JPS60144638A - Thermal dipping testing device - Google Patents

Thermal dipping testing device

Info

Publication number
JPS60144638A
JPS60144638A JP13984A JP13984A JPS60144638A JP S60144638 A JPS60144638 A JP S60144638A JP 13984 A JP13984 A JP 13984A JP 13984 A JP13984 A JP 13984A JP S60144638 A JPS60144638 A JP S60144638A
Authority
JP
Japan
Prior art keywords
valve
liquid
test chamber
test
tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13984A
Other languages
Japanese (ja)
Inventor
Shozo Ito
伊藤 昭三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to JP13984A priority Critical patent/JPS60144638A/en
Publication of JPS60144638A publication Critical patent/JPS60144638A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/60Investigating resistance of materials, e.g. refractory materials, to rapid heat changes

Abstract

PURPOSE:To take a thermal dipping test without moving a sampling nor opening and closing a door by transporting cooling liquid and heating liquid to a test chamber alternately. CONSTITUTION:The principal part of the main body 1 is surrounded with a heat insulating medium 2, and the test chamber 10 is arranged at a front position and a cooling tank 20 and a heating tank 30 are provided successively at rear positions. A frame 3 containing a sample is installed in the test chamber 10 and a discharge valve 17 and a liquid feed valve 28 are opened to transport the heat medium from the cooling tank 20 to the test chamber 10. A feed air valve 13 and liquid transport valve 28 are opened a specific time later and the heat medium is returned to the cooling tank 20 with pressurized air fed through the valve 13. Then, a liquid transport valve 38 and a discharge valve 17' are opened to discharge the pressurized air from the valve 17' through a condenser 45, and the heat medium is transported from the heating tank 30. The valve 13 and valve 38 are opened a specific time later to return the heat medium to the heating tank 30, and the heat medium is fed from he cooling tank 20 to the test chamber 10. Said operations are repeated to take a thermal dipping test.

Description

【発明の詳細な説明】 本発明は、IC,LSI等の半導体を始め、電子部品、
精密機器及び−膜素材の熱衝駆や塩度サイクルに対する
耐久性、強度、作動、測定等の浸漬試験を、試料の移動
及び扉の開閉を行なうことなく、試験室内にて実施でき
るようにした、冷熱浸漬試験装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention applies to semiconductors such as ICs and LSIs, as well as electronic components,
Immersion tests on precision instruments and membrane materials to determine durability, strength, operation, measurement, etc. against thermal shock and salinity cycles can now be carried out in the test chamber without moving samples or opening/closing doors. , relates to a cold immersion test device.

従来、半導体及び小型部品、素材等の熱衝撃試験や温度
サイクル試験を行なうには、目的の試料を、試料の形状
及び試験条件に応じた試料支持枠またはカゴに入れ、冷
却槽から加熱槽え、あるいはその逆にと、試料を移動し
浸漬試験を繰返す方式の試験装置が採用されている。
Conventionally, in order to perform thermal shock tests and temperature cycle tests on semiconductors, small parts, materials, etc., the target sample is placed in a sample support frame or cage that matches the sample shape and test conditions, and then transferred from a cooling tank to a heating tank. , or vice versa, a test device is used in which the sample is moved and the immersion test is repeated.

腎かしながら、従来の方式によれば、試料が移動するた
めに、枠又はカゴからの試料のはみ出し、落ちこぼれ、
振動、衝撃による損傷、それに測定や通電の不適当等取
扱上の欠点を有し、更に移動中、槽の試料出入口が開展
状態となるため、冷却槽の液面は氷結して試料の浸漬を
妨げ、加熱槽は高温蒸気放出による危険、及び悪臭や汚
染と、高価な熱媒液の大量消費等をもたらし、構造上で
は枠又はカゴの複雑な移動機構、検出入口封止の連動機
構、それに枠又はカゴから移動中滴下した熱媒液の処理
等があり、浸漬試験が他の試験法に比し優秀であるにも
かかわらず、利用度が低い最大の要因となっている。
However, according to the conventional method, as the sample moves, the sample protrudes from the frame or basket, falls out, and
There are handling disadvantages such as damage from vibration and shock, as well as improper measurement and energization.Furthermore, because the sample entrance and exit of the tank is open during transportation, the liquid level in the cooling tank freezes, making it difficult to immerse the sample. In addition, the heating tank poses dangers due to high-temperature steam release, bad odors and pollution, and large consumption of expensive heat transfer fluid. Although the immersion test is superior to other test methods, it is the biggest reason why it is underused, as there is a need to dispose of the heat transfer liquid that drips from the frame or basket during transport.

本発明は従来の問題を解決して、試料を試験室内に定置
した状態で、しかも試験終了まで扉を開けることなく、
試験条件による指令に基ずき、冷却槽、加熱槽の熱媒液
を入換え、試料を低塩又は高温に浸漬、条件によっては
室温の雰囲気を中間に取入れた試験も、容易に実施でき
るようにしたものである。
The present invention solves the conventional problems and enables the test to be carried out while the sample is kept in the test chamber without opening the door until the end of the test.
Based on the instructions given by the test conditions, it is easy to conduct tests by replacing the heat medium in the cooling tank and heating tank, immersing the sample in low salt or high temperature, and depending on the conditions, introducing a room temperature atmosphere in between. This is what I did.

本発明は、冷却手段により冷しされた低温の熱媒液を移
動させる機構を備えた冷却槽と、加熱手段により加熱さ
れた高温の熱gwを移動させる機構を備えた加熱槽と、
前記冷却槽並びに加熱槽の上部及び下部に、個々に開閉
できる弁と連接する試験室とを、それぞれ断熱壁体で仕
切り、所要配置して1個の箱体内に組合せ、試験室上部
に加圧気体を圧入する給気口と、所要時開閉できる弁を
設け、排気口を冷却槽上部の弁の連接部と接合させ、末
端に逆止弁を取付け、加熱槽の排気口も前記同様に接合
を行ない、末端に凝縮器を設ける。
The present invention provides a cooling tank equipped with a mechanism for moving a low-temperature heat medium liquid cooled by a cooling means, a heating tank equipped with a mechanism for moving high-temperature heat gw heated by a heating means,
Valves that can be opened and closed individually and a connected test chamber are separated at the upper and lower parts of the cooling tank and heating tank by insulating walls, arranged as required, and combined into a single box, and the upper part of the test chamber is pressurized. An air supply port for pressurizing gas and a valve that can be opened and closed as required are provided, the exhaust port is connected to the connecting part of the valve on the top of the cooling tank, a check valve is attached to the end, and the heating tank exhaust port is also connected in the same way as above. and install a condenser at the end.

冷却槽又は加熱槽の一媒液を移動させる機構(例えば液
中ポンプ等)の吐出口には、所要時開閉できる弁を介し
て試験室と連通せしめ、また弁閉時には槽内に吐出でき
るよう分岐口を設ける。
The discharge port of the mechanism (for example, a submersible pump) that moves the liquid medium in the cooling tank or heating tank should be connected to the test chamber through a valve that can be opened and closed as required, and so that it can be discharged into the tank when the valve is closed. Provide a branch entrance.

本発明にては、試験室を低温から高温、又はその逆の状
部、あるいは中間で室温のW囲気にするなどの切換を、
6弁の動作を予め設定した制御機構によって所定の順序
で開閉操作し、試験室の試料に対して所望の試験が行な
えるようにしたので 。
In the present invention, switching the test chamber from low temperature to high temperature or vice versa, or changing it to room temperature W atmosphere in the middle,
The six valves were opened and closed in a predetermined order using a preset control mechanism, allowing the desired test to be performed on the sample in the test chamber.

ある。be.

また本装置では、試料を試験室内に定置後扉を閉じ、外
sgL体にて試験室を加圧することにより、冷却槽又は
加熱槽の熱媒液を試験室より冷却槽または加熱槽内に移
送させ、加圧を解除することに ′より、加熱槽又は冷
却槽の熱媒液を加熱槽又稔冷却槽から試験室え移送させ
、更に冷却槽又は加熱槽の熱媒液を移動させる機構の吐
出口を所要時試験室と連通し、: 冷却槽又は加熱槽の
熱媒液を循環させ、試験室内の温度精度を一保持できる
よう構成したのである。
In addition, with this device, after placing the sample in the test chamber, the door is closed and the test chamber is pressurized by the outer sgL body, thereby transferring the heat medium liquid in the cooling tank or heating tank from the test chamber to the cooling tank or heating tank. The mechanism for transferring the heat medium liquid in the heating tank or cooling tank from the heating tank or the cooling tank to the test chamber, and further transferring the heat medium liquid in the cooling tank or heating tank. The discharge port is communicated with the test chamber when necessary, and the heat transfer liquid in the cooling tank or heating tank is circulated to maintain temperature accuracy within the test chamber.

以下本発明装置について実施例を図面により詳述すれば
次の通りである。
Embodiments of the apparatus of the present invention will be described in detail below with reference to the drawings.

第1図ないし第3図は、本発明装置の代表的なN1実施
例を示しており、主要部を断熱壁体(2)により囲み、
所要寸法の箔体に形成した本体(1)の内部は、前位置
に所要容積の試験室(10)を設け、この試験室(10
)の後方には、比較的容積の大きい低温熱i液を5給す
る冷MJ竺(zo)及び高温の熱媒液を供給する加熱槽
(3o)を併設し、また試験室(1o)の上部には試料
の出し入れ口を密閉するための断熱性を有す゛る扉(1
1)を取付?である・ この試験室(10)の上部には、加圧気体入口(15)
と加圧気体出口(16) (16’)が連設されており
、試験室(10)の下部には熱媒液を移送させる熱媒液
出入口(25)(35)及び排液口(14)を設け、試
験M(10)の側面には熱媒液循環1コ(18)(18
’)を設けである。
1 to 3 show a typical N1 embodiment of the device of the present invention, in which the main part is surrounded by a heat insulating wall (2),
The interior of the main body (1) formed of a foil body of required dimensions is a test chamber (10) with a required volume at the front position.
) At the rear of the test chamber (1o), there is a cold MJ (ZO) that supplies a relatively large volume of low-temperature thermal I-liquid and a heating tank (3o) that supplies a high-temperature heat transfer liquid. At the top, there is a door (1
1) Installed? There is a pressurized gas inlet (15) at the top of this test chamber (10).
and a pressurized gas outlet (16) (16') are connected to each other, and at the bottom of the test chamber (10) there are a heat medium liquid inlet/outlet (25) (35) for transferring the heat medium liquid and a liquid drain port (14). ), and on the side of test M (10), one heat medium liquid circulation (18) (18
') is provided.

このような試験室(10)の背後位置には冷却槽(2o
)が形成されており、この冷却槽、(2G)内には冷却
器(蒸発器)(21)と低塩域の温度制御用ヒータ(2
2)及び液送用のポンプ(23)とが配設されており、
試験室(+0)に対しては、冷却槽(2o)上部に給徘
鰐口、(27)を設け、前部加圧気体出口(16)と排
気弁(17)を介し、て連通せしめ、冷は熱媒液移送口
(26)を、前記熱媒出入rJ(25)と液送弁(28
)を介し可熱壁体(2)を貫通して連通させ、末−には
排液弁(24〕を接合し、ポンプ(23)の吐出口には
吐出弁(29)を介して、前記熱媒液循環口(18)に
断熱壁体(2)を貫通して連通させている。
A cooling tank (2 o
) is formed, and this cooling tank (2G) contains a cooler (evaporator) (21) and a heater (2G) for temperature control in the low salt range.
2) and a pump (23) for feeding the liquid,
For the test chamber (+0), a feeding port (27) is provided at the top of the cooling tank (2o), and it is communicated with the front pressurized gas outlet (16) via the exhaust valve (17). connects the heat medium liquid transfer port (26) with the heat medium inlet/outlet rJ (25) and the liquid feed valve (28).
) through the heatable wall body (2), and a drain valve (24) is connected at the end, and the discharge port of the pump (23) is connected through the discharge valve (29). The heat medium liquid circulation port (18) is communicated through the heat insulating wall (2).

またポンプ(23)の4吐出口には、熱媒液を冷却槽(
20)内え還流できる分岐口(40)が設けてあり、常
時熱媒液の蓋部(吐出−(29)閉鎖時には全部)を槽
内で循環させて、温度精度の向上を計っている。
In addition, the four discharge ports of the pump (23) are connected to a cooling tank (
20) A branch port (40) is provided to allow internal reflux, and the heat transfer liquid lid part (all when the discharge (29) is closed) is constantly circulated within the tank to improve temperature accuracy.

試験室(10)の背面位置には、前記冷却槽(20)と
並列に、、断熱壁体(2)で仕切−られた加熱槽(30
)が形成してあり、この加熱槽(30〕内、にはヒータ
(32)とポンプ(33)とが配設されており、試験室
(10)に対しては、前記冷却槽(20)同様給排気口
(37)と加圧気体出口(16’)を、熱媒液移送口(
36)と熱媒液出入口(35)及びポンプ(33)の吐
出口と熱媒液循環口(18’)をそれぞれ排気弁(+7
’)、液送弁(38)、吐出弁(39)を介して連通さ
せ、ポンプ(33)から吐出する熱媒液を、試験室(1
0)内に循環させており、ポンプ(23) (33)の
駆動モータ(23’) (33’)はいずれも槽、外部
に設置されている。
At the rear of the test chamber (10), in parallel with the cooling tank (20), there is a heating tank (30) partitioned by a heat insulating wall (2).
), a heater (32) and a pump (33) are disposed inside this heating tank (30), and a cooling tank (20) is provided for the test chamber (10). Similarly, the supply/exhaust port (37) and the pressurized gas outlet (16') are connected to the heat medium liquid transfer port (
36), the heat medium liquid inlet/outlet (35), the discharge port of the pump (33), and the heat medium liquid circulation port (18'), respectively, through the exhaust valve (+7).
'), a liquid supply valve (38), and a discharge valve (39) to communicate the heat transfer liquid discharged from the pump (33) to the test chamber (1).
The drive motors (23') (33') of the pumps (23) (33) are both installed outside the tank.

加圧気体入口(15)の手前には給気弁(13)を、ま
た・加熱槽(30)の給排気口(37)の末端には凝縮
器(45)を接続し、排出される熱媒液の蒸気を冷却し
て凝縮させ、渡取出弁(46)を開いて凝JI波を回収
する。
An air supply valve (13) is connected in front of the pressurized gas inlet (15), and a condenser (45) is connected to the end of the supply and exhaust port (37) of the heating tank (30), so that the heat exhausted is The vapor of the medium is cooled and condensed, and the transfer valve (46) is opened to collect the condensed JI wave.

凝縮器(45)の手前に給液弁(46)が上向に接続さ
れ、液補給時に使用し、熱媒液移送口(36)の下端に
は排液弁(34)を取付け、熱媒液を回収出来るように
配慮されている。
A liquid supply valve (46) is connected upward in front of the condenser (45) and is used for liquid replenishment, and a liquid drain valve (34) is installed at the lower end of the heating medium liquid transfer port (36) to Care has been taken to ensure that the liquid can be recovered.

前記冷却槽(20)にも同様に、給排気口(27)の末
端には、外気の侵入を防ぐため逆止弁(41)を設け、
上向には給皺弁(42)を、また熱媒液送]コ(26)
の下部には排液弁(24)を取付けである。
Similarly, the cooling tank (20) is provided with a check valve (41) at the end of the supply/exhaust port (27) to prevent outside air from entering.
There is a wrinkle supply valve (42) upward, and a heating medium liquid supply valve (26).
A drain valve (24) is installed at the bottom of the tank.

本体(1)の下部及び後部には、本体〈1)の支持及び
冷却装置(8)を収納する機械室(5)を配設し、本体
(1)の側部には試験温度、浸漬時間、サイクル数、等
を制御及び表示又は記録する計測器や、各動力の駆動、
機器の操作を司どる電気部品を装着できる配電盤(9ン
を設置しである。
A machine room (5) is provided at the bottom and rear of the main body (1) to support the main body (1) and house a cooling device (8). , number of cycles, etc., and measuring instruments that control and display or record each power drive,
A power distribution board (9 units) is installed on which the electrical components that control the operation of the equipment can be installed.

試験室(10)と冷却槽(20)及び試験室(lO)と
加熱槽(30)は、前述のようにそれぞれυr気弁(1
7)、液送弁(28)1.吐出弁(29)及び刊気弁(
17’)、液送弁(38)、吐出弁(39)を介して連
通されており、それぞれの弁を配電盤(9)に装着され
たu1測器の制御信号にて作動するよう配線されている
The test chamber (10) and the cooling tank (20) and the test chamber (lO) and the heating tank (30) each have a υr air valve (10) as described above.
7), Liquid feed valve (28)1. Discharge valve (29) and air valve (
17'), a liquid feed valve (38), and a discharge valve (39), and each valve is wired to be activated by a control signal from the u1 measuring instrument installed on the switchboard (9). There is.

第4図は低温の状態にある熱媒液の移励を示した説朗図
で、所要時間経過後給気弁(13)及び液送弁(28)
を開き、その他の弁を閉にすることにより、試験M(1
0)は低温の段階を終了し、給気弁(13)から圧送さ
れた加圧気体により、冷却された熱媒液(50’ )は
液送弁(28)を通って冷却槽(20)に還元され、熱
媒液(50’)が(50)位置に還元後液送弁(28)
を閉じ、試験室(10)内に気体の雰囲気を作成する。
Figure 4 is an explanatory diagram showing the transfer of heat transfer liquid in a low-temperature state.
test M (1) by opening the valve and closing the other valves.
0) has completed the low temperature stage, and the cooled heat transfer liquid (50') is passed through the liquid feed valve (28) by the pressurized gas fed from the air supply valve (13) to the cooling tank (20). The heating medium liquid (50') is returned to the (50) position after being reduced to the liquid sending valve (28).
is closed to create a gas atmosphere within the test chamber (10).

もし試験中に室温の雰囲気を必要とする場合は、排出弁
(14)を開き、加圧気体の流量を絞って送ることによ
り、所要時間Mm状態を保持することができる。
If a room temperature atmosphere is required during the test, the Mm state can be maintained for the required time by opening the exhaust valve (14) and reducing the flow rate of the pressurized gas.

第5図は、前記試験室(10)内が中空になり、引続き
高温の浸漬に移行する状態を説明、図示したもので、液
送弁(38)及び排気弁(17’)を開きその他、−の
弁を閉にすることにより、試験1(10)内の加圧気体
は排気弁(17’)を通り凝縮器(45)を経て外一部
え放出され、その1部は給排気口(37)より加熱槽(
30)に還元され、加熱された熱媒液(60’)を液送
弁(38)を通して試験室(10)内に移送させ、均衡
して液面(60)を形成し、吐出弁(39ンを開き、そ
の他の弁を閉じて、熱媒液を加熱槽(30)から試験!
(10)え循環させることにより、高温の浸漬を保持し
ている。
FIG. 5 explains and illustrates the state in which the inside of the test chamber (10) becomes hollow and continues to be immersed in high temperature, and the liquid feed valve (38) and the exhaust valve (17') are opened and other - By closing the valve, the pressurized gas in test 1 (10) passes through the exhaust valve (17'), passes through the condenser (45), and is partially discharged to the outside. (37) from the heating tank (
The heated heat transfer liquid (60') is transferred into the test chamber (10) through the liquid delivery valve (38), and is balanced to form a liquid level (60), which is then transferred to the discharge valve (39). Open the valve, close the other valves, and test the heat transfer fluid from the heating tank (30)!
(10) High temperature immersion is maintained by circulating the water.

図示してはいないが、所要時間経過径、前記の給気弁(
13)と高温側の液送弁(38)を開き、他の弁を閉じ
、給気弁(13)から加圧気体を圧送することにより、
熱媒液は試m室(10)から加熱槽(30)え還送され
、試験室(10)内を空洞にし、引続き低温側の排気弁
(17)及び液送弁(28)を開き、他の弁を閉じ熱媒
液を冷却槽(2o)から試験室(10)内に移送、均衡
させることにより、低温域の浸漬を行なうことができる
Although not shown, the required time elapsed diameter, the above-mentioned air supply valve (
13) and the high temperature side liquid feed valve (38), close the other valves, and forcefully feed pressurized gas from the air supply valve (13).
The heating medium liquid is returned from the test chamber (10) to the heating tank (30), the inside of the test chamber (10) is made hollow, and then the exhaust valve (17) and the liquid feed valve (28) on the low temperature side are opened. By closing the other valves and transferring the heat transfer liquid from the cooling tank (2o) into the test chamber (10) and balancing it, immersion in the low temperature range can be performed.

第6図は、本発明装置の第2実施例の配置を示したもの
で、試験室(10)に対して冷却槽(2o)、加熱槽(
3(す、とそれ以外に常温槽(7o)を配置し、前記第
1実施例同様、液送弁(78)を断熱壁体(2)を貫通
して試験室(14りと連通せしめ、槽上部にはuト気弁
(77)を、前記抽気弁(+7) (17’)の間に接
合せしめ回路を構成する。
FIG. 6 shows the arrangement of the second embodiment of the apparatus of the present invention, in which a cooling tank (2o), a heating tank (
3. In addition to this, a room temperature tank (7o) is arranged, and as in the first embodiment, the liquid feed valve (78) is communicated with the test chamber (14) through the heat insulating wall (2). An air valve (77) is connected to the top of the tank between the air extraction valves (+7) (17') to form a circuit.

必要に応じて常温槽(70)内に、冷却器(蒸発器)(
71)及びヒータ(72)を配設して温度の制御を行な
い、又ポンプ(73)及び吐出弁(79)を取付けて熱
媒液を循環し、所要の温度を保持することができる。
If necessary, a cooler (evaporator) (
71) and a heater (72) are installed to control the temperature, and a pump (73) and a discharge valve (79) are installed to circulate the heat transfer fluid and maintain the required temperature.

上述したそれぞれの弁を、外部信号により切換えて、低
温、常温、高温、又はその逆の繰返しにて、冷熱浸漬試
験ができるようにしたものである。
Each of the above-mentioned valves is switched by an external signal so that a cold immersion test can be performed repeatedly at low temperature, room temperature, high temperature, or vice versa.

第7図は、本発明装置の第3実施例の要部を示したもの
で、試験室(10)から熱媒液を冷却槽(20)、又は
加熱槽(30〕に圧送する時に、給気弁(13)及び液
送弁(28)又は(38)を開いたが、液送弁(28)
 (38)を閉じることにより、試験室(10)は加圧
され、試料により過大なストレスを加えることが可能と
なる。
FIG. 7 shows the main parts of the third embodiment of the device of the present invention, in which the heating medium liquid is supplied under pressure from the test chamber (10) to the cooling tank (20) or the heating tank (30). The air valve (13) and the liquid feed valve (28) or (38) were opened, but the liquid feed valve (28)
By closing (38), the test chamber (10) is pressurized, making it possible to apply more stress to the sample.

給気弁(+3)を閉じ、排気弁(17)又は(+7’)
及び吐出弁(29)又は(39)を開いて、熱媒液を循
環することにより通常の試験に戻すことができる。
Close the air supply valve (+3) and close the exhaust valve (17) or (+7')
Then, normal testing can be resumed by opening the discharge valve (29) or (39) and circulating the heat transfer liquid.

第8図は、本発明装置の第4実施例の要部を示したもの
で、試験室(10)内が中空の状態にて単独、あるいは
連続試験中に実施し、給気弁(13)に加圧する1次側
回路内に蒸気発生器(80)及び冷却器(蒸発器)(8
1Lヒータ(82)を設置し、外部より温度及び圧力を
調整することにより、試験室(10)内を所要の温、湿
度の雰囲気に保ちながら加圧でき、浸漬試験と異なるス
トレスを試料に加えることが出来る。
FIG. 8 shows the main parts of the fourth embodiment of the device of the present invention, in which tests were carried out alone or during continuous tests with the test chamber (10) in a hollow state, and the air supply valve (13) A steam generator (80) and a cooler (evaporator) (8
By installing a 1L heater (82) and adjusting the temperature and pressure from the outside, it is possible to pressurize the inside of the test chamber (10) while maintaining the required temperature and humidity atmosphere, applying stress to the sample that is different from the immersion test. I can do it.

この試験を連続試験中に実施する場合は、加醍弁(83
)を閉、加圧弁(84)を開に切換え、排出弁(14)
を開き、試験室(10)内の水蒸気を完全に放出してか
ら、次のサイクルに移行させることが、望ましい。
If this test is to be carried out during continuous testing, please use Kadaiben (83
) is closed, the pressurizing valve (84) is opened, and the discharge valve (14) is closed.
It is desirable to open the test chamber (10) and completely release the water vapor in the test chamber (10) before proceeding to the next cycle.

本発明装置llの各部の配置や構成及び外形については
、上述のように種々の例を列挙したが、これ等に限定さ
れるものではなく、必要に応じて、他の状態に組合せて
構成することも、任意になし得るものである。
Although various examples have been listed above regarding the arrangement, configuration, and external shape of each part of the device 11 of the present invention, the present invention is not limited to these examples, and may be configured in other configurations as necessary. This can also be done arbitrarily.

上述した各実施例が示すように、本発明装置は試料を試
験室内に定置して、この試験室に加熱液を移送して高温
に、冷却液を移送して低温に、常を品薄又は加圧気体を
送り込んで常温に、それぞれ切換えることにより、直ち
に試料を所要の条件に浸漬して試験を実施することが出
来、試料のはみ出し、落ちこぼれ、振動、衝撃等も発生
せず、液面の氷結や熱媒蒸気の放出もなく、従来の装置
に残されていた種々の問題点をすべて解決し、しかも移
動機構や扉開閉機構等が不要になり、全体の構成が簡素
化され、高温蒸気による危険や汚染もないため、作業員
による取扱も安全、簡便となり、高価な熱媒液の消耗も
少ない等、数多くの利点を具備した試験装置となし得た
のである。
As shown in the above-mentioned embodiments, the present invention apparatus places a sample in a test chamber, transfers a heating liquid to this test chamber to raise the temperature, and transfers a cooling liquid to lower the temperature. By sending in pressurized gas and switching the temperature to room temperature, the test can be carried out by immediately immersing the sample under the required conditions, and there is no risk of sample protrusion, spillage, vibration, shock, etc., and there is no freezing of the liquid surface. This eliminates the need for a moving mechanism or a door opening/closing mechanism, which simplifies the overall configuration and eliminates the need for high-temperature steam. Since there is no danger or contamination, it is safe and easy to handle by workers, and there is little consumption of expensive heat transfer fluid, making it possible to create a test device with many advantages.

従来の浸漬試験装置では、加圧試験を行なえる装置は見
当らない。
Among conventional immersion test equipment, there is no equipment that can perform pressure tests.

わずかに気体の加圧試験専用器が市場に出ているが、こ
れとて熱衝邪試験や温度サイクル試験はできない。
There are a few specialized gas pressurization test devices on the market, but they cannot perform heat shock tests or temperature cycle tests.

本発明配置では、前述したようにいともlVJ単に加圧
試験が実施でき、現在まで液槽による熱衝撃試験が最も
過酷な試験とされて来たが、その常識を覆して、はるか
にそれを上回る、より過酷なストレスを試料に加えるこ
とが出来、短時間で以前と同じ、あるいはそれ以上の効
果をあげることを可能となし得たのである。
With the arrangement of the present invention, as mentioned above, it is possible to simply perform a pressurization test on the VJ, and to date, the thermal shock test using a liquid tank has been considered the most severe test, but it overturns common sense and far exceeds that test. , it was possible to apply even more severe stress to the sample, making it possible to achieve the same or even greater effects than before in a short period of time.

更に本発明装置では、単独あるいはサイクル試験中に、
加湿、加圧の条件を組入れることが出来、又、熱媒液に
水分の混入するのを意に介さなければ、試料の凍結、融
解試験も可能で、試料にまた異ったストレスを加えるこ
とも出来る。
Furthermore, with the device of the present invention, alone or during a cycle test,
Humidification and pressurization conditions can be incorporated, and if moisture is not mixed into the heat transfer fluid, freezing and thawing tests on samples are also possible, and different stresses can be applied to the sample. You can also do it.

本発明装置は、上述したように多目的試験が可能であり
、試験装置の目標である万能試験装置にかなり歩み寄れ
た冷熱浸漬試験装置とすることができたのである。
The apparatus of the present invention is capable of multi-purpose testing as described above, and has been able to be made into a cold/hot immersion test apparatus that comes fairly close to the all-purpose test apparatus that is the goal of the test apparatus.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明装置の第1実施例の機械収容部ル。制御
HA器器官容部除、横断面図、第2図、ようの縦断面図
、第3図は平断面図、第4図、第5図は原理説明図。 第6図は本発明装置の第2実施例の平面配置図。 第7図は本発明装置の第3実鹿例゛の要部拡大図。 第8図は本発明装置の第4実施例の要部拡大図。 (蔦)・・・・・外 箱(21・・・・・・・・断熱壁
体(:1〕・・−・・・・・訊利枠(5)・・・・・・
機械室(10」 ・ ・ ・ 試 験 室 (’i+1
・・ ・・ ・・断 熱 扉(13)−・ ・給 気 
弁 (14) (24’) (:づ4)排 液 弁(+
71(17’ン(77)ノJ1 気 弁 (pro) 
・−)’L−−冷 1aJ 槽+211 (711+8
1)冷 却 器 (22) (321(72) (82
)ヒ−タ(231+331 (73) ボ ン プ +
29) (39) (791吐 出 弁(30)・・・
・・・・・加 熱 槽(41)・・・・逆 止 弁(4
2) (43) (44) 給 液 弁 (45)・・
 ・ 凝 縮 器(46)・・・・・蔽取出弁(70)
・・・・・・常 温 槽(80)・・・・・蒸気発生器
(83)・ ・加 個 弁(84)・・・・・・・・加
 圧 弁(86)・・・・給 水 弁(87)・・・・
・・・排 水 弁 特許出願人 伊 藤 昭 三 箋 31囚 光 6 図
FIG. 1 shows a machine accommodating section of a first embodiment of the device of the present invention. FIG. 2 is a vertical sectional view, FIG. 3 is a plan sectional view, and FIGS. 4 and 5 are diagrams explaining the principle. FIG. 6 is a plan layout diagram of a second embodiment of the device of the present invention. FIG. 7 is an enlarged view of the main parts of a third example of the device of the present invention. FIG. 8 is an enlarged view of the main parts of the fourth embodiment of the device of the present invention. (Ivy)...Outer box (21...Insulating wall (:1)...Toruri frame (5)...
Machine room (10) ・ ・ ・ Test room ('i+1
・・・・Insulation door (13)−・・Air supply
Valve (14) (24') (:zu4) Drain valve (+
71 (17'n (77) no J1 Ki Valve (pro)
・-)'L--Cold 1aJ tank +211 (711+8
1) Cooler (22) (321 (72) (82
) Heater (231+331 (73) Bump +
29) (39) (791 Discharge valve (30)...
... Heating tank (41) ... Check valve (4
2) (43) (44) Liquid supply valve (45)...
・ Condenser (46)... Screening valve (70)
...Normal temperature tank (80) ...Steam generator (83) ...Purification valve (84) ...Pressure valve (86) ...Supply Water valve (87)...
...Drainage valve patent applicant Akira Ito Miyuki 31 Kyo Hikaru 6 Figure

Claims (1)

【特許請求の範囲】[Claims] 試料を入れた枠またはカゴを、加圧出来る試験室内に定
置し、熱媒液を冷却した冷却槽及び熱媒液を加熱した加
熱槽の熱媒液を、交互に試験室に移送し、枠またはカゴ
の移動や扉の開閉を行なうことなく、試料の冷却及び加
熱を繰返し行なえるようにした冷熱浸漬試験装置
The frame or basket containing the sample is placed in a test chamber that can be pressurized, and the heat transfer liquid in the cooling tank that cooled the heat transfer liquid and the heating tank that heated the heat transfer liquid are alternately transferred to the test chamber. Or a cold immersion test device that can repeatedly cool and heat samples without moving the basket or opening/closing the door.
JP13984A 1984-01-04 1984-01-04 Thermal dipping testing device Pending JPS60144638A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13984A JPS60144638A (en) 1984-01-04 1984-01-04 Thermal dipping testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13984A JPS60144638A (en) 1984-01-04 1984-01-04 Thermal dipping testing device

Publications (1)

Publication Number Publication Date
JPS60144638A true JPS60144638A (en) 1985-07-31

Family

ID=11465690

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13984A Pending JPS60144638A (en) 1984-01-04 1984-01-04 Thermal dipping testing device

Country Status (1)

Country Link
JP (1) JPS60144638A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5167451A (en) * 1990-08-10 1992-12-01 Hoechst Aktiengesellschaft Method and device for the thermal shock test
US5290101A (en) * 1992-12-03 1994-03-01 At&T Bell Laboratories Liquid thermal cycling methods and apparatus
US5294199A (en) * 1992-10-29 1994-03-15 Venturedyne, Ltd. System and method for thermally stress screening products

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5167451A (en) * 1990-08-10 1992-12-01 Hoechst Aktiengesellschaft Method and device for the thermal shock test
US5294199A (en) * 1992-10-29 1994-03-15 Venturedyne, Ltd. System and method for thermally stress screening products
US5290101A (en) * 1992-12-03 1994-03-01 At&T Bell Laboratories Liquid thermal cycling methods and apparatus

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