JPS5960229A - Integrating sphere type reflection measuring device - Google Patents
Integrating sphere type reflection measuring deviceInfo
- Publication number
- JPS5960229A JPS5960229A JP17243282A JP17243282A JPS5960229A JP S5960229 A JPS5960229 A JP S5960229A JP 17243282 A JP17243282 A JP 17243282A JP 17243282 A JP17243282 A JP 17243282A JP S5960229 A JPS5960229 A JP S5960229A
- Authority
- JP
- Japan
- Prior art keywords
- window
- light
- sample
- integrating sphere
- windows
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
- G01N21/474—Details of optical heads therefor, e.g. using optical fibres
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】 本発明は積か球を用いた反射測定装置に関する。[Detailed description of the invention] The present invention relates to a reflection measuring device using stacked balls.
試軒1面の反射特性は、試料の視覚的な質感を規定する
ものであり、また材料の表1ai仕」−げ加ゴニの良〆
iに関係するものであるから、ム4射測定は製造業にお
りる品質1jfH,理に(j効なテークをBy供するも
のである3、反”!1測定においては照明条件として一
方向からの直「に尤による照明と拡散光による照明と云
った種類かあり、また受光側の条件として鏡面反射光を
除いた拡散反射光だけを測定する場合と鏡面反射、拡散
反射の両方を含んた全反射)16を測定する場合があり
、両方の組合せで邑々な、反射測定の種類ができる。積
分球を用いると照明条件としても受光条件としても拡I
W光が容易に扱えるので、反射測定には積分球式反射測
定装置が便利である。The reflection characteristics of one side of the sample eaves determine the visual texture of the sample, and are also related to the quality of the material's surface finish. In the measurement, the illumination conditions include direct illumination from one direction and illumination by diffused light. In addition, as conditions on the light receiving side, there are cases in which only diffuse reflection light excluding specular reflection light is measured, cases in which total reflection (including both specular reflection and diffuse reflection)16 is measured, and a combination of both. Various types of reflection measurements can be performed using the integrating sphere.
An integrating sphere reflectance measurement device is convenient for reflection measurement because W light can be easily handled.
まず以後の説明の便利のため反射測、定の種類を表わす
符けについて説明しておく。符1°は斜線の左にに照明
条)41−1右下に受光条件を店いた分数形式で、To
は直接照明光或は試料からの反則光の受光方向の試料m
l法線とのなす角で、00は試料面に垂直の意味、dは
照明光2反射)にを問わず拡11尤成分だけの場合、D
は鏡面反射成分と拡119反射成分とを合せた全反射光
の意である。例えば(1/CIは直接光による垂直照明
で、鏡面反射成分を除いた拡散反射光だけを測定すると
云うことであり、Cl10は拡11(尤照明で、試料面
の法線方向から反射光を受光し測定すると云うことであ
り、持に反射率−1り定τあることを明・1ミ4−るた
め、Rn/(l 、 R(+/+1′、9と1くを1.
J1i己する、。First, for the convenience of the following explanation, we will explain the symbols that represent the types of reflection measurement and measurement. The symbol 1° is in fractional format with the illumination line to the left of the diagonal line) 41-1, and the light receiving condition is shown at the bottom right.
is the sample m in the receiving direction of the direct illumination light or the reflected light from the sample.
l is the angle formed with the normal, 00 means perpendicular to the sample surface, and d is the illumination light 2 reflection).
is the total reflected light that is a combination of the specular reflection component and the expanded 119 reflection component. For example, (1/CI is vertical illumination with direct light, and only the diffuse reflected light excluding the specular reflection component is measured. Cl10 is magnified 11 (normal illumination, and the reflected light is measured from the normal direction of the sample surface. This means that the light is received and measured, and since it is clear that the reflectance -1 is constant τ, Rn/(l, R(+/+1', 9 and 1) are 1.
J1i myself.
i;L束のIJliか球式反射測定装置は光i1B、’
iと光検出器点を固定(、た条附てはu/d或は(1/
’IJ伺れか一方の、1(す定しかできなかった37本
発明は光源及び光検出kjiの位11°/+”を置換え
る必要なしに、通常の分光光度計の試4:[室に反射1
i11J定ユニツトとしてセントしたまNて測定試オ;
゛[を置く位置を変えるたけで+1/(1。i; L flux IJli or the spherical reflection measuring device is light i1B,'
i and the photodetector point are fixed (, with the condition u/d or (1/
The present invention allows the use of a conventional spectrophotometer without the need to replace the light source and light detection kji of 11°/+". reflection 1
I11J was used as a constant unit for measurement test;
+1/(1 just by changing the position of ゛[.
(l/’nの両種の反射測定ができる積か球式反則測定
ル1装置を1是供しようさするものである1゜本発明は
、もlj ′Jよ]c12に光111411を含む同−
平向内で4個の窓を設け、これら4個の窓のうちの−っ
を先入r、n :tx 、池の−っを光出射窓とし、残
りの2個の窓を試):S1窓と(7、この2つの窓のう
ち何れかに試本゛[を置き、他方に白板を置くようにし
、両者の位置の交換でo/d、 dlo 伺れの同射
測定もできるよ°うにしたbT 分球式反射41+1定
装置を1是供するものである。、以下実施例によって本
発明を説明する。(The purpose of the present invention is to provide a multi-sphere type foul measuring device capable of measuring both types of reflection of l/'n. Same-
Four windows are provided in the horizontal direction, and among these four windows, - is used as the pre-input r, n: tx, and the - of the pond is used as the light exit window, and the remaining two windows are tested): S1 By placing a sample on one of these two windows and a white board on the other, you can also perform simultaneous measurements of o/d and dlo by exchanging the positions of the two windows. The present invention will be described below with reference to examples.
第1図は本発明の一実施例を示し、同図Δはo、(1の
測定を1jう場合間Bは(1/ +1の測定を行う状j
態を示ず。1か積分球てX〜1.〜V o、 WS
l 。FIG. 1 shows an embodiment of the present invention.
Show no attitude. 1 or integrating sphere X~1. ~Vo, WS
l.
)vs 2の4個の窓をf」する。これらの窓はこの実
施例では積分球Iの中心を通る一つの平向1−で直交す
る2本の直径の両端に設けられており、〜・■1は光入
射窓、同窓と隣合うW oが光出射窓でW iと対向す
るWSl及びW oと対向するWS2の2つか試料怒で
ある。区外右方の分光器から出射(7た単色光はミラー
R1]、 M2. M:(を経て光入射窓\■1か
ら積分球Iの中心を通るように人射仕しめられる。この
入射光束の中心線即ち窓W]とW51の各中心を結ふ線
及び窓Ws 2とW oの中心を嵩11ふ線をblj分
球Iの入射>’G ”、11及び出q・1尤IIIIl
lとする1、両>’61lllllはこの実施例では(
頁交している+4 : l’I CI・[光+jiH1
+ 1.て+7は集光光学系で、光出射窓(■0と対向
する窓WS 2の像をバッフル板BF2J二に形成する
t) Dは光検出器でB F 2の後方に置かれる1、
バッフル板I3 F 2は窓WS2のH51、を含めて
(ユ「1分球Iの内面部分の(急の部分が光検出1jl
+I)に入射しないようにするものである。即ち窓〜’
l’ s 2に15′tかれた試オ―゛1或は標準白板
からの反帽尤のみを光検出1a+、7 ))(こ人ri
tさぜるためのものである6、光学系I5の後側にもバ
ッフルBF1か配置されているが、これも不・功渭乱)
′6か先途1“I! ′A:i l)に入射するのを防
くものである7、
次に十―述実すiu例装置の用法を説明する+l Rt
)/ (1ijjll定の腸aを第1図Aに不ず3.こ
の揚台試料Sをソロ人身1窓\〜1と対向する窓Wsl
に置き、他方の試11:[、’、fi< Ws 2には
白板8wを置く。白板Swは積うす01口の内面と同じ
反射特性を有し、例えはB aS OII 塗rli
阪か用いられる。このようにすると試料8には光入射窓
W1から入射した光が直接垂直に人【j■する。1他方
試料8の鏡面反射成分は試料面にlj(直に反射して光
入射窓W1から積分球外に出てしまい、拡11(反射成
分だけが積分球内で繰返、し反射されて光出射窓WOか
ら出q1シ、光検出器りに入射する3、従って成畦のo
/(1の反射測定条部か1ノいγする1、第1図BはR
d /′o測定の腸aを示ず1、この1.!、S合、試
料窓Ws1に白板S wが置かれ、光用Q、I :e’
t Wnと対向する試El窓Ws2に試料Sが置1))
hる1、この配置であると試料Sは積分球内で多重反射
された拡1戊光によって照明され、試イ;[から垂直に
反射される光が光検出器I)に入射せしめられ、(1、
/’ +1の反射測定がなされる0、第2図は本発明の
他の実施例を示し、RLf/I)及びR(1/ oの測
定ができるようにしたものである。この実施例では積分
球Iの窓〜VO2〜■81゜Ws 2の;3つは積分球
の直交するIF!1径の端に設けられているが、光入射
窓W iはWSlを通る直径に対しT′姉れた位置に設
けられ、入射光軸と出Q=)光軸は斜交し、かつ入射光
軸は積分球1の中心から外れている。このil、J成で
窓〜Vslに試料ISを置き、’l:、 Ws 2に白
板Swを置くと、試本:[は積分球入射光によってピ傾
いた直接照明を受け、試水:[5からの鏡面反射光は積
分球■の内面に入射するから、光検出器Iうには鏡+T
j7反射成分と拡ft、反射成分を含む全反射成分が入
射してx<’7’10の測定がなされる。またtVsl
に白板(Sw’)を置き、WS2に試本刊8)を置いた
場合は、試本’I (!−,)は拡散)′6で照明され
、これを垂直方向から測定することになってRd /
oの測定がなされる。) vs 2 four windows. In this embodiment, these windows are provided at both ends of two diameters that are perpendicular to each other in one plane 1- passing through the center of the integrating sphere I. o is a light exit window, and there are two sample windows: WS1 facing W i and WS2 facing W o. The monochromatic light is emitted from the spectroscope on the right side outside the area (7 monochromatic light is transmitted through the mirror R1), M2. The center line of the luminous flux, that is, the line connecting the window W] and each center of W51, and the center of the window Ws 2 and W o. IIIl
Let l be 1, both>'61llllll in this example (
Page crossing +4: l'I CI・[light+jiH1
+1. +7 is a condensing optical system, and the light exit window (■forms the image of the window WS2 facing 0 on the baffle plate BF2J2); D is a photodetector;
The baffle plate I3F2 includes the window WS2 H51 (the steepest part of the inner surface of the 1st sphere I
+I). That is, the window~'
1a+, 7)) (This person ri
6. There is also a baffle BF1 placed on the back side of the optical system I5, but this is also used for stirring)
'6 or in the future 1 "I! 'A: i l) 7. Next, let's explain how to use the iu example device +l Rt
)/ (1ijjlll fixed intestine a as shown in Figure 1A.
Place the white board 8w on the other trial 11: [, ', fi < Ws 2. The white board Sw has the same reflective characteristics as the inner surface of the stack, and for example, B aS OII paint rli
Saka is used. In this way, the light incident on the sample 8 from the light incidence window W1 directly strikes the sample 8 vertically. 1 On the other hand, the specular reflection component of sample 8 is directly reflected on the sample surface lj (directly reflected and exits the integrating sphere from the light entrance window W1, and is magnified 11 (only the reflected component is repeatedly reflected within the integrating sphere). The light q1 exits from the light exit window WO and enters the photodetector.
/(Reflection measurement strip of 1 is 1, γ is 1, Fig. 1B is R
The intestine a of d/'o measurement is not shown 1, and this 1. ! , S case, a white plate Sw is placed in the sample window Ws1, and the light Q, I: e'
The sample S is placed in the sample El window Ws2 facing tWn1))
With this arrangement, the sample S is illuminated by the multi-reflected beam of light within the integrating sphere; (1,
Figure 2 shows another embodiment of the present invention, which is capable of measuring RLf/I) and R(1/o. In this embodiment, Window of integrating sphere I~VO2~■81°Ws 2; Three of them are provided at the end of the orthogonal IF!1 diameter of the integrating sphere, but the light entrance window Wi is T' with respect to the diameter passing through WSl. They are provided at opposite positions, the incident optical axis and the output optical axis are obliquely intersecting, and the incident optical axis is off the center of the integrating sphere 1. When the sample IS is placed between the windows and Vsl in this il and J formation, and the white board Sw is placed on 'l:, Ws 2, the sample:[ receives direct illumination tilted by the integrating sphere incident light, and the sample:[ Since the specularly reflected light from 5 is incident on the inner surface of the integrating sphere ■, the photodetector I has a mirror + T
A total reflection component including the j7 reflection component, the widening ft, and the reflection component is incident, and a measurement of x<'7'10 is performed. Also tVsl
If a white board (Sw') is placed at Te Rd /
A measurement of o is made.
第3図は本発明の更に他の−・実施例を示し、1くf/
1.)及U R(115の測定がなされる。こ\でδ
は試朴[而の1グei!+iから66傾いた方向て反射
光を測定号−ると云うこと丁ある。この川音、L′1分
」求Iの入射>’O’f’lll c!:出q1光輔と
は斜交しかつ伺れも(J″[分」ボlの中心を通らない
7、光入射窓W1の中心と窓Ws lの中心を結ぶ入射
光軸と窓1〜’slの法、Fjj+とのj、fす欽
角は芦、出射光軸と窓tV s 2の法線とのなず角は
である1、窓\\’slに試料を置き、WS 2にl′
l板4−置くとR<f)/I)の)凹定か行われる1、
窓WS Iに自上述第2.第、目’xiの各実施例でf
及O−Jはi!i−通5°01■1々の角度か採用され
ている7、なお集光)1′、学系17はなくてもよいか
、その用aハンフルのカニ状や数をj内当にして読本・
1:乙(〜’82の周Nう1部の不要)で、か光倹ニー
1t xiiに人(11シないようにする?1g、・蹄
が必要である。FIG. 3 shows still another embodiment of the present invention, in which 1 f/
1. ) and U R (115 measurements are made. Here δ
It's a test! It is said that the reflected light is measured in a direction tilted 66 from +i. This river sound, L'1 minute'' incident of I>'O'f'llll c! : It is oblique to the output q1 light and can be seen. 'sl law, Fjj + j, f's angle is A, the angle between the output optical axis and the normal to the window tV s 2 is 1, place the sample in the window \\'sl, and WS 2 ni l′
l board 4 - When placed, R<f)/I)) will be determined concavely 1,
Window WS I has the above-mentioned 2nd. f in each example of the th, 'xi'
And O-J is i! i-tsu 5° 01 ■ 1 angle is adopted 7, condensing) 1', academic system 17 may be omitted, use the crab shape and number of a hand full j to guess Reader/
1: In Otsu (~'82's lap N, the first part is unnecessary), a person (11 shi? 1g, ・hoof is required).
本π1明反射6(:1定4?!〜髄は1−祁したような
構成で、光(0ミ出器と丸亀1とを入れノー!・える必
要js<、試本[と白板との七′ノド位置を入れ替える
たけでRt、+ / (1或はRo / I) 、
R′f/ 1)とR(l / (l或はR1,) /′
(1。This π1 bright reflection 6 (: 1 constant 4?! ~ The pith is 1-excellent configuration, and the light (0 mi output device and Marugame 1 are put in! No need to get js<, the sample [and the white board and Just by changing the 7' position of Rt, + / (1 or Ro / I),
R'f/1) and R(l/(l or R1,)/'
(1.
RI’) //cf)等の2通りの反射測定かt’+J
it−:てあり、このため毛(1jとかヒロ−1’
4j舌のtJIi :’cm質材(・1とか深みのある
(イ柘の(!v彩反射測定において安価かつ簡rli、
l’J: E・、・)作τ、それらの(イ本S1の:
児党的特・計を明かにすることかuJ能となる1、史に
本発明−こは2通りの測定においで一尤検出藷と光源と
は全く動かず必要が!、NいかL゛、毘【j中古(〜で
η1なる電し1ミのような発光器すJ(’ f、1′<
、分光)1部1度計を用いることかi−J能てあり、従
−)で(jL東のR(1/ +1或はR+1 /’ (
1等の測定装置か白ビ、 、il、■j+!を用い白色
光照明で1測定を行っていたいて1’tl+ #”’t
にJ二つては槌色するものかあつjこか、木尾明τは甲
色毘照明がitJ能となり、試本゛1の砿色をJ:’i
(JることかitJ能である。しかし本発明て白(!v
光ン1!j fこよる自a+j+’、i明でのt測定か
てきIよいさムうことてはj、(<、本発明て゛は11
色照明による測定ももちろんitJ能である1、
/1・ は(而の筒中IN説明
εlj ]図は本発明の一実施例の・14面図で、同A
は1ンo/(1測定の場合、同Bは1ぐcl / o測
定の揚aを示し、第2図及び第;(図は本発明の第2.
第13の実施例の11工而図である3、
■・・・積分り、’、<−、\Vi、Wo、 \■s
l、 〜’1’ S2− TJ’j分球の窓、I)・
・・光検出よ々、■、・・・集光)16学系、、+st
’1.13F2・・・ハ゛ツフル、。Two types of reflection measurements such as RI') //cf) or t'+J
it-: There is a hair (1j or Hiro-1')
4j Tongue tJIi: 'cm material (・1 or deep (Itsu's (! v Inexpensive and simple rli in color reflection measurement,
l'J: E・,・)author τ, their (I book S1:
In order to reveal the special features and plans of UJ, the present invention is the first to reveal that the detection field and light source do not move at all in two different measurements. , N or L゛, bi [j secondhand (~ with η1, a light emitter like 1mi J(' f, 1'<
, spectroscopy) It is possible to use a 1 part 1 degree meter, and 1 part 1 degree meter, and 1 part 1 degree meter, and 1 part 1 degree meter.
1st class measuring device or white vinyl, ,il,■j+! When performing one measurement under white light illumination using
In J2, there is a hammer-colored one, but Akira Kio's Kio-irobi illumination becomes itJ function, and the deep-brown color of sample ゛1 is J:'i.
(J or itJ Noh.However, the present invention is white (!v
Light 1! j f depends on self a+j+', i is t measurement method in light.
Of course, measurement using color illumination is also possible.
In the case of 1 cl/o measurement, the same B indicates the lift a of 1 cl/o measurement, and FIGS.
3, which is the 11th diagram of the 13th embodiment, ■... Integral, ', <-, \Vi, Wo, \■s
l, ~'1' S2- TJ'j sphere window, I)・
・・Light detection, ■, ・・・Light condensing) 16 systems, +st
'1.13F2...Height full.
代狸人 弁理111′糸 詰 介149−Daitanukito Patent Attorney 111' Ito Tsume 149-
Claims (1)
平面内゛ここれらのソロ輔が(j′1分球を貫く場所に
夫々計4個の窓を設け、これらの窓のうちの一つを光入
射窓、その窓と隣合う他の一つの窓を先出9寸窓とし、
残りの2つの窓のうちの一方に試料を置き、他方に1′
−1板を置くようにし、試料と白板との位置を入れ/i
、Jiえることで2通りの反射測定ができるようにした
+1°1分」7)2式反射測定装置。[(°1 minute j) In the plane including the incident optical axis and the front of the output Qt゛ Here, a total of four windows are provided at the places where these solo frames (j') penetrate the 1 minute sphere, and these One of the windows is a light entrance window, and the other window adjacent to that window is a 9-inch window,
Place the sample in one of the remaining two windows and 1' in the other.
-1 board and enter the position of the sample and the white board/i
7) 2-type reflection measurement device that allows two types of reflection measurement by adjusting the angle of +1° 1 minute.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17243282A JPS5960229A (en) | 1982-09-29 | 1982-09-29 | Integrating sphere type reflection measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17243282A JPS5960229A (en) | 1982-09-29 | 1982-09-29 | Integrating sphere type reflection measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5960229A true JPS5960229A (en) | 1984-04-06 |
JPH0261701B2 JPH0261701B2 (en) | 1990-12-20 |
Family
ID=15941862
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17243282A Granted JPS5960229A (en) | 1982-09-29 | 1982-09-29 | Integrating sphere type reflection measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5960229A (en) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6166147A (en) * | 1984-09-04 | 1986-04-04 | イ−ストマン コダック カンパニ− | Reflector having integrated void having improved efficiency |
JPS62113046A (en) * | 1985-11-12 | 1987-05-23 | Shimadzu Corp | Spectrophotometer |
JPS6454231A (en) * | 1987-08-26 | 1989-03-01 | Hitachi Ltd | Measurement of surface reflection for transparent material |
JPH05302853A (en) * | 1991-03-29 | 1993-11-16 | Shimadzu Corp | Integrating sphere apparatus |
US5408312A (en) * | 1990-09-28 | 1995-04-18 | Kim Yoon-Ok | Device for the qualitative and/or quantitative determination of the composition of a sample that is to be analyzed |
US6300621B1 (en) * | 1998-12-09 | 2001-10-09 | Intel Corporation | Color calibration device and method |
JP6492220B1 (en) * | 2018-09-26 | 2019-03-27 | 大塚電子株式会社 | Measurement system and method |
-
1982
- 1982-09-29 JP JP17243282A patent/JPS5960229A/en active Granted
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6166147A (en) * | 1984-09-04 | 1986-04-04 | イ−ストマン コダック カンパニ− | Reflector having integrated void having improved efficiency |
JPS62113046A (en) * | 1985-11-12 | 1987-05-23 | Shimadzu Corp | Spectrophotometer |
JPS6454231A (en) * | 1987-08-26 | 1989-03-01 | Hitachi Ltd | Measurement of surface reflection for transparent material |
US5408312A (en) * | 1990-09-28 | 1995-04-18 | Kim Yoon-Ok | Device for the qualitative and/or quantitative determination of the composition of a sample that is to be analyzed |
JPH05302853A (en) * | 1991-03-29 | 1993-11-16 | Shimadzu Corp | Integrating sphere apparatus |
US6300621B1 (en) * | 1998-12-09 | 2001-10-09 | Intel Corporation | Color calibration device and method |
JP6492220B1 (en) * | 2018-09-26 | 2019-03-27 | 大塚電子株式会社 | Measurement system and method |
JP2020051854A (en) * | 2018-09-26 | 2020-04-02 | 大塚電子株式会社 | Measurement system and measurement method |
Also Published As
Publication number | Publication date |
---|---|
JPH0261701B2 (en) | 1990-12-20 |
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