JPS59225349A - 超音波顕微鏡の試料台傾斜調整方法 - Google Patents

超音波顕微鏡の試料台傾斜調整方法

Info

Publication number
JPS59225349A
JPS59225349A JP58100320A JP10032083A JPS59225349A JP S59225349 A JPS59225349 A JP S59225349A JP 58100320 A JP58100320 A JP 58100320A JP 10032083 A JP10032083 A JP 10032083A JP S59225349 A JPS59225349 A JP S59225349A
Authority
JP
Japan
Prior art keywords
sample
inclination
specimen
scanning
ultrasonic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP58100320A
Other languages
English (en)
Japanese (ja)
Other versions
JPH056144B2 (enEXAMPLES
Inventor
Junichi Ishibashi
石橋　純一
Koji Taguchi
耕司 田口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp, Olympus Optical Co Ltd filed Critical Olympus Corp
Priority to JP58100320A priority Critical patent/JPS59225349A/ja
Publication of JPS59225349A publication Critical patent/JPS59225349A/ja
Publication of JPH056144B2 publication Critical patent/JPH056144B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP58100320A 1983-06-07 1983-06-07 超音波顕微鏡の試料台傾斜調整方法 Granted JPS59225349A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58100320A JPS59225349A (ja) 1983-06-07 1983-06-07 超音波顕微鏡の試料台傾斜調整方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58100320A JPS59225349A (ja) 1983-06-07 1983-06-07 超音波顕微鏡の試料台傾斜調整方法

Publications (2)

Publication Number Publication Date
JPS59225349A true JPS59225349A (ja) 1984-12-18
JPH056144B2 JPH056144B2 (enEXAMPLES) 1993-01-25

Family

ID=14270888

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58100320A Granted JPS59225349A (ja) 1983-06-07 1983-06-07 超音波顕微鏡の試料台傾斜調整方法

Country Status (1)

Country Link
JP (1) JPS59225349A (enEXAMPLES)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259170A (ja) * 1985-05-14 1986-11-17 Olympus Optical Co Ltd 超音波顕微鏡における試料の傾き調整装置
JP2008046096A (ja) * 2006-08-21 2008-02-28 Honda Electronic Co Ltd 超音波顕微鏡システムの調整方法、及び超音波顕微鏡システム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57194060U (enEXAMPLES) * 1981-06-03 1982-12-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57194060U (enEXAMPLES) * 1981-06-03 1982-12-09

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61259170A (ja) * 1985-05-14 1986-11-17 Olympus Optical Co Ltd 超音波顕微鏡における試料の傾き調整装置
US4683751A (en) * 1985-05-14 1987-08-04 Olympus Optical Co., Ltd. Sample stand adjusting device in an ultrasonic microscope
JP2008046096A (ja) * 2006-08-21 2008-02-28 Honda Electronic Co Ltd 超音波顕微鏡システムの調整方法、及び超音波顕微鏡システム

Also Published As

Publication number Publication date
JPH056144B2 (enEXAMPLES) 1993-01-25

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