JPS5999336A - Sensitivity adjusting device for emission spectrochemical analysis apparatus - Google Patents
Sensitivity adjusting device for emission spectrochemical analysis apparatusInfo
- Publication number
- JPS5999336A JPS5999336A JP21116182A JP21116182A JPS5999336A JP S5999336 A JPS5999336 A JP S5999336A JP 21116182 A JP21116182 A JP 21116182A JP 21116182 A JP21116182 A JP 21116182A JP S5999336 A JPS5999336 A JP S5999336A
- Authority
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- Japan
- Prior art keywords
- sensitivity
- result
- value
- objective
- yes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
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- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
【発明の詳細な説明】 本発明は発光分光分析における感度調整装置に関する。[Detailed description of the invention] The present invention relates to a sensitivity adjustment device for emission spectrometry.
火花放電によって試料を発光させ、試料中の種々な元素
の定量分析を行う場合、各元素の発光強度が異っている
ので、各元素毎に測定感度を適当に設定する必要がある
。本発明は発光分析におけるこのような各元素毎の測定
感度の自動設定を行うだめの装置に関する。When performing quantitative analysis of various elements in a sample by causing the sample to emit light by spark discharge, the emission intensity of each element is different, so it is necessary to appropriately set the measurement sensitivity for each element. The present invention relates to an apparatus for automatically setting measurement sensitivity for each element in luminescence analysis.
一つの装置によって製造される材料の品質管理B、C等
とする。これらの不純物元素の含有量は夫々成る範囲内
にあシ、例えばA元素は0.01〜0・1%の範囲でば
らついており、B元素は0.5〜2%の範囲でばらつい
ているとする。他方A、 B両元素の同一含有量にお
ける発光強度はへ元素がB元素の2倍だとすると、今の
場合、発光強度の比率はへ元素の0.02〜0.2に対
してB元素が0゜5〜2と云うことになり、両者の発光
強度は約10倍の開きがある。このような場合、分析計
の感度をB元素の最犬含景に対して測定値がスケールオ
ーバしないように設定しておくと、A元素は感度不足と
云うことになる。分析計の効率的な使い方としては、各
元素とも最大含有量(通常の最大含有量で異常に大きな
含有量ではない)が分析81の表示面における最大目盛
例近に来て、かつ表示値に簡単な整数5とか10或は0
.1等を掛けると実際のチ含有量の数値になると云うよ
うに、各元素毎の測定感度を設定するのがよい。他方発
光分光分析では試料に対向させた電極の消耗とか分光器
の光入射窓の透過率が経時的に低下して来る等のために
、感度が経時的に変化して来るので、再々感度の調整を
やり直す必要がある。Quality control of materials manufactured by one device B, C, etc. The contents of these impurity elements are within their respective ranges; for example, element A varies in the range of 0.01 to 0.1%, and element B varies in the range of 0.5 to 2%. shall be. On the other hand, assuming that the luminescence intensity for the same content of both elements A and B is twice that of the element B, in this case, the ratio of the luminescence intensity is 0.02 to 0.2 for the element B and 0 for the element B. This means that the luminescence intensity of the two is approximately 10 times as large. In such a case, if the sensitivity of the analyzer is set so that the measured value does not exceed the scale of the B element, the A element will be said to be insufficiently sensitive. In order to use the analyzer efficiently, the maximum content of each element (normal maximum content, not abnormally large content) should be close to the maximum scale on the display of Analysis 81, and the displayed value should be Simple integer 5, 10 or 0
.. It is preferable to set the measurement sensitivity for each element such that multiplying by 1 or the like yields the actual value of the CH content. On the other hand, in emission spectroscopy, the sensitivity changes over time due to wear of the electrode facing the sample and the decrease in transmittance of the light entrance window of the spectrometer over time. Need to readjust.
上述した感度の調整は元素含有量が既知の適当量である
ような標準試料を用意しておいて、この標イ((試料を
分析して、目的元素の測定値が予め定めである所定値に
なるように感度調整するのであり、従来はこの調整をオ
ペレータが行っており、上述したように感度調整は再々
行う必要があるだめ、分析担当者にとっては大きな負担
であると共に感度の誤設定と云うこともあった。To adjust the sensitivity described above, prepare a standard sample with a known and appropriate amount of element content, Conventionally, this adjustment has been done by the operator, but as mentioned above, sensitivity adjustment has to be done over and over again, which is a heavy burden on the analyst and can lead to incorrect sensitivity settings. There was something to be said.
本発明は発光分光分析における感度調整と云うオペレー
タの負担を軽減し、かつ感度の誤設定をなくすことを目
的とするものである。The present invention aims to reduce the burden on the operator of sensitivity adjustment in emission spectrometry and to eliminate erroneous settings of sensitivity.
本発明においても標準試料を用いることは従来と同じで
ある。本発明では、コンピュータに予め標準試料におけ
る各元素の目枕測定出力が記憶させてあり、標準試料を
発光させながら感度調整のプログラムを実行させると、
コンピュータは各元素の測定出力が目標値になるまでワ
ンステップずつ各元素の測定感度を増減して行くように
なっている。以下実施例によって本発明を説明する。In the present invention, the use of a standard sample is the same as in the prior art. In the present invention, the computer stores the eye pillow measurement output of each element in the standard sample in advance, and runs the sensitivity adjustment program while making the standard sample emit light.
The computer increases or decreases the measurement sensitivity of each element one step at a time until the measurement output of each element reaches the target value. The present invention will be explained below with reference to Examples.
次の表はコンピュータのメモリの内容を表にして示した
もので、4欄あり、左の3欄は標準試料に関するデータ
であシ、右端の1欄は感度調整を行う度に吉換えられる
感度調整器の設定値である。The following table shows the contents of the computer's memory as a table. It has 4 columns. The 3 columns on the left are data related to the standard sample, and the 1 column on the right is the sensitivity that changes each time the sensitivity is adjusted. This is the setting value of the regulator.
この実施例は銑鉄の検査用であり、分析対象の元素は左
端第1欄に示す通りである。標準試料はA、 B、
Cと3種用意されている。これは炭素以下の各元素は
含有量のばらつきの中間値側近の含最のものが標準試料
として好ましいが、一つの試料で全ての元素が適当量含
有されていると云うものは得られないので、例えばc、
p、 sについては試料A、Si、Mnについて
は試料Bを用いると云うようになっているのである。第
3欄は標準試料を分析したとき各元素の示すべき表示測
定値であって、コンピュータは表示測定値がこの値にな
るように各元素に対応する感度調整器を操作するのであ
る。This example is for testing pig iron, and the elements to be analyzed are as shown in the first column on the left. Standard samples are A, B,
Three types are available: C. This is because for each element below carbon, it is preferable to use the highest content near the intermediate value of the variation in content as a standard sample, but it is not possible to obtain a sample that contains all the elements in appropriate amounts. , for example c,
Sample A is used for p and s, and sample B is used for Si and Mn. The third column is the displayed measured value that should be shown for each element when the standard sample is analyzed, and the computer operates the sensitivity adjuster corresponding to each element so that the displayed measured value becomes this value.
(以下空白) 第1図は本発明の一実施例装置の全体を示す。(blank below) FIG. 1 shows an entire apparatus according to an embodiment of the present invention.
1は光源で試料を発光させる。2は分光器で、そのスペ
クトル像面の測定しようとする各元素の輝線位置に夫々
光検出器PI、P2・・・が配置される。1 causes the sample to emit light using a light source. Reference numeral 2 denotes a spectrometer, and photodetectors PI, P2, .
図では光検出器P ]、を代表として回路構成が示しで
ある。測光出力は増幅器AMP、A/D変換器ADを経
てコンピュータCPUに送られる。In the figure, the circuit configuration is shown with the photodetector P as a representative. The photometric output is sent to the computer CPU via an amplifier AMP and an A/D converter AD.
3は光検出器の感度調整器である。感度調整は増幅器A
MPの増幅度を変えることによって行うこともできる。3 is a sensitivity adjuster for the photodetector. Sensitivity adjustment is done using amplifier A.
This can also be done by changing the amplification degree of MP.
感度調整器の操作はコンピュータCP’ Uが行う。T
はコンピュータの操作卓であり、CRTはコンピュータ
の操作を対話式に行うだめの表示用ブラウン管である。The sensitivity adjuster is operated by the computer CP'U. T
is a computer console, and CRT is a display cathode ray tube used to interactively operate a computer.
感度調整を行う場合には光源1.に上述した標準試料を
セットして発光させ、標準試料のコード(前表における
A、B。When adjusting sensitivity, light source 1. Set the standard sample described above to emit light, and code the standard sample (A, B in the previous table).
C)を操作卓Tによってコンピュータに知らせ、感度調
整モードを指定してプログラムをスタートさせる。標準
試料としてAを用いるときは、コンピュータCPUはF
e、C,P、Sにライて感度調整動作を行う。第2図は
一つの元素についての感度調整動作のプログラムのフロ
ーチャートである。感度調整をスタートさせると、測光
出力がA/D変換器ADを介してCPUに入力され(イ
)、そ範囲内が3回続けて得られたか否かを調べ(ハ)
、3回に達しなければXに戻る。儒)の判定がYESな
ら調整路シで、そのときの感度調整器の設定値(前表の
右端4M)をメモリにファイルする四〇判定動作(ロ)
で答えがNoの場合、(ニ)において、感度調整を単純
に−ステップ上げるか下るかすればよいか否かをチェッ
クする。この動作の意味は次の通りである。感度調整は
連続的でなく、一定量ずつ段階的に切換えるようになっ
ている。従って感度を一段上げると測定値が目標値の範
囲を上に超過し、−股下げると目標範囲を下に超えると
云う場合が生じ、このとき(ニ)の判定の答はNOであ
り、単純に感度を上げ又は下げてよい場合は答はYES
になる。なおこの判定ステップを設ける理由については
更に後で詳述する。(ニ)の判定がYESの場合を先に
述べると、(ホ)において、感度が1」標範囲より下か
が問われ、YESなら感度を+αだけ上げ(へ)、No
なら感度を−α増す(αだけ下げる)(1・)。N又は
(ト)で更新された感度値を感度調整器に出力して感度
調整を実行させる(チ)、動作はX点に戻る。かくして
感度は目標値に向ってαずつ近づいて行く。さて、(ニ
)の判定がNOのとき(これは二、ホ、へ又は1・、チ
、Xの循還が繰返されると到達する状態)、測定値を目
標範囲内に収めるだめの感度調整値の端数が計算され(
す)、これに基き感度調整器が制御され(ス)、Y点を
経て感度設定値がメモリにファイルされ、−元素につい
ての調整動作が終る。C) is notified to the computer via the console T, the sensitivity adjustment mode is specified, and the program is started. When using A as a standard sample, the computer CPU
Perform the sensitivity adjustment operation on e, C, P, and S. FIG. 2 is a flowchart of a program for sensitivity adjustment operation for one element. When sensitivity adjustment is started, the photometric output is input to the CPU via the A/D converter AD (B), and it is checked whether or not the range has been obtained three times in a row (C).
, if it does not reach 3 times, return to X. 40 Judgment operation (B): If the judgment of ``Confucian'' is YES, go to the adjustment path ``S'' and file the setting value of the sensitivity adjuster at that time (4M on the right side of the previous table) in the memory.
If the answer is No, it is checked in (d) whether the sensitivity adjustment can be simply raised or lowered by -steps. The meaning of this operation is as follows. Sensitivity adjustment is not continuous, but is done step by step. Therefore, if you increase the sensitivity by one step, the measured value may exceed the target value range, and if you lower the sensitivity, the measured value may exceed the target range below. The answer is YES if you can increase or decrease the sensitivity.
become. Note that the reason for providing this determination step will be explained in detail later. Let us first describe the case where the judgment in (d) is YES. In (e), it is asked whether the sensitivity is below the 1" standard range, and if it is YES, the sensitivity is increased by +α (to).
If so, increase the sensitivity by -α (decrease by α) (1.). At N or (g), the updated sensitivity value is output to the sensitivity adjuster to execute sensitivity adjustment (ch), and the operation returns to point X. In this way, the sensitivity approaches the target value by α. Now, when the judgment in (d) is NO (this is the state reached by repeating the cycle of 2, E, H or 1, H, X), adjust the sensitivity to keep the measured value within the target range. The fraction of the value is calculated (
Based on this, the sensitivity adjuster is controlled (step), and the sensitivity setting value is filed in the memory through the Y point, and the adjustment operation for the - element is completed.
上述したプログラムでは調Drk動作が終了するルート
が2種ある。その一つは(イ)(Ol(ハ)、Xの経路
を3回連続して繰返すルートでもう一つは(二1(す1
(ヌ)の経路である。(ニ)(ul(ス)の経路では測
定出力が11標範囲に入るようトリミングしだ後3回確
認の動作を行わず直ちに調整動作を終了する。このよう
に一つのルートを設けているのは次の理由による。(ニ
)の判定がNOになる場合を考えると2通りある。In the above-mentioned program, there are two routes by which the key Drk operation ends. One is a route that repeats the route (A) (Ol (C), X three times in a row) and the other is (21 (S1)
(nu) route. (d) In the (ul) route, after trimming is started so that the measurement output falls within the 11 standard range, the adjustment operation is immediately finished without checking three times. This is due to the following reason.If we consider the case where the determination in (d) is NO, there are two cases.
その一つは(イ)(ロ)(ハ)の経路を1〜2回通って
(ロ)の判定がN Oになった場合で、これtよ感度を
αずつ段階的に変えて行ったとき最後の段階で測定出力
が目標範囲の内に入ったが上限か下限に近い所に感度が
セットされた場合で確認を繰返すと目標範囲から外れる
ことがあるのである。もう一つの場合は感度をαずつ変
えて行ったとき、測定出力が目標範囲の上下限近くで目
標範囲外に感度が七ノドされた場合で、例えば感度が高
過ぎるとしてαだけ下げると目標範囲の下限より下って
しまう。これら2通りの何れの場合も感度をαずつ変え
て行った場合、測定出力が目標範囲の上下限に近接した
点に到達したと云うことである。従ってこのような場合
は(ニ)(リバヌンの経路でトリミングしないと、いつ
寸で経っても(ニ)がNoの状態から脱出できない。他
方(細口)(ハ)の3回(これは−例で何回でもよい)
確認を省くと、感度の段階的調節で過熱目標範囲の中央
イ」近にセットされた場合と、上下限の近くにセットさ
れた場合とを区別できないことになる。One is when the judgment in (b) becomes NO after going through the routes (a), (b), and (c) once or twice, and this is done by changing the sensitivity step by step by α. If the measured output falls within the target range at the final stage, but the sensitivity is set close to the upper or lower limit, repeating the check may cause it to fall outside the target range. Another case is when the sensitivity is changed by α and the measured output is near the upper and lower limits of the target range and the sensitivity is seven steps outside the target range.For example, if the sensitivity is too high and you lower it by α, it will fall within the target range. It falls below the lower limit of . In either of these two cases, when the sensitivity is changed by α, the measured output reaches a point close to the upper and lower limits of the target range. Therefore, in such a case, if you do not trim the path of (d) (libanun), you will not be able to escape from the state where (d) is No no matter how long it takes.On the other hand (narrow mouth) (c) three times (this is (as many times as you like)
If confirmation is omitted, it will not be possible to distinguish between a case where the sensitivity is set near the center of the target overheating range and a case where it is set near the upper and lower limits in the stepwise adjustment of the sensitivity.
以上の動作で各元素についての測定感度が目標値に設定
されると共に、そのときの感度調整器における設定量が
前表右端欄のようにメモリに記憶され、以後感度調整の
やり直しが行われるまでは・ その設定量が維持される
。このようにメモリしておくのは、試71’=’lは一
種類でなく、全熱別種の試料を分析するときは各元素の
測定感度を別の値に設定するので、初めに設定した感度
に復元できるようにするだめである。With the above operations, the measurement sensitivity for each element is set to the target value, and the setting amount of the sensitivity adjuster at that time is stored in the memory as shown in the rightmost column of the previous table, until the sensitivity adjustment is performed again. - The set amount is maintained. The reason for storing this in memory is that test 71'='l is not just one type, and when analyzing samples of different types of total heat, the measurement sensitivity of each element is set to a different value, so It is not possible to restore the sensitivity.
本発明は上述したような構成で、分析担当者は標準試料
を発光させて感度調整の指令操作をするだけで自動的に
各元素に対する感度設定ができるので、感度調整作業の
負担が著るし01イ減されると共に感度設定の誤りもな
くなり、分析の信頼性が向上する。The present invention has the above-described configuration, and the analyst can automatically set the sensitivity for each element simply by making the standard sample emit light and commanding the sensitivity adjustment, which reduces the burden of sensitivity adjustment work. 01 is reduced, errors in sensitivity setting are eliminated, and the reliability of analysis is improved.
第1図は本発明の一実施例装置のブロック図、第2図は
同実施例の動作のフローチャートである。FIG. 1 is a block diagram of an apparatus according to an embodiment of the present invention, and FIG. 2 is a flow chart of the operation of the embodiment.
Claims (1)
せたメモリを有し、感度調整の指令によって上記メモリ
のデータに基き、各元素の測定出力が上記目標値になる
ように分析計の感度調整を行うようプログラムされた制
御回路を備えだ発光分光分析装置の感度調整装置。Memorize the target value of measurement output of each element in the standard sample1
Emission spectroscopy has a control circuit programmed to adjust the sensitivity of the analyzer so that the measured output of each element reaches the target value based on the data in the memory according to the sensitivity adjustment command. Sensitivity adjustment device for analyzers.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21116182A JPS5999336A (en) | 1982-11-30 | 1982-11-30 | Sensitivity adjusting device for emission spectrochemical analysis apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP21116182A JPS5999336A (en) | 1982-11-30 | 1982-11-30 | Sensitivity adjusting device for emission spectrochemical analysis apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5999336A true JPS5999336A (en) | 1984-06-08 |
JPS642894B2 JPS642894B2 (en) | 1989-01-19 |
Family
ID=16601403
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP21116182A Granted JPS5999336A (en) | 1982-11-30 | 1982-11-30 | Sensitivity adjusting device for emission spectrochemical analysis apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5999336A (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5427493A (en) * | 1977-08-03 | 1979-03-01 | Kawasaki Steel Co | Instrumental analysis |
-
1982
- 1982-11-30 JP JP21116182A patent/JPS5999336A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5427493A (en) * | 1977-08-03 | 1979-03-01 | Kawasaki Steel Co | Instrumental analysis |
Also Published As
Publication number | Publication date |
---|---|
JPS642894B2 (en) | 1989-01-19 |
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