JPS6041807U - surface inspection equipment - Google Patents

surface inspection equipment

Info

Publication number
JPS6041807U
JPS6041807U JP13347083U JP13347083U JPS6041807U JP S6041807 U JPS6041807 U JP S6041807U JP 13347083 U JP13347083 U JP 13347083U JP 13347083 U JP13347083 U JP 13347083U JP S6041807 U JPS6041807 U JP S6041807U
Authority
JP
Japan
Prior art keywords
measured
inspection device
reflected light
position detector
surface inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13347083U
Other languages
Japanese (ja)
Inventor
望月 政彦
Original Assignee
株式会社東芝
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社東芝 filed Critical 株式会社東芝
Priority to JP13347083U priority Critical patent/JPS6041807U/en
Publication of JPS6041807U publication Critical patent/JPS6041807U/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図乃至第4図はそれぞれ本考案の第1乃至第4の実
施例を示す構成図である。 A・・・第1の入射光、B・・・第2の入射光、5・・
・第1の検出器、6・・・第2の検出器。
FIGS. 1 to 4 are block diagrams showing first to fourth embodiments of the present invention, respectively. A...first incident light, B...second incident light, 5...
- First detector, 6... second detector.

Claims (6)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)被測定面を照射する投光手段と、上記被測定面か
らの反射光を斜反射光成分として検出する位置に設けら
れる第1の位置検出器と、同じく上記被測定面からの反
射光をこの被測定面の法線方向の垂直反射光成分として
検出する位置に設けられる第2の位置検出器と、上記第
2の位置検出器の信号と上記第1の位置検出器の信号か
ら上記第2の位置検出器の信号に相当する成分を減算し
た信号とにより上記被測定面の平行移動量と傾きを検出
する手段とを備えたことを特徴とする表面検査装置。
(1) A light projection means for illuminating the surface to be measured, a first position detector provided at a position to detect the reflected light from the surface to be measured as an oblique reflected light component, and a first position detector that also detects the reflected light from the surface to be measured as an oblique reflected light component; a second position detector provided at a position to detect the light as a vertically reflected light component in the normal direction of the surface to be measured; and a signal from the second position detector and a signal from the first position detector. A surface inspection device comprising means for detecting the amount of parallel movement and inclination of the surface to be measured based on a signal obtained by subtracting a component corresponding to the signal of the second position detector.
(2)投光手段は被測定面に対して垂直および斜めの2
方向からの照射になることを特徴とする実用新案登録請
求の範囲第1項記載の表面検査装置。
(2) The light projecting means has two directions, one perpendicular and one diagonal to the surface to be measured.
The surface inspection device according to claim 1, which is characterized in that the irradiation is performed from a direction.
(3)  投光手段は被測定面に対して斜めの一方向か
らなり被測定面からの反射光が第1および第2の位置検
出器方向に分岐されることを特徴とする実用新案登録請
求の範囲第1項記載の表面検査装置。
(3) A request for registration of a utility model characterized in that the light projecting means extends in one direction obliquely to the surface to be measured, and the reflected light from the surface to be measured is branched toward the first and second position detectors. The surface inspection device according to item 1.
(4)被測定面への垂直の、照射は集束スポットめ照射
にされたことを特徴とする実用新案登録請求の範囲第2
項記載の表面検査装置。
(4) Utility model registration claim 2, characterized in that the irradiation perpendicular to the surface to be measured is focused spot irradiation.
The surface inspection device described in Section 1.
(5)集束スポットは被測定面に一定の集束径に保持さ
れることを特徴とする実用新案登録請求の範囲第4項記
載の表面検査装置。
(5) The surface inspection device according to claim 4, wherein the focused spot is maintained at a constant focused diameter on the surface to be measured.
(6)投光手段はレーザ光を投光する装置になることを
特徴とする実用新案登録請求の範囲第1項乃至第3項の
いずれかに記載の表面検査装置。
(6) The surface inspection device according to any one of claims 1 to 3, wherein the light projecting means is a device that projects a laser beam.
JP13347083U 1983-08-31 1983-08-31 surface inspection equipment Pending JPS6041807U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13347083U JPS6041807U (en) 1983-08-31 1983-08-31 surface inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13347083U JPS6041807U (en) 1983-08-31 1983-08-31 surface inspection equipment

Publications (1)

Publication Number Publication Date
JPS6041807U true JPS6041807U (en) 1985-03-25

Family

ID=30301056

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13347083U Pending JPS6041807U (en) 1983-08-31 1983-08-31 surface inspection equipment

Country Status (1)

Country Link
JP (1) JPS6041807U (en)

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