccentricity measuring apparatus and decentration adjusting apparatus for optical deflection apparatus, and scanning optical apparatus and image forming apparatus using them

Also Published As

Publication number Publication date
JPH0735988B2 (en) 1995-04-19

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