JPS5931146U - Sample equipment such as electron microscopes - Google Patents
Sample equipment such as electron microscopesInfo
- Publication number
- JPS5931146U JPS5931146U JP12500582U JP12500582U JPS5931146U JP S5931146 U JPS5931146 U JP S5931146U JP 12500582 U JP12500582 U JP 12500582U JP 12500582 U JP12500582 U JP 12500582U JP S5931146 U JPS5931146 U JP S5931146U
- Authority
- JP
- Japan
- Prior art keywords
- shaft
- electron microscopes
- specimen
- sample
- sample equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来のサイドエントリー装置を電子顕微鏡に取
付けた場合の縦断面図、第2図は横断面図を示す。第3
図は本考案の一実施例を示すサイドエントリー型試料装
置の断面図を示す。
1・・・・・・鏡筒、2・−・・・・電子レンズ上部磁
極、3・・・・・・電子レンズ下部磁極、4・・・・・
・試料、5・・・・・・ケース、6・・・・・・外側ケ
ース、7・・・・・・球形先端、8・・・・・・軸、9
・・・・・・0リング、10・・・・・・スプリング、
11・・・・・・保持筒、12・・・・・・球形接点、
13・・・・・・試料保持軸、14・・・・・・ツマミ
、15・・・・・・微動回転軸、16・・・・・・ツマ
ミ、17・・・・・・0リング、18・・・・・・保持
筒、1−9・・・・・・微動回転軸、20・・・・・・
ツマミ、21・・・・・・保持筒、22・・・・・・球
形接点、23・・・・・・スプリング。FIG. 1 shows a longitudinal cross-sectional view of a conventional side entry device attached to an electron microscope, and FIG. 2 shows a cross-sectional view. Third
The figure shows a sectional view of a side entry type sample device showing an embodiment of the present invention. 1... Lens barrel, 2... Electron lens upper magnetic pole, 3... Electron lens lower magnetic pole, 4...
・Specimen, 5...Case, 6...Outer case, 7...Spherical tip, 8...Shaft, 9
...0 ring, 10 ... spring,
11... Holding cylinder, 12... Spherical contact,
13...Sample holding shaft, 14...Knob, 15...Fine rotation axis, 16...Knob, 17...0 ring, 18...Holding cylinder, 1-9...Fine rotation shaft, 20...
Knob, 21... Holding cylinder, 22... Spherical contact, 23... Spring.
Claims (1)
筒中心部に該試材保持軸と一体で持込む電子顕微鏡等の
試料装置において、該試料軸の鏡体外に露出する部分を
取外し自由な熱遮断カバーで被ったことを特徴とする電
子顕微鏡等の試料装置。'In a sample device such as an electron microscope, which is attached to the tip of a shaft that holds specimen details and the sample and is brought into the center of the lens barrel together with the specimen holding shaft, the part of the specimen shaft that is exposed outside the lens body. A sample device, such as an electron microscope, characterized by being covered with a removable heat shielding cover.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12500582U JPS5931146U (en) | 1982-08-20 | 1982-08-20 | Sample equipment such as electron microscopes |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12500582U JPS5931146U (en) | 1982-08-20 | 1982-08-20 | Sample equipment such as electron microscopes |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5931146U true JPS5931146U (en) | 1984-02-27 |
Family
ID=30284768
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12500582U Pending JPS5931146U (en) | 1982-08-20 | 1982-08-20 | Sample equipment such as electron microscopes |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5931146U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6156934U (en) * | 1984-09-21 | 1986-04-16 | ||
JPS6267538U (en) * | 1985-10-17 | 1987-04-27 |
-
1982
- 1982-08-20 JP JP12500582U patent/JPS5931146U/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6156934U (en) * | 1984-09-21 | 1986-04-16 | ||
JPH0217536Y2 (en) * | 1984-09-21 | 1990-05-16 | ||
JPS6267538U (en) * | 1985-10-17 | 1987-04-27 |
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