JPS60133716A - Method of forming magnetic anisotropic permalloy layer - Google Patents

Method of forming magnetic anisotropic permalloy layer

Info

Publication number
JPS60133716A
JPS60133716A JP59246962A JP24696284A JPS60133716A JP S60133716 A JPS60133716 A JP S60133716A JP 59246962 A JP59246962 A JP 59246962A JP 24696284 A JP24696284 A JP 24696284A JP S60133716 A JPS60133716 A JP S60133716A
Authority
JP
Japan
Prior art keywords
gas
nitrogen
sputtering
permalloy
permalloy layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59246962A
Other languages
Japanese (ja)
Inventor
ハンス、ウエルナー、ペツルベルガー
ジークフリート、ボツク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Siemens AG
Original Assignee
Siemens Schuckertwerke AG
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Schuckertwerke AG, Siemens AG filed Critical Siemens Schuckertwerke AG
Publication of JPS60133716A publication Critical patent/JPS60133716A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F41/00Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
    • H01F41/14Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
    • H01F41/18Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by cathode sputtering

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Thin Magnetic Films (AREA)
  • Physical Vapour Deposition (AREA)
  • Magnetic Heads (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、小さな保磁力強度1Hc)をもつ磁気異方性
パーマロイ層をスパッタリング被覆によって生成する方
法に関する。小さなHeをもつパーマロイ層は、種々の
用途に必要である。例えば薄膜磁気ヘッド用として、陰
極スパッタリングによって被覆された数マイクロメータ
の厚さのパーマロイ層(Ni/Fe約80/20)が必
要である。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application] The present invention relates to a method for producing magnetically anisotropic permalloy layers with a low coercive strength (1Hc) by sputter coating. Permalloy layers with small He are required for various applications. For example, for thin film magnetic heads, a few micrometers thick permalloy layer (Ni/Fe approximately 80/20) coated by cathodic sputtering is required.

〔従来の技術〕[Conventional technology]

従来の高周波ダイオードスパッタリング(RF=無腺周
波数)による通常の方法では、約3μm/hまでのスパ
ッタリング率が得られる。その場合、吹付は気体として
アルゴンが使用される。
The usual method with conventional radio frequency diode sputtering (RF=no frequency) gives sputtering rates of up to about 3 μm/h. In that case, argon is used as the gas for spraying.

従来、磁界の支持によるスパッタリング被覆方法(マグ
ネトロンスパッタリング被覆)は、ターゲット内の磁気
短絡によって磁気ターゲットがマグネトロンリングの形
成を阻止するため、パーマロイには使用されていない。
Traditionally, magnetic field supported sputter coating methods (magnetron sputter coating) have not been used for permalloy because magnetic shorts in the target prevent the magnetic target from forming magnetron rings.

しかしながら特定の装置(通常より高い磁界強度をもつ
マグネトロンおよび/またはスリット付パーマロイ・タ
ーゲット、IEEE Transactions On
 Magnetics。
However, certain devices (such as magnetrons and/or slit permalloy targets with higher than normal magnetic field strengths, IEEE Transactions On
Magnetics.

MAG−18巻、第6号、1982年11月、1080
−1082頁参照)を使用することによって、マグネト
ロンスパッタリングを行なうことができる。これによっ
て、約9μm / h−1,でのスパッタリング率が可
能である。
MAG-Volume 18, No. 6, November 1982, 1080
Magnetron sputtering can be performed by using the following methods: (see page 1082). This allows sputtering rates of approximately 9 μm/h−1.

薄膜磁気ヘッド用のパーマロイ層の場合には、層が磁気
異方性をもつ(°′軽°°方向、′°重°□方向)こと
が特に要求される。これは、層の形成中に、′°軽”1
方向に安定な磁界をつぐることによって達成される。特
に、ヘッドの完全な記録動作/読取り動作に対しては、
保磁力強度Hc(一般の誘導測定方法により11軽0方
向に測定)が所定の値、例えば0.23 A/cmを超
過[7ないことが絶対必要である。
In the case of a permalloy layer for a thin-film magnetic head, it is particularly required that the layer has magnetic anisotropy (in the ``light'' direction and the ``heavy'' direction). This is because during the formation of the layer,
This is achieved by passing a stable magnetic field in the direction. Especially for complete recording/reading operations of the head.
It is absolutely necessary that the coercive force strength Hc (measured in the 11 light direction by a general inductive measurement method) does not exceed a predetermined value, for example 0.23 A/cm [7].

従来のスパッタリング方法においては、これは再現する
ことが不可能である。これは特に、スパッタリングの際
に始めから僅かな残留ガス収量をもつスルース装置の場
合に当て嵌まる。同様に、数ミクロンの厚さの層を必要
とする場合、バッチ法による装置にも当て嵌まる。この
原因は、スパッタリングの際の残留ガス収量の磁気特性
への影響である。しかし成る程度の残留ガス成分がを効
であることは明白である。
In conventional sputtering methods this is impossible to reproduce. This applies in particular to sluice devices which initially have a low residual gas yield during sputtering. This also applies to batch-based devices if layers of several microns in thickness are required. The reason for this is the influence of the residual gas yield during sputtering on the magnetic properties. However, it is clear that a certain amount of residual gas components are effective.

〔発明の解決すべき問題点〕[Problems to be solved by the invention]

本発明の目的は、小さなI−1cを有する磁気的に異方
性のパーマロイ層の被覆を再現可能に実施することが可
能な冒頭に述べた方法を提供することにある。
The object of the invention is to provide a method as mentioned at the outset with which the coating of magnetically anisotropic permalloy layers with a small I-1c can be carried out reproducibly.

〔問題点の解決手段〕[Means for solving problems]

この目的は、吹付は気体(一般にはアルゴン)に反応気
体(窒素、空気など)を加えることによって達成される
This purpose is achieved by adding a reactive gas (nitrogen, air, etc.) to the gas (generally argon).

〔作用効果〕[Function and effect]

このようにすることによって、常に同量の反応気体をス
パッタリング時に得られることになる。
By doing so, the same amount of reaction gas can always be obtained during sputtering.

これによってこの方法は、バッチ原理またはスルース原
理による装置、またはスパッタリング率の異なるスパッ
タリング方法(RF’ダイオード原理、マグネトロン原
理)の場合に、再現可能に使用することができる。
This allows the method to be used reproducibly in apparatuses according to the batch principle or the sluice principle, or in the case of sputtering methods with different sputtering rates (RF' diode principle, magnetron principle).

本発明の発展形態によれば、吹付は気体としては、アル
ゴン・窒素混合体が使用される。その場合、アルゴン吹
付は気体に0.5−2%の窒素を加えることが好ましい
。本発明による方法の使用は、RF’ダイオード原理お
よびマグネトロン原理の装置に可能である。
According to a development of the invention, the blowing gas is an argon/nitrogen mixture. In that case, it is preferable to add 0.5-2% nitrogen to the argon blowing gas. The use of the method according to the invention is possible for devices on the RF' diode principle and on the magnetron principle.

〔実施例〕〔Example〕

本発明を実施例によって説明する。次の基質。 The present invention will be explained by examples. Next substrate.

酸化アルミニウムベースをもつ炭化チタン(厚さ4mm
)、ソフトガラス(4m1R)、ケイ素つェーへf0.
fll)が使用された。この例の層の厚さは、2−4μ
mである。
Titanium carbide with aluminum oxide base (4 mm thickness)
), soft glass (4m1R), silicone glass f0.
fll) was used. The layer thickness in this example is 2-4μ
It is m.

実施例1 スルースを備えたRF・ダイオード原理によるスパッタ
リング装置。前記基質の場合、窒素のない場合には最良
でも0.4−0.6 A/crnのHc値であるが、窒
素を加えた場合にはO,2A/mが得られる(定常被覆
;パーマロイスパッタリング率3μm/h)。
Example 1 A sputtering device based on the RF/diode principle and equipped with a sluice. For the above substrates, in the absence of nitrogen, Hc values of 0.4-0.6 A/crn are obtained at best, but with nitrogen addition O.2 A/m can be obtained (steady coverage; permalloy sputtering rate 3 μm/h).

実施例2 スルースを備えた半自動連続運転装置。マグネトロン原
理によるスパッタリング。窒素のない場合0.45 A
/crn、窒素のある場合0.2A/cm0(定常被覆
;パーマロイスパッタリング率6−8μm/h)。
Example 2 Semi-automatic continuous operation device equipped with a sluice. Sputtering using the magnetron principle. 0.45 A without nitrogen
/crn, 0.2 A/cm0 with nitrogen (steady coverage; permalloy sputtering rate 6-8 μm/h).

Claims (1)

【特許請求の範囲】 ■)吹付は気体(一般にはアルゴン)に反応気体(窒素
、空気など)を加えることを特徴とする小さな保磁力強
度(Hc)をもつ磁気異方性パーマロイ層の生成方法。 2)吹付は気体としてアルゴン/窒素混合気体を使用す
ることを特徴とする特許請求の範囲第1項記載の方法。 3)アルゴン吹付は気体に0.5−2%の窒素を加える
ことを特徴とする特許請求の範囲第2項記載の方法。
[Claims] ■) A method for producing a magnetically anisotropic permalloy layer with a small coercive force strength (Hc), characterized in that spraying involves adding a reactive gas (nitrogen, air, etc.) to a gas (generally argon). . 2) The method according to claim 1, characterized in that the spraying uses an argon/nitrogen mixed gas as the gas. 3) A method according to claim 2, characterized in that the argon blowing includes adding 0.5-2% nitrogen to the gas.
JP59246962A 1983-11-24 1984-11-21 Method of forming magnetic anisotropic permalloy layer Pending JPS60133716A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19833342533 DE3342533A1 (en) 1983-11-24 1983-11-24 SPRAYING OF PERMALLOY LAYERS
DE3342533.7 1983-11-24

Publications (1)

Publication Number Publication Date
JPS60133716A true JPS60133716A (en) 1985-07-16

Family

ID=6215167

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59246962A Pending JPS60133716A (en) 1983-11-24 1984-11-21 Method of forming magnetic anisotropic permalloy layer

Country Status (3)

Country Link
EP (1) EP0144851B1 (en)
JP (1) JPS60133716A (en)
DE (2) DE3342533A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6324030A (en) * 1986-06-26 1988-02-01 Res Dev Corp Of Japan Anisotropic rare earth magnet material and its production
GB2194965B (en) * 1986-09-12 1991-01-09 Sharp Kk A process for preparing a soft magnetic film of ni-fe based alloy
JP2778494B2 (en) * 1994-12-26 1998-07-23 日本電気株式会社 Electrode thin film and magnetoresistive head using the electrode thin film
AU6733196A (en) * 1995-08-30 1997-03-19 Danfoss A/S Method of producing magnetic poles on a base member, and rotor of an electrical machine

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4094761A (en) * 1977-07-25 1978-06-13 Motorola, Inc. Magnetion sputtering of ferromagnetic material
US4271232A (en) * 1978-08-28 1981-06-02 International Business Machines Corporation Amorphous magnetic film
JPS5571006A (en) * 1978-11-22 1980-05-28 Matsushita Electric Ind Co Ltd Magnetic thin film and its manufacturing method
JPS57149706A (en) * 1981-03-12 1982-09-16 Tdk Corp Magnetic recording medium
JPS5987622A (en) * 1982-11-09 1984-05-21 Ulvac Corp Magnetic recording body and its production

Also Published As

Publication number Publication date
DE3476718D1 (en) 1989-03-16
DE3342533A1 (en) 1985-06-05
EP0144851A2 (en) 1985-06-19
EP0144851A3 (en) 1985-07-17
EP0144851B1 (en) 1989-02-08

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