JPS60128549A - Nonvolatile raw having automatic storage function - Google Patents

Nonvolatile raw having automatic storage function

Info

Publication number
JPS60128549A
JPS60128549A JP58237575A JP23757583A JPS60128549A JP S60128549 A JPS60128549 A JP S60128549A JP 58237575 A JP58237575 A JP 58237575A JP 23757583 A JP23757583 A JP 23757583A JP S60128549 A JPS60128549 A JP S60128549A
Authority
JP
Japan
Prior art keywords
power supply
electronic circuit
supply voltage
internal electronic
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58237575A
Other languages
Japanese (ja)
Other versions
JPS6351300B2 (en
Inventor
Toru Machida
町田 透
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Priority to JP58237575A priority Critical patent/JPS60128549A/en
Publication of JPS60128549A publication Critical patent/JPS60128549A/en
Publication of JPS6351300B2 publication Critical patent/JPS6351300B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/14Error detection or correction of the data by redundancy in operation
    • G06F11/1402Saving, restoring, recovering or retrying
    • G06F11/1415Saving, restoring, recovering or retrying at system level
    • G06F11/1441Resetting or repowering

Abstract

PURPOSE:To protect simply the content of a memory at power fault by detecting that a power supply voltage drops to a prescribed level, and transfering automatically a data in a RAM area to a nonvolatile memory area. CONSTITUTION:The charging to an externally mounted capacitor 4 is finished during normal operation. When the power supply voltage drops and is lower than a voltage value Ej1, a switch SWa is turned off to hold a voltage stored in the capacitor 4. When the power supply voltage drops and is lower than the voltage value Ej2, a switch SWc is turned off and also a switch SWb is set and the electric charge stored in the capacitor 4 allows an internal electronic circuit 2 to transfer from the RAM area 2a to the nonvolatile memory 2b. The transfer of data is finished by allowing the internal electronic circuit itself to generate a timing pulse requested from the memory. When the transfer is finished, the switch SWc is turned on again.

Description

【発明の詳細な説明】 本発明は、RAMと、電気的に書換可能な不揮発性メモ
リを組み合わせた不揮発性RAMに関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a nonvolatile RAM that is a combination of a RAM and an electrically rewritable nonvolatile memory.

従来の不揮発性RAMは、RAM領域内のデータを不揮
発性メモリ領域に転送する場合に、転送を指令する制御
信号を制御端子に印加して行なうため、電源電圧降下や
瞬時の停電等のような電源異常時に、RAM、li域内
のデータを保膿すべく不揮発性メモリ領域に転送したい
場合、チンフ゛外部に電源電圧の異常を検知して、転送
制御信号を発生させる回路を必要とするうえ、転送を完
了するまでの101間、不揮発性RAMの内部電子回路
に、正しく転送が行なえる電力を供給し続けなければな
らず、これらのことを実際に実現することは、難しいと
いう欠点があった。
Conventional non-volatile RAM transfers data in the RAM area to the non-volatile memory area by applying a control signal that instructs the transfer to the control terminal, so it is difficult to transfer data from the RAM area to the non-volatile memory area by applying a control signal to the control terminal. If you want to transfer data in the RAM or LI area to a nonvolatile memory area for preservation in the event of a power failure, you will need a circuit external to the chip that detects an abnormality in the power supply voltage and generates a transfer control signal. It is necessary to continue supplying power to the internal electronic circuit of the nonvolatile RAM for the 101 days until the transfer is completed, and this has the disadvantage of being difficult to actually achieve.

本発明は、これらの欠点を解決するため、チンツブに内
蔵されたMQS)ランジスタにより構成される複数のス
イッチ及び電源電圧の変化を検知する回路と、チップに
外付けされたコンデンサにより電源電圧があらかじめ定
められた一定のレベルまで降下するのを検出して、自動
的にRAM領域内のデータを不揮発性メモ’J tA域
へ転送するもので、従来難しかったtti異常時のメモ
リ内容の保獲が簡単に行なネるもので、以下図面に基づ
いて本発明の詳細な説明する。
In order to solve these drawbacks, the present invention uses a circuit that detects changes in the power supply voltage and a plurality of switches constituted by MQS transistors built into the chip, and a capacitor externally attached to the chip to adjust the power supply voltage in advance. It detects the drop to a certain level and automatically transfers the data in the RAM area to the non-volatile memory area, making it possible to preserve the memory contents in the event of a tti error, which was previously difficult. BRIEF DESCRIPTION OF THE DRAWINGS The present invention will be described in detail below with reference to the drawings.

第1図は、本発明の実施例であって、1は電源端子、2
はRAMと不揮発性メモリ及び、それらの周辺回路から
成る内部電子回路3は外付コンデンサ端子であり、sw
aは電源端子1と外付コンデンサ端子5間に接続された
MO8I−ランジスタによるスイッチ、swbは内部電
子回路2と外付コンデンサ端子5間に接続されたMQS
 )ランジスタによるスイッチ、swcは電源端子1と
内部電子回路2間に接続されたMOSトランジスタによ
るスイッチであり、以上三つのスイッチswa、 sw
bとswcとを電源電圧の変化に応じて制御することに
より、RAM領域のデータを不揮発性メモリ領域へ転送
する。
FIG. 1 shows an embodiment of the present invention, in which 1 is a power supply terminal, 2
The internal electronic circuit 3 consisting of RAM, nonvolatile memory, and their peripheral circuits is an external capacitor terminal, and sw
a is a MO8I-transistor switch connected between power supply terminal 1 and external capacitor terminal 5, and swb is an MQS switch connected between internal electronic circuit 2 and external capacitor terminal 5.
) The transistor switch swc is a MOS transistor switch connected between the power supply terminal 1 and the internal electronic circuit 2, and the above three switches swa and sw
By controlling b and swc according to changes in the power supply voltage, data in the RAM area is transferred to the nonvolatile memory area.

第2図は、電源電圧の変化に対しての3つのスイッチs
wa、 swbとθweとの動作状態を示すものであシ
、まず電源を投入するとスイッチ8weがオンし、内部
電子回路2へ電源を供給すると共に、内部電子回路2#
′ia)らかじめ決められた初期状態に設定される。次
に電源電圧が上昇し電圧値Bilを越えるとスイッチe
wa がオンし、外付したコンデンサ4へ電荷を送9元
電を開始させる。さらに電の電圧が上昇し、正常に動作
する電圧に達すると通常のRAM動作が可能となシ、こ
の通常動作中に外付コンデンサへの光電を完了する。そ
の後、′FPL源電圧が降下し電圧値Ei1よシ低くな
った時点で、スイッチswaiJ−オフし、コンデンサ
に貯えた電荷を逃がさない様にする。さらに、電源電圧
が降下し電圧値Ei2より低くなった時点で、スイッチ
SWCがオフすると共にスイッチswbがオンし、コン
デンサに貯えた電荷によって内部電子回路2はRA y
t M域2aから不揮発性メモリ2bへのデータの転送
を行なう。このデータの転送は、内部電子回路自身がメ
モリに要求されるタイミングパルスを発生し完了する。
Figure 2 shows the three switches s for changes in power supply voltage.
This indicates the operating status of wa, swb and θwe.When the power is turned on, switch 8we turns on, supplies power to internal electronic circuit 2, and also switches on internal electronic circuit 2#.
'ia) is set to a predetermined initial state. Next, when the power supply voltage rises and exceeds the voltage value Bil, switch e
wa is turned on, sending charge to external capacitor 4 and starting power supply. When the voltage of the current increases further and reaches a voltage that allows normal operation, normal RAM operation becomes possible, and photoelectric transfer to the external capacitor is completed during this normal operation. Thereafter, when the FPL source voltage drops and becomes lower than the voltage value Ei1, the switch swaiJ- is turned off to prevent the charge stored in the capacitor from escaping. Furthermore, when the power supply voltage drops and becomes lower than the voltage value Ei2, the switch SWC is turned off and the switch swb is turned on, and the internal electronic circuit 2 is activated by the charge stored in the capacitor.
t Data is transferred from M area 2a to nonvolatile memory 2b. This data transfer is completed by the internal electronics themselves generating the required timing pulses to the memory.

転送が終了するとスイッチSWCは、再びオンする。When the transfer is completed, the switch SWC is turned on again.

かくして、側らかの原因で電源電圧が降下した場合、外
部に何ら電子回路を付加せず、コンデンサ端子6に規定
の容量のコンデンサを接続するだけで、自動的KRAM
領域から不揮発性メモリ領域へのデータ転送が行なわれ
、メモリの内容を消失することが防げるという利点があ
る。
In this way, if the power supply voltage drops due to some external cause, simply connecting a capacitor of the specified capacity to the capacitor terminal 6 without adding any external electronic circuit will automatically reset the KRAM.
This has the advantage that data is transferred from the area to the nonvolatile memory area, and the contents of the memory can be prevented from being lost.

また、何らかの都合で、オートストアを行ないたくない
場合如おいては、オートストアを禁止する制御端子(図
示せず)を有しておl)シ、この制御端子を電源電圧の
二値電位のいずれが一方に固定しておくことにより、オ
ートストア動作を有さない不揮発性RAMと容易に置き
換え可能であるという利点がある。
In addition, if for some reason you do not want to perform auto store, there is a control terminal (not shown) that prohibits auto store. By fixing either one to the other, there is an advantage that it can be easily replaced with a non-volatile RAM that does not have an auto store operation.

さらに第1図に示した内部電子回路及びスイッチの接続
構成においては、通常のRAM動作時は内部電子回路2
は、電源端子1がらスイッチθweを導通させて電流を
供給されているが、RAMの動作速度が速くなシ、よシ
多くの電流を内部電子回路2が消費する様な場合、電流
容量を増やすべくスイッチSWCを構成するMOSトラ
ンジスタの面積を大きくしなければならず、集積度を下
げ不利である。そこで、第6図に示す様に、内部電子回
路のうちオートストア動作時には電源を供給しlくても
よい部分2′を直接電源端子1に接続しておくことによ
シ、スイッチoweを小さくすることができ、しかも、
オートストア時には、内部電子回路のうちオートストア
に無関係な部分2′に対し、外付やコンデンサ4に貯え
た電荷を消費させずに済むので、コンデンサ4の容量も
小さくて済み、回路実装上有利である。
Furthermore, in the connection configuration of the internal electronic circuit and the switch shown in FIG. 1, during normal RAM operation, the internal electronic circuit 2
is supplied with current by conducting the switch θwe from the power supply terminal 1, but if the operating speed of the RAM is fast or the internal electronic circuit 2 consumes a large amount of current, increase the current capacity. Therefore, the area of the MOS transistor constituting the switch SWC must be increased, which is disadvantageous because it lowers the degree of integration. Therefore, as shown in Fig. 6, by directly connecting the part 2' of the internal electronic circuit that does not need to be supplied with power during auto store operation to the power supply terminal 1, the switch owe can be made smaller. can be done, and
During auto store, the electric charge stored in the external capacitor 4 does not need to be consumed by the portion 2' of the internal electronic circuit that is unrelated to auto store, so the capacitance of the capacitor 4 can also be small, which is advantageous in terms of circuit implementation. It is.

オートストアにより不揮発性メモリ内に貯えられたデー
タは、電源投入時あるいは瞬時の停電後の回復後の回ゆ
時に、電源電圧が適正電圧値になるのを検出して、自動
的にRAMに転送することにより、電源異常が発生して
も、電源異常が発生しても、%源異常以前のデータと同
じものがRAMに転送されているので、何ら問題なくR
AMの動作を続行できるという効果を有する。
Data stored in nonvolatile memory by auto store is automatically transferred to RAM when the power supply voltage reaches the appropriate voltage value when the power is turned on or after recovery from a momentary power outage. By doing this, even if a power failure occurs, the same data as before the power failure has been transferred to the RAM, so it can be read without any problem.
This has the effect of allowing AM operation to continue.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例の回路構成図、紀2図は電源電
圧の変化に利する三つのスイッチの動作を示す図、 第6図は本発明の実施例のもひとつの回路構成図を示す
ものである。 1・・・電源端子、 2・・・内部電子回路、2a・・
・RAM 2b・・・不揮発性メモリ、5・・・コンデ
ンサ端子 4・・・外付コンデンサ、swa、swt+
、ewc・−xインチ、2′・・・内部電子回路の一部
。 以 上 出願人 セイコー電子工業株式会社
Figure 1 is a circuit configuration diagram of an embodiment of the present invention, Figure 2 is a diagram showing the operation of three switches that are useful for changing the power supply voltage, and Figure 6 is a circuit diagram of another embodiment of the present invention. This shows that. 1...Power terminal, 2...Internal electronic circuit, 2a...
・RAM 2b...Nonvolatile memory, 5...Capacitor terminal 4...External capacitor, swa, swt+
, ewc・-x inch, 2′...Part of the internal electronic circuit. Applicant: Seiko Electronics Industries Co., Ltd.

Claims (2)

【特許請求の範囲】[Claims] (1)半導体集積回路チップ内で、RAMと、そのビッ
ト毎に1対1で組み込まれた電気的に書換可能な不揮発
性メモリから成る集積回路において、電源電圧降下おる
いは電源オフ時に、チップ外部に設けられたコンデンサ
及びチップに内蔵されたMOS )ランジスタにより構
成される複数個のスイッチによシ、RAM領域内のデー
タを不揮発性メモリtin域へ転送し、自動的にRAM
内のデータを不揮発性化することを%微とするオートス
トア機能を有する不揮発性RA M。
(1) In an integrated circuit consisting of a RAM and electrically rewritable nonvolatile memory incorporated one-to-one for each bit in a semiconductor integrated circuit chip, when the power supply voltage drops or the power is turned off, the chip Data in the RAM area is transferred to the non-volatile memory area by multiple switches composed of an external capacitor and a MOS transistor built into the chip, and is automatically transferred to the RAM area.
Non-volatile RAM that has an auto store function that makes it possible to make the data in it non-volatile.
(2) 前記複数個のスイッチが、電源端子と外付コン
デンサ端子間に設けられたスイッチと、外付コンデンサ
端子と内部電子回路間に設けられたスイッチと、内部電
子回路と電源端子間に設けられたスイッチであって、検
出された電源電圧の変化によシ前記複数個のスイッチが
あらかじめ設定された複数の電圧範囲に応じて、オン・
オフ制御されることを特徴とする特許請求範囲第1項記
載のオートストア機能を有する不揮発性RAM0(3)
 前記オートストア機能は、その機能を禁示する制御端
子を電源電圧の二値電位のいずれか一方に固定しておく
ことによシ禁示されることを特徴とする特許請求範囲第
1項あるいは第2項記載のオートストア機能を有する不
揮発性RAM0(4) 前記内部電子回路のうちオート
ストア機能の動作をしない部分が、直接電源端子に接続
されていることを特徴とする特許請求範囲第2項あるい
は第5項記載のオートストア機能を有する不揮発性RA
M0
(2) The plurality of switches include a switch provided between the power supply terminal and the external capacitor terminal, a switch provided between the external capacitor terminal and the internal electronic circuit, and a switch provided between the internal electronic circuit and the power supply terminal. The plurality of switches are configured to turn on and off according to a plurality of preset voltage ranges according to a detected change in power supply voltage.
Non-volatile RAM0(3) having an auto store function according to claim 1, which is controlled to be turned off.
The auto store function is inhibited by fixing the control terminal that inhibits the function to one of the binary potentials of the power supply voltage. Nonvolatile RAM0(4) having an auto store function according to claim 2, wherein a portion of the internal electronic circuit that does not operate the auto store function is directly connected to a power supply terminal. Or a non-volatile RA with an auto store function as described in Section 5.
M0
JP58237575A 1983-12-16 1983-12-16 Nonvolatile raw having automatic storage function Granted JPS60128549A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58237575A JPS60128549A (en) 1983-12-16 1983-12-16 Nonvolatile raw having automatic storage function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58237575A JPS60128549A (en) 1983-12-16 1983-12-16 Nonvolatile raw having automatic storage function

Publications (2)

Publication Number Publication Date
JPS60128549A true JPS60128549A (en) 1985-07-09
JPS6351300B2 JPS6351300B2 (en) 1988-10-13

Family

ID=17017344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58237575A Granted JPS60128549A (en) 1983-12-16 1983-12-16 Nonvolatile raw having automatic storage function

Country Status (1)

Country Link
JP (1) JPS60128549A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380649U (en) * 1986-11-13 1988-05-27
JPH07177776A (en) * 1994-07-25 1995-07-14 Matsushita Electric Ind Co Ltd Parameter setting apparatus of motor controller

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6380649U (en) * 1986-11-13 1988-05-27
JPH07177776A (en) * 1994-07-25 1995-07-14 Matsushita Electric Ind Co Ltd Parameter setting apparatus of motor controller

Also Published As

Publication number Publication date
JPS6351300B2 (en) 1988-10-13

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