JPS60121652A - Sample holder for mass spectrometry - Google Patents
Sample holder for mass spectrometryInfo
- Publication number
- JPS60121652A JPS60121652A JP58226855A JP22685583A JPS60121652A JP S60121652 A JPS60121652 A JP S60121652A JP 58226855 A JP58226855 A JP 58226855A JP 22685583 A JP22685583 A JP 22685583A JP S60121652 A JPS60121652 A JP S60121652A
- Authority
- JP
- Japan
- Prior art keywords
- glycerol
- sample
- target
- matrix
- plates
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004949 mass spectrometry Methods 0.000 title description 3
- 150000002500 ions Chemical group 0.000 claims abstract description 19
- 239000011159 matrix material Substances 0.000 claims abstract description 16
- 239000002245 particle Substances 0.000 claims abstract description 5
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 abstract description 63
- 230000008020 evaporation Effects 0.000 abstract description 6
- 238000001704 evaporation Methods 0.000 abstract description 6
- 238000004458 analytical method Methods 0.000 abstract description 5
- 230000001678 irradiating effect Effects 0.000 abstract description 2
- 239000002699 waste material Substances 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 22
- 239000012530 fluid Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 238000011109 contamination Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 150000001793 charged compounds Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 238000004611 spectroscopical analysis Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/142—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の利用分野〕
本発明は有機物を対象とした二次イオン質量分析計の試
料ホルダーに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a sample holder for a secondary ion mass spectrometer that targets organic substances.
[発明の背景〕
生体に関連した種々の物質の分子量、分子構造決定は大
きな課題である。これに応える手法として高速粒子衝撃
により得られる二次イオンを質量分析する手段が発展し
てきた。この手法では試料を多量のグリセロールなどの
71〜リツクスと共に金属板上に塗布しく第1図)、直
接試料導入プローブにより減圧下(10−” 〜10−
’ Torr )のイオン照射部に導入する。これに5
〜10KeVのエネルギーを持った高速イオンあるいは
中性粒子を照射してマトリックスをスパッタし、それと
同時に試料をもスパッタするものである。この時、スパ
ッタされた有機物の一部が正あるいは負のイオンとなっ
て飛び出してくる。これらは二次イオンと呼ばれるが、
この中には試量中の分子イオンなども含まれている。こ
れらを集めて質量分析するのが二次イオン質量分析法(
MolecularSecondary↓on Mas
s Spectrometry ; Mo1ecula
rsins)である。[Background of the Invention] Determining the molecular weight and molecular structure of various substances related to living organisms is a major challenge. In order to meet this demand, a method has been developed to perform mass spectrometry on secondary ions obtained by high-speed particle bombardment. In this method, the sample is coated on a metal plate together with a large amount of glycerol or other 71~ lyx (Fig. 1), and then the sample is directly introduced under reduced pressure (10~10~10~) using a probe.
' Torr ) into the ion irradiation section. 5 for this
The matrix is sputtered by irradiating high speed ions or neutral particles with an energy of ~10 KeV, and the sample is also sputtered at the same time. At this time, some of the sputtered organic matter becomes positive or negative ions and flies out. These are called secondary ions,
This includes molecular ions in the sample. Secondary ion mass spectrometry (secondary ion mass spectrometry) collects these and performs mass analysis.
Molecular Secondary↓on Mas
s Spectrometry;
rsins).
この手法では試料はグリセロールなど流体マトリックス
と共にほぼ平坦な金属板上に塗布され、照射部に導入さ
れていた。グリセロールなどの流体マトリックスの蒸気
圧は低いが真空中ではかなりのスピードで揮発していく
。このため長時間測定を行なうと質量分析計の内部に流
体マトリックスが付着し、質量分解能の低下、感度の低
下など種々の1−ラブルを引きおこす。In this method, the sample was coated with a fluid matrix such as glycerol on a nearly flat metal plate and introduced into the irradiation section. Although the vapor pressure of fluid matrices such as glycerol is low, they volatilize at a considerable rate in a vacuum. For this reason, when long-term measurements are performed, the fluid matrix adheres to the inside of the mass spectrometer, causing various troubles such as a decrease in mass resolution and sensitivity.
一方、流体マトリックスの量を非常に少なくすると短時
間で測定ができなくなったり、スペクトルの再現性が悪
くなるなどの問題があった。On the other hand, when the amount of the fluid matrix is extremely reduced, there are problems such as the inability to perform measurements in a short time and the reproducibility of spectra.
さらに、具体的に説明すると、第1図および第2図は、
従来の保持法で2 rrtn X 5 M11100試
料ホルダ−1全面にマトリックス3を保持するので71
〜リツクス3が気相と接する面積は大きい。−次イオン
2はこの71−リツクス3の一部に照射され、そこから
二次イオン5が放出されるが第1図および第2図に示し
たようにこれら二次イオン5の一部がスリツ1−を通過
し、分析部を通ってコレクターに到達する。この方法で
はマトリックスが気相と接する面が広く多量のグリセロ
ールが蒸発し汚染の原因となってしまう。そこで試料ホ
ルダー1のサイズを小さくする(2m++φ位)事が有
効であるが十分な試料量を塗布できなかったり、ホルダ
ー1の側面にまで試料を含んだマトリックス3層が流れ
出たりして気相と接する面積が広くなってしまう難点が
ある。また、通常の磁場型質量分析計ではスパッタされ
て出て来る二次イオンのうちスリットや分析部を通過し
て有効にコレクターに到達するのは照射領域のうち0.
5mmX5++a+程度の領域から出たものである。こ
のためスパッターされてイオンのうちほんの一部しか有
効に利用できない。そこでイオン照射される領域を必要
最少限におさえると共にマトリックスを必要に応じて供
給できる構造のホルダーが望まれる。Furthermore, to explain specifically, FIG. 1 and FIG.
The conventional holding method holds the matrix 3 on the entire surface of the 2 rrtn x 5 M11100 sample holder, so the
~The area in which Rix 3 is in contact with the gas phase is large. -The secondary ions 2 are irradiated to a part of this 71-rix 3, and secondary ions 5 are emitted from there, but as shown in Figs. 1 and 2, some of these secondary ions 5 are 1-, passes through the analysis section, and reaches the collector. In this method, the surface of the matrix in contact with the gas phase is large, and a large amount of glycerol evaporates, causing contamination. Therefore, it is effective to reduce the size of the sample holder 1 (approximately 2 m + + φ), but it may not be possible to apply a sufficient amount of sample, or the three layers of matrix containing the sample may flow out to the side of the holder 1, and the gas phase The problem is that the contact area becomes large. In addition, in a normal magnetic field type mass spectrometer, only 0.0% of the sputtered secondary ions pass through the slit or analysis section and effectively reach the collector in the irradiated area.
It came out of an area of about 5mm x 5++a+. Therefore, only a small portion of the sputtered ions can be effectively used. Therefore, a holder is desired that has a structure that can minimize the area irradiated with ions and supply matrix as needed.
本発明は、このような流体マトリックスの蒸発による質
量分析計内部の汚染を少なくした質量分析用試料ホルダ
ーを提供することを目的とする。An object of the present invention is to provide a sample holder for mass spectrometry that reduces contamination inside the mass spectrometer due to evaporation of the fluid matrix.
本発明の特徴は、粒子線照射して二次イオンを取り出す
領域を感度を損なわない限り小さくし、そのまわりにグ
リセロールなとのマトリックスを保持しうる溜を設けて
、液体マトリックスの蒸発を少なくすることにある。The feature of the present invention is to make the region from which secondary ions are extracted by particle beam irradiation as small as possible without impairing sensitivity, and to provide a reservoir around the region that can hold a matrix such as glycerol to reduce evaporation of the liquid matrix. There is a particular thing.
本発明の一実施例を第3図ないし第5図に基づいて説明
する。第3図に示す本実施例の特徴の一つは、グリセロ
ールのようなマトリックスの保持部などのイオン照射部
分以外は密封型で、グリセロールの蒸気をおさえている
ことである。第4図およびその拡大図である第5図に示
すように、ターゲット外箱8とターゲット外箱8の一部
である2枚の板9,10によって空間11が形成される
。An embodiment of the present invention will be described based on FIGS. 3 to 5. One of the features of this embodiment shown in FIG. 3 is that the parts other than the ion-irradiated parts, such as the holding part for a matrix such as glycerol, are sealed to suppress glycerol vapor. As shown in FIG. 4 and FIG. 5, which is an enlarged view thereof, a space 11 is formed by the target outer box 8 and two plates 9 and 10 that are part of the target outer box 8.
この空間11内で外箱8に密着してターゲット12が設
けられる。グリセロール保持部13は、ターゲット12
と上記2枚の板9,10の間に表面張力を利用して形成
される。イオン照射部14に近づくほど、この2枚の板
9,10の間隔は狭くなり、グリセロールは表面張力に
よって照射領域14へ必要に応じて送りこまれる。この
結果、不必要なグリセロールの蒸発をおさえることがで
きる。従来、試料とグリセロールは混合してターゲット
上に塗布されるので極微量試料の測定の場合に試料濃度
が低下してS/Nが悪くなる難点があった。しかし1本
発明では、グリセロールをまず保持し、次いで照射領域
14に試料を塗布することにより照射領域14に試料濃
度が高い領域を作り、必要量のグリセロールを周囲から
供給できる利点がある。また、試料を無駄なく有効に利
用できる。A target 12 is provided in this space 11 in close contact with the outer box 8. The glycerol holding part 13 is the target 12
It is formed between the two plates 9 and 10 using surface tension. The closer you get to the ion irradiation section 14, the narrower the distance between the two plates 9, 10 becomes, and the glycerol is sent into the irradiation region 14 as necessary due to surface tension. As a result, unnecessary evaporation of glycerol can be suppressed. Conventionally, since the sample and glycerol are mixed and applied onto the target, there has been a problem that the sample concentration decreases and the S/N ratio deteriorates when measuring a very small amount of sample. However, one advantage of the present invention is that by first holding glycerol and then applying the sample to the irradiation area 14, a region with a high sample concentration can be created in the irradiation area 14, and the necessary amount of glycerol can be supplied from the surrounding area. In addition, the sample can be used effectively without wasting it.
第6図は、本発明の他の実施例を示し、2枚の板15.
16は、内部の空間側へ曲がっており、グリセロールの
表面張力をさらに活すことができる。FIG. 6 shows another embodiment of the invention, in which two plates 15.
16 is bent toward the inner space, and the surface tension of glycerol can be further utilized.
以上述べたように、本発明ではグリセロールなど有機マ
トリックスの蒸発を少なく抑え、汚染を防止すると共に
照射領域の試料密度を高くして長時間測定することがで
きる。As described above, in the present invention, evaporation of organic matrices such as glycerol can be suppressed to a minimum, contamination can be prevented, and the sample density in the irradiation area can be increased to enable long-term measurement.
【図面の簡単な説明】
第1図は従来用いているターゲットで平面上に試料を塗
布している例を示す図、第2図は従来のターゲット面積
を小さくした例を示す図、第3図は本発明によるターゲ
ットでグリセロールを保持している部分は内部に隠れて
いる例を示す図、第4図および第5図はターゲットの断
面図、第6図は本発明の変形例を示す図である。
1・・・試料ホルダー、2・・・−次ビーム、3・・・
試料面、4・・・イオン照射部、5・・・二次イオンビ
ーム、6・・・スリット、7・・・分析部に導入され得
る二次イオンビーム、8・・本発明のターゲット外箱、
9.10・・・仮、11・・・空間、12・・・ターゲ
ット、13・・・グリセロール保持部、14・・・照射
領域、15.16・・・板。
茅30
芽40
茅乙用[Brief explanation of the drawings] Figure 1 shows an example of applying a sample on a flat surface using a conventional target, Figure 2 shows an example of a conventional target with a smaller area, and Figure 3 is a diagram showing an example of a target according to the present invention in which the portion holding glycerol is hidden inside, FIGS. 4 and 5 are cross-sectional views of the target, and FIG. 6 is a diagram showing a modified example of the present invention. be. 1... Sample holder, 2... -order beam, 3...
Sample surface, 4... Ion irradiation section, 5... Secondary ion beam, 6... Slit, 7... Secondary ion beam that can be introduced into the analysis section, 8... Target outer box of the present invention ,
9.10 Temporary, 11 Space, 12 Target, 13 Glycerol holding part, 14 Irradiation area, 15.16 Plate. 30 buds 40 buds for kaotsui
Claims (1)
いは試料を含んだマトリックスを保持しうる部分あるい
は溜を有し、前記照射部にマトリックス剤を少量ずつ供
給し得る手段を有する質量分析社用試料ホルダー。1. A mass spectrometer having a part or reservoir capable of holding a matrix containing a sample or secondary ions obtained by irradiation with a high-speed particle beam, and a means for supplying a matrix agent little by little to the irradiation part. Corporate sample holder.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58226855A JPS60121652A (en) | 1983-12-02 | 1983-12-02 | Sample holder for mass spectrometry |
US06/676,923 US4620103A (en) | 1983-12-02 | 1984-11-30 | Sample holder for mass analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58226855A JPS60121652A (en) | 1983-12-02 | 1983-12-02 | Sample holder for mass spectrometry |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60121652A true JPS60121652A (en) | 1985-06-29 |
Family
ID=16851620
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58226855A Pending JPS60121652A (en) | 1983-12-02 | 1983-12-02 | Sample holder for mass spectrometry |
Country Status (2)
Country | Link |
---|---|
US (1) | US4620103A (en) |
JP (1) | JPS60121652A (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4719349A (en) * | 1986-05-27 | 1988-01-12 | The United States Of America As Represented By The Department Of Health And Human Services | Electrochemical sample probe for use in fast-atom bombardment mass spectrometry |
GB2257295B (en) * | 1991-06-21 | 1994-11-16 | Finnigan Mat Ltd | Sample holder for use in a mass spectrometer |
US5208458A (en) * | 1991-11-05 | 1993-05-04 | Georgia Tech Research Corporation | Interface device to couple gel electrophoresis with mass spectrometry using sample disruption |
US5498545A (en) * | 1994-07-21 | 1996-03-12 | Vestal; Marvin L. | Mass spectrometer system and method for matrix-assisted laser desorption measurements |
USRE39353E1 (en) * | 1994-07-21 | 2006-10-17 | Applera Corporation | Mass spectrometer system and method for matrix-assisted laser desorption measurements |
US5625184A (en) * | 1995-05-19 | 1997-04-29 | Perseptive Biosystems, Inc. | Time-of-flight mass spectrometry analysis of biomolecules |
US6002127A (en) | 1995-05-19 | 1999-12-14 | Perseptive Biosystems, Inc. | Time-of-flight mass spectrometry analysis of biomolecules |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2335839A1 (en) * | 1975-12-19 | 1977-07-15 | Commissariat Energie Atomique | METHOD OF ANALYSIS OF SAMPLES IN INSULATING MATERIAL BY PHOTO-ELECTRONIC SPECTROMETRY AND SAMPLE HOLDER FOR THE IMPLEMENTATION OF THE SAID PROCESS |
DE2654057B1 (en) * | 1976-11-29 | 1978-04-27 | Varian Mat Gmbh | Process for the ionization of organic substances, as well as analyzer using this process |
DE2837715A1 (en) * | 1978-08-30 | 1980-03-13 | Leybold Heraeus Gmbh & Co Kg | METHOD FOR ANALYZING ORGANIC SUBSTANCES |
DE2950329C2 (en) * | 1979-12-14 | 1985-06-05 | Leybold-Heraeus GmbH, 5000 Köln | Device for removing material from the surface of a target |
DE3128814A1 (en) * | 1981-07-21 | 1983-02-10 | Siemens AG, 1000 Berlin und 8000 München | ELECTRICALLY CONDUCTIVE SAMPLE HOLDER FOR THE ANALYSIS TECHNOLOGY OF SECONDARY ION MASS SPECTROMETRY |
-
1983
- 1983-12-02 JP JP58226855A patent/JPS60121652A/en active Pending
-
1984
- 1984-11-30 US US06/676,923 patent/US4620103A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US4620103A (en) | 1986-10-28 |
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