JPS60145715A - Production of substrate for forming piezoelecric resonator - Google Patents
Production of substrate for forming piezoelecric resonatorInfo
- Publication number
- JPS60145715A JPS60145715A JP213484A JP213484A JPS60145715A JP S60145715 A JPS60145715 A JP S60145715A JP 213484 A JP213484 A JP 213484A JP 213484 A JP213484 A JP 213484A JP S60145715 A JPS60145715 A JP S60145715A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- resonator
- forming
- window
- piezoelectric
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 103
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 238000000034 method Methods 0.000 claims abstract description 25
- 210000001015 abdomen Anatomy 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000007517 polishing process Methods 0.000 claims description 3
- 241000218645 Cedrus Species 0.000 claims 1
- 238000003384 imaging method Methods 0.000 claims 1
- 238000005498 polishing Methods 0.000 abstract description 9
- 239000012790 adhesive layer Substances 0.000 abstract description 7
- 239000010410 layer Substances 0.000 description 18
- 239000013078 crystal Substances 0.000 description 11
- 239000010408 film Substances 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 10
- 239000000463 material Substances 0.000 description 10
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 9
- 238000005530 etching Methods 0.000 description 9
- 229910052710 silicon Inorganic materials 0.000 description 9
- 239000010703 silicon Substances 0.000 description 9
- 239000002131 composite material Substances 0.000 description 8
- 239000010409 thin film Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 229910052681 coesite Inorganic materials 0.000 description 3
- 229910052906 cristobalite Inorganic materials 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 229910052682 stishovite Inorganic materials 0.000 description 3
- 229910052905 tridymite Inorganic materials 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 2
- 239000013013 elastic material Substances 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 229910052594 sapphire Inorganic materials 0.000 description 2
- 239000010980 sapphire Substances 0.000 description 2
- DDFHBQSCUXNBSA-UHFFFAOYSA-N 5-(5-carboxythiophen-2-yl)thiophene-2-carboxylic acid Chemical compound S1C(C(=O)O)=CC=C1C1=CC=C(C(O)=O)S1 DDFHBQSCUXNBSA-UHFFFAOYSA-N 0.000 description 1
- IBXOPEGTOZQGQO-UHFFFAOYSA-N [Li].[Nb] Chemical compound [Li].[Nb] IBXOPEGTOZQGQO-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 210000001520 comb Anatomy 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
【発明の詳細な説明】
この発明はごく商い周波数電域V(おいて動作する圧電
共振子の基板の形成に用いる圧電共振子形成用基板の製
造方法に関するものでちる、1<tE来核技術
圧電共振子は小形でQが丙く、安57な衛気共振特性が
得られるため、兜振周波数の制御素子、あるいけフィル
タ用の素子として利用されてきた。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a substrate for forming a piezoelectric resonator which is used for forming a substrate for a piezoelectric resonator operating in the frequency range V (1<tE). Piezoelectric resonators are small, have a low Q value, and provide safe air resonance characteristics, so they have been used as control elements for helmet vibration frequencies and as elements for air filters.
その使用周波数範囲は、従来VHFHF下((限られて
いたが、近年UHF帯圧電共振子の必汐作か高まり、徐
々に開発されつつある1、圧電共振子の動作周波数は基
板の厚さに逆比例するのでUl−iF帯の共振子を実現
するに!′i<y、μmないしは致10μm程度の極め
て薄い基板を作製することが計装であシ、そのため畑合
共振子徊欣5とするなどいくつかの方法が知られている
。The operating frequency range of the piezoelectric resonator was traditionally limited to VHFHF, but in recent years UHF piezoelectric resonators have become increasingly popular and are being gradually developed1.The operating frequency of the piezoelectric resonator depends on the thickness of the substrate. Since it is inversely proportional, in order to realize a resonator in the Ul-iF band!'i < y, it is necessary to fabricate an extremely thin substrate with a thickness of about 10 μm or less. Several methods are known.
即1図はU HF m用摺合圧′眼共振子として従来知
らハている構fr’iを7Jクシ、シリコン基板1の上
面及び1l−(’;’而にそれそi1シリコン酸化層(
Si’021噌)2及び3か形成され、7リコン酸化層
2の上に電極1(費5か形成され、その′…、極膜5上
に圧電性薄膜4がll’4.5’u:され、圧電性/i
9?、4十にこれを介して電極lIは5と一部月向し、
て′小極%:、5が形成される。これを製作するには、
平行平板状の/リコン基桧1に熱的あるいは化学的処理
を施して、基板表面にSlす2層2,3を設け、しかる
後片側のSiO2;曽3の一部分を化学エツチングなど
の方法で除去し、さらにそのSiO2層を除去した部分
に露出した未6′9什の7917層基板1をエツチング
除去して窓9を開け、ノリコンと酸化シリコンとのエツ
チング速1見の差を利用し、で5102層2のみが窓9
の部分に残るようにして複合共振子形成用の基板とする
。つ寸り電極膜5,6の対向部分が惹9の部分に位置し
ている。In other words, Figure 1 shows a conventionally known structure fr'i as a sliding-pressure eye resonator for UHF m with 7J combs, the upper surface of silicon substrate 1 and 1l-(';'and that i1 silicon oxide layer (
An electrode 1 (Si'021) 2 and 3 is formed on the silicon oxide layer 2, and a piezoelectric thin film 4 is formed on the electrode film 5. : is, piezoelectricity/i
9? , 40 through which the electrode lI is partially oriented with 5,
5 is formed. To produce this,
The silicon substrate 1 in the form of a parallel plate is thermally or chemically treated to form two Sl layers 2 and 3 on the surface of the substrate, and then a part of the SiO2 layer on one side is chemically etched. After removing the SiO2 layer, the unexposed 7917-layer substrate 1 exposed in the area where the SiO2 layer was removed was removed by etching to open a window 9, making use of the apparent difference in etching speed between Noricon and silicon oxide. So only 5102 layer 2 is window 9
This is used as a substrate for forming a composite resonator. Opposing portions of the thin electrode films 5 and 6 are located at a portion 9.
との構造はノリコンダイヤフラム構造として知られてお
り、Si+)21@2の代りにシリコン基板1に不純物
を尚奴ヴで拡散した層となし、その非拡散層と拡蔽層と
のエツチング速1隻゛kを利用して不純物拡散層のみを
窓部分に残す方法も用いられる。This structure is known as a Noricon diaphragm structure, in which impurities are diffused into the silicon substrate 1 instead of Si+21@2, and the etching speed of the non-diffused layer and the spreading layer is increased. A method of leaving only the impurity diffusion layer in the window portion using one layer is also used.
共振子とするには一ト述の方法で形成した芯9の部分の
5IO2層2aあるいは不純物拡散層上に電極5.6及
び圧電性薄j良4を設けて仮台共振子を形成する。To make a resonator, a temporary resonator is formed by providing electrodes 5, 6 and a piezoelectric thin film 4 on the 5IO2 layer 2a or the impurity diffusion layer in the core 9 portion formed by the method described above.
上述の構成は複合共振子を形ByするS@であるが、そ
のほか第2図に示すように水晶などの圧電性基板7の一
部分を薄板状に力(」工する方法も知られている。即ち
第2図Aにおいて水晶などの圧電性基本シフの一面にレ
ジスト膜8を形成し、レジスト膜8の懇を通して基板7
をエツチングあるいはイオンビームスパッタなどの方法
で除去して怒の周辺部に比べて薄くシ、第2図Bのよう
に%板状に加工された部分7aの両面に電極5,6を設
けて共振子を形成する。The above-mentioned structure is S@ which forms a composite resonator, but there is also a known method in which a part of the piezoelectric substrate 7, such as crystal, is shaped into a thin plate, as shown in FIG. That is, in FIG. 2A, a resist film 8 is formed on one surface of a piezoelectric substrate such as crystal, and a substrate 7 is formed through the edges of the resist film 8.
is removed by a method such as etching or ion beam sputtering to make it thinner than the surrounding area, and as shown in Fig. 2B, electrodes 5 and 6 are provided on both sides of the plate-shaped portion 7a to generate resonance. form a child;
第1図の方法によれば、厚さが数μ常程問以丁の基板2
aを得ることができるが、薄板状基&、2aとして用い
られる材料は前述のように5i02あるいは不純物を高
隙1廷に拡散したシリコンに限られているため基板2a
には圧電性がない。このため共振子を構成するためには
圧電性薄膜4を例月したN、17合共振子猶成とする心
安がある。初台共振子のヤ「性は基板イA料、圧策薄膜
材料等によって決−するが・1l1図の方法では基板2
aの拐4」を任意にりζぶことかできないため温度特性
が良好でかつQが高いなど共振特性の良好なUl(F帯
共振子を得ることid: 11釦であった。According to the method shown in FIG.
However, as mentioned above, the material used for the thin plate substrate 2a is limited to 5i02 or silicon with impurities diffused into a high gap.
has no piezoelectricity. Therefore, in order to construct a resonator, it is safe to use the piezoelectric thin film 4 as an N, 17-coupled resonator. The properties of the first resonator are determined by the substrate material, pressure thin film material, etc. In the method shown in Figure 1, the substrate 2
Since it is not possible to arbitrarily change the width of 4 of a, it is possible to obtain an F-band resonator with good temperature characteristics and good resonance characteristics such as high Q. ID: 11 button.
−’)−7、第2図の方法においては圧電性材料を薄&
aに711H工することかできるか加工時間が長くかか
りかつiyl 軸かj;IJな!1なこと加工に際して
厚さの微細なflil偵11か困I′ll:で仕上り帽
度が悪いこと、史には1111王而が荒か易いなどの問
題があった。。-')-7. In the method shown in Figure 2, the piezoelectric material is
Is it possible to do 711H machining on a? It takes a long machining time and is it an Iyl axis? One thing is that when processing, there are problems such as the fineness of the thickness and the poor quality of the finish, and the roughness of the surface. .
く発明のA(ゼt−侠〉
この発明は汗範の基鈑を薄枦状に精度良く加工し7、か
つ強い支持り年度を有する圧電共振子形成用基板のy昌
告を可能とし、それにより特性の良好な−UH)”帯共
振子の実現を可能ならしめるものである。。A of the Invention (Zet-Kyo) This invention enables the production of a substrate for forming a piezoelectric resonator that is precisely processed into a thin rod shape7 and has strong support. This makes it possible to realize a -UH) band resonator with good characteristics.
この発明によれは片I川を平面状に911丁した圧′岨
共振子形成用基板を、支持基板の平間状加]ニした而に
貼り付け、その圧電共振子形成相νiI4σt ILし
て平行薄板状にし、その薄板状とされた圧電共振子形成
用基板に影脅を与えることなく支持基板に窓を開けてそ
のU =tt分に平行薄板状に加工された圧電共振子形
成用基板を残存させる。According to this invention, a piezoelectric resonator forming substrate having 911 pieces of piezoelectric resonator formed in a planar shape is attached to a flat surface of a support substrate, and the piezoelectric resonator forming phase νiI4σt IL is parallel to A piezoelectric resonator forming substrate is made into a thin plate, and a window is opened in the supporting substrate without affecting the thin plate shaped piezoelectric resonator forming substrate, and the piezoelectric resonator forming substrate is processed into a parallel thin plate shape by U = tt. Let it remain.
〈実施例〉 第3図はこの発明の実施例1の工程を7Izず。<Example> FIG. 3 shows the steps of Example 1 of the present invention.
工程A、片面を平面状に精度良く仕上けられた金属ある
いはノリコンなどの支持用鼻板10と、片面を平面状に
精度よく仕−ヒけられた水晶なとの共振子形成用圧電性
基板11とを、仕上は而どうじを向かい合Iフせて接着
層12で貼り合わせる。このとき各基板10.11の1
1さは貼り合わせ作業において加えられるストレスにm
;iえるよう十分な身、さとしておく。なお多板10の
厚さに関しては工程Bについて述べる柔性が加わる。Step A: A piezoelectric substrate for forming a resonator, consisting of a supporting nose plate 10 made of metal or glue, which is precisely finished to have one side flat, and a quartz crystal, which is precisely finished to be flat on one side. 11 are finished by pasting them together with an adhesive layer 12 with their edges facing each other. At this time, 1 of each board 10.11
1 is due to the stress added during the bonding work.
;I will prepare myself sufficiently so that I can stand up to you. Regarding the thickness of the multi-plate 10, the flexibility described in step B is added.
工程B1工@Aにより得られた貼り合わせ基板の両面ま
たij共振子形成用圧電性基板11の側の曲をイiff
rし、基十丁7.11が共振子としてn■麦の厚さの
・ト行゛V板状の1・樽後となるように加工する。If the curve is on both sides of the bonded substrate obtained in Step B1@A or on the side of the piezoelectric substrate 11 for forming the ij resonator,
Then, process it so that the base 7.11 becomes a resonator with a thickness of n-mugi and a V-plate shape.
なお両哨白+Jt rMを;!li6す場合には支持用
基板10もり;すくなるので共振子形成用圧電性基板1
1するに+5±な強rとをもつよう相当の117−さを
残1−5て什ヒかるように基&10の彷抽厚さを設定し
ておく1、
工程C1ツメ;板10伎び11の面上にレジスト膜13
を塗布形IJ(シ、支持用基板10iI++側のレジス
ト11ii’、 13の一部分に解17を開ける。In addition, Ryōsōpaku + Jt rM ;! In the case of li6, the size of the supporting substrate 10 will be smaller, so the piezoelectric substrate 1 for forming a resonator will be
Set the thickness of base &10 so that it has a strong r of +5± for 1, leaving a considerable 117-strength 1-5.1, Step C1; Resist film 13 on the surface of 11
A solution 17 is opened in a part of the resist 11ii' and 13 on the support substrate 10iI++ side.
二I”、 E iJ 、化学エツチングあるいはスパッ
タエツチングなどの物理的・化学的方法により支持用基
彬10の袈17に所出した部分を除去して窓9を形成す
る。このときエツチング液あるいはエツチング川ガスに
は共振子形成用圧電性基板11に灼するエツチング作用
の小さいものを用いる。The window 9 is formed by removing the portion of the supporting base 10 that has been exposed on the edge 17 by a physical or chemical method such as chemical etching or sputter etching. The river gas used is one that has a small etching effect on the piezoelectric substrate 11 for forming a resonator.
次いで接着J! 12の窓9による露出部分及びレジス
ト膜13を共振子形成用圧電性基板11に苅する作用の
小さい方法で除去する。Next is adhesion J! 12 and the resist film 13 exposed by the windows 9 are removed by a method that has a small effect on the piezoelectric substrate 11 for forming a resonator.
以上の工程により窓9の部分には博佃状に形成された共
振子形成用圧電性基板11の与かイL任することとなり
、その周辺部の支持用層板10は支持体として使用でき
る。Through the above steps, the piezoelectric substrate 11 for forming a resonator formed in a rectangular shape is placed in the window 9, and the support laminate 10 around the window 9 can be used as a support. .
工程F2.′電極5,6を薄板状の共振子形成用圧電性
基板11の両面に設は共振fを形歇、ずろ1゜基板11
の材料として74水晶、タンタル1ソリチウムあるいは
ニオブばリチウム等の壮怠の圧′嘔材料を用いることが
でき、工程A〜1〕により奴μ?n程度の極めて薄い基
板に加工できるから、工程Eに示すように複合共振子構
成とすることなく UHF’帯共据子を実現できる。圧
電性基槽11ケ辱仮に加工する工程Bにおいてラッチン
グ、ポリ/インク等の機械的研磨法を用いれは、研賦工
程の途中で厚さをモニタすることができるから、厚さの
調整が容易であり、捷だ良好な加工向を得ることが可能
で、特性の良好な共振子が実現できる。3第4図はこの
発明の実施例2を示し、和合用振子を形成する例であり
、工程Aで支持用基板10にサファイア、溶融水晶など
の弾性材の複合共振子形成用基鈑14を貼り付ける。そ
の他は工程A〜I) 4′:l:天施例1の下杵A〜D
と同様であり、工程りの股階で、薄板状基板14が窓9
の部分に形成される9、工程Eにおいて窓9の部分の薄
板状基板14」−に′小極5、圧電性薄膜4、電極6を
順次設けることにより複合共振子を構成する。この実施
例2においては基板14の材料に任意のものが使用でき
るから共振子に要求される特性を実現するのにfQ j
丙なものをJ輩ぶことができる。例えばQの高いことが
重要である場合には基板14としてすAilσLの実施
例1及び2において工程Bを実施する場合、基板11あ
るいは14のみを研F縛しても良いか、ii+i常は両
面研磨法により実施する方が量産性、平行1丈などの仕
上がり精度の面で有利であル1.その際、基板10と1
1の研磨速度か異なる表、基板1・1の仕−トリ厚さに
ばらつきが生じ易い。Process F2. 'The electrodes 5 and 6 are arranged on both sides of the piezoelectric substrate 11 for forming a resonator in the form of a thin plate, so that the resonance f is arranged in the pattern, and the substrate 11 is shifted by 1°.
74 crystal, tantalum 1-solithium or niobium lithium can be used as the material, and by steps A~1] Since it can be processed into an extremely thin substrate of about n size, it is possible to realize a UHF' band common emitter without using a composite resonator configuration as shown in step E. If a mechanical polishing method such as latching or poly/ink is used in the temporary processing step B, the thickness can be monitored during the polishing process, making it easy to adjust the thickness. Therefore, it is possible to obtain a very good processing direction, and a resonator with good characteristics can be realized. 3. FIG. 4 shows a second embodiment of the present invention, which is an example of forming a harmonic pendulum. In step A, a composite resonator forming base plate 14 made of an elastic material such as sapphire or fused crystal is attached to a supporting substrate 10. paste. Others are steps A to I) 4': l: Lower pestle A to D of Example 1
The process is similar to the above, and the thin plate-like substrate 14 is connected to the window 9 at the step of the process.
9. In step E, a small pole 5, a piezoelectric thin film 4, and an electrode 6 are sequentially provided on the thin plate substrate 14'' in the window 9 portion, thereby constructing a composite resonator. In this second embodiment, since any material can be used for the substrate 14, fQ j
You can breed J things that are C. For example, if a high Q is important, use the substrate 14. When performing step B in Examples 1 and 2 of AilσL, is it okay to grind only the substrate 11 or 14? The polishing method is more advantageous in terms of mass production and finish accuracy such as parallel length.1. At that time, the substrates 10 and 1
If the polishing speed of the substrate 1 is different, the thickness of the substrate 1 tends to vary.
そのたd)研磨に対して同一の特性を有する材料が両面
にQ出することが望ましい。第5図はこのような場合を
示す図であり、工程Aで支持用基板として、基板11の
平向状加工した1用にIt′屯性基似11と同−材料捷
たは基板11と同様t、但[1者性を有するダミー用基
板15i接M1曽121で貼り付けたものを用い、その
基板10のタミー用基板15と反対の面に圧電性基板1
1を貼り台わせる。基板10に基板11.15を同時(
屹貼り合わせてもよい。次いで工程Bで3層に貼り合わ
せた基板に両面研磨を施して基板11?FyT女の厚さ
となし、工程Cで基板15及び接着TtIi12”i研
j@あるいはエツチングにより除去した後、I 桿1)
でレジスト塗布ならひに窓開けを行い、工nEで窓17
の部分より基板10、接着層12ケエツチンク除去埃、
レジスト膜13を除去し、次いで工程FT44jB5.
6を窓9部分の基板11に設けて共振子を形成する。In addition, d) It is desirable that materials with the same polishing characteristics exhibit Q on both sides. FIG. 5 is a diagram showing such a case, in which the support substrate 11 is used as a support substrate in step A. Similarly, a piezoelectric substrate 1 is attached to the opposite side of the dummy substrate 15 from the tummy substrate 15 of the substrate 10, except that a dummy substrate 15i having one-party property is attached with a
Paste 1. At the same time, the substrates 11 and 15 are attached to the substrate 10 (
It is also possible to paste them together. Next, in step B, both sides of the three-layered substrate are polished to form a substrate 11? After removing the thickness of the FyT layer by polishing or etching the substrate 15 and adhesive TtIi12'' in step C, the I rod 1)
If you are applying resist, open the window first, and then open the window 17 with
Remove dust from the substrate 10, adhesive layer 12,
The resist film 13 is removed, and then step FT44jB5.
6 is provided on the substrate 11 at the window 9 portion to form a resonator.
この方法によれば研磨工程Bにおいて基板11と15と
が同時に同じ速度で研磨されるから、基板11の研磨量
は全体の研磨量の1/2となり、厚み制御が容易で高い
仕上り精度かイIられる。According to this method, the substrates 11 and 15 are polished at the same time and at the same speed in polishing process B, so the amount of polishing of the substrate 11 is 1/2 of the total amount of polishing, which allows for easy thickness control and high finishing accuracy. I get caught.
第6図はこの発明の実施例4を示す。ダミー基板16と
してサファイア、溶融水晶などの弾性材の複合共振子用
基板14と同一材料あるいは基板1!4と同等の研磨性
を有するものを用いた場合で製造工程A−Eは第5図の
実施例3における工程A−Eに対応する。工程Fにおい
て窓9の部分の複合共振子用基板14上に電極5、圧電
性薄膜4及び電極6を順次設けることにより複合共振子
を形成する。FIG. 6 shows a fourth embodiment of the invention. When the dummy substrate 16 is made of the same material as the composite resonator substrate 14 made of an elastic material such as sapphire or fused crystal, or has the same abrasiveness as the substrates 1 to 4, the manufacturing steps A to E are as shown in FIG. This corresponds to steps A-E in Example 3. In step F, a composite resonator is formed by sequentially providing the electrode 5, piezoelectric thin film 4, and electrode 6 on the composite resonator substrate 14 in the window 9 portion.
なお、上記実施例3及び4においては、工程Cにおいて
ターミー基板を全部除去しているが、工程Cにおいてダ
、ミー基板15.16を除去することなく、ダミー基板
15.16及び接着層12′に窓開けを行い、更に支持
用基板10ならびに接着層12に芯開けを行う方法を用
いてもよい。この場合、タミー基板15.16は窓9の
周囲に残ることになるが共振子形成上支障を来たすこと
はない。In Examples 3 and 4, the termi substrates are all removed in step C, but the dummy substrates 15.16 and the adhesive layer 12' are removed without removing the dummy substrates 15.16 in step C. Alternatively, a method may be used in which a window is opened in the first step and a core is opened in the supporting substrate 10 and the adhesive layer 12. In this case, the tummy substrates 15 and 16 remain around the window 9, but this does not pose any problem in forming the resonator.
次に第5図の実施例3により、基本共振周波数500.
1vII(zI(zの水晶共振子を作製する例を説明す
る。Next, according to the third embodiment shown in FIG. 5, the fundamental resonance frequency is 500.
An example of manufacturing a crystal resonator of 1vII(zI(z) will be described.
基板10には厚さ300μηLの(1’OO)シリコン
板を、基板11及び15には厚さ60μmのBTカット
水晶板をそれぞれ用い、商分子接漕剤により接着層12
、12’の厚さが3μm程[Wで接着する。その結果
厚さ426μmの3層貼9合わせ板が得られる。これを
両面同時研磨によって厚さ316μmまで加工すると基
板11及び15の厚さはいずれも5μmとなる。タミー
用の水晶基板15のエツチングにはフッ化アンモニウム
溶液をシリコン基板のエツチングには異方性エツチング
液として知られたPED液をそれぞれ用い、まだ接着層
12 、12’はプラズマ灰化によって除去する。これ
により面積1−程度、厚さ5μmのBTカット水晶基板
が窓9の部分に形成され、基本周波数500 MHz、
3次オーバートーンによれは15G t(zの温度に対
して安定な共振子ケ実現することが可能となる。また共
振のQ値は水晶の材料Q値に近い値が得られる。共振子
周辺部は十分な強1(を有するシリコン板10で支えら
れているから、取扱いも容易で振動、衝撃などにも強い
ものが得られることは勿論である。A (1'OO) silicon plate with a thickness of 300 μηL was used as the substrate 10, and a BT cut crystal plate with a thickness of 60 μm was used as the substrates 11 and 15, respectively.
, 12' have a thickness of about 3 μm [attached with W]. As a result, a three-layer laminated board with a thickness of 426 μm was obtained. When this is processed to a thickness of 316 μm by simultaneous polishing of both sides, the thickness of both substrates 11 and 15 becomes 5 μm. An ammonium fluoride solution is used for etching the crystal substrate 15 for the tammy, and a PED solution known as an anisotropic etching solution is used for etching the silicon substrate, while the adhesive layers 12 and 12' are removed by plasma ashing. . As a result, a BT-cut crystal substrate with an area of about 1 mm and a thickness of 5 μm is formed in the window 9, and the fundamental frequency is 500 MHz.
It is possible to realize a resonator that is stable against the temperature of 15 Gt (z) due to the third overtone.Also, the resonance Q value can be close to the Q value of the crystal material. Since the part is supported by the silicon plate 10 having sufficient strength 1, it is of course easy to handle and resistant to vibrations, shocks, etc.
〈効 果〉
以上i発明したようにこの発明による圧電1共振子形成
用基板の製造方法は材料にかかわらず任意の基板を仕上
14度よく薄板状に形成できるから温度特性、Q+1旬
等の共振特性が良好であるU HF帯共振子r実現する
ことが可能である。<Effects> As invented above, the method of manufacturing a substrate for forming a piezoelectric resonator according to the present invention allows any substrate to be formed into a thin plate shape with a finish of 14 degrees, regardless of the material, so temperature characteristics, resonances such as Q + 1 temperature, etc. can be improved. It is possible to realize a UHF band resonator with good characteristics.
ili 1図は健来の懐合圧′亀共振子を示す断面構造
図、第2図は従来用いられている薄板状基板の形成法ケ
示す断面図、第3図はこの発明による圧電共振子形成用
基板の製造方法の実施例]の工程を示す力白IIi図、
第4図乃埜第6図はそれぞれこの発明の(I+?の実施
側1の工程を示す断面図である。
1:シリコン基&、2,3:シリコン給化層、4:圧匿
性ン袴膜、5,6:電極膜、7:圧電、性基+a、8ニ
レジスト膜、9:窓、1o:支持用基板、11:共振子
形成用圧電1基板、12.12゜:接層層、13ニレジ
スト膜、14:圧電共振子形成用基板、15,16:タ
ーミー基板。
代理人東野 卓
74 図
井 5 図 A
75 図 B
オ 6 図 A
76 図Bili Figure 1 is a cross-sectional structural diagram showing Kengo's Kaigoi pressure tome resonator, Figure 2 is a cross-sectional diagram showing a conventional method of forming a thin plate-like substrate, and Figure 3 is a piezoelectric resonator according to the present invention. Rikihaku IIi diagram showing the process of [Example of manufacturing method of forming substrate],
FIG. 4 and FIG. 6 are cross-sectional views showing the steps of implementation side 1 of (I+?) of the present invention. 1: Silicon base &, 2, 3: Silicon supply layer, 4: Compression property N Hakame film, 5, 6: electrode film, 7: piezoelectric, sexual group + a, 8 resist film, 9: window, 1o: supporting substrate, 11: piezoelectric 1 substrate for resonator formation, 12.12°: contact layer , 13 resist film, 14: substrate for piezoelectric resonator formation, 15, 16: termi substrate. Agent Takashi Higashino 74 Tsui 5 Figure A 75 Figure B O 6 Figure A 76 Figure B
Claims (2)
、片面を平面状に加工した支持用基板とをその平面状に
加工された面どうしを対向させて貼り合わせる貼り合せ
工程と、その貼り合わせた状態に訃いて上記圧電共振子
影成用番板に研磨加工を施してその圧電共振子形成用基
板を平行凍杉状にする研磨工程と、その平行薄板状とさ
れた圧電共振・予形成用基板には影響を与えない方法で
上記支持用基板に袈、開は加工を施してその窓開けされ
た邪に上記平行薄板状に加工された圧電共振子形成用基
板のみを残存させる慾ら1十工程とを有する圧電共振子
形成用基板の製造方法。(1) A bonding process in which a piezoelectric resonator forming substrate with one side processed into a flat shape and a supporting substrate with one side processed into a flat shape are bonded together with their flat surfaces facing each other. , a polishing process in which the piezoelectric resonator imaging number plate is polished in the bonded state to make the piezoelectric resonator forming substrate into a parallel frozen cedar shape; The support substrate is processed in a manner that does not affect the resonance/preformation substrate, and only the piezoelectric resonator formation substrate processed into the parallel thin plate shape is placed inside the opening. 1. A method for manufacturing a substrate for forming a piezoelectric resonator, comprising 10 steps in which remaining steps are required.
の基板の一面に片面を平面状に加工したダミー基板をそ
の平面加工された面で貼り合せたものであり、前記貼り
合せ工程は目finじタミー奉僚が貼り合された面と反
対の面に圧″P@、共振子共振子暴飲用基板合せる工程
であるLP4f訝請釆の蛇囲第1歩記載の圧電共振子形
成用ポ依の喪菫力法。(2) The supporting base plate described in H is the first plate whose both sides are flat.
A dummy substrate with one side processed into a flat surface is bonded to one surface of the substrate, and the bonding process is performed on the surface opposite to the surface to which the tummy staff is bonded. Pressure "P@@" is the process of assembling the resonator with the resonator board, which is the first step of the LP4f questionable mechanism.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP213484A JPS60145715A (en) | 1984-01-09 | 1984-01-09 | Production of substrate for forming piezoelecric resonator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP213484A JPS60145715A (en) | 1984-01-09 | 1984-01-09 | Production of substrate for forming piezoelecric resonator |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60145715A true JPS60145715A (en) | 1985-08-01 |
Family
ID=11520860
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP213484A Pending JPS60145715A (en) | 1984-01-09 | 1984-01-09 | Production of substrate for forming piezoelecric resonator |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60145715A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6382116A (en) * | 1986-09-26 | 1988-04-12 | Matsushita Electric Ind Co Ltd | Piezoelectric thin film resonator and its manufacture |
JPH05226964A (en) * | 1992-02-14 | 1993-09-03 | Matsushita Electric Ind Co Ltd | Crystal vibrator and its processing method |
US5283458A (en) * | 1992-03-30 | 1994-02-01 | Trw Inc. | Temperature stable semiconductor bulk acoustic resonator |
EP0641073A2 (en) * | 1990-02-09 | 1995-03-01 | Toyo Communication Equipment Co. Ltd. | Packaged piezoelectric resonator |
US6349454B1 (en) * | 1999-07-29 | 2002-02-26 | Agere Systems Guardian Corp. | Method of making thin film resonator apparatus |
-
1984
- 1984-01-09 JP JP213484A patent/JPS60145715A/en active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6382116A (en) * | 1986-09-26 | 1988-04-12 | Matsushita Electric Ind Co Ltd | Piezoelectric thin film resonator and its manufacture |
EP0641073A2 (en) * | 1990-02-09 | 1995-03-01 | Toyo Communication Equipment Co. Ltd. | Packaged piezoelectric resonator |
EP0644653A2 (en) * | 1990-02-09 | 1995-03-22 | Toyo Communication Equipment Co. Ltd. | Packaged piezoelectric resonator |
EP0644653A3 (en) * | 1990-02-09 | 1995-04-12 | Toyo Communication Equip | |
EP0641073A3 (en) * | 1990-02-09 | 1995-04-26 | Toyo Communication Equip | Packaged piezoelectric resonator. |
JPH05226964A (en) * | 1992-02-14 | 1993-09-03 | Matsushita Electric Ind Co Ltd | Crystal vibrator and its processing method |
US5283458A (en) * | 1992-03-30 | 1994-02-01 | Trw Inc. | Temperature stable semiconductor bulk acoustic resonator |
US6349454B1 (en) * | 1999-07-29 | 2002-02-26 | Agere Systems Guardian Corp. | Method of making thin film resonator apparatus |
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