JPS60158611A - Plating device - Google Patents

Plating device

Info

Publication number
JPS60158611A
JPS60158611A JP1329184A JP1329184A JPS60158611A JP S60158611 A JPS60158611 A JP S60158611A JP 1329184 A JP1329184 A JP 1329184A JP 1329184 A JP1329184 A JP 1329184A JP S60158611 A JPS60158611 A JP S60158611A
Authority
JP
Japan
Prior art keywords
substrate
plating
magnetic field
holder
substrate holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1329184A
Other languages
Japanese (ja)
Other versions
JPH051608B2 (en
Inventor
Makoto Morijiri
誠 森尻
Masaaki Sano
雅章 佐野
Midori Imura
井村 みどり
Shinichi Hara
真一 原
Shinji Narushige
成重 真治
Tsuneo Yoshinari
吉成 恒男
Mitsuo Sato
佐藤 満男
Masanobu Hanazono
雅信 華園
Toshihiro Yoshida
吉田 敏博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Computer Basic Technology Research Association Corp
Original Assignee
Computer Basic Technology Research Association Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Computer Basic Technology Research Association Corp filed Critical Computer Basic Technology Research Association Corp
Priority to JP1329184A priority Critical patent/JPS60158611A/en
Publication of JPS60158611A publication Critical patent/JPS60158611A/en
Publication of JPH051608B2 publication Critical patent/JPH051608B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electroplating Methods And Accessories (AREA)
  • Thin Magnetic Films (AREA)

Abstract

PURPOSE:To obtain a plated film having no variation of the composition of the plated film, and to indicate favorably magnetic anisotropy by a method wherein a substrate to form the plated film thereon is rotated, and a magnetic field having the fixed direction always is applied on the substrate according to the magnetic field to rotate synchronizing with the rotation of the substrate. CONSTITUTION:A substrate holder 13 is connected to a rotary shaft 12 in a plating tank 11, and a substrate 14 to be plated is held by the substrate holder 13. Permanent magnets 15 to apply magnetic anisotropy to the substrate 14 are held by the substrate holder 13, and a plating current is flowed between an anode 16 and the substrate 14 rotating the rotary shaft 12 according to a rotation driving body such as a motir, etc. to form a plated film on the surface of the substrate 14.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は磁性膜をめっきするめつき装置に係シ、特に、
めっき膜を形成する基板を回転することによシ定常的な
めつき液の攪拌をし、かつ、基板上に常に一定方向の磁
場を印加しながらめっきすることを特徴とするめつき装
置に関する。
[Detailed Description of the Invention] [Field of Application of the Invention] The present invention relates to a plating apparatus for plating a magnetic film, and in particular,
The present invention relates to a plating apparatus characterized in that a plating solution is constantly stirred by rotating a substrate on which a plating film is formed, and plating is performed while always applying a magnetic field in a fixed direction onto the substrate.

〔発明の背景〕[Background of the invention]

従来よシ、電子部品等に各種の金属膜や合金膜をめっき
する場合、そのめっき時のめつき極表面の溶液の攪拌が
めつき膜の性質に重要なファクタとなることが知られて
おシ、めつき槽中でのめつき液の空気泡による攪拌や、
機械的に攪拌器を動かすことによる攪拌などが行なわれ
てきた。
Conventionally, when plating various metal films or alloy films on electronic components, etc., it is known that stirring of the solution on the surface of the plating during plating is an important factor in the properties of the plating film. , stirring of the plating solution by air bubbles in the plating tank,
Stirring has been carried out by mechanically moving a stirrer.

特に、めっき膜組成を正確に制御しなければならない電
子部品用の合金めっきに関しては、その攪拌方法及びめ
っき液の攪拌状態がめつき膜合金組成に大きな影響を与
えることが知られており、めっき装置にも色々の工夫が
されている。たとえば、A、bstrat A 287
. Extended AbStrHCtSドルタイプ
と称するめっき装置について報告されている。この方式
によれば、常に平均的にはめつき極に流れる電流密度が
均一になシ、多くの種類の電子部品に対して、All、
pe−Ni、pe−Ni−Cu等の各種の金属あるいは
合金を形成していることが示されている。しかしながら
、この装置の場合、めっきされる基板上の近傍をパドル
が移動することによってめっき液の攪拌をしているので
、パドルの移動に伴ないめっきされる基板上に新しい液
の供給と、めっきされる金属イオンの拡散が起こシ、め
っき電流の周期的な変動を生じることが述べられている
In particular, when it comes to alloy plating for electronic components, where the composition of the plating film must be precisely controlled, it is known that the stirring method and the state of stirring of the plating solution have a large effect on the alloy composition of the plating film. Various efforts have also been made. For example, A, bstrat A 287
.. A plating device called Extended AbStrHCtS dollar type has been reported. According to this method, the current density flowing through the mating electrodes is always uniform on average, and it can be applied to many types of electronic components such as All,
It has been shown that various metals or alloys such as pe-Ni and pe-Ni-Cu are formed. However, in the case of this device, the plating solution is stirred by moving the paddle near the substrate to be plated, so as the paddle moves, new solution is supplied onto the substrate to be plated, and plating It has been stated that diffusion of metal ions occurs, resulting in periodic fluctuations in the plating current.

合金膜をめっきする場合、めっき電流が変化するとめつ
き膜組成が変動する。従って、めっき電流を一定に保ち
ながらめっきする必要がある。そのためには、めっき液
中でめっきされる基板上近傍のめつき液の攪拌状態が経
時変化をしない、すなわち、定常状態を保つことのでき
る攪拌方式が必要である。
When plating an alloy film, the composition of the plated film changes when the plating current changes. Therefore, it is necessary to perform plating while keeping the plating current constant. To this end, a stirring method is required that allows the stirring state of the plating solution near the substrate to be plated in the plating solution to not change over time, that is, to maintain a steady state.

〔発明の目的〕 本発明の目的は、Fe−Ni合金膜のような磁性膜をめ
っきする場合に、めっきされる基板に常に方向性をもっ
た磁場を印加しながら、めっきされる基板上近傍のめつ
き液の攪拌状態を定常状態に保つことによシ、めっき膜
組成の変動のない良好な磁気異方性を示すめっき膜を得
るためのめつき装置を提供することにある。
[Object of the Invention] When plating a magnetic film such as a Fe-Ni alloy film, an object of the present invention is to apply a directional magnetic field to the substrate to be plated, and to apply a directional magnetic field to the substrate to be plated. An object of the present invention is to provide a plating apparatus for obtaining a plating film exhibiting good magnetic anisotropy without fluctuations in the composition of the plating film by keeping the agitation state of the plating solution in a steady state.

〔発明の概要〕[Summary of the invention]

本発明めっき装置の特徴とするところは、めっき膜を形
成する基板をめっき液中で回転させながらめっきするこ
とによって、基板表面の溶液の状態を定常状態に保ち、
すなわち、基板表面の流体力学的境界層を基板面内全域
で一定の厚さにすることによって、基板表面への間欠的
な新しい溶液の更新によるめっき電流の経時変化を防止
して、基板上のめつき電流の電流分布を均一化し、かつ
、めっき電流を一定に保つとともに、回転する基板に対
し常に一定の方向の磁場を印加するようにした点にある
The plating apparatus of the present invention is characterized by plating while rotating the substrate on which the plating film is to be formed in the plating solution, thereby maintaining the solution state on the substrate surface in a steady state.
That is, by creating a hydrodynamic boundary layer on the substrate surface with a constant thickness throughout the substrate plane, changes in the plating current over time due to intermittent renewal of new solution to the substrate surface are prevented, and the The current distribution of the plating current is made uniform, the plating current is kept constant, and a magnetic field is always applied in a constant direction to the rotating substrate.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明を図面を用いて説明する。 Hereinafter, the present invention will be explained using the drawings.

第1図は、基板に印加する磁場を形成する部分が、基板
の回転と同じ方向に回転する場合の一実施例を示すもの
で、基板に印加する磁場を印加する部分として、永久磁
石を用いたものである。めっき槽11の中に、基板ホル
ダ13が回転シャフト12に接続されている。また、基
板ホルダ13にはめつきされる基板14が保持され、ま
だ、基板14に磁気異方性を付加するために永久磁石1
5が1組基板ホルダ13に保持された構造としている。
Figure 1 shows an example in which the part that forms the magnetic field to be applied to the substrate rotates in the same direction as the rotation of the board, and a permanent magnet is used as the part that applies the magnetic field to the board. It was there. A substrate holder 13 is connected to a rotating shaft 12 within the plating bath 11 . Further, the substrate 14 to be fitted into the substrate holder 13 is held, and a permanent magnet 1 is still attached to the substrate 14 in order to add magnetic anisotropy to the substrate 14.
5 is held in one set by a substrate holder 13.

この基板ホルダ13は、ベアリング17によって保持さ
れた回転シャフト12が、図には示していないが、モー
タ等の回転駆動体によって駆動されめっき液中でなめら
かに回転する。また、めつき槽11の基板14と対向す
る部分には、アノード16が設置され、アノード16と
基板14の間にめっき電流を流すことによシ、基板14
表面にめっき膜を形成する。
In this substrate holder 13, a rotating shaft 12 held by a bearing 17 is driven by a rotational drive body such as a motor (not shown), and smoothly rotates in the plating solution. Further, an anode 16 is installed in a portion of the plating tank 11 facing the substrate 14, and by passing a plating current between the anode 16 and the substrate 14, the substrate 14 is
Form a plating film on the surface.

このように構成することによって、基板14表面のめつ
き液の攪拌は、経時変化をせず、常に一定の電流を流す
ことができ、均一な組成でかつ、一様な磁気異方性の付
与されためつき膜を形成することができる。
With this configuration, stirring of the plating liquid on the surface of the substrate 14 does not change over time, and a constant current can be passed at all times, and a uniform composition and uniform magnetic anisotropy can be imparted. It is possible to form a prickly film.

第2図には、基板ホルダ13をめっきする面から見た場
合の基板14と永久磁石15の配置状態を示す。この場
合、基板ホルダ13の基板14を取付ける側の面はでき
るだけ平滑な面であることが望ましい。これは、表面が
凹凸のはげしい面の場合には、基板ホルダ13を回転さ
せた時にめっき液の流れがその凹凸部に邪魔され、局部
的な乱流状態を生じ、境界層の厚さが変化することが原
因となって、基板面内で均一な電流密度分布を得ること
ができなくなるためである。
FIG. 2 shows the arrangement of the substrate 14 and the permanent magnets 15 when the substrate holder 13 is viewed from the surface to be plated. In this case, it is desirable that the surface of the substrate holder 13 on the side on which the substrate 14 is attached is as smooth as possible. This is because when the surface is extremely uneven, when the substrate holder 13 is rotated, the flow of the plating solution is obstructed by the unevenness, creating a local turbulent flow state and changing the thickness of the boundary layer. This is because it becomes impossible to obtain a uniform current density distribution within the plane of the substrate.

第3図には、基板ホルダ13の断面図を示す。FIG. 3 shows a cross-sectional view of the substrate holder 13. As shown in FIG.

上述の様に基板ホルダ13のめつき面は平滑であること
が必要であるので、永久磁石15は基板ホルダ13のめ
つき面と反対側よシ基板ホルダ13内にうめ込むことが
推奨される。また、基板14の保持方法としては、基板
14表面に電気的接触をするために、また、基板14上
全面だけをめっきするとその端部に電流集中が起こり基
板14面内でのめつき膜の膜厚及び組成を均一にするだ
めに、基板14面よシ大きい面積部分をめっきすること
によって基板14面端部に電流集中するのを防止し、基
板14面内の電流分布を一定にするため、金属板、たと
えば、ステンレス材で作成した基板保持部131を用い
ることが推奨される。この基板保持部131のつばの高
さは、基板14と基板ホルダ13の段差になるので、液
の流れを均一にするためには、できるだけ小さい方が良
く、0、2 rtarr以下の厚さにすることが望まれ
る。また、基板保持部131以外の基板ホルダー13は
、絶縁体、たとえばフッ素樹脂で作成する。ただし、基
板面内の電流密度分布を均一にするために、その基板保
持部131である同時めっき部分の大きさと、基板ホル
ダ13の絶縁体部分132との面積の割合を変更するこ
とも可能である。また、基板面及び基板保持部を含むめ
っき部分は、基板ホルダの回転中心を中心とする円盤形
状であることが、めっき液の流れを均一にでき、基板面
内の電流密度分布を均一にすることに有効である。13
3はゴムシー)、134は基板14を押えるブロックで
ある。
As mentioned above, the mating surface of the board holder 13 needs to be smooth, so it is recommended that the permanent magnet 15 be embedded in the board holder 13 on the opposite side from the mating surface of the board holder 13. . In addition, the method for holding the substrate 14 is to make electrical contact with the surface of the substrate 14, and if only the entire surface of the substrate 14 is plated, current concentration will occur at the edge of the plated film on the surface of the substrate 14. In order to make the film thickness and composition uniform, by plating an area larger than the surface of the substrate 14, current concentration at the edge of the surface of the substrate 14 is prevented and the current distribution within the surface of the substrate 14 is made constant. It is recommended to use a substrate holder 131 made of a metal plate, for example, stainless steel. The height of the brim of this substrate holding part 131 is the difference in level between the substrate 14 and the substrate holder 13, so in order to make the flow of liquid uniform, it is better to make it as small as possible, and it is recommended that the height of the brim be 0.2 rtarr or less. It is desirable to do so. Further, the substrate holder 13 other than the substrate holding part 131 is made of an insulator, for example, a fluororesin. However, in order to make the current density distribution uniform in the plane of the substrate, it is also possible to change the ratio of the size of the simultaneous plating part that is the substrate holding part 131 and the area of the insulator part 132 of the substrate holder 13. be. In addition, the plating part, including the substrate surface and the substrate holder, has a disk shape centered on the rotation center of the substrate holder, which allows for uniform flow of the plating solution and uniform current density distribution within the substrate surface. It is particularly effective. 13
3 is a rubber seal), and 134 is a block that presses the board 14.

第4図、第5図及び第6図には、基板を2枚同時にめっ
きする場合の基板と永久磁石との配置状態を示す。第5
図の場合、1組の永久磁石15の距離が離れるため、基
板14上に十分な磁場を印加するためには、強力な磁石
が必要となる。これに対し、第6図は、永久磁石15間
の距離が第5図の半分ですむので、永久磁石15の強度
は1枚の基板に磁場を印加するのと同様の強度で良い。
FIG. 4, FIG. 5, and FIG. 6 show the arrangement of substrates and permanent magnets when two substrates are plated at the same time. Fifth
In the case shown in the figure, since the distance between the pair of permanent magnets 15 is large, a strong magnet is required to apply a sufficient magnetic field onto the substrate 14. On the other hand, in FIG. 6, the distance between the permanent magnets 15 is half that of FIG. 5, so the strength of the permanent magnets 15 may be the same as that of applying a magnetic field to one substrate.

第4図の配置と第5図及び第6図の配置については、め
っき液の流れの方向は回転に対するほぼ接線方向となる
ので、磁場印加方向と微小パターンとの方向性を一致さ
せることの必要な電子部品の場合、その微小パターンに
よって液の流れ方向を選択することができる。
Regarding the arrangement shown in Figure 4 and the arrangement shown in Figures 5 and 6, the flow direction of the plating solution is almost tangential to the rotation, so it is necessary to match the direction of the magnetic field application and the micropattern. In the case of electronic components, the direction of liquid flow can be selected depending on the micropattern.

同様にして、基板の枚数を3枚以上保持することも可能
である。
Similarly, it is also possible to hold three or more substrates.

また、以上に説明してきたものは、永久磁石を用いた場
合の内容であるが、これは、同じ様に電磁石を用いても
可能でおる。
Furthermore, although the above explanation is based on the case where permanent magnets are used, this is also possible using electromagnets in the same way.

以上、基板ホルダ面内に基板と印加する磁場を与える磁
石(永久磁石おるいは電磁石等)を−緒に保持したもの
を示したが、基板に印加する磁場を形成する部分が、基
板の回転と同じく回転して基板に磁場を印加する方式の
他の実施例を第7図に示す。基板ホルダ73はめつき血
中で基板75を保持した状態で回転する。これは第1図
の実施例と同一である。印加磁場は、めつき槽71外周
に配置され、回転軸72に連結された永久磁石保持部7
7に保持されfc1組の永久磁石74によって常に基板
の一定方向に印加される。この方式の特徴は、基板ホル
ダ73内にはめつきされる基板75だけが保持されれば
よいので、基板ホルダ73の大きさが、同じ基板枚数で
あれは、第1図に示した方式よシも小さくできる点であ
る。また、同じ基板ホルダの大きさならば、基板枚数を
増加することができる。しかしながら、めつき槽71の
外に印加磁場用の永久磁石74を設置し、さらに、その
永久磁石74を基板75の回転と同時に回転させること
が必要となるので、めっき装置全体の構造は回転移動部
分が大きくなるので、大きいものとなる。
Above, we have shown a substrate holder that holds the substrate together with a magnet (permanent magnet or electromagnet) that provides a magnetic field to be applied in the plane, but the part that forms the magnetic field to be applied to the substrate is Another embodiment of the method in which the magnetic field is applied to the substrate by rotating the same as in FIG. 7 is shown in FIG. The substrate holder 73 rotates while holding the substrate 75 in the blood. This is the same as the embodiment of FIG. The applied magnetic field is applied to a permanent magnet holder 7 arranged around the outer periphery of the plating tank 71 and connected to a rotating shaft 72.
7 and is always applied in a fixed direction to the substrate by fc1 set of permanent magnets 74. The feature of this method is that only the board 75 to be fitted into the board holder 73 needs to be held, so if the size of the board holder 73 is the same and the number of boards is the same, the method shown in FIG. The point is that it can also be made smaller. Furthermore, if the size of the substrate holder is the same, the number of substrates can be increased. However, since it is necessary to install a permanent magnet 74 for applying a magnetic field outside the plating tank 71 and to rotate the permanent magnet 74 simultaneously with the rotation of the substrate 75, the structure of the entire plating apparatus is rotatable. The portions are larger, so it is larger.

この場合においても、磁石印加としては永久磁石だけで
はなく、電磁石を用いることができる。
Even in this case, not only a permanent magnet but also an electromagnet can be used to apply the magnet.

次に、基板に印加する磁場を形成する部分は移動せず、
基板に印加される磁場のみが、基板の回転と同じく回転
しながらめっきする場合の実施例を第8図に示す。この
構造は、基板回転めっき部と、電磁石85を用いた回転
磁場印加部に大きく分けられる。そして、基板840回
転に同期させて電磁石85によ)印加される磁場を回転
させることによシ、常に基板84上に同じ方向の磁場を
印加できるものである。
Next, the part that forms the magnetic field applied to the substrate does not move;
FIG. 8 shows an embodiment in which plating is performed while only the magnetic field applied to the substrate rotates in the same manner as the rotation of the substrate. This structure is roughly divided into a substrate rotating plating section and a rotating magnetic field applying section using an electromagnet 85. By rotating the magnetic field applied by the electromagnet 85 in synchronization with the rotation of the substrate 840, a magnetic field in the same direction can always be applied to the substrate 84.

めつき槽81には、めっきされる基板84を保持した基
板ホルダ83が、回転シャフト82に連結されて設置さ
れている。また、めつき槽81の外には回転磁場印加用
の電磁石コイル85が設置されておシ、それは、回転シ
ャフト82に設置された回転位置検知器87を用いて基
板84の回転位置を検出すると同時に電磁石用電源88
に電気信号を与え、電磁石85によって基板84に常に
一定の磁場を与えながらめっきする。
A substrate holder 83 holding a substrate 84 to be plated is connected to a rotating shaft 82 and installed in the plating tank 81 . Further, an electromagnetic coil 85 for applying a rotating magnetic field is installed outside the plating tank 81, and it detects the rotational position of the substrate 84 using a rotational position detector 87 installed on the rotating shaft 82. At the same time, the electromagnet power supply 88
An electric signal is applied to the substrate 84, and plating is performed while a constant magnetic field is always applied to the substrate 84 by the electromagnet 85.

この方式によれば、基板ホルダ部分には基板のみが保持
されれば良いので、同じ基板枚数であれば、基板ホルダ
の大きさを小さくすることができるという特徴がある。
According to this method, only the substrates need to be held in the substrate holder portion, so the size of the substrate holder can be reduced as long as the number of substrates remains the same.

また、磁場は固定された電磁石コイルによる回転磁場な
ので、磁石を回転するための駆動部分の様な可動部分が
不必要で6Dめっき装置の構造が簡単になるという特徴
がある。
Further, since the magnetic field is a rotating magnetic field generated by a fixed electromagnetic coil, there is no need for a movable part such as a driving part for rotating the magnet, and the structure of the 6D plating apparatus is simplified.

上述の各実施例に示しためつき槽中の基板ホルダは、基
板面が水平で下向きの構造としていたが、これは、水平
で上向きにすることも、垂直にすることも可能である。
Although the substrate holder in the mating tank shown in each of the above embodiments has a structure in which the substrate surface is horizontal and faces downward, it can be made horizontal and facing upward, or it can be vertical.

また、水平面よシ傾斜させた構造とすることも可能であ
シ、めっき条件によシめりき膜組成の均一性と対応して
、最適な構造を取ることが可能である。
It is also possible to have a structure inclined with respect to the horizontal plane, and it is possible to obtain an optimal structure depending on the plating conditions and the uniformity of the plating film composition.

〔発明の効果〕〔Effect of the invention〕

以上説明した如く、本発明めっき装置によれば常に組成
の均一で磁気異方性の良好なめつき膜を得ることができ
る。
As explained above, according to the plating apparatus of the present invention, a plated film having a uniform composition and good magnetic anisotropy can always be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明めっき装置の一実施例を示す概略図、第
2図は、基板ホルダと基板と磁石の位置関係を示す概略
図、第3図は基板ホルダの構造を示す概略図、第4図、
第5図及び第6図は、゛基板ホルダと基板と磁石の位置
関係を示す概略図、第7図及び第8図は本発明の他の実
施例を示す概略図である。 11・・・めっき槽、13・・・基板ホルダ、14・・
・基板、11図 亙2 図 /3 13図 32 ■4図 イ 7 図 万3 図
Fig. 1 is a schematic diagram showing an embodiment of the plating apparatus of the present invention, Fig. 2 is a schematic diagram showing the positional relationship between a substrate holder, a substrate, and a magnet, and Fig. 3 is a schematic diagram showing the structure of the substrate holder. Figure 4,
5 and 6 are schematic diagrams showing the positional relationship between the substrate holder, the substrate, and the magnet, and FIGS. 7 and 8 are schematic diagrams showing other embodiments of the present invention. 11... Plating tank, 13... Substrate holder, 14...
・Board, Figure 11, Figure 2 Figure/3 Figure 13, Figure 32 ■Figure 4 A, Figure 7, Figure 3

Claims (1)

【特許請求の範囲】 1、めっき液を収納するめつき槽と、めっき膜を形成す
べき基板を支持してめつき槽内でめっき中基板を回転さ
せる基板ホルダと、めっき中基板に所定方向の磁場を加
える手段とを具備することを特徴とするめつき装置。 2、特許請求の範囲第1項において、基板に磁場を加え
る手段が、基板と同期して回転する永久磁石であること
を特徴とするめつき装置。 3、特許請求の範囲第1項において、基板に磁場を加え
る手段が、基板の回転方向に沿って配置され、基板の回
転と同期した回転磁界を発生する電磁石であることを特
徴とするめつき装置。
[Claims] 1. A plating tank that stores a plating solution, a substrate holder that supports a substrate on which a plating film is to be formed and rotates the substrate during plating within the plating tank, and a substrate holder that supports the substrate on which a plating film is to be formed and rotates the substrate during plating, and A plating device comprising means for applying a magnetic field. 2. The plating apparatus according to claim 1, wherein the means for applying a magnetic field to the substrate is a permanent magnet that rotates in synchronization with the substrate. 3. The plating apparatus according to claim 1, wherein the means for applying a magnetic field to the substrate is an electromagnet that is arranged along the rotational direction of the substrate and generates a rotating magnetic field in synchronization with the rotation of the substrate. .
JP1329184A 1984-01-30 1984-01-30 Plating device Granted JPS60158611A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1329184A JPS60158611A (en) 1984-01-30 1984-01-30 Plating device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1329184A JPS60158611A (en) 1984-01-30 1984-01-30 Plating device

Publications (2)

Publication Number Publication Date
JPS60158611A true JPS60158611A (en) 1985-08-20
JPH051608B2 JPH051608B2 (en) 1993-01-08

Family

ID=11829089

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1329184A Granted JPS60158611A (en) 1984-01-30 1984-01-30 Plating device

Country Status (1)

Country Link
JP (1) JPS60158611A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62122208A (en) * 1985-11-22 1987-06-03 Hitachi Ltd Apparatus for manufacturing thin film
JP2008156677A (en) * 2006-12-21 2008-07-10 Yamamoto Mekki Shikenki:Kk Plating tool and plating apparatus
JP2013502513A (en) * 2009-08-24 2013-01-24 エンパイア テクノロジー ディベロップメント エルエルシー Magnetic electroplating

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6057579U (en) * 1983-09-26 1985-04-22 三菱電機株式会社 cardboard packaging

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55108932A (en) * 1979-02-14 1980-08-21 Nippon Telegr & Teleph Corp <Ntt> Magnetic disc plating unit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55108932A (en) * 1979-02-14 1980-08-21 Nippon Telegr & Teleph Corp <Ntt> Magnetic disc plating unit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62122208A (en) * 1985-11-22 1987-06-03 Hitachi Ltd Apparatus for manufacturing thin film
JP2008156677A (en) * 2006-12-21 2008-07-10 Yamamoto Mekki Shikenki:Kk Plating tool and plating apparatus
JP2013502513A (en) * 2009-08-24 2013-01-24 エンパイア テクノロジー ディベロップメント エルエルシー Magnetic electroplating
US9797057B2 (en) 2009-08-24 2017-10-24 Empire Technology Development Llc Magnetic electro-plating

Also Published As

Publication number Publication date
JPH051608B2 (en) 1993-01-08

Similar Documents

Publication Publication Date Title
US6001235A (en) Rotary plater with radially distributed plating solution
US5316642A (en) Oscillation device for plating system
US5332487A (en) Method and plating apparatus
EP0248118A1 (en) Metallurgical structure control of electrodeposits using ultrasonic agitation
US6093453A (en) Electroless plating method
KR20010022951A (en) THE APPARATUS FOR MANUFACTURING Ni-Fe ALLOY THIN FOIL
CN102677138B (en) A kind of Metal electro-deposition method
JP4426127B2 (en) Metal foil electrolytic manufacturing equipment
JP2006249450A (en) Plating method and plating device
JPS60158611A (en) Plating device
JP4795075B2 (en) Electroplating equipment
JP4579306B2 (en) Circular plating tank
JP2007084932A (en) Method of electroplating
JPH0754189A (en) Electroplating device
CN202415726U (en) Metal electrodeposition device
CN213951406U (en) Polymer composite inner chamber electroplating device
JP4560201B2 (en) Cup type plating equipment
JPH06128795A (en) Electroplating method
JP2868470B2 (en) Paddle rotary plating method and plating apparatus
JP2001329400A (en) Plating device and plating method
JPS63121697A (en) Dispersion plating method
JP2510423Y2 (en) Cutting plate electroplating equipment
JPH07169714A (en) Method and device for plating
TWI314957B (en) Apparatus for metal plating on a substrate
JP2005520930A (en) Apparatus and method for electroplating a wafer surface