JPS5977707A - Bias circuit device - Google Patents

Bias circuit device

Info

Publication number
JPS5977707A
JPS5977707A JP57188501A JP18850182A JPS5977707A JP S5977707 A JPS5977707 A JP S5977707A JP 57188501 A JP57188501 A JP 57188501A JP 18850182 A JP18850182 A JP 18850182A JP S5977707 A JPS5977707 A JP S5977707A
Authority
JP
Japan
Prior art keywords
bias
output
radiator
trs1
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57188501A
Other languages
Japanese (ja)
Other versions
JPH0374525B2 (en
Inventor
Hideyasu Jikou
秀保 慈幸
Takeshi Sato
剛士 佐藤
Katsuhiko Higashiyama
勝比古 東山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP57188501A priority Critical patent/JPS5977707A/en
Publication of JPS5977707A publication Critical patent/JPS5977707A/en
Publication of JPH0374525B2 publication Critical patent/JPH0374525B2/ja
Granted legal-status Critical Current

Links

Abstract

PURPOSE:To suppress the change in a bias current due to the fluctuation in the collector loss by fitting an output transistor (TR) and its bias circuit to a radiator and controlling the bias circuit with a bias voltage in response to the temperature difference detected at a heat sensing resistive element. CONSTITUTION:The output TRs1, 2 and a TR3 giving a bias to the TRs1, 2 are fitted to a radiator 13. A resistive element 11 of negative temperature dependancy is fitted to the vicinity of the output TRs 1, 2 of the radiator 13, and a negative characteristic temperature dependancy resistive element 12 is fitted apart from the output TRs1, 2 of the radiator 13. A difference of resistance of the elements 11, 12 is detected by a comparator amplifier 10 and a detecting output controls a bias voltage variable device 9. The fluctuation in the bias current is suppressed because of the fluctuation in the collector loss of the output TRs1, 2.

Description

【発明の詳細な説明】 産業上の利用分野 本発明はオーディオ用低歪率電力増幅器の5EPP出力
段に使用することができるバイアス回路装置に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a bias circuit device that can be used in a 5EPP output stage of a low distortion power amplifier for audio.

従来例の構成とその問題点 第1図に従来のバイアス回路例を示す。第1図において
、1,2が出力トランジスタで、3がバイアス用トラン
ジスタ、4,6は直流電源端子、6.7は信号入力端子
、8は出力端子、R1,R2はバイアス設定用抵抗であ
る。そして、出力トランジスタ1,2のベース、エミッ
タ間に与えられるバイアス電圧vbは、バイアス用トラ
ンジスタ3のベース、エミッタ間電圧をVbe3とする
と、Vb =(R1+R2) ”bea/R1・−・・
(1)となる。
1. Structure of conventional example and its problems FIG. 1 shows an example of a conventional bias circuit. In Figure 1, 1 and 2 are output transistors, 3 is a bias transistor, 4 and 6 are DC power supply terminals, 6.7 is a signal input terminal, 8 is an output terminal, and R1 and R2 are bias setting resistors. . Then, the bias voltage vb applied between the base and emitter of the output transistors 1 and 2 is as follows, where Vbe3 is the voltage between the base and emitter of the bias transistor 3.
(1) becomes.

ここで出力トランジスタ1,2に一定のバイアス電流を
流すのに必要な出力トランジスタ1,2のベース、エミ
ッタ間電圧をそれぞれVbe1  +Vbe2としたと
き、 ”bel =Vbe2””Vbe3 =Vo  2(T5−To) ただし vO:  各トランジスタ1.2.3のジャン
ク・ンヨン温度がToのとき のベース、エミッタ間電圧 Tj: 各トランジスタ1.2.3のジャンクション温
度 という温度特性であるとすると、出力トランジスタ1,
2と、バイアス用トランジスタ3の温度差が常に一定で
あればVb −(Vbe1”Vbe2)となり、一定の
バイアス電流を流すことができる。しかし、出力信号が
変化して、出力トランジスタ1゜2のコレクタ損失が変
化した場合、出力トランジスタ1,2とバイアス用トラ
ンジスタ30間には必ず熱抵抗があるため、出力トラン
ジスタ1,2とバイアス用トランジスタ3の温度差が変
化してしまうためバイアス電流が変化してしまう欠点が
ある。
Here, when the voltages between the base and emitter of output transistors 1 and 2 required to flow a constant bias current through output transistors 1 and 2 are respectively Vbe1 + Vbe2, "bel = Vbe2""Vbe3 = Vo 2 (T5- To) However, vO: Voltage between the base and emitter when the junction temperature of each transistor 1.2.3 is To: Tj: Assuming that the temperature characteristic is the junction temperature of each transistor 1.2.3, the output transistor 1 ,
If the temperature difference between the output transistor 2 and the bias transistor 3 is always constant, it will be Vb - (Vbe1"Vbe2), and a constant bias current can flow. However, the output signal changes and the output transistor 1. When the collector loss changes, since there is always thermal resistance between the output transistors 1 and 2 and the bias transistor 30, the temperature difference between the output transistors 1 and 2 and the bias transistor 3 changes, so the bias current changes. There are drawbacks to doing so.

発明の目的 本発明は」二記欠点を除去し、出力トランジスタのコレ
クタ損失が変動することによりバイアス電流が変動する
のを抑制することを目的とするものである。
OBJECTS OF THE INVENTION It is an object of the present invention to eliminate the above-mentioned drawbacks and to suppress variations in the bias current due to variations in the collector loss of the output transistor.

器に取付け、この放熱器の上記出力トランジスタに近い
ところに第1の感熱抵抗素子を取付け、上記放熱器の上
記出力トラ7ジスタから離れたところに第2の感熱抵抗
素子を取付け、上記第1の感熱素子と第2の感熱素子に
より検出される温度の差に応じたバイアス電圧を作るバ
イアス回路を設け、上記両バイアス回路を直列に接続し
たものである。
A first heat-sensitive resistance element is mounted on the heatsink near the output transistor, a second heat-sensitive resistance element is mounted on the heatsink away from the output transistor; A bias circuit is provided to generate a bias voltage according to the difference in temperature detected by the second heat-sensitive element and the second heat-sensitive element, and both bias circuits are connected in series.

実施例の説明 以下本発明の一実施例について図面を参照して説明する
。第2図はその一実施例を示す回路図であシ、第1図と
同一部分については同一番号を付して説明を省略する。
DESCRIPTION OF EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings. FIG. 2 is a circuit diagram showing one embodiment of the present invention, and the same parts as those in FIG. 1 are given the same numbers and the explanation thereof will be omitted.

第2図、第3図において、9はバイアス可変器、10は
比較増幅器、11゜12は負特性温度依存性抵抗素子、
13は放熱器である。抵抗素子11は出力トランジスタ
1,2の近くに、抵抗素子12は出力トランジスタ1゜
2から離れだ所に取り付けているため、周囲温度の変化
によって13の放熱器の温度が変化しても負特性温度依
存性抵抗素子11.12の抵抗値の差は変化しないが、
出力トランジスタ1,2のコレクタ損失が変化すること
Kよって放熱器13の温度が変化した時は負特性温度依
存性抵抗素子11.12の抵抗値の差が変化する。した
がって第2図のような回路構成では、負特性温度依存性
抵抗素子11.12の抵抗値の差を比較増幅器1゜によ
り検出し、この出力によってバイアス電圧可変器9を制
御することにより、周囲温度の変化による出力トランジ
スタ1,2のジャンクション温度の変化に対するバイア
ス電圧の補正をバイアス用トランジスタ3で行ない、出
力トランジスタ1゜2のコレクタ損失が変化することに
よる出力トランジスタ1,2のジャンクション温度の変
化1対するバイアス電圧の補正をバイアス電圧可変器9
により制御することができる。
In FIGS. 2 and 3, 9 is a bias variable device, 10 is a comparison amplifier, 11° and 12 are negative temperature-dependent resistance elements,
13 is a heat sink. Since the resistor element 11 is installed near the output transistors 1 and 2, and the resistor element 12 is installed at a location away from the output transistors 1 and 2, there is no negative characteristic even if the temperature of the heat sink 13 changes due to changes in the ambient temperature. Although the difference in the resistance values of the temperature-dependent resistance elements 11 and 12 does not change,
Since the collector losses of the output transistors 1 and 2 change, when the temperature of the radiator 13 changes, the difference in the resistance values of the negative characteristic temperature dependent resistance elements 11 and 12 changes. Therefore, in the circuit configuration as shown in FIG. The bias voltage is compensated by the bias transistor 3 for the change in the junction temperature of the output transistors 1 and 2 due to a change in temperature, and the change in the junction temperature of the output transistors 1 and 2 due to the change in the collector loss of the output transistor 1゜2. Bias voltage variable device 9 corrects the bias voltage for 1.
can be controlled by

発明の効果 以上のように本発明によれば出力トランジスタのコレク
タ損失が温度によって変化してもバイアス電流が変化す
ることがなりものである。
Effects of the Invention As described above, according to the present invention, even if the collector loss of the output transistor changes with temperature, the bias current changes as a matter of course.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来例におけるバイアス回路装置の回路図、第
2図は本発明の一実施例におけるバイアス回路装置の回
路図、第3図は同装置の一部分の斜視図である。 1.2・・・・・・出力トランジスタ、3・・・・・・
バイアス用トランジスタ、4,6・・・・・・直流電源
端子、6゜了・・・・・・信号入力端子、8・・・・・
・出力端子、9・・・・・バイアス電圧可変器、10・
・・・・・比較増幅器、11゜12・・・・・・負特性
温度依存性抵抗素子、13・・・・・・放熱器、R1,
R2・・・・・・バイアス設定用抵抗。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図 2 図 3図
FIG. 1 is a circuit diagram of a bias circuit device in a conventional example, FIG. 2 is a circuit diagram of a bias circuit device in an embodiment of the present invention, and FIG. 3 is a perspective view of a portion of the same device. 1.2... Output transistor, 3...
Bias transistor, 4, 6...DC power supply terminal, 6゜end...Signal input terminal, 8...
・Output terminal, 9...Bias voltage variable device, 10.
... Comparison amplifier, 11゜12 ... Negative characteristic temperature dependent resistance element, 13 ... Heat sink, R1,
R2...Resistance for bias setting. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 出力トランジスタと、この出力トランジスタにバイアス
を与えるバイアス回路とを放熱器に取付け、この放熱器
の上記出力トランジスタに近いところに第1の感熱抵抗
素子を取付け、上記放熱器の上記出力トランジスタから
離れたところに第2の感熱抵抗素子を取付け、上記第1
の感熱素子と第2の感熱素子により検出される温度の差
に応じたバイアス電圧を作るバイアス回路を設け、上記
二つのバイアス回路を直列に接続するようにしたバイア
ス回路装置。
An output transistor and a bias circuit that applies a bias to the output transistor are attached to a heat sink, a first heat-sensitive resistance element is attached to the heat sink near the output transistor, and a first heat-sensitive resistance element is attached to the heat sink away from the output transistor. A second heat-sensitive resistance element is attached to the above-mentioned first
A bias circuit device is provided with a bias circuit that generates a bias voltage according to the difference in temperature detected by a second heat-sensitive element and a second heat-sensitive element, and the two bias circuits are connected in series.
JP57188501A 1982-10-26 1982-10-26 Bias circuit device Granted JPS5977707A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57188501A JPS5977707A (en) 1982-10-26 1982-10-26 Bias circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57188501A JPS5977707A (en) 1982-10-26 1982-10-26 Bias circuit device

Publications (2)

Publication Number Publication Date
JPS5977707A true JPS5977707A (en) 1984-05-04
JPH0374525B2 JPH0374525B2 (en) 1991-11-27

Family

ID=16224827

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57188501A Granted JPS5977707A (en) 1982-10-26 1982-10-26 Bias circuit device

Country Status (1)

Country Link
JP (1) JPS5977707A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5483199A (en) * 1994-10-21 1996-01-09 Hewlett-Packard Company Method and apparatus for compensating thermal time constants in an electronic amplifier
JP2007074039A (en) * 2005-09-02 2007-03-22 Kenwood Corp Power amplifying circuit, bias control method of power amplifying circuit, bias control program of power amplifying circuit, and storage medium
JP2013258598A (en) * 2012-06-13 2013-12-26 Mitsubishi Electric Corp Bias circuit

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5483199A (en) * 1994-10-21 1996-01-09 Hewlett-Packard Company Method and apparatus for compensating thermal time constants in an electronic amplifier
JP2007074039A (en) * 2005-09-02 2007-03-22 Kenwood Corp Power amplifying circuit, bias control method of power amplifying circuit, bias control program of power amplifying circuit, and storage medium
JP2013258598A (en) * 2012-06-13 2013-12-26 Mitsubishi Electric Corp Bias circuit

Also Published As

Publication number Publication date
JPH0374525B2 (en) 1991-11-27

Similar Documents

Publication Publication Date Title
JPH04266110A (en) Band-gap reference circuit
JPH07202591A (en) Standard electric current source
US5428287A (en) Thermally matched current limit circuit
JP4388144B2 (en) Reference circuit and method
JPS5977707A (en) Bias circuit device
JP3315921B2 (en) Temperature detection circuit
JPS62191907A (en) Semiconductor circuit
US4092613A (en) Transistorized class ab power amplifier and its bias circuit
JPH065493B2 (en) Constant current supply circuit
JPH082738Y2 (en) Constant current circuit
JPS5827540Y2 (en) power amplifier
JPS60129818A (en) Reference voltage circuit
JPS6410101B2 (en)
JP4163861B2 (en) Semiconductor device
JP2591817Y2 (en) Constant voltage generation circuit
JP2604671B2 (en) Bias circuit
JPH0248896Y2 (en)
JP2807700B2 (en) Output circuit having current limiting circuit
JPS6365894B2 (en)
JP2000124743A (en) Current source circuit
JPS5853730A (en) Heat detecting circuit
JPS58107921A (en) Current supply device
JPH0435776Y2 (en)
JPH021608Y2 (en)
JPS58146111A (en) Constant current circuit