JPS60156446U - X線光電子分光装置 - Google Patents
X線光電子分光装置Info
- Publication number
- JPS60156446U JPS60156446U JP4444684U JP4444684U JPS60156446U JP S60156446 U JPS60156446 U JP S60156446U JP 4444684 U JP4444684 U JP 4444684U JP 4444684 U JP4444684 U JP 4444684U JP S60156446 U JPS60156446 U JP S60156446U
- Authority
- JP
- Japan
- Prior art keywords
- sample holder
- gun
- ray
- specimen
- photoelectron spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4444684U JPS60156446U (ja) | 1984-03-27 | 1984-03-27 | X線光電子分光装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4444684U JPS60156446U (ja) | 1984-03-27 | 1984-03-27 | X線光電子分光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60156446U true JPS60156446U (ja) | 1985-10-18 |
| JPH0355097Y2 JPH0355097Y2 (forum.php) | 1991-12-06 |
Family
ID=30557024
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4444684U Granted JPS60156446U (ja) | 1984-03-27 | 1984-03-27 | X線光電子分光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60156446U (forum.php) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009204511A (ja) * | 2008-02-28 | 2009-09-10 | Yazaki Corp | シール検査方法、及びシール検査装置 |
| JP2010112873A (ja) * | 2008-11-07 | 2010-05-20 | Jeol Ltd | 分光分析装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56138242A (en) * | 1980-03-31 | 1981-10-28 | Shimadzu Corp | X-ray photoelectron analysis equipment |
-
1984
- 1984-03-27 JP JP4444684U patent/JPS60156446U/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56138242A (en) * | 1980-03-31 | 1981-10-28 | Shimadzu Corp | X-ray photoelectron analysis equipment |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009204511A (ja) * | 2008-02-28 | 2009-09-10 | Yazaki Corp | シール検査方法、及びシール検査装置 |
| JP2010112873A (ja) * | 2008-11-07 | 2010-05-20 | Jeol Ltd | 分光分析装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0355097Y2 (forum.php) | 1991-12-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS60156446U (ja) | X線光電子分光装置 | |
| JPS5949935U (ja) | 光電色度計の自動標準校正装置 | |
| JPS6262968U (forum.php) | ||
| JPS6312153U (forum.php) | ||
| JPS593060U (ja) | 密閉カバ−の0リング溝構造 | |
| JPS60167699U (ja) | シ−ト材位置決め装置 | |
| JPS5933534U (ja) | ユニツトの固定機構 | |
| JPS59180258U (ja) | カセツト装着装置 | |
| JPS5926859U (ja) | 質量分析装置のイオン源装置 | |
| JPS5923152U (ja) | 分析装置用多重イオン源 | |
| JPS58185110U (ja) | 鼻毛切り装置 | |
| JPS5887243U (ja) | マグネテングスイツチにおけるカバ−取付装置 | |
| JPS5982842U (ja) | X線分析装置における試料交換装置 | |
| JPS5946007U (ja) | 指向性アンテナの方向制御装置 | |
| JPS60141196U (ja) | シ−ルドケ−ス | |
| JPS5918494U (ja) | 電気フアン | |
| JPS5893965U (ja) | 簡易学習反応分析装置 | |
| JPS5953254U (ja) | 試料プレヒ−テイング用恒温装置 | |
| JPS5828327U (ja) | ハンドル装置 | |
| JPS5930663U (ja) | モ−タ | |
| JPS5998328U (ja) | 回転試験振動測定用の保護装置付きギヤツプセンサ | |
| JPS6078539U (ja) | 多方向動作スイツチ | |
| JPS5932080U (ja) | ドアの危険防止装置 | |
| JPS5826707U (ja) | カ−ステレオ用パツク插入口の照明装置 | |
| JPS6379113U (forum.php) |