JPS60133340A - 洩れ探査装置 - Google Patents
洩れ探査装置Info
- Publication number
- JPS60133340A JPS60133340A JP14397783A JP14397783A JPS60133340A JP S60133340 A JPS60133340 A JP S60133340A JP 14397783 A JP14397783 A JP 14397783A JP 14397783 A JP14397783 A JP 14397783A JP S60133340 A JPS60133340 A JP S60133340A
- Authority
- JP
- Japan
- Prior art keywords
- probe
- gas
- helium
- container
- nozzle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 title claims description 21
- 239000000523 sample Substances 0.000 claims abstract description 40
- 239000007789 gas Substances 0.000 claims abstract description 35
- 239000001307 helium Substances 0.000 claims abstract description 17
- 229910052734 helium Inorganic materials 0.000 claims abstract description 17
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims abstract description 17
- 239000007788 liquid Substances 0.000 claims abstract description 10
- 239000002808 molecular sieve Substances 0.000 claims abstract description 8
- URGAHOPLAPQHLN-UHFFFAOYSA-N sodium aluminosilicate Chemical compound [Na+].[Al+3].[O-][Si]([O-])=O.[O-][Si]([O-])=O URGAHOPLAPQHLN-UHFFFAOYSA-N 0.000 claims abstract description 8
- 239000003463 adsorbent Substances 0.000 claims abstract description 7
- 229910052754 neon Inorganic materials 0.000 claims abstract description 7
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims abstract description 7
- 239000001257 hydrogen Substances 0.000 claims abstract description 5
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract description 23
- 229910052757 nitrogen Inorganic materials 0.000 abstract description 12
- 230000035945 sensitivity Effects 0.000 abstract description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract description 3
- 239000001301 oxygen Substances 0.000 abstract description 3
- 229910052760 oxygen Inorganic materials 0.000 abstract description 3
- 238000013459 approach Methods 0.000 abstract description 2
- 125000004435 hydrogen atom Chemical class [H]* 0.000 abstract 2
- 238000012360 testing method Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 13
- 238000007796 conventional method Methods 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000011160 research Methods 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229910003460 diamond Inorganic materials 0.000 description 2
- 239000010432 diamond Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000004949 mass spectrometry Methods 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 238000007789 sealing Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000000499 gel Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M3/00—Investigating fluid-tightness of structures
- G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
- G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
- G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
- G01M3/202—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material using mass spectrometer detection systems
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Examining Or Testing Airtightness (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14397783A JPS60133340A (ja) | 1983-08-06 | 1983-08-06 | 洩れ探査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14397783A JPS60133340A (ja) | 1983-08-06 | 1983-08-06 | 洩れ探査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60133340A true JPS60133340A (ja) | 1985-07-16 |
JPH0159531B2 JPH0159531B2 (enrdf_load_stackoverflow) | 1989-12-18 |
Family
ID=15351443
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14397783A Granted JPS60133340A (ja) | 1983-08-06 | 1983-08-06 | 洩れ探査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60133340A (enrdf_load_stackoverflow) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61290561A (ja) * | 1985-06-19 | 1986-12-20 | Mitsubishi Electric Corp | インタフエ−ス制御回路 |
JPH0385550U (enrdf_load_stackoverflow) * | 1989-12-22 | 1991-08-29 | ||
JP2019219151A (ja) * | 2018-06-22 | 2019-12-26 | 東京瓦斯株式会社 | 床暖房装置の温水漏洩調査方法 |
JP2023538573A (ja) * | 2020-08-17 | 2023-09-08 | インフィコン・ゲーエムベーハー | ガス漏洩検出器用のバイパス開口部を備えたスニファー・プローブ |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1309574A (en) * | 1969-09-19 | 1973-03-14 | Commissariat Energie Atomique | Device for detecting helium leaks |
-
1983
- 1983-08-06 JP JP14397783A patent/JPS60133340A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1309574A (en) * | 1969-09-19 | 1973-03-14 | Commissariat Energie Atomique | Device for detecting helium leaks |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61290561A (ja) * | 1985-06-19 | 1986-12-20 | Mitsubishi Electric Corp | インタフエ−ス制御回路 |
JPH0385550U (enrdf_load_stackoverflow) * | 1989-12-22 | 1991-08-29 | ||
JP2019219151A (ja) * | 2018-06-22 | 2019-12-26 | 東京瓦斯株式会社 | 床暖房装置の温水漏洩調査方法 |
JP2023538573A (ja) * | 2020-08-17 | 2023-09-08 | インフィコン・ゲーエムベーハー | ガス漏洩検出器用のバイパス開口部を備えたスニファー・プローブ |
Also Published As
Publication number | Publication date |
---|---|
JPH0159531B2 (enrdf_load_stackoverflow) | 1989-12-18 |
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