JPS60156446U - Ｘ線光電子分光装置 - Google Patents

Ｘ線光電子分光装置

Info

Publication number
JPS60156446U
JPS60156446U JP4444684U JP4444684U JPS60156446U JP S60156446 U JPS60156446 U JP S60156446U JP 4444684 U JP4444684 U JP 4444684U JP 4444684 U JP4444684 U JP 4444684U JP S60156446 U JPS60156446 U JP S60156446U
Authority
JP
Japan
Prior art keywords
sample holder
gun
ray
specimen
photoelectron spectrometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4444684U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0355097Y2 (enrdf_load_stackoverflow
Inventor
後藤　宝裕
洋 山内
勲 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP4444684U priority Critical patent/JPS60156446U/ja
Publication of JPS60156446U publication Critical patent/JPS60156446U/ja
Application granted granted Critical
Publication of JPH0355097Y2 publication Critical patent/JPH0355097Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Electron Tubes For Measurement (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP4444684U 1984-03-27 1984-03-27 Ｘ線光電子分光装置 Granted JPS60156446U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4444684U JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4444684U JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Publications (2)

Publication Number Publication Date
JPS60156446U true JPS60156446U (ja) 1985-10-18
JPH0355097Y2 JPH0355097Y2 (enrdf_load_stackoverflow) 1991-12-06

Family

ID=30557024

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4444684U Granted JPS60156446U (ja) 1984-03-27 1984-03-27 Ｘ線光電子分光装置

Country Status (1)

Country Link
JP (1) JPS60156446U (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009204511A (ja) * 2008-02-28 2009-09-10 Yazaki Corp シール検査方法、及びシール検査装置
JP2010112873A (ja) * 2008-11-07 2010-05-20 Jeol Ltd 分光分析装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56138242A (en) * 1980-03-31 1981-10-28 Shimadzu Corp X-ray photoelectron analysis equipment

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56138242A (en) * 1980-03-31 1981-10-28 Shimadzu Corp X-ray photoelectron analysis equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009204511A (ja) * 2008-02-28 2009-09-10 Yazaki Corp シール検査方法、及びシール検査装置
JP2010112873A (ja) * 2008-11-07 2010-05-20 Jeol Ltd 分光分析装置

Also Published As

Publication number Publication date
JPH0355097Y2 (enrdf_load_stackoverflow) 1991-12-06

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