JPS5964807A - Photoelectric transducing device for distance measurement - Google Patents

Photoelectric transducing device for distance measurement

Info

Publication number
JPS5964807A
JPS5964807A JP17597282A JP17597282A JPS5964807A JP S5964807 A JPS5964807 A JP S5964807A JP 17597282 A JP17597282 A JP 17597282A JP 17597282 A JP17597282 A JP 17597282A JP S5964807 A JPS5964807 A JP S5964807A
Authority
JP
Japan
Prior art keywords
circuit
light
photoelectric conversion
signal
operational amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17597282A
Other languages
Japanese (ja)
Inventor
Koji Matsushima
幸治 松島
Yasushi Hoshino
康 星野
Junji Kajiwara
梶原 淳治
Fumio Yasui
文男 安井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Konica Minolta Inc
Panasonic Holdings Corp
Original Assignee
Konica Minolta Inc
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konica Minolta Inc, Matsushita Electric Industrial Co Ltd filed Critical Konica Minolta Inc
Priority to JP17597282A priority Critical patent/JPS5964807A/en
Publication of JPS5964807A publication Critical patent/JPS5964807A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Measurement Of Optical Distance (AREA)
  • Focusing (AREA)
  • Automatic Focus Adjustment (AREA)

Abstract

PURPOSE:To attain a photoelectric transducing device for distance measurement which is not affected by a bias current by providing a filter circuit through which only modulation signal components of the output of a bipolar operational amplifying circuit pass. CONSTITUTION:A modulation light is converted to a current signal IA corresponding to the input light by a photoelectric transducer D. The current signal IA is converted to a voltage signal by the first operational amplifying circuit. The filter circuit consisting of a capacitor C1 and a resistance R1 is provided for the purpose of taking out a modulation signal. The output of the first operational amplifying circuit U1 has DC components cut by the capacitor C1 while it passes the filter circuit, and the whole of the modulation signal where VB is added to V0 is taken out. This modulation signal is amplified by the second operational amplifying circuit U2 furthermore and is outputted as VAC. Thus, the photoelectric transducing device which is not affected by the bias current is realized.

Description

【発明の詳細な説明】 本発明は、光電変換素子の出力を受番プる演算増幅回路
としてバイポーラ形のものを用いても、バイアス電流の
影響を受りることなく正確に光電変換を行える測距用光
電変換装置に関する。
[Detailed Description of the Invention] The present invention enables accurate photoelectric conversion without being affected by bias current even when a bipolar type operational amplifier circuit is used as an operational amplifier circuit that receives the output of a photoelectric conversion element. The present invention relates to a photoelectric conversion device for distance measurement.

カメラ等に用いられる測光回路では、微少電流を増幅す
る必要があるため、その初段部にMO8入力方式やFE
T入力方式が用いられている。これは、光電変換素子の
出力電流が微小であるため、信号を正確に増幅するには
測光回路入力段の入力インピーダンスを高くして、バイ
アス電流の大きさを、信号電流のそれに比較して無視で
きる程疫に小さくする必要があるからである。
In photometry circuits used in cameras, etc., it is necessary to amplify minute currents, so MO8 input type or FE type is used in the first stage.
A T input method is used. This is because the output current of the photoelectric conversion element is minute, so in order to accurately amplify the signal, the input impedance of the photometric circuit input stage is made high, and the magnitude of the bias current is ignored compared to that of the signal current. This is because it is necessary to make it as small as possible.

第1図は、従来の光重変換装置の一例を示す回路図であ
る。この装置において、被変換光は、光電変換素子])
によって光■に応じた電流IAに変えられて、演算増幅
器U1と帰還抵抗R「とで構成される演算増幅回路に入
力され、該演算増幅回路で電流信号IAは電圧信号\l
oに変換される。
FIG. 1 is a circuit diagram showing an example of a conventional optical weight conversion device. In this device, the light to be converted is a photoelectric conversion element])
The current signal IA is converted into a current IA corresponding to the light \l by , and is input to an operational amplifier circuit consisting of an operational amplifier U1 and a feedback resistor R'', where the current signal IA is converted into a voltage signal \l.
converted to o.

尚、演算増幅器U1の正入力端子は阜14j電位Vre
fに接続されている。
Incidentally, the positive input terminal of the operational amplifier U1 is at the potential Vre
connected to f.

ここで、演算増幅器LJ 1のバイアス電流をIsとす
ると、信号電流[Aのうち帰還抵抗R「を流れる電流分
は(IA−Is)となり、演算増幅回路(演算増幅器U
+)の出力Voは次式のようになる。尚、抵抗の値とし
て符号をそのまま用いた(以下同様)。
Here, if the bias current of the operational amplifier LJ1 is Is, the current flowing through the feedback resistor R out of the signal current [A is (IA-Is), and the operational amplifier circuit (operational amplifier U
+) output Vo is as shown in the following equation. Note that the symbols are used as they are as the resistance values (the same applies below).

Vo=−(lA−Is)Rf=(1) 従って、真値−rA−R「に対して4−re −Rfは
誤X1となる。今、IA > Inの場合を考えると、
測定精度に与えるバイアス電流[日の影響は無視できる
。しかしながら、バイアス電流Isの大きい入力段を用
いたり、低輝度領域になったような場合はrA占Isど
なり測定精度に極めて大きな影響を及は1ことになる。
Vo=-(lA-Is)Rf=(1) Therefore, for the true value -rA-R', 4-re -Rf becomes error X1.Now, considering the case where IA > In,
The effect of bias current on measurement accuracy is negligible. However, if an input stage with a large bias current Is is used or if the brightness is in a low brightness region, the rA ratio Is will have a very large effect on the measurement accuracy.

第2図は、被変換光が連続光の場合のバイアス電流Is
の影響を示寸図である。バイアス電流[Bによるオフセ
ラ1〜電圧Vs  (−Is −Rf )は、出力Vo
として表われてこhいので、このVaだけ測定誤差と4
7る。
Figure 2 shows the bias current Is when the light to be converted is continuous light.
This is a dimensional diagram showing the influence of The offset voltage Vs (-Is - Rf) due to the bias current [B is the output Vo
Therefore, this Va is the measurement error and 4
7ru.

一般に、測光系で扱う信号電流■Aは数nA以下になる
ことが多い。そのため、信号電流を精度よく測定するた
めに、バイアス電流Isが信号電流IAに比較して充分
小さい入力段をもつ演算増幅回路を用いる必要がある。
Generally, the signal current ■A handled by a photometric system is often less than several nA. Therefore, in order to accurately measure the signal current, it is necessary to use an operational amplifier circuit having an input stage in which the bias current Is is sufficiently smaller than the signal current IA.

MOS入力方式或いはF E丁入カカ式の場合、バイア
ス電流Isが数pA稈1αのものが容易に得られるので
、0.1%以下の精度で光量に比例して信号を10るこ
とが可能となる。
In the case of the MOS input method or the FE type, it is easy to obtain a bias current Is of several pA or 1α, so it is possible to generate a signal proportional to the amount of light with an accuracy of 0.1% or less. becomes.

一方、近江カメラのシーケンスコン[−ロール部或いは
ΔF(J−1〜フオーカス)演算回路部等のIC化が進
んでおり、アナログ演算回路やロジック回路等と()て
、全体システムの兼合いから、I21−を含むバイポー
ラ系のデバイスを用いることが多い。従って、測光系の
デバイスがMOSのよう4r揚合、MOSタイプの測光
系とバイポーラタイプの信号増幅系との組合せどへり、
その接続が困t1]である。このため、両者を別チップ
或いは別3− パッケージにせざるを噌qない場合が生じ、大幅27コ
ストアツプとなる。更に空間ファクタが悪くなり装置の
小形化が図れなくなる。或いはワンプツブ、J二lこb
i−MOSのような高度なプロセス(こよるIC化も考
えられるがバイポーラ型に較べればコストアップとなる
。バイポーラ形はどのように優れた回路でもn△オーダ
ーのバイアス電流をもつ。
On the other hand, the use of ICs in Omi cameras' sequence controllers (-roll section or ΔF (J-1 to focus) arithmetic circuit section, etc.) is progressing, and from the viewpoint of the balance of the overall system, they are being integrated with analog arithmetic circuits, logic circuits, etc. , I21- are often used. Therefore, if the photometric device is a MOS type 4R device, the combination of a MOS type photometric system and a bipolar type signal amplification system,
The connection is difficult t1]. For this reason, it may be necessary to use separate chips or separate packages for both, resulting in a significant increase in cost. Furthermore, the space factor deteriorates, making it impossible to downsize the device. Or Wamp Tsubu, J2lkob
It is possible to use an advanced process such as i-MOS (IC), but the cost will be higher than that of a bipolar type.The bipolar type has a bias current on the order of n△, no matter how good the circuit is.

従って、このままでは、光電変換装置どして使えない。Therefore, as it is, it cannot be used as a photoelectric conversion device.

本発明は、このような点に鑑みてなされたもので、その
目的は、光電変換素子の出力を受ける演算増幅回路どし
てバイポーラ形演粋増幅回路を用いても、バイアス電流
の悪影響が生じない測距用光電変換gEを実現すること
にある。
The present invention has been made in view of these points, and its purpose is to prevent the adverse effects of bias current from occurring even if a bipolar type arithmetic amplification circuit is used as an operational amplification circuit that receives the output of a photoelectric conversion element. The objective is to realize photoelectric conversion gE for distance measurement.

この目的を達成する本発明の測距用光電変換装置は、被
写体への又は被写体からの光を変調光に変える変調手段
と、該変調手段によって変調された光を受【プる光電変
換素子と、該光電変換素子の出力を増幅するバイポーラ
形演算増幅回路と、該演算増幅回路の出力のうち変調信
号弁のみ通過さ4− せるフィルタ回路とを備えたことを特徴と覆るものであ
る。
A photoelectric conversion device for distance measurement according to the present invention that achieves this object includes a modulation device that converts light toward or from a subject into modulated light, and a photoelectric conversion device that receives the light modulated by the modulation device. , a bipolar operational amplifier circuit that amplifies the output of the photoelectric conversion element, and a filter circuit that allows only the output of the operational amplifier circuit to pass through the modulation signal valve.

以下、図面を参照して本発明の詳細な説明する。Hereinafter, the present invention will be described in detail with reference to the drawings.

第3図は、本発明の一実施例を示す電気的構成図である
(第1図と同一部分には同一符号を付して示した)。図
において、CPは直流光を変調光に変換する変調手段で
ある。該変調手段CPとしては、例えば連続光をパルス
状光に変換するシーメンスター(多数の放射状スリット
が形成された回転円盤)が用いられる。演算増幅器U1
及び帰う9抵抗Rfどで構成される第1の演算増幅回路
の出力Voは、]ンデン1」C1ど抵抗R1どの直列回
路であるフィルタ回路を経て、演算増幅器U2及び帰還
抵抗R?とで構成される第2の演算増幅回路に入力され
ている。
FIG. 3 is an electrical configuration diagram showing an embodiment of the present invention (the same parts as in FIG. 1 are given the same reference numerals). In the figure, CP is a modulation means that converts DC light into modulated light. As the modulation means CP, for example, a Siemens star (a rotating disk in which a large number of radial slits are formed) that converts continuous light into pulsed light is used. Operational amplifier U1
The output Vo of the first operational amplifier circuit consisting of nine resistors Rf, Rf, etc. passes through a filter circuit, which is a series circuit, to an operational amplifier U2 and a feedback resistor R? The signal is input to a second operational amplifier circuit consisting of.

このように構成された装置の動作を説明寸れば、以下の
通りである。
The operation of the device configured as described above will be explained as follows.

連続光は、変調手段CPによってパルス状光に変えられ
る。この変調光は、光電変換素子りによって、入力光に
応じた電流信号IAに変換される。
The continuous light is changed into pulsed light by the modulation means CP. This modulated light is converted by a photoelectric conversion element into a current signal IA corresponding to the input light.

尚、この光電変換索子りとしては、例えば、フォトダイ
オードやフォ1〜トランジスタが用いられる。
Incidentally, as this photoelectric conversion element, for example, a photodiode or a phototransistor is used.

又、フォトダイオードの一種Cあるが、F” S l)
と呼ぶ半導体装置検出器にも適用できる。但し、このP
SDは入射光スポットの位首(被写体距離によって変化
)によって変動する一対の電流信号を出力J−るもので
、このPSDの)商用に対しては特開昭57−2205
08号公報や特願昭56−178583号に示した如く
、一対の電流各々に対して用いる必要がある。電流信号
IAは、続く第1の演算増幅回路によって電圧4rr月
に変換される。
Also, there is a type of photodiode C, F"S l)
It can also be applied to semiconductor device detectors called . However, this P
The SD outputs a pair of current signals that vary depending on the position of the incident light spot (changes depending on the subject distance).
As shown in Japanese Patent Application No. 08 and Japanese Patent Application No. 56-178583, it is necessary to use this method for each of a pair of currents. The current signal IA is converted into a voltage 4rr by a subsequent first operational amplifier circuit.

このときの電圧信号voは(1)式と同じく−(lA−
Is)Rfどなる。第4図(a >は、この第1の演算
増幅回路の出力波形を示す図である。
The voltage signal vo at this time is -(lA-) as in equation (1).
Is) Rf roars. FIG. 4(a) is a diagram showing the output waveform of this first operational amplifier circuit.

直流的な電位どしては\loであるが、基準電位\1r
efより正極性側にオフセフ1ル分Va(=ra ・R
f)が含まれている。 Voをそのまま直流的に増幅す
れば、バイアス電流Isの影響を受は誤差を含んだもの
となるが、本発明回路では、\10のみならずVsも含
まれた変調信号を取り出すために、コンデンiJ’ C
I及び抵抗R1どで構成したフィルタ回路を設けている
。第1の演算増幅回路の出力は、該フィルタ回路を通過
する間に、コンデンIJ−CIT−直流分がカットされ
VoにVaが加わった変調信号がそっくり取り出される
。この変調信号は、続く第2の演算増幅回路で更に増幅
され、V’ACとして出力される。第4図(b)は、こ
の第2の演算増幅回路の出力波形を示寸図である。変調
波形がそっくり増幅されていることがわかる。このどき
、VACは、コンデンサC1の容量が充分大きいものと
すれば、次式で与えられる。
The DC potential is \lo, but the reference potential \1r
Va (=ra ・R
f) is included. If Vo is directly amplified directly, it will be affected by the bias current Is and will contain an error, but in the circuit of the present invention, in order to extract a modulation signal that includes not only \10 but also Vs, a capacitor is used. iJ'C
A filter circuit composed of I and a resistor R1 is provided. While the output of the first operational amplifier circuit passes through the filter circuit, the capacitor IJ-CIT-DC component is cut off, and a modulated signal in which Va is added to Vo is extracted in its entirety. This modulation signal is further amplified by the subsequent second operational amplifier circuit and output as V'AC. FIG. 4(b) is a dimensional diagram showing the output waveform of this second operational amplifier circuit. It can be seen that the modulation waveform is completely amplified. At this time, VAC is given by the following equation, assuming that the capacitance of capacitor C1 is sufficiently large.

V A C−’R2(\10+Ve)/R+=Rz  
((IA−Is )Rf 十Ze −Rf )/R+ =R2・Rf−rA/R+    ・・・(2)このよ
うに、本発明装置にJ:れば、バイアス電流の影響のな
い充電変換が行え、結局、正確な測距が可能となる。又
、バイアス電流の影響が無くなる結果、演算増幅回路の
入力段に、バイアス電流の大ぎいバイポーラ形のトラン
ジスタ回路を用 7− いることができる。従って、ワンデツプIC化やワンパ
ッケージ化が可能になる。更に、演算増幅器のオフセッ
ト電圧の影響をも併せて取り除くことができるので、オ
フセット電圧の小さいバイポーラ形演算増幅器を用いた
場合、オフセット無調整の測光回路を実現しうる。MO
8形演尊増幅器を用いた場合、オフセット電圧が数十m
V程度あるので、無調整回路の実現は一般に困難である
V A C-'R2(\10+Ve)/R+=Rz
((IA-Is)Rf +Ze-Rf)/R+ =R2・Rf-rA/R+ (2) In this way, if J: is used in the device of the present invention, charging conversion without the influence of bias current is possible. After all, accurate distance measurement becomes possible. Furthermore, since the influence of the bias current is eliminated, a bipolar type transistor circuit with a large bias current can be used in the input stage of the operational amplifier circuit. Therefore, it becomes possible to use one-deep IC and one package. Furthermore, since the influence of the offset voltage of the operational amplifier can also be removed, if a bipolar operational amplifier with a small offset voltage is used, a photometric circuit without offset adjustment can be realized. M.O.
When using an 8-type amplifier, the offset voltage is several tens of meters.
Since the voltage is about V, it is generally difficult to realize a circuit without adjustment.

尚、上述の説明では、変調手段としてシーメンスターを
用いた場合を例にとって説明したが、アクティブ方式の
ΔFの場合、発光を変調するようにしてもにい。又、変
調信号を取り出すフィルタ回路として、最も回路構成が
簡単なコンデンサC1と抵抗R1の直列回路の場合を例
にとって説明したが、こねに限る必要はなく、変調信号
のみを取り出せるものであれば、どのようなものであっ
てもよい。又、出力信号VACは必要に応じて直流に変
換して用いることができる。
In the above description, a Siemenster is used as the modulation means. However, in the case of an active type ΔF, it is also possible to modulate the light emission. Further, as a filter circuit for extracting a modulated signal, the case has been explained using a series circuit of a capacitor C1 and a resistor R1, which has the simplest circuit configuration, as an example, but it is not limited to kneading, and as long as only a modulated signal can be extracted, It can be anything. Further, the output signal VAC can be converted into direct current and used as necessary.

以上説明したように、本発明によれば、バイアス電流の
影響の無い測距用光電変換装置を実現で8− きる。従って、バイアス電流の大ぎいバイポーラ形演棹
増幅回路を使用できるので、ワンデツプ化やワンパッケ
ージ化が可能となり、他の回路との融合性も向上し、低
コスト化及び装置の小形化を実現できる。
As described above, according to the present invention, it is possible to realize a photoelectric conversion device for distance measurement that is not affected by bias current. Therefore, it is possible to use a bipolar derivational amplifier circuit with a large bias current, making it possible to integrate it into one depth and into one package, improving compatibility with other circuits, and realizing cost reduction and downsizing of the device. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の光電変換装置の一例を示す回路図、第2
図はそのバイアス電流の影響を示す説明図、第3図は本
発明の一実施例を示J−回路図、第4図は第3図回路の
動作説明図である。 D・・・光電変換索子    CP・・・変調手段Rf
 、R2・・・帰還抵抗 tJ+ 、U2・・・演算増幅器 C1・・・」ンデン
ザR+・・・抵抗 特91出願人  小西六写真工業株式会ネ1(外1名)
Figure 1 is a circuit diagram showing an example of a conventional photoelectric conversion device, Figure 2 is a circuit diagram showing an example of a conventional photoelectric conversion device.
FIG. 3 is an explanatory diagram showing the influence of the bias current, FIG. 3 is a J-circuit diagram showing one embodiment of the present invention, and FIG. 4 is an explanatory diagram of the operation of the circuit shown in FIG. D...Photoelectric conversion cable CP...Modulation means Rf
, R2...Feedback resistance tJ+, U2...Operation amplifier C1...'Ndenza R+...Resistance special 91 Applicant: Konishiroku Photo Industry Co., Ltd. Ne1 (1 other person)

Claims (4)

【特許請求の範囲】[Claims] (1)被写体への又は被写体からの光を変調光に変える
変調手段と、該変調手段によって変調された光を受ける
光電変換素子と、該光電変換素子の出力を増幅するバイ
ポーラ形演算増幅回路と、該演算増幅回路の出力のうち
変調信号弁のみ通過させるフィルタ回路とを備えた測距
用光電変換装置。
(1) A modulation means that converts light to or from the subject into modulated light, a photoelectric conversion element that receives the light modulated by the modulation means, and a bipolar operational amplifier circuit that amplifies the output of the photoelectric conversion element. and a filter circuit that allows only the modulation signal valve to pass among the output of the operational amplifier circuit.
(2)前記変調手段として被写体への照射光をパルス状
に変調する光源の発光回路を用いたことを特徴とする特
許請求の範囲第1項記載の測距用光電変換装置。
(2) The photoelectric conversion device for distance measurement according to claim 1, wherein a light emitting circuit of a light source that modulates the light irradiated onto the subject in a pulse form is used as the modulation means.
(3)前記変調手段として被写体からの反射光をパルス
状に変調するシーメンスターを用いたことを特徴とする
特許請求の範囲第1項記載の測距用光電変換装置。
(3) The photoelectric conversion device for distance measurement according to claim 1, wherein a Siemenster that modulates reflected light from a subject in a pulse shape is used as the modulation means.
(4)前記フィルタ回路としてコンアン1フ゛ど抵抗の
直列回路を用いたことを特徴とする特許請求の範囲第1
項乃至第3項記載の測距用光電変換装置。
(4) Claim 1, characterized in that the filter circuit is a series circuit of a conductor and a resistor.
A photoelectric conversion device for distance measurement according to items 1 to 3.
JP17597282A 1982-10-05 1982-10-05 Photoelectric transducing device for distance measurement Pending JPS5964807A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17597282A JPS5964807A (en) 1982-10-05 1982-10-05 Photoelectric transducing device for distance measurement

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17597282A JPS5964807A (en) 1982-10-05 1982-10-05 Photoelectric transducing device for distance measurement

Publications (1)

Publication Number Publication Date
JPS5964807A true JPS5964807A (en) 1984-04-12

Family

ID=16005459

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17597282A Pending JPS5964807A (en) 1982-10-05 1982-10-05 Photoelectric transducing device for distance measurement

Country Status (1)

Country Link
JP (1) JPS5964807A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61117407A (en) * 1984-11-13 1986-06-04 Kyocera Corp Automatic range measuring circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5443374A (en) * 1977-09-12 1979-04-05 Toyota Motor Corp Oil circulating filtration apparatus for machining process
JPS5535399A (en) * 1978-09-04 1980-03-12 Vockenhuber Karl Focusing device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5443374A (en) * 1977-09-12 1979-04-05 Toyota Motor Corp Oil circulating filtration apparatus for machining process
JPS5535399A (en) * 1978-09-04 1980-03-12 Vockenhuber Karl Focusing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61117407A (en) * 1984-11-13 1986-06-04 Kyocera Corp Automatic range measuring circuit

Similar Documents

Publication Publication Date Title
JPS62145938A (en) Photodetector
EP1963870B1 (en) Current measurement circuit and method
US4362996A (en) Method and means for an accurate wideband peak detector
KR101024220B1 (en) Power applying circuit and testing apparatus
JPS5964807A (en) Photoelectric transducing device for distance measurement
US6549058B1 (en) Signal processing circuits for multiplication or division of analog signals and optical triangulation distance measurement system and method incorporating same
JP2656265B2 (en) Current-voltage conversion circuit
JPH05122158A (en) Photoelectric converter
JPH10255300A (en) Photodetecting apparatus
JPH1038930A (en) Circuit for detecting peak voltage
SU1689764A1 (en) A light beam deviometer
JPS6276329A (en) Optical reception circuit
JPS5868615A (en) Output circuit of magnetic type rotary encoder
Antilogus et al. Cherenkov ring imaging detector front-end electronics
KR20200000877A (en) Flow signal processing device and flow meter using the same
JPH0757671A (en) Beam current measuring device
JP2585734B2 (en) Noise suppression circuit
JPH0156385B2 (en)
JPH0779122A (en) Amplifier circuit
JP3335918B2 (en) Optoelectronic circuit
SU991314A1 (en) High-voltage converter
JPH0216441B2 (en)
SU748302A1 (en) Device for registering transistor static transfer coefficient
JPH02118402A (en) High accuracy position measuring circuit
Chen et al. Integrated 1.2/spl mu/m CMOS photodiodes, transimpedance amplifier, 12 bits A/D converter, and DSP interface for microinstrument applications