JPS594408U - transmission electron microscope - Google Patents
transmission electron microscopeInfo
- Publication number
- JPS594408U JPS594408U JP9919882U JP9919882U JPS594408U JP S594408 U JPS594408 U JP S594408U JP 9919882 U JP9919882 U JP 9919882U JP 9919882 U JP9919882 U JP 9919882U JP S594408 U JPS594408 U JP S594408U
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- transmission electron
- signal
- moving
- magnification
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案の一実施例の概略図、第２図は本考案の
一実施例の電気回路系のブロック図、第３図は螢光板上
の試料像を示す図である。
１：試料室、２：試料、３：ｘ軸移動機構、４：Ｙ軸移
動機構、５ａ、５ｂ：Ｘ軸調整ツマミ、６ａ、６ｂ：Ｙ
軸調整ツマミ、？、 ８．９． １０：ポテンショメー
タ、１１．１２：ＡＤ変換器、１３：演算制御回路、１
４：倍率設定回路、１５：表示装置、１６：螢光板、１
７：マーカ。 ・FIG. 1 is a schematic diagram of an embodiment of the present invention, FIG. 2 is a block diagram of an electric circuit system of an embodiment of the present invention, and FIG. 3 is a diagram showing a sample image on a fluorescent plate. 1: Sample chamber, 2: Sample, 3: X-axis movement mechanism, 4: Y-axis movement mechanism, 5a, 5b: X-axis adjustment knob, 6a, 6b: Y
Axis adjustment knob? , 8.9. 10: Potentiometer, 11.12: AD converter, 13: Arithmetic control circuit, 1
4: Magnification setting circuit, 15: Display device, 16: Fluorescent plate, 1
7: Marker.・
Claims (1)
るための移動機構と、螢光板上に投影される試料像の倍
率に対応する信号を発生するための手段と、該移動機構
からの移動量を電気信号に変換する手段と、該手段によ
る出力信号と前記倍率に対応する信号が供給される演算
手段と、該演算手段からの出力を表示する表示手段とを
備え、螢光板上に投影される試料像を移動させることに
より該像中の２点間の長さを測定することを特徴とした
透過電子顕微鏡。A moving mechanism for moving and tilting a sample to be irradiated with an electron beam from outside the lens barrel, a means for generating a signal corresponding to the magnification of a sample image projected onto a fluorescent plate, and a means for generating a signal from the moving mechanism. A means for converting the amount of movement into an electrical signal, an arithmetic means to which an output signal from the means and a signal corresponding to the magnification are supplied, and a display means for displaying the output from the arithmetic means; A transmission electron microscope characterized by measuring the length between two points in a projected sample image by moving the image.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9919882U JPS594408U (en) | 1982-06-30 | 1982-06-30 | transmission electron microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9919882U JPS594408U (en) | 1982-06-30 | 1982-06-30 | transmission electron microscope |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS594408U true JPS594408U (en) | 1984-01-12 |
Family
ID=30235188
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9919882U Pending JPS594408U (en) | 1982-06-30 | 1982-06-30 | transmission electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS594408U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08292164A (en) * | 1995-04-25 | 1996-11-05 | Hitachi Ltd | Electron microscope and three-dimensional atomic arrangement observing method |
| JP2020071209A (en) * | 2018-11-02 | 2020-05-07 | 神津精機株式会社 | Dimension measuring device and dimension measuring method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53114344A (en) * | 1977-03-16 | 1978-10-05 | Jeol Ltd | Electronic microscope |
-
1982
- 1982-06-30 JP JP9919882U patent/JPS594408U/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS53114344A (en) * | 1977-03-16 | 1978-10-05 | Jeol Ltd | Electronic microscope |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08292164A (en) * | 1995-04-25 | 1996-11-05 | Hitachi Ltd | Electron microscope and three-dimensional atomic arrangement observing method |
| JP2020071209A (en) * | 2018-11-02 | 2020-05-07 | 神津精機株式会社 | Dimension measuring device and dimension measuring method |
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