JPS5977051U - Disk defect detection device - Google Patents

Disk defect detection device

Info

Publication number
JPS5977051U
JPS5977051U JP17266682U JP17266682U JPS5977051U JP S5977051 U JPS5977051 U JP S5977051U JP 17266682 U JP17266682 U JP 17266682U JP 17266682 U JP17266682 U JP 17266682U JP S5977051 U JPS5977051 U JP S5977051U
Authority
JP
Japan
Prior art keywords
disk
signal
defect
detection
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17266682U
Other languages
Japanese (ja)
Inventor
小松 忠紀
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP17266682U priority Critical patent/JPS5977051U/en
Publication of JPS5977051U publication Critical patent/JPS5977051U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例におけるディスク欠陥検出装
置の概略構成図、第2図は同装置の受光器の構成を示す
図、第3図a”−dは第1図に示した装置の作用説明に
用いるための信号波形図、第4図は本考案の他の実施例
における欠陥検出装置の検出光学系の構成を示す図であ
る。 1・・・被検査ディスク、2・・・回転機構、3・・・
回転座標検出部、4・・・検出光学系、41・・・レー
ザ発生器、42・・・照射光学系、43・・・受光器、
43a。 〜、43d・・・受光素子、43e、43f・・・減算
器、5a・・・レーザ光、5b・・・反射光、6・・・
移動機構、7・・・信号処理部、71・・・フィルタ回
路、72・・・微分回路、73・・・増幅回路、訃・・
演算回路、9・・・移動座標検出部、10・・・出力装
置、11・・・半透鏡あるいはプリズム型ハーフミラ−
Fig. 1 is a schematic configuration diagram of a disk defect detection device according to an embodiment of the present invention, Fig. 2 is a diagram showing the configuration of a light receiver of the same device, and Fig. 3 a”-d are the devices shown in Fig. 1. FIG. 4 is a diagram showing the configuration of a detection optical system of a defect detection device in another embodiment of the present invention. 1... disk to be inspected, 2... Rotating mechanism, 3...
Rotating coordinate detection unit, 4... Detection optical system, 41... Laser generator, 42... Irradiation optical system, 43... Light receiver,
43a. ~, 43d... Light receiving element, 43e, 43f... Subtractor, 5a... Laser light, 5b... Reflected light, 6...
Moving mechanism, 7... Signal processing unit, 71... Filter circuit, 72... Differentiating circuit, 73... Amplifying circuit, Death...
Arithmetic circuit, 9... Moving coordinate detection unit, 10... Output device, 11... Half mirror or prism type half mirror
0

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)定速回転中の被検査ディスクの表面にレーザ光を
照射しその反射光を受光してこの受光位置の変化を検出
する検出光学系と、この検出光学系により得られた受光
位置変化信号のうちから被検査ディスク自在の表面形状
による規則的な変化信号成分を少なくとも除去するフィ
ルタと、このフィルタを通過した信号を波形整形して欠
陥信号を得る信号処理回路と、前記被検査ディスクの回
転座標を検出する回転座標検出部と、前記被検査ディス
クの表面に対するレーザ光の照射位置をディスクの径方
向へ相対移動せしめる照射位置移動部と、前記信号処理
回路により得られた欠陥信号、前記回転座標検出部から
の座標検出信号および照射位置移動部からの照射位置信
号に基づいて被検査ディスクの欠陥の状態を求める演算
部とを具備したことを特徴とするディスク欠陥検出装置
。  ゛
(1) A detection optical system that irradiates the surface of the disk to be inspected while rotating at a constant speed, receives the reflected light, and detects changes in the light reception position, and a detection optical system that detects changes in the light reception position obtained by this detection optical system. a filter for removing at least regular changing signal components due to the surface shape of the disk to be inspected from the signal; a signal processing circuit for waveform-shaping the signal passing through the filter to obtain a defect signal; a rotational coordinate detection unit that detects rotational coordinates; an irradiation position moving unit that relatively moves the irradiation position of the laser beam on the surface of the disk to be inspected in the radial direction of the disk; a defect signal obtained by the signal processing circuit; What is claimed is: 1. A disk defect detection device comprising: a calculation section that determines a defect state of a disk to be inspected based on a coordinate detection signal from a rotational coordinate detection section and an irradiation position signal from an irradiation position moving section.゛
(2)検出光学系は、レーザ光の照射光路および反射光
の受光光路の大部分を相互に共用するものである実用新
案登録請求の範囲第1項記載のディスク欠陥検出装置。
(2) The disk defect detection device according to claim 1, wherein the detection optical system shares most of the laser beam irradiation optical path and the reflected light reception optical path.
JP17266682U 1982-11-15 1982-11-15 Disk defect detection device Pending JPS5977051U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17266682U JPS5977051U (en) 1982-11-15 1982-11-15 Disk defect detection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17266682U JPS5977051U (en) 1982-11-15 1982-11-15 Disk defect detection device

Publications (1)

Publication Number Publication Date
JPS5977051U true JPS5977051U (en) 1984-05-24

Family

ID=30376322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17266682U Pending JPS5977051U (en) 1982-11-15 1982-11-15 Disk defect detection device

Country Status (1)

Country Link
JP (1) JPS5977051U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989011645A1 (en) * 1988-05-25 1989-11-30 Kabushiki Kaisha Csk Defect inspection apparatus

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830779A (en) * 1971-08-23 1973-04-23
JPS57161641A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for defect of surface

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4830779A (en) * 1971-08-23 1973-04-23
JPS57161641A (en) * 1981-03-31 1982-10-05 Olympus Optical Co Ltd Inspecting device for defect of surface

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1989011645A1 (en) * 1988-05-25 1989-11-30 Kabushiki Kaisha Csk Defect inspection apparatus

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