JPS60148950U - temperature test chamber - Google Patents
temperature test chamberInfo
- Publication number
- JPS60148950U JPS60148950U JP3723884U JP3723884U JPS60148950U JP S60148950 U JPS60148950 U JP S60148950U JP 3723884 U JP3723884 U JP 3723884U JP 3723884 U JP3723884 U JP 3723884U JP S60148950 U JPS60148950 U JP S60148950U
- Authority
- JP
- Japan
- Prior art keywords
- base
- test chamber
- temperature test
- semiconductor heater
- opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案の一実施例を示す斜視図、第２図は第１
図におけるベースの一部断面を示す部分断面図、第３図
は第１図におけるシートの構造を示す部分斜視図、第４
図は第１図におけるシートの端部キベースとの間の接続
の態様を示す部分斜視図、第５図は第１図における温度
試験槽の電源系統を示すブロック図、第６図は半導体ヒ
ータの特性を示す特性図であ名。
１・・・ベース、２・・・フレーム、３・・・シート、
４・・・止め金、５・・・計器、８・・・制御ボックス
、１１・・・半 ４導体ヒータ、１２・・・循環
ファン、１３・・・制御回路、１４・・・温度設定器。
−−尾３図 −。Fig. 1 is a perspective view showing one embodiment of the present invention, and Fig. 2 is a perspective view showing an embodiment of the present invention.
Fig. 3 is a partial sectional view showing a partial cross section of the base in Fig. 1; Fig. 3 is a partial perspective view showing the structure of the seat in Fig. 1;
The figure is a partial perspective view showing the mode of connection between the end of the sheet and the base in Fig. 1, Fig. 5 is a block diagram showing the power supply system of the temperature test chamber in Fig. 1, and Fig. 6 is a diagram of the semiconductor heater. Named with a characteristic diagram showing the characteristics. 1...Base, 2...Frame, 3...Seat,
4... Clasp, 5... Meter, 8... Control box, 11... Semiconductor 4-conductor heater, 12... Circulation fan, 13... Control circuit, 14... Temperature setting device . --Tail figure 3-.
Claims (1)
に設けられた半導体ヒータと、前記半導体ヒータにより
加熱された空気を前記開放部を介して循環する前記ベー
ス内に設けられた循環ファレと、前記べ＝スの上部に所
定の空間を形成し前記ベース上に置かれた被試験物を覆
う断熱性の可撓シートとを具備する温度試験槽。a base having a partial opening on the top surface; a semiconductor heater provided within the base; and a circulation fan provided within the base that circulates air heated by the semiconductor heater through the opening. and a heat insulating flexible sheet forming a predetermined space above the base and covering a test object placed on the base.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3723884U JPS60148950U (en) | 1984-03-15 | 1984-03-15 | temperature test chamber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3723884U JPS60148950U (en) | 1984-03-15 | 1984-03-15 | temperature test chamber |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60148950U true JPS60148950U (en) | 1985-10-03 |
Family
ID=30543139
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3723884U Pending JPS60148950U (en) | 1984-03-15 | 1984-03-15 | temperature test chamber |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60148950U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6126842U (en) * | 1984-07-23 | 1986-02-18 | 株式会社 サンレ−ル | handrail attachment device |
-
1984
- 1984-03-15 JP JP3723884U patent/JPS60148950U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6126842U (en) * | 1984-07-23 | 1986-02-18 | 株式会社 サンレ−ル | handrail attachment device |
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