JPS60116784A - Apparatus for producing deposited film by electric discharge - Google Patents

Apparatus for producing deposited film by electric discharge

Info

Publication number
JPS60116784A
JPS60116784A JP58223137A JP22313783A JPS60116784A JP S60116784 A JPS60116784 A JP S60116784A JP 58223137 A JP58223137 A JP 58223137A JP 22313783 A JP22313783 A JP 22313783A JP S60116784 A JPS60116784 A JP S60116784A
Authority
JP
Japan
Prior art keywords
electrode
electric discharge
film
deposition chamber
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58223137A
Other languages
Japanese (ja)
Inventor
Takeshi Kurokawa
岳 黒川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP58223137A priority Critical patent/JPS60116784A/en
Publication of JPS60116784A publication Critical patent/JPS60116784A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Light Receiving Elements (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To form stably deposited films without the need for adjusting impedance matching in the stage of forming various kinds of deposited films on the surface of a base body by electric discharge by providing heating and cooling means and control means for said means to the inside wall of a deposition chamber. CONSTITUTION:A base body 102 to be formed thereon with a deposited film is disposed in a deposition chamber 101 and thereafter the inside of the chamber is evacuated to a reduced pressure. The body 102 is preliminarily heated to a prescribed temp. by a heater 103 and a gaseous raw material for forming the deposition chamber is supplied into the chamber 101. A high-frequency voltage is impressed between an electrode 106 for electric discharge provided to the inside wall of the chamber 101 and the body 102 to generate electric discharge, thereby converting the gaseous raw material to plasma and forming the deposited film such as photoconductive film, semiconductor film or the like on the base body. The temp. of the electrode 106 is measured by an IR monitor 109 and a heater 107 or cooling water pipe 108-1 is adjusted by a temp. controller 112 to maintain the specified temp. of the electrode 106. The deposited film is formed stably without the need for impedance matching of the electric discharge.

Description

【発明の詳細な説明】 有機樹脂膜を、放電等によって製造する際の製造装置に
関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a manufacturing apparatus for manufacturing an organic resin film by electric discharge or the like.

高周波グロー放電あるいはアーク放電等の放電により、
減圧した堆積室内に導入された原料気体を、活性化,分
解または反応させて該気体または生成気体から、単一元
素または化合物の膜を基体」二に堆積させる方法につい
てはすでに知られている。しかも、この方法によれば通
常の化学反応では得られ難い化合物や単一元素の11(
:積膜を得ることができる。また、この種のxmi撫’
h※放′屯を用いる堆積膜の製造装置では、原料気体を
多量に供給し、かつ大出力の高周波電力を投入すること
により、原料気体からの堆積膜形成速度が向」ニする。
Due to discharge such as high frequency glow discharge or arc discharge,
Methods are already known in which a source gas introduced into a deposition chamber under reduced pressure is activated, decomposed or reacted, and a film of a single element or compound is deposited on a substrate from the gas or product gas. Moreover, this method allows compounds that are difficult to obtain through normal chemical reactions, as well as single element 11(
: A laminated film can be obtained. Also, this kind of xmi masturbation
In a deposited film manufacturing apparatus using h* radiation, the speed of forming a deposited film from the raw material gas is increased by supplying a large amount of raw material gas and applying high-output high-frequency power.

この効果を得るには例えば周波数1 3 、 56 M
H.y.。
To obtain this effect, for example, the frequency 1 3, 56 M
H. y. .

100〜i’ooowの高周波電力を投入する必要があ
るが、このような大出力の高周波電力を投入した場合、
放電エネルギー,または放電エイ、ルギ〜および熱エネ
ルギーにより堆積室内壁が加熱される。
It is necessary to input high-frequency power of 100 to i'ooow, but when such high-output high-frequency power is input,
The interior walls of the deposition chamber are heated by the discharge energy or by the discharge energy and thermal energy.

特に、多量にまた長時間にわたって反応炉を運転すると
、堆積室内壁の温度が300℃以上になることもある。
In particular, when the reactor is operated in large quantities and for a long period of time, the temperature of the inner wall of the deposition chamber may reach 300° C. or higher.

逆に、原料気体の供給層が多いときは、堆積室内壁が冷
却され、堆積室内壁の6llIX度が下降する。このよ
うに堆積室内壁の温度が変化すると、堆積室内のインピ
ーダンスが変化し、xxi”x’hへ放電のインピーダ
ンス整合を調整しなければならない。この調整を行なわ
なければ、異なる反応条件で形成された堆積膜が一つの
基体の」二に形成され、膜質特性の低下、不均一性の原
因となる。
Conversely, when there is a large supply layer of raw material gas, the inner wall of the deposition chamber is cooled, and the temperature of the inner wall of the deposition chamber decreases by 6llIX degrees. When the temperature on the walls of the deposition chamber changes in this way, the impedance inside the deposition chamber changes, and the impedance matching of the discharge to xxi''x'h must be adjusted. A deposited film is formed on one substrate, causing deterioration of film quality characteristics and non-uniformity.

しかし、通常、インピーダンス整合は設計の段階で行な
われ、逐次変化するインピーダンスに応じ、インピーダ
ンス整合を調整することは非常に困難である。
However, impedance matching is usually performed at the design stage, and it is very difficult to adjust impedance matching in response to impedance that changes successively.

本発明の目的は、インピーダンス整合を調整することな
く、一定の条件下で堆積膜を形成し得る&思&久鉢へ放
電による堆積膜の製造装置を提供することにある。
An object of the present invention is to provide an apparatus for producing a deposited film by electric discharge, which can form a deposited film under certain conditions without adjusting impedance matching.

この目的は次の製造装置により達成される。This objective is achieved by the following manufacturing equipment.

減圧にし得る堆積室内で島海Cあ外観も放電により堆積
膜を形成する製造装置において、堆積室内壁の内側およ
び/または外側に加熱手段および冷却手段並びにそれら
をコントロールする手段を設けたことな特徴とする高周
&大キ\放電による堆積膜の製造装置。
A production device that forms a deposited film by electrical discharge in a deposition chamber that can be reduced in pressure, and is characterized by providing heating means, cooling means, and means for controlling them on the inside and/or outside of the walls of the deposition chamber. A device for producing deposited films using high-frequency & large-kid discharge.

本発明の加熱手段および冷却手段は該堆積室の内壁の内
側および/または外側の内壁の一部または全体に接して
冷却室および加熱室を設けたり、コイルを装着したり、
1〜数本のパイプを設けたり、メツシュを用いるなど種
々の形状をとり得る。
The heating means and cooling means of the present invention include providing a cooling chamber and a heating chamber in contact with a part or the whole of the inner and/or outer inner wall of the deposition chamber, or installing a coil therein.
It can take various shapes, such as providing one to several pipes or using a mesh.

内壁の温度は温度モニターにより監視し、常に所定の温
度を確保できるように温度コントロール装置にて、加熱
、冷却の指令を行なう。
The temperature of the inner wall is monitored by a temperature monitor, and a temperature control device issues heating and cooling instructions to ensure a predetermined temperature at all times.

温度調整は、水、空気などを温度調整装置内を流して温
度を調整すれば加熱と、冷却を行なうことも、又、冷却
のみ行なうこともでき、冷却には、液体窒素、フンオン
などの流体、加熱には、オイルなどをそれぞれ冷却装置
、加熱装置内を流すことにより行なう。また、加熱には
電熱線を用いることもできる。
Temperature adjustment can be done by flowing water, air, etc. through the temperature adjustment device to perform heating and cooling, or only cooling can be performed. Heating is performed by flowing oil or the like through the cooling device and heating device, respectively. Moreover, a heating wire can also be used for heating.

ところで、高周波×※へ放電による堆積膜の製造装置に
は、大別して誘導結合型装置と定量結合型装置とがある
。前者は、高周波電源に接続した高周波コイルを配置し
、≠コイルに高層lJl電力をフィードし、電磁エネル
ギーでガスをプラズマ化し、基体上に堆積膜を製造する
装置である。一方後者は、反応炉の堆積室を取り囲む了
うにしてカソード電極を配置し、堆積室の内部にアノー
ド電極を配置し、両電極間にガスを流しながら、両電極
間に直流もしくは交流の電界を印加し、原料ガスをプラ
ズマ化して基体上に堆積膜を製造する装置である。本発
明はどちらの型の装置にも適用することができる。
By the way, apparatuses for producing deposited films by discharging to high frequency ** can be roughly divided into inductive coupling type apparatuses and quantitative coupling type apparatuses. The former is a device in which a high-frequency coil connected to a high-frequency power supply is arranged, high-level lJl power is fed to the coil, gas is turned into plasma by electromagnetic energy, and a deposited film is produced on a substrate. On the other hand, in the latter method, a cathode electrode is placed in a space surrounding the deposition chamber of the reactor, an anode electrode is placed inside the deposition chamber, and a direct current or alternating current electric field is applied between the two electrodes while gas is flowing between the two electrodes. This is a device that applies a gas to turn the raw material gas into plasma to produce a deposited film on a substrate. The invention is applicable to either type of device.

本発明による装置の実施態様を図面を参照して説明する
。第1図は本発明の高周波グロー放電による堆積膜の製
造装置である。図中101は減圧にし得る堆積室である
。堆積室101内には堆積膜を形成するた′めの円筒状
基体102と該基体102を加熱するための基体加熱ヒ
ータ106が設けてあり、堆積室101の下方にはメイ
ンバルブ104の開放によって、堆積室101内を不図
示の排気装置によって排気して所定の真空度にする様に
排気口105が設けである。基体102とグロー放電を
引起こすための電極106を堆積室101の内壁として
設けている。図の装置に於いては、基体102はアース
に接続され膜質を均一化するため回転を行なっている。
Embodiments of the apparatus according to the present invention will be described with reference to the drawings. FIG. 1 shows an apparatus for producing a deposited film using high frequency glow discharge according to the present invention. In the figure, 101 is a deposition chamber that can be reduced in pressure. Inside the deposition chamber 101, a cylindrical substrate 102 for forming a deposited film and a substrate heater 106 for heating the substrate 102 are provided. An exhaust port 105 is provided so that the inside of the deposition chamber 101 is evacuated to a predetermined degree of vacuum by an exhaust device (not shown). A base 102 and an electrode 106 for causing glow discharge are provided as the inner wall of the deposition chamber 101. In the apparatus shown in the figure, the base 102 is connected to ground and rotated to make the film quality uniform.

電極106は不図示マツチング回路を経て高周波電源に
接続されている。電極106の外側には電極加熱ヒータ
107と冷却用バイブ1oa−iとがあり、非接触の赤
外温度モニター109によって測定された電極温度によ
って一定の温度になるように温度コントロー−2−11
2によってヒーターパワーと冷却流体量によってコント
ロールして加熱、冷却を行なう。堆積室101の上部位
には原料ガスを導入するガス導入管110が連結されて
いる。基体102は基体加熱ヒータ106によって、予
め所定の適正温度まで加熱しておく。また、電極106
は電極加熱ヒータ107によって予め所定の適正、温度
まで加熱しておく。
The electrode 106 is connected to a high frequency power source via a matching circuit (not shown). There are an electrode heater 107 and a cooling vibrator 1oa-i on the outside of the electrode 106, and a temperature controller 2-11 is installed to maintain a constant temperature according to the electrode temperature measured by a non-contact infrared temperature monitor 109.
2, heating and cooling are controlled by the heater power and the amount of cooling fluid. A gas introduction pipe 110 for introducing source gas is connected to the upper part of the deposition chamber 101. The base 102 is heated in advance to a predetermined appropriate temperature by a base heater 106 . In addition, the electrode 106
is heated in advance to a predetermined appropriate temperature by the electrode heater 107.

本発明は、水素化アモルファスシリコン膜、C9N、O
,B等の第■族元素、P等の第V族元素を含有させたア
モルファスシリコン膜の製造に適用でき、暗抵抗、光導
電特性に優れた均一な膜質の堆積膜を製造することがで
きる。
The present invention is a hydrogenated amorphous silicon film, C9N, O
It can be applied to the production of amorphous silicon films containing Group I elements such as , B, and Group V elements such as P, and can produce deposited films with uniform film quality that have excellent dark resistance and photoconductive properties. .

また、5t3N4 + SiC+ 5i02 、 si
o等の絶縁性膜の製造にも適用でき、絶縁特性の良好な
膜を得ることができる。
Also, 5t3N4 + SiC+ 5i02, si
This method can also be applied to the production of insulating films such as O, etc., and films with good insulating properties can be obtained.

実施例1 第1図に示した堆積膜製造装;6を用いてSiH45〜
40体積%+ H295〜60体積%の混合ガスをII
 Ifガスとして水素化アモルファスシリコン(a−3
iH)膜を製造した。基体を予め200〜400°に加
熱しておき、原料ガスをガス圧帆j〜2 torr 、
ガス流量0.1〜21/hrでガス導入管110から導
入した。電極加熱ヒータ107と冷却用パイプ108−
1に水を流すことにより電極温度がO〜250°になる
ように調節しつつ、グロー放電をおこし基体1D−2に
a −SiH膜を形成した。
Example 1 Using the deposited film manufacturing apparatus shown in FIG.
40 volume% + H295-60 volume% mixed gas II
Hydrogenated amorphous silicon (a-3
iH) A membrane was produced. The substrate is heated to 200 to 400° in advance, and the raw material gas is heated to a pressure of about 2 torr,
The gas was introduced from the gas introduction pipe 110 at a gas flow rate of 0.1 to 21/hr. Electrode heater 107 and cooling pipe 108-
While controlling the electrode temperature to 0 to 250° by flowing water through the substrate 1, glow discharge was generated to form an a-SiH film on the substrate 1D-2.

成膜中にマツチングのずれはなく、製造したa−8iH
膜は暗抵抗、光導電特性に優れ、均一な膜質であった。
There was no mismatching during film formation, and the manufactured a-8iH
The film had excellent dark resistance and photoconductive properties, and was uniform in quality.

実施例2 第2図に示し・た装置は、第1図における冷却用パイプ
108−1の代わりに、電極加熱ヒータ107を内蔵す
る電極温度調節室108−2を設け、加熱を電1萌加熱
ヒータ107で、冷却を電極温度調節室108−2に空
気を流すことにより行なう。図中の数字は、第1図と同
じ部位は同一数字で示した。
Embodiment 2 The apparatus shown in FIG. 2 is provided with an electrode temperature control chamber 108-2 containing an electrode heater 107 in place of the cooling pipe 108-1 in FIG. The heater 107 performs cooling by flowing air into the electrode temperature control chamber 108-2. The numbers in the figure indicate the same parts as in FIG. 1 with the same numbers.

第2図に示し−た堆積膜製造装置を用いて5iH45〜
40体積%、 H295〜60体積%の混合ガスを原料
ガスとしてa−8iH膜を製造した。基体を予め200
〜400°に加熱しておき、原料ガスをガス圧0−1〜
2 torr +ガス流@ 0.1〜21!/ hrで
ガスj9人管110から導入した。電極加熱ヒータ10
7と電極温度調節室108−2に空気を流すことにより
電極温度がO〜250°になるように調節しつつ、グロ
ー放電をおこし基体102にa−3iH膜を形成した。
Using the deposited film manufacturing apparatus shown in Fig. 2, 5iH45~
An a-8iH film was manufactured using a mixed gas of 40% by volume and 95 to 60% by volume of H2 as a raw material gas. 200mm base material in advance
Heat the raw material gas to ~400° and reduce the gas pressure to 0-1~
2 torr + gas flow @ 0.1~21! Gas was introduced from pipe 110 at a rate of 1/hr. Electrode heater 10
7 and the electrode temperature control chamber 108-2 to adjust the electrode temperature to 0 to 250°, glow discharge was generated to form an a-3iH film on the substrate 102.

成膜中にマツチングのずれはなく、製造したa−8iH
膜は暗抵抗、光導電特性に優れ、均一な膜質であった。
There was no mismatching during film formation, and the manufactured a-8iH
The film had excellent dark resistance and photoconductive properties, and was uniform in quality.

実施例3 第6図に示した装置は、堆積室を収り囲むようにして電
極106を設け、その内側(基体側)に実施例2と同様
な電極温度調節室108−2を設けた装置の例である。
Example 3 The apparatus shown in FIG. 6 is an example of an apparatus in which an electrode 106 is provided so as to surround a deposition chamber, and an electrode temperature control chamber 108-2 similar to that in Example 2 is provided inside the electrode 106 (on the substrate side). It is.

第6図に示した堆積膜製造装置を用いて5iH45〜4
0体積%、 H295〜60体積%の混合ガスを原料ガ
スとして、a−8iH膜を製造した。基体を予め200
〜400°に加熱しておき、原料ガスをガス圧0.1〜
2 LQrr Iガス流量0.1〜21/hrでガス導
入管110から導入した。電極加熱ヒータ107と電極
温度調節室108−2に空気を流すことにより電極温度
がO〜250°になるように調節しつつ、グロー放電を
おこし基体102にa−8iH膜を形成した。
5iH45~4 using the deposited film manufacturing apparatus shown in Figure 6.
An a-8iH film was manufactured using a mixed gas of 0% by volume and 95% to 60% by volume of H2 as a raw material gas. 200mm base material in advance
Heat the raw material gas to ~400° and reduce the gas pressure to 0.1~
2 LQrr I gas was introduced from the gas introduction pipe 110 at a flow rate of 0.1 to 21/hr. An a-8iH film was formed on the substrate 102 by generating glow discharge while adjusting the electrode temperature to 0 to 250° by flowing air through the electrode heater 107 and the electrode temperature control chamber 108-2.

成膜中にマツチングのずれはなく、製造したa−8iH
膜は暗抵抗、光導電特性に優れ、均一な膜質であった。
There was no mismatching during film formation, and the manufactured a-8iH
The film had excellent dark resistance and photoconductive properties, and was uniform in quality.

【図面の簡単な説明】[Brief explanation of drawings]

第1図、第2図、第6図は本発明の堆積膜の縦Ifノr
曲図である。 101・・・・・・堆積室 102・・・・・・円筒状基体 103・・・・・・基体加熱ヒータ 104・・・・・・メインバルブ 105・・・・・・排気口 106・・・・・・電極 107・・・・・・電極加熱ヒータ 108−1・・冷却用パイプ 108−2・・電極温度調節室 109・・・・・・赤外温度モニター 110・・・・・・ガス導入管 112・・・・・・温度コントローラー+12 第1図 第2図
FIGS. 1, 2, and 6 show the vertical If ratio of the deposited film of the present invention.
This is a song diagram. 101...Deposition chamber 102...Cylindrical substrate 103...Substrate heater 104...Main valve 105...Exhaust port 106... ... Electrode 107 ... Electrode heater 108-1 ... Cooling pipe 108-2 ... Electrode temperature control chamber 109 ... Infrared temperature monitor 110 ... Gas introduction pipe 112...Temperature controller +12 Fig. 1 Fig. 2

Claims (1)

【特許請求の範囲】[Claims] 減圧にし得る堆積室内で放電により堆積膜を形成する製
造装置において、堆積室内壁の内側および/または外側
に加熱手段および冷却手段並びC二それらをコントロー
ルする手段を設けたことを特徴とする高部1%鉾へ放電
による堆積膜の製造装置。
A manufacturing apparatus for forming a deposited film by electric discharge in a deposition chamber which can be reduced in pressure, characterized in that a heating means, a cooling means, and a means for controlling them are provided inside and/or outside the wall of the deposition chamber. A device for producing deposited films using 1% discharge.
JP58223137A 1983-11-29 1983-11-29 Apparatus for producing deposited film by electric discharge Pending JPS60116784A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58223137A JPS60116784A (en) 1983-11-29 1983-11-29 Apparatus for producing deposited film by electric discharge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58223137A JPS60116784A (en) 1983-11-29 1983-11-29 Apparatus for producing deposited film by electric discharge

Publications (1)

Publication Number Publication Date
JPS60116784A true JPS60116784A (en) 1985-06-24

Family

ID=16793369

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58223137A Pending JPS60116784A (en) 1983-11-29 1983-11-29 Apparatus for producing deposited film by electric discharge

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Country Link
JP (1) JPS60116784A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63501514A (en) * 1985-09-24 1988-06-09 センター・ナショナル・ド・ラ・リセルシェ・シェンティフィク(シー・エヌ・アール・エス) Methods and apparatus for chemical processing, especially thermochemical and chemical deposition processing, in large volume homogeneous plasmas
US6113732A (en) * 1996-03-18 2000-09-05 Canon Kabushiki Kaisha Deposited film forming apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63501514A (en) * 1985-09-24 1988-06-09 センター・ナショナル・ド・ラ・リセルシェ・シェンティフィク(シー・エヌ・アール・エス) Methods and apparatus for chemical processing, especially thermochemical and chemical deposition processing, in large volume homogeneous plasmas
US6113732A (en) * 1996-03-18 2000-09-05 Canon Kabushiki Kaisha Deposited film forming apparatus
KR100284918B1 (en) * 1996-03-18 2001-03-15 미다라이 후지오 Deposit film forming apparatus and method

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