JPS5996758A - Lead frame - Google Patents

Lead frame

Info

Publication number
JPS5996758A
JPS5996758A JP57206624A JP20662482A JPS5996758A JP S5996758 A JPS5996758 A JP S5996758A JP 57206624 A JP57206624 A JP 57206624A JP 20662482 A JP20662482 A JP 20662482A JP S5996758 A JPS5996758 A JP S5996758A
Authority
JP
Japan
Prior art keywords
frame
hole
partition
lead
lead frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57206624A
Other languages
Japanese (ja)
Other versions
JPH0463544B2 (en
Inventor
Yuichi Yuki
幸 友一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP57206624A priority Critical patent/JPS5996758A/en
Publication of JPS5996758A publication Critical patent/JPS5996758A/en
Publication of JPH0463544B2 publication Critical patent/JPH0463544B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49541Geometry of the lead-frame
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)
  • Wire Bonding (AREA)

Abstract

PURPOSE:To prevent the generation of warpage by alleviating the thermal strain at the time of wire bonding by a method wherein through holes connected to through hole bored through a partition frame are bored at positions of joint to the partition frame of the outer frame in a lead frame. CONSTITUTION:The through hole 13' extended to outer frame 11 and 11' is bored through the partition frame 12. A new through hole 19 connected to a through hole 13 is formed along a longitudinal direction at the position of joint to the partition frame 12 through the outer frame 11 and 11'. This lead frame enables the strain due to the heat at the time of wire bonding to be alleviated by the two through holes 13' and 19. Particularly, the strain connected in a longitudinal direction via the outer frame 11 and 11' which was never absorbed conventionally can be largely alleviated by the newly provided through hole 19. Therefore, this lead frame enables to prevent the generation of warp also at the time of wire bonding a continuous or thin lead frame.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はIC、LS I等の半導体装置を外囲器内に組
み立てる際に使用されるリードフレームの改良に関する
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to improvements in lead frames used when assembling semiconductor devices such as ICs and LSIs into envelopes.

〔発明の技術的背景〕[Technical background of the invention]

第1図に示すように、ICやLSI等の半導体チップl
はリードフレームUを用いて外囲器にパッケージングさ
れる。同図において、11 、11’はリードフレーム
の外枠で、平行に配役されている。薇外枠11 、 I
 Z’は所定の間隔をおいて仕切枠12で連結されてお
り、この仕切枠12には喝その全長に亘って透孔13が
穿設されている。そして、1を切砕12および外枠I 
Z 、 12’で囲まれた領域には所定のノくターンが
形成されている。壕ず、その・令甲火に(は半導体チッ
プlをマウントするためのベッド部14が自己役され、
該ベッド部は支干守り一ド15によって外枠I Z 、
 J 1’に連結支持されている。
As shown in Figure 1, semiconductor chips such as IC and LSI
is packaged into an envelope using a lead frame U. In the figure, 11 and 11' are outer frames of lead frames, which are arranged in parallel. Outer frame 11, I
Z' are connected by a partition frame 12 at a predetermined interval, and a through hole 13 is bored in the partition frame 12 over its entire length. Then, cut 1 into pieces 12 and outer frame I.
A predetermined notch is formed in the area surrounded by Z and 12'. The bed section 14 for mounting the semiconductor chip is self-contained, without a trench.
The bed part has an outer frame IZ,
It is connected and supported by J1'.

このベッド部14の周囲にはこれに離間して多数のイン
ナーリード16・・・が目己役されている。
A large number of inner leads 16 are provided around the bed portion 14 at a distance therebetween.

これらのインナーリード16・・・はその先端がベッド
部14を取シ囲むように1己役され、他端部は外部リー
ド17・・・とじて延設されて仕゛切枠12に運7附さ
れている。また、同じ方間に延設てれるインナーリード
16・・・は外部リード17・・・との境界においてブ
リッジ部18を介して相互に連結され、更に外枠17 
、 Z 1’に運、1店支持されている。
The tips of these inner leads 16 are used to surround the bed part 14, and the other ends are extended as external leads 17 and carried to the cutting frame 12. It is attached. Further, the inner leads 16 extending in the same direction are connected to each other via the bridge portion 18 at the boundary with the outer leads 17, and furthermore, the outer leads 17
, Z 1' is lucky and supported by 1 store.

上記のリードフレームを用いて半へ9体チップ1を外l
i5器にパッケージングする際には、1ず図示のように
半導体チップ1をベッド部14上にマウントする(ダイ
ボンディング)。続いて半4にチップlの内部端子とイ
ンナーリード16・・・の先端部間をAu あるいはA
I!巻のボンディングワイヤ2で接続する(ワイヤボン
ディング)。その後、飼えば樹脂封止パッケージの場合
には、半導体チップ1、ベッド部14、インナーリード
16・・・およびポンディングワイヤ2の部分を樹脂モ
ールド層で気酪封止する(樹脂封止工程)。次いで、支
持リード15を外枠Z Z 、 Z Z’から切断する
と共に外部リード17・・・を仕切枠12から切断し、
同時にブリッジ部18を切除する。これてよって個々の
半導体装置がフレームから分離され、また個々の独立し
たリードが形成される(リードフォーミング工程)。
Remove the 9-piece chip 1 into half using the above lead frame.
When packaging into an i5 device, the semiconductor chip 1 is first mounted on the bed portion 14 as shown in the figure (die bonding). Next, on half 4, connect Au or A between the internal terminal of chip l and the tip of inner lead 16...
I! Connect with the 2-volume bonding wire (wire bonding). After that, in the case of a resin-sealed package, the semiconductor chip 1, bed portion 14, inner leads 16, and bonding wires 2 are air-sealed with a resin mold layer (resin sealing step). . Next, the support leads 15 are cut from the outer frames ZZ, ZZ', and the outer leads 17... are cut from the partition frame 12,
At the same time, the bridge portion 18 is removed. As a result, individual semiconductor devices are separated from the frame, and individual independent leads are formed (lead forming step).

ところで、インナーリード16・・・の先端部には一般
にへグ メッキが施されており、前記ワイヤボンディン
グエ梶においては、インナーリード16・・・を250
〜350℃にヒートアップした状態でボイディングワイ
ヤ2を圧脇する。仕切枠12の略全長に亘って穿設され
た透孔13は、このワイヤボンディング時の加熱によっ
て生じる歪を緩和し、リードフレーム10に反りが発生
するのを防止する作用を果たすものである。
By the way, the tips of the inner leads 16 are generally coated with a metal plate, and in the wire bonding machine, the inner leads 16 are coated with 250 ml of metal.
The voiding wire 2 is pressed while heated to ~350°C. The through holes 13 formed along substantially the entire length of the partition frame 12 serve to alleviate the distortion caused by heating during wire bonding and to prevent the lead frame 10 from warping.

〔背景技術の問題点〕[Problems with background technology]

しかしながら、上記従来のリードフレームは、フラット
パッケージ用リードフレームのように板厚が0.2〜0
.15 mmと薄い場合には熱歪に対する調性が小さい
ため、仕切枠12に設けた透孔13だけではこの歪を防
止できず、反りの発生を回避できないという問題があっ
た。また長尺フレームの場合にも、ワイヤボンディング
時の熱膨張が外枠11. I J’を介して7賭がるた
めに透孔13だけではこれを緩和できず、反りの発生を
防止できないという間通があった。
However, the conventional lead frame mentioned above has a plate thickness of 0.2 to 0.
.. When the thickness is as thin as 15 mm, the tonality with respect to thermal distortion is small, so that the through holes 13 provided in the partition frame 12 alone cannot prevent this distortion, and there is a problem that warping cannot be avoided. Also, in the case of a long frame, the thermal expansion during wire bonding will cause the outer frame 11. 7 through IJ', the through hole 13 alone could not alleviate this problem and could not prevent the occurrence of warpage.

〔発明の目的〕[Purpose of the invention]

本発明は上記事情に鑑みてなされたもので、板厚の薄い
フラットパッケージ用リードフレ°−ムあるいは長尺の
リードフレームの場合にも、ワイヤボンディング時の熱
歪を緩和して反りの発生を防止することが7できるリー
ドフレームを提供しようとするものである。
The present invention was made in view of the above circumstances, and even in the case of thin lead frames for flat packages or long lead frames, thermal distortion during wire bonding is alleviated and warpage is prevented. The purpose of the present invention is to provide a lead frame that can

〔発明の概要J 本発明によるリードフレームは、従来のリードフレーム
における外枠の仕切枠との連結位置に、仕切枠に穿設さ
れだ透孔と連通する新たな透孔を穿設したことを特徴と
するものである。
[Summary of the Invention J The lead frame according to the present invention has a new through hole that communicates with the through hole drilled in the partition frame at the connection position of the outer frame and the partition frame in the conventional lead frame. This is a characteristic feature.

上記本発明のリードフレームでは外枠に新たに設けた透
孔により、ワイヤボンディング時に外枠を介して長手方
向に継がる熱歪を緩和することができる。
In the lead frame of the present invention, the through holes newly provided in the outer frame can alleviate thermal strain that continues in the longitudinal direction through the outer frame during wire bonding.

実施例 第2図は本発明の一笑加例になるリードフレームを示す
平面1図である。同図において、11゜li’jは外枠
、12は仕切枠、14はベッド、N15、z5tj、支
持リード、16はインナーリード、17は外部リード、
18はブリッジ部であシ、これらは総て第1図の従来の
リードフレームと同bj<に形成されている。他方、こ
の実施トリでは仕切枠12Vこ、従来の透孔13と違っ
て外枠12 、11’に種で延設された透孔13’が穿
設されている。そして、外枠I Z 、 11’には仕
切枠12との遅1.活位、il vで前記透孔13V?
l連通する新たな透孔19が長手方向(てτaって形成
されている。
Embodiment FIG. 2 is a plan view showing a lead frame which is an additional example of the present invention. In the same figure, 11゜li'j is an outer frame, 12 is a partition frame, 14 is a bed, N15, z5tj is a support lead, 16 is an inner lead, 17 is an outer lead,
Reference numeral 18 denotes a bridge portion, all of which are formed at the same bj< as in the conventional lead frame shown in FIG. On the other hand, in this embodiment, the partition frame 12V is different from the conventional through hole 13 in that the outer frame 12, 11' is provided with a through hole 13' extending with a seed. The outer frame I Z , 11' has a lag 1. The active position, the through hole 13V at il v?
A new through hole 19 that communicates with each other is formed in the longitudinal direction (τa).

上記実’;”A (!11jのリードフレームによれば
、ワイヤボンディング時の刀口熱による歪は二つの透孔
13’ + 19’によってl丙オロされる。待に、新
たに設けられた透孔19によって、従来は全く吸収され
なかった外枠11 、11’を介して長手方向に′i社
がる歪を犬tll昌に緩和することができる。従つて、
上に実Mti e’ll」のリードフレームによれば、
長尺あるいは薄手のリードフレームの揚台にもワイヤボ
ンディング時の反1)’A生を直重することができる。
According to the lead frame of the above-mentioned actual ';'A (!11j), the distortion caused by the knife edge heat during wire bonding is reduced by the two through holes 13' + 19'. Due to the holes 19, the strain exerted in the longitudinal direction through the outer frames 11 and 11', which was not absorbed at all in the past, can be completely alleviated.
According to the lead frame,
It is also possible to directly load the raw material during wire bonding on the platform of a long or thin lead frame.

〔発明の効果〕〔Effect of the invention〕

以上説明したよう(で、本発明によればワイヤボンディ
ング+13:の年ζ歪を太:i昌に緩オ日し、フラット
パッケージ用のリードフレームあるいは長尺のリードフ
レームの場合にも反りの発生を直重することができるり
−、ドフレームを提供でさるものである。
As explained above, according to the present invention, the distortion of wire bonding +13:0. It can be hung vertically or provided with a frame.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のリードフレームに半4体チップをマウン
トし、史Qζフイヤボンデイング?行なった状態cシ示
す平面図、第2図は本発明の一実施例になるリードフレ
ームの平面図である。 11 、11’・・・外枠、12・・・仕切枠、13′
・・・透孔、14・・・ベッド部、15・・・支持リー
ド、16・・・インナーリード、17・・・外部リード
、18・・・ブリッジ部、19・・・透孔。
Figure 1 shows a half-quad chip mounted on a conventional lead frame and subjected to history Qζ wire bonding. FIG. 2 is a plan view of a lead frame according to an embodiment of the present invention. 11, 11'...outer frame, 12...partition frame, 13'
...Through hole, 14...Bed part, 15...Support lead, 16...Inner lead, 17...Outer lead, 18...Bridge part, 19...Through hole.

Claims (1)

【特許請求の範囲】[Claims] 長手方向に平行に配設された二本の外枠と、この外枠間
を所定間隔で連結する複数の仕切枠と、該仕切枠および
前記外枠で囲まれた領域の略中央に配設され、外枠また
は仕切枠に連結支持されたベッド部と、該ベッド部の周
囲にこれと離間して配設された複数のインナーリードと
、該インナーリードを延設して形成され、AiJ記仕切
枠に連結支持された外部リードと、前記仕切枠の略全長
に亘って穿設された第10透孔と、前記外枠における仕
切枠との連結位置に前記第1の透孔に連辿して穿設され
た嬉2のI力孔とを具備したことを4似とするリードフ
レーム。
Two outer frames arranged in parallel in the longitudinal direction, a plurality of partition frames connecting these outer frames at predetermined intervals, and arranged approximately in the center of the area surrounded by the partition frames and the outer frame. AiJ memory is formed by extending the inner leads, including a bed portion connected and supported by an outer frame or a partition frame, a plurality of inner leads arranged around the bed portion at a distance from the bed portion, and the inner leads extending from the bed portion. An external lead connected and supported by the partition frame, a tenth through hole drilled over substantially the entire length of the partition frame, and a connecting position of the outer frame with the partition frame are connected to the first through hole. A lead frame similar to 4 in that it is equipped with a 2-hole I force hole.
JP57206624A 1982-11-25 1982-11-25 Lead frame Granted JPS5996758A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57206624A JPS5996758A (en) 1982-11-25 1982-11-25 Lead frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57206624A JPS5996758A (en) 1982-11-25 1982-11-25 Lead frame

Publications (2)

Publication Number Publication Date
JPS5996758A true JPS5996758A (en) 1984-06-04
JPH0463544B2 JPH0463544B2 (en) 1992-10-12

Family

ID=16526453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57206624A Granted JPS5996758A (en) 1982-11-25 1982-11-25 Lead frame

Country Status (1)

Country Link
JP (1) JPS5996758A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4887352A (en) * 1986-12-31 1989-12-19 Texas Instruments Incorporated Method for making matrix lead frame

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5294074A (en) * 1976-02-04 1977-08-08 Hitachi Ltd Leading-in frame

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5294074A (en) * 1976-02-04 1977-08-08 Hitachi Ltd Leading-in frame

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4887352A (en) * 1986-12-31 1989-12-19 Texas Instruments Incorporated Method for making matrix lead frame

Also Published As

Publication number Publication date
JPH0463544B2 (en) 1992-10-12

Similar Documents

Publication Publication Date Title
US7443022B2 (en) Board-on-chip packages
JP2670408B2 (en) Resin-sealed semiconductor device and method of manufacturing the same
US5418189A (en) Integrated circuit device and method to prevent cracking during surface mount
JP2957168B2 (en) Lead frame and semiconductor package using the same
JP3837215B2 (en) Individual semiconductor device and manufacturing method thereof
US6777266B2 (en) Dual-chip integrated circuit package and method of manufacturing the same
JPH0992772A (en) Lead on chip semiconductor package and its preparation
JPH10270626A (en) Semiconductor device and manufacture thereof
JPH05136202A (en) Semiconductor package and manufacture thereof
JPS5996758A (en) Lead frame
JPH0777257B2 (en) Lead frame
JP3226244B2 (en) Resin-sealed semiconductor device
JP2746224B2 (en) Semiconductor device and manufacturing method thereof
TWI287876B (en) Semiconductor package
JPH0338057A (en) Flagless lead frame, and package using it, and manufacture
JP2682200B2 (en) Semiconductor device
JPS63293963A (en) Resin-sealed semiconductor device
JPH0547988A (en) Semiconductor device
JPS589585B2 (en) Dense hinge lead frame
JPH11251510A (en) Lead frame and semiconductor device using the same
JPH04316356A (en) Resin-sealed type semiconductor device
JPH01278757A (en) Lead frame
JP3078526B2 (en) Resin-sealed semiconductor device
JPS60113932A (en) Assembling process of resin sealed semiconductor device
JPH0422159A (en) Semiconductor integrated circuit device and manufacture thereof