JPS5922232A - Production of aluminium substrate for magnetic disc - Google Patents

Production of aluminium substrate for magnetic disc

Info

Publication number
JPS5922232A
JPS5922232A JP57130152A JP13015282A JPS5922232A JP S5922232 A JPS5922232 A JP S5922232A JP 57130152 A JP57130152 A JP 57130152A JP 13015282 A JP13015282 A JP 13015282A JP S5922232 A JPS5922232 A JP S5922232A
Authority
JP
Japan
Prior art keywords
purity
substrate
blank plate
blank
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57130152A
Other languages
Japanese (ja)
Inventor
Shoichi Yoshinaga
吉永 彰一
Makoto Ando
誠 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Sumitomo Light Metal Industries Ltd
Original Assignee
Sumitomo Light Metal Industries Ltd
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Light Metal Industries Ltd, Sumitomo Metal Industries Ltd filed Critical Sumitomo Light Metal Industries Ltd
Priority to JP57130152A priority Critical patent/JPS5922232A/en
Publication of JPS5922232A publication Critical patent/JPS5922232A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/84Processes or apparatus specially adapted for manufacturing record carriers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/62Record carriers characterised by the selection of the material
    • G11B5/73Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
    • G11B5/739Magnetic recording media substrates
    • G11B5/73911Inorganic substrates
    • G11B5/73917Metallic substrates, i.e. elemental metal or metal alloy substrates
    • G11B5/73919Aluminium or titanium elemental or alloy substrates

Landscapes

  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Magnetic Record Carriers (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To produce a substrate of which smoothness and cleanliness are improved on the surface by adhering high-purity >=99.0% Al with the prescribed thickness to the surface of a blank plate prior to mechanical or chemical surface smoothing processing to the blank plate or after the surface smoothing processing. CONSTITUTION:After planning the Al alloy blank plate by a required method and executing thermal correction for the purposes of the removal of distortion, etc., mechanical or chemical surface smoothing processing is applied to adjust the surface and to finish the objective magnetic disc substrate. Prior to or after the surface smoothing processing, high purity >=99.0% Al is adhered to the surface of the blank plate to form the high-purity Al layer with the prescribed thickness on the surface of the blank plate. The adhesion of the high-purity Al to the blank plate surface is generally performed by various methods such as physical and chemical vapor deposition methods, but the physical vapor-deposition method such as vacuum vapor deposition, ion plating method and sputtering method is properly adopted.

Description

【発明の詳細な説明】 本発明は磁気ティスフ用アルミニウム基板(サブストレ
ート)の製造法に係り、特に基板材質中に存在する非金
属介在物や金属間化合物による表面欠陥の発生を阻止し
、表面の平滑性や清浄度を向上せしめた、高密度磁気デ
ィスク用として有用なアルミニウム基板を経済的に有利
に得る方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method of manufacturing an aluminum substrate (substrate) for magnetic tissue, and in particular, it prevents the occurrence of surface defects due to non-metallic inclusions and intermetallic compounds present in the substrate material, and The present invention relates to an economically advantageous method for obtaining an aluminum substrate useful for high-density magnetic disks, which has improved smoothness and cleanliness.

従来より、電子用算機における記録媒体の一つとして磁
気ディスクが汎用されているが、この磁気ディスクはア
ルミニウム(A6)基合金からなる所定厚さの基板の表
面を磁性体塗膜にて被覆した構成からなるものであって
、この磁性体塗膜を磁化させることにより信号を記憶す
るようになっている。
Traditionally, magnetic disks have been widely used as one of the recording media in electronic calculators, and these magnetic disks consist of a substrate of a predetermined thickness made of an aluminum (A6)-based alloy whose surface is coated with a magnetic coating film. The device stores signals by magnetizing this magnetic coating.

ところで、このような磁気ディス、り用として用いられ
るA召基板は、通常圧延して得られるA召基合金板(素
板)の表面を機械加工して所定の厚さにした後、表面を
研磨したものであるが、一般に次の如き特性を具備すべ
きものとされている。
By the way, the A-substrate used for such magnetic disks is produced by machining the surface of an A-substrate alloy plate (base plate) obtained by rolling to a predetermined thickness, and then machining the surface to a predetermined thickness. Although it is a polished product, it is generally considered to have the following characteristics.

(a)  磁化操作において、磁気ヘッドと磁気ディス
ク基板との間隙を一定に保ち、記憶特性を安定化さぜる
ため、研磨後の表面精度(粗さやうねり等)が良好なこ
と、 (b)  磁性体塗膜の欠陥原因となる凸起や穴状の凹
みが基板表面に”存在しないこと、 (0)  使用時の高速回転に対して充分な機械的強度
を有すること、 ((1)耐食様、且つある程度の耐熱性を有すること、 ((+)  非磁性、軽量、且つ安価であること。
(a) In order to keep the gap between the magnetic head and the magnetic disk substrate constant during magnetization operation and stabilize the storage characteristics, the surface accuracy after polishing (roughness, waviness, etc.) must be good; (b) There should be no protrusions or hole-like depressions on the substrate surface that could cause defects in the magnetic coating; (0) It should have sufficient mechanical strength against high-speed rotation during use; (1) Corrosion resistance. ((+) It must be non-magnetic, lightweight, and inexpensive.

一方、磁気ディスク用基板として現在最も多用されてい
るのは、AA規格5086のAg基合金からなる板であ
るが、近年における磁気ディスクの大容量化、高密度化
の要請には充分に応えられなくなってきている。即ち、
かかる大容量化、高密度化のためには、1ビット当りの
磁化領域をより一層微小化せしめ、また磁気ヘッドと磁
気ディスクとの間の間隙の狭小化が、望まれているので
あるが、前述したA、A3086基板ではその表面精度
などが充分に満たされないからである。
On the other hand, the most commonly used substrate for magnetic disks at present is a plate made of Ag-based alloy of AA standard 5086, but it has not been able to fully meet the recent demands for larger capacity and higher density magnetic disks. It's disappearing. That is,
In order to increase the capacity and density, it is desired to further miniaturize the magnetized area per bit and narrow the gap between the magnetic head and the magnetic disk. This is because the above-mentioned A and A3086 substrates do not have sufficient surface accuracy.

このため、かかるAe基板の表面状態の改良を図るべく
種々なる検討が加えられてきており、例えば特公昭56
−39699号公報、特開昭56−10’5846号公
報などには、前記(b)の欠陥原因となる非金属介在物
や金属間化合物(例えばA5−Fc−MnJ%やMg−
8i系の晶出物など)を、合金成分の調整などによって
、可及的に少なくし且つ微細化せしめて、均一分散させ
、以て凸起や穴状の凹みを低減させるようにした手法が
明らかにされているが、これらの手法を採用したとして
も、非金属介在物や金属間化合物の微細化には限度があ
るのであり、またそれらを基金表面から完全に排除する
ことも困難であって、結果的には該非金属介在物や金属
間化合物を1〜10μ+n程度までの大きさとするのが
限界であったのである。しかも、その製造工程において
は、介在物混入阻止の観点から、高純度のAI地金の使
用が要請され、また厳格な合金成分調整も要求される他
、溶湯を鋳込むに際しては、該溶湯を高密度なフィルタ
ーにて濾過しなければならないところから、かかるフィ
ルターの効果を確認するための検査が必要となる等、各
種の条件や操作が要求され、これが最終的な基板の製造
コストの」二昇を招いていたのである。
For this reason, various studies have been made to improve the surface condition of such Ae substrates.
-39699, JP-A-56-10'5846, etc., describe nonmetallic inclusions and intermetallic compounds (for example, A5-Fc-MnJ% and Mg-
8i-based crystallized substances, etc.) by adjusting alloy components, etc., to reduce them as much as possible, make them fine, and disperse them uniformly, thereby reducing protrusions and hole-like depressions. However, even if these methods are adopted, there are limits to the miniaturization of nonmetallic inclusions and intermetallic compounds, and it is also difficult to completely eliminate them from the surface of the fund. As a result, the limit was to limit the size of the nonmetallic inclusions and intermetallic compounds to about 1 to 10 μ+n. Moreover, in the manufacturing process, the use of high-purity AI metal is required from the perspective of preventing inclusions, and strict alloy composition adjustment is also required. Various conditions and operations are required, such as the need for filtration through a high-density filter and the need for testing to confirm the effectiveness of such filters, which increases the final manufacturing cost of the substrate. It was inviting him to ascend.

而して、先述した如く、磁気ディスクの大容量化、高密
度化の要請を考えると、究極的には非金属介在物や金属
間化合物を完全に無くし、それらの基板表面への影響を
完全に排除する必要に迫られているのである。
As mentioned above, considering the demand for larger capacity and higher density of magnetic disks, the ultimate goal is to completely eliminate nonmetallic inclusions and intermetallic compounds and completely eliminate their influence on the substrate surface. There is an urgent need to eliminate them.

ここにおいて、本発明は、かかる事情を背景にして為さ
れたものであって、そのl」的とするところは、表面特
性に優れた磁気ディスク用Ad基板を経済的に得る方法
を提供することにある。
The present invention has been made against this background, and its objective is to provide a method for economically obtaining an Ad substrate for magnetic disks with excellent surface properties. It is in.

また、本発明の他の目的は、磁気ディスク用基板に仕上
げる前の素板として、特別の非金属介在物・金属間化合
物の除去対策の講じられていない、各種用途に用いられ
ている通常のAd基基合金板金そのまま用いて、表面の
平滑性や清浄度を向上させた基板を製造することの出来
る方法を提供することにある。
Another object of the present invention is to use ordinary substrates used for various purposes as base plates before being finished into magnetic disk substrates, where no special measures are taken to remove non-metallic inclusions and intermetallic compounds. The object of the present invention is to provide a method for manufacturing a substrate with improved surface smoothness and cleanliness by using an Ad-based alloy sheet metal as it is.

本発明の更なる他の目的は、前記磁気ディスク用として
要請される(a)〜(e)の特性を悉く満足し、且つ非
金属介在物や金属間化合物による表面門凸発生の問題を
実質的に解消した磁気ディスク用AI基板の製造法を提
供することにある。
Still another object of the present invention is to satisfy all of the characteristics (a) to (e) required for the magnetic disk, and to substantially eliminate the problem of surface protrusion caused by nonmetallic inclusions and intermetallic compounds. An object of the present invention is to provide a method for manufacturing an AI substrate for magnetic disks that solves the problem.

そして、これらの目的を達成するため、本発明は、所定
厚さのAdd合金素板を用いて、表面が平滑な磁気ディ
スク用Aβ基板を製造するにあたり、該素板に対する機
械的若しくは化学的な表面平滑化処理に先立って或はか
かる表面平滑化処理の後に、該素板の表面に99.0%
以上の高純度のAIを所定厚さて付着せしめたことを特
徴とするものである。
In order to achieve these objects, the present invention uses an Add alloy blank plate of a predetermined thickness to produce an Aβ substrate for a magnetic disk with a smooth surface, and the present invention provides mechanical or chemical treatment to the blank plate. Prior to or after the surface smoothing treatment, 99.0% of the surface of the base plate is coated.
It is characterized in that the above-mentioned high-purity AI is deposited to a predetermined thickness.

かくの如き本発明に従えば、A4基合金素板上に、新た
に、非金属介在物や金属間化合物を含まない高純度なA
d層が形成せしめられ、該素板を覆うこととなるため、
該素板の品質、換言すれば非金属介在物、金属間化合物
の存在がそれ程重要な問題ではなくなり、たとえそれら
非金属介在物、金属間化合物に基因する表面凹凸が該素
板に存在していても、そのような表面凹凸は付着せしめ
られる高純度AIにて効果的に埋められるようになり、
また更に必要に応じて表面平滑化処理を施すことによっ
て、極めて平滑な表面が容易に得られるのであって、そ
れ故かかる素板表面の凹凸による影響を殆んど無視し得
ることとなったのである。
According to the present invention, high-purity A4 containing no non-metallic inclusions or intermetallic compounds is newly added to the A4 base alloy base plate.
Since the d layer is formed and covers the base plate,
The quality of the raw sheet, in other words, the presence of non-metallic inclusions and intermetallic compounds is no longer an important issue, and even if surface irregularities caused by these non-metallic inclusions and intermetallic compounds are present on the raw sheet. However, such surface irregularities can now be effectively filled with the high-purity AI that is attached.
Furthermore, by applying surface smoothing treatment as necessary, an extremely smooth surface can be easily obtained, and therefore the influence of unevenness on the surface of the raw plate can be almost ignored. be.

そして、その結果、本発明にあっては、磁気ディスク用
基板に仕上げる前の素板として、従来の如き特別の非金
属介在物・金属間化合物の除去対策が講じられていない
、各種用途に用いられている通常のAg基基合金月利そ
のまま使用し得ることとなり、以て素板のコストを著し
く低減せしめ得ることとなったのである。けだし、素板
の製造に際して、従来のような高純度のAl地金の使用
、厳格な合金成分管理、鋳込時における高密度フィルタ
の使用、更にはフィルタ効果の確認検査なとが悉く不要
となるからであり、また特別の材質(合金組成)のもの
を使用する必要もなくなったからである。
As a result, the present invention can be used as a base plate before being finished into a magnetic disk substrate in various applications where special measures to remove non-metallic inclusions and intermetallic compounds have not been taken as in the past. It became possible to use the conventional Ag-based alloy as it is, thereby significantly reducing the cost of the blank plate. When producing blanks and blank plates, the conventional use of high-purity Al ingots, strict control of alloy composition, use of high-density filters during casting, and inspections to confirm filter effectiveness are no longer necessary. This is because there is no need to use a special material (alloy composition).

更に、本発明手法によれば、暴利となるA5素板の表面
粗度に合わせて、均一な高純度A4層を必要最小限の厚
さで付着せしめ得るところから、信頼性のある磁気ディ
スク用基板が製造出来ることとなる他、付着せしめられ
る高純度A、 1層は非金属介在物や金属間化合物を含
んでいないので、表面の平滑性や清浄度を著しく向上せ
しめ得て、ディスク製造工程における塗装前の表面凹凸
の発生を効果的に防止し得るのである。
Furthermore, according to the method of the present invention, a uniform high-purity A4 layer can be deposited with the minimum necessary thickness in accordance with the surface roughness of the A5 blank sheet, which is profitable, so it can be used for reliable magnetic disks. In addition to being able to manufacture substrates, the high-purity A layer that is deposited does not contain nonmetallic inclusions or intermetallic compounds, so the smoothness and cleanliness of the surface can be significantly improved, and the disk manufacturing process can be improved. This can effectively prevent the occurrence of surface irregularities before painting.

ところで、かくの如き本発明において用いられるA5基
合金素板とは、一般に、従来から磁気ディスク用基板材
質として公知のA4基合金からなる板材を意図するもの
であるが、本発明はまた非金属介在物や金属間化合物の
故にその使用が不適とされていた他のAd基合金からな
る板材をも使用可能と為すものである。特に、本発明は
、それらAl基合金から鋳造、圧延によって所定厚さの
素板を製造するに際して、高純度な地金の使用、厳格な
合金成分管理、鋳込時における高密度フィルタの使用な
どを行なわずに得られた素板であっても使用可能である
、大きな利点を有するものである。
By the way, the A5-based alloy material plate used in the present invention is generally intended to be a plate material made of an A4-based alloy, which has been conventionally known as a substrate material for magnetic disks, but the present invention also uses non-metallic materials. This makes it possible to use plate materials made of other Ad-based alloys, which were considered unsuitable due to inclusions and intermetallic compounds. In particular, the present invention uses high-purity base metal, strict alloy composition control, use of high-density filters during casting, etc. when manufacturing blank plates of a predetermined thickness from these Al-based alloys by casting and rolling. This has the great advantage that even blank plates obtained without performing this process can be used.

そして、このようなA4基合金素板には、所望の旋削が
施され、更に歪取り、、等の目的をもって熱矯正が施さ
れた後、機械的若しくは化学的な表面平滑化処理が施さ
れて、表面が調整され、目的とする磁気ディスク用基板
に仕上げられることとなるが、本発明fあっては、かか
る表面平滑化処理に先立って或はかかる表面平滑化処理
の後に、該素板の表面に99.0%以上の高純度A4を
付着せしめ、以て該素板表面上に所定厚さの高純度Ag
層を形成するものである。
Then, such an A4 base alloy blank plate is subjected to desired turning, heat straightening for the purpose of removing distortion, etc., and then subjected to mechanical or chemical surface smoothing treatment. Then, the surface is adjusted and the target substrate for magnetic disk is finished. However, in the present invention, the raw substrate is processed before or after such surface smoothing treatment. High purity A4 of 99.0% or more is adhered to the surface of the base plate, and a predetermined thickness of high purity Ag is deposited on the surface of the base plate.
It forms a layer.

かかる高純度A5の素板表面に対するイー、1着は、一
般に物理的蒸着法、化学的蒸着法などの各種の手法を用
いて実施され得るものであるが、本発明では、真空蒸着
法、イオンブレーティング法、スパッタリング法等の物
理的蒸着法が好適に採用され、なかでも素板温度の上昇
による寸法変化の問題がなく、また自浄効果も発揮する
イオンブレーティング法の採用が最も推奨されるのであ
る。また、この(=J着せしめられるA4は、純度が9
90%以上、好ましくは99.9%以上で、場合により
99.9999%或はそれ以上にも達する高純度のもの
であって、これによって非金属介在物や金属間化合物を
含まない所定厚さの均一なA4層が素板表面上に形成さ
れることとなる。
E-coating on the surface of such a high-purity A5 base plate can generally be performed using various methods such as physical vapor deposition and chemical vapor deposition, but in the present invention, deposition using vacuum vapor deposition, ion deposition, etc. Physical vapor deposition methods such as the brating method and sputtering method are preferably adopted, and among them, the ion blating method is the most recommended because it does not have the problem of dimensional changes due to increases in the temperature of the base plate and also has a self-cleaning effect. It is. In addition, the purity of this A4 (=J) is 9.
A product of high purity of 90% or more, preferably 99.9% or more, and in some cases reaching 99.9999% or more, so that it does not contain non-metallic inclusions or intermetallic compounds. A uniform A4 layer is formed on the surface of the blank.

なお、A4素板表面上に形成される高純度Ag層の厚さ
は、該A4素板の表面粗度に応じて適宜に決定されるも
のであるが、その厚さを余りにも厚くすると、基板のコ
ストアップを惹起するところから、その上限は約50μ
m程度に止めるのが望ましい。また、その下限は、表面
粗度とも関連するが、一般に約1μrn、好ましくは約
5μm程度である。
The thickness of the high-purity Ag layer formed on the surface of the A4 blank plate is determined appropriately depending on the surface roughness of the A4 blank plate, but if the thickness is too thick, The upper limit is approximately 50μ since it increases the cost of the board.
It is desirable to stop it at about m. The lower limit is also related to the surface roughness, but is generally about 1 μrn, preferably about 5 μm.

また、本発明に従って、かかる高純度11層の形成の前
または後に実施される表面平滑化処理は、従来からA5
基板の製造に際して採用されているものと同様なもので
あって、磁気ディスク用基板に要請される平滑性を付与
するものであり、一般に機械的若しくは化学的な手法に
て行なわれ、例えば切削、研削、研磨、更には表面鏡面
仕」−げ、ポリッシング操作などが含まれる。より具体
的には、砥石によって所定厚さまで研削せしめ、更にポ
リッシングする方法や、ダイヤモンドバイ14−用いた
超精密旋盤による表面鏡面仕上げ手法などが、好適に採
用されることとなる。
Further, according to the present invention, the surface smoothing treatment performed before or after the formation of the high purity 11 layer has been conventionally performed on A5
It is similar to that used in the manufacture of substrates, and provides the smoothness required for magnetic disk substrates, and is generally carried out by mechanical or chemical methods, such as cutting, This includes grinding, polishing, surface mirror finishing, and polishing operations. More specifically, a method of grinding to a predetermined thickness with a grindstone and further polishing, a surface mirror finishing method using an ultra-precision lathe using a diamond viper 14, etc. are suitably employed.

ところで、かくの如き本発明に従う高純度11層の形成
工程と表面平滑化処理工程とは、相互にその実施順序を
入れ換えることが可能である。即ち、素板に所定の高純
度A/層を形成せしめた後、該高純度Ae層表面に対し
て表面平滑化処理を施すプロセス(A)と、素板に対し
て表面平滑化処理を施し、素板表面を充分に平滑化なら
しめた後、高純度A5層を形成せしめるプロセス(B)
を採用することが可能であり、これらプロセスは素板の
表面状態や(=J着せしめられるAIの純度などに応じ
て選択されることとなるが、一般に素板の表面粗度が小
さく或はAd線純度低い場合には、前者のAプロセスが
、また素板の表面粗度が大きく或はAIの純度−が高い
場合には、後者のBプロセスが好適に採用される。更に
、かかるBプロセスの後に、必要に応じて素板上に形成
された高純度A4層の表面に対して前記と同様の表面平
滑化処理を施すようにすることも出来、これによって製
造される基板の表面特性のより一層の向上を図ることが
可能である。
By the way, the order of execution of the high-purity 11 layer formation step and the surface smoothing treatment step according to the present invention can be interchanged. That is, a process (A) of forming a predetermined high-purity A/layer on a base plate and then subjecting the surface of the high-purity Ae layer to a surface smoothing process (A); , Process of forming a high-purity A5 layer after sufficiently smoothing the surface of the base plate (B)
It is possible to adopt these processes, and these processes are selected depending on the surface condition of the blank plate and the purity of the AI to be coated (=J), but in general, when the surface roughness of the blank plate is small or When the purity of the Ad line is low, the former process A is preferably adopted, and when the surface roughness of the blank is large or the purity of AI is high, the latter process B is preferably adopted. After the process, if necessary, the surface of the high-purity A4 layer formed on the base plate can be subjected to the same surface smoothing treatment as described above, thereby improving the surface characteristics of the manufactured substrate. It is possible to further improve this.

かくして得られたA4基板は、一般に、平均表面粗さく
 Ra)が0.02μm程度以下、最大表面粗さく R
+nax 、μ)が0.2μ!n程度以下の表面精度を
具備するものであって、特にその表面が非金属介在物や
金属間化合物の実質的に存在しない高純度A/層にて形
成されているところから、該Ag基板からの磁気ディス
クの製造に際して採用される磁性体コーティング工程に
先立つ前処理(化成皮膜形成)工程を経ても、その表面
特性が劣化せしめられるようなことは殆んどないのであ
る。
The A4 substrate thus obtained generally has an average surface roughness (Ra) of approximately 0.02 μm or less, and a maximum surface roughness (R) of approximately 0.02 μm or less.
+nax,μ) is 0.2μ! It has a surface precision of about n or less, and in particular, because its surface is formed of a high-purity A/layer that is substantially free of nonmetallic inclusions and intermetallic compounds, it is possible to Even through the pretreatment (chemical conversion film formation) process that precedes the magnetic coating process employed in the manufacture of magnetic disks, there is almost no deterioration of the surface properties.

以下に実施例を示し、本発明を更に具体的に明らかにす
るが、本発明はそれらの実施例の記載によって何等の制
約をも受けるものでない。なお、実施例中の百分率は重
量基準にて示されている。
Examples are shown below to clarify the present invention more specifically, but the present invention is not limited in any way by the description of these Examples. Note that the percentages in the examples are shown on a weight basis.

実施例 I AA5086規格゛の合金組成、即ちMg:4.2%、
Fe:0.18%、Si:0.06%、Mn:037%
、Cr:0.08%、Cu:0.04%、Ti:0.0
8%、Zn:0.01%以下、A4:残部からなるA4
合金溶湯を、厳密な濾過操作や合金成分調整を行なうこ
となく、通常の手法に従って半連続鋳造し、板厚ニー5
00mmのスラブを得た。
Example I Alloy composition according to AA5086 standard, namely Mg: 4.2%,
Fe: 0.18%, Si: 0.06%, Mn: 037%
, Cr: 0.08%, Cu: 0.04%, Ti: 0.0
A4 consisting of 8%, Zn: 0.01% or less, A4: remainder
The molten alloy was semi-continuously cast according to the usual method without strict filtration or alloy composition adjustment, and the plate thickness was reduced to knee 5.
A slab of 00 mm was obtained.

次いで、このスラブの両面を面側した後、常法に従って
熱間圧延、冷間圧延を施して、板厚:2.2印の圧延板
を得た。更に、この圧延板の両面を旋削し、続いて32
0°Cの温度下に5時間保持することによって熱矯正を
施した。
Next, both sides of this slab were side-faced, and then hot rolling and cold rolling were performed according to a conventional method to obtain a rolled plate having a thickness of 2.2 marks. Furthermore, both sides of this rolled plate were turned, and then 32
Heat straightening was performed by holding at a temperature of 0°C for 5 hours.

かくして得られた板厚:1.9mmのA4合金板(素板
)に対して、次の条件下にイオンブレーティング法にて
純度が9999%のAIを利着せしめ、その両面に約I
 Q p mの厚さの高純度A4層をそれぞれ形成した
。即ち、イオンブレーティング法としては、真空度:1
0’〜I Q  ’  Torrに維持され、且つAr
雰囲気下に保持されたチャンバー内に前記11合金板を
入れて、99.99%のアルミニウム利ヲエレクトロン
ビームにより蒸発すせ、そして高周波励起法を用いて、
該A、 1合金板に蒸着させる手法を採用した。
The thus obtained A4 alloy plate (base plate) with a thickness of 1.9 mm was coated with AI with a purity of 9999% by the ion blating method under the following conditions, and approximately I
High purity A4 layers with a thickness of Q p m were each formed. That is, for the ion blating method, the degree of vacuum: 1
0' to IQ' Torr, and Ar
The 11 alloy plate was placed in a chamber maintained in an atmosphere, and 99.99% aluminum was evaporated by an electron beam, and then using a high frequency excitation method,
The method of vapor deposition on the A.1 alloy plate was adopted.

次いで、かかる高純度A4の付着せしめられたAg合金
板を単結晶ダイヤモンドバイトを使用して、スピンドル
回転数: 2000 rl)II+程度、切込み:10
μ■】以下の条件下に鏡面仕上げ加工して表面平滑化処
理を施し、目的とする本発明に従うサブストレート(基
板)を得り。
Next, the Ag alloy plate to which the high-purity A4 was attached was cut using a single-crystal diamond cutting tool, spindle rotation speed: 2000 rl) approximately II+, cutting depth: 10
[μ■] A substrate according to the present invention was obtained by mirror finishing and surface smoothing under the following conditions.

一方、比較のために、前記合金組成のAd溶湯に従来の
如き厳密な濾過操作を施した後、前記と同様にして得ら
れたA4合金板(素板)に対して、前記の如き高純度A
dの付着を行うことなく、直ちにダイヤモンドバイトに
よる鏡面仕上げ加工を施して、表面平滑化処理を行ない
、比較サブストレートを得た。
On the other hand, for comparison, after subjecting Ad molten metal having the above alloy composition to a strict filtration operation as in the conventional method, an A4 alloy plate (base plate) obtained in the same manner as above was subjected to high purity A
A comparative substrate was obtained by immediately performing mirror finishing using a diamond tool to smooth the surface without applying d.

かくして得られた2種類のサブストレートについて、鏡
面仕上げ加工後の粗さ: Ita及びRmaxを触針式
粗さ計(東京精密株式会社:8URF−20型)にて測
定したところ、本発明手法に従って得られたサブストレ
ートは、Raが0.008μIII。
For the two types of substrates obtained in this way, the roughness after mirror finishing: Ita and Rmax were measured using a stylus roughness meter (Tokyo Seimitsu Co., Ltd.: 8URF-20 model) according to the method of the present invention. The obtained substrate had an Ra of 0.008μIII.

Rmaxが0.08μInであって、比較サブストレー
トの几a = Q、Q I Q Itrn、 Rmax
= Q、 l Q Itmに対して、その表面平滑性が
優れていることが認められた。
Rmax is 0.08μIn, and the comparison substrate's temperature a = Q, Q I Q Itrn, Rmax
= Q, l Q It was found that the surface smoothness was superior to that of Itm.

また、かかるサブストレートから磁気ディスクを製造す
るために、それらサブストレートに対して磁性体コーテ
ィングが施される前の前処理洗浄として、通常の化成処
理をそれぞれ施し、化成皮膜をその表面に形成せしめた
ところ、本発明に従うザブストレートにあっては、その
表面の粗さは、1La=Q、Q l 5 μmXRma
x=Q、l 5 lzmを示し、基板材質中に存在する
非金属介在物、金属間化合物による表面欠陥の発生が効
果的に抑制されたものとなり、また表面の平滑性や清浄
度も著しく向上せしめられたものであった。これに対し
て、比較サブストレートを化成処理したものの表面粗さ
は、几a ”’0.02077 Ill、Rrnax 
= 0.20 μm テアって、基板材質中に存在する
一非金属介在物や金属間化合物の影響によって、表面欠
陥が惹起されていることが認められ、また表面の平滑性
や清浄度も充分でないことが認められた。
In addition, in order to manufacture magnetic disks from such substrates, ordinary chemical conversion treatment is applied to the substrates as a pre-cleaning process before magnetic coating is applied to form a chemical conversion film on the surface. However, in the substrate according to the present invention, the surface roughness is 1La=Q, Q l 5 μmXRma
x = Q, l 5 lzm, and the occurrence of surface defects due to non-metallic inclusions and intermetallic compounds present in the substrate material is effectively suppressed, and the smoothness and cleanliness of the surface are also significantly improved. It was something I was forced to do. On the other hand, the surface roughness of the comparative substrate subjected to chemical conversion treatment is 几a"'0.02077 Ill, Rrnax
= 0.20 μm Tear is recognized as a surface defect caused by the influence of nonmetallic inclusions and intermetallic compounds present in the substrate material, and the surface smoothness and cleanliness are sufficient. It was acknowledged that this was not the case.

このように、本実施例において得られた本発明に従うザ
ブストレートは、従来からのサブストレー1に対して、
表面欠陥の発生の問題や表面の平滑性、清浄度の点にお
いて優れているばかりでなく、また他の余分な或いは面
倒な操作、例えば合金成分の調製、溶湯の濾過の強化、
またその濾過効果を確認するための検査等が全く不要と
なる等、大きな利点を有しているのである。
As described above, the substrate according to the present invention obtained in this example has the following characteristics compared to the conventional substrate 1.
Not only is it superior in terms of surface defects, surface smoothness, and cleanliness, but it also eliminates other unnecessary or troublesome operations, such as preparing alloy components, strengthening molten metal filtration,
It also has great advantages, such as completely eliminating the need for tests to confirm its filtration effectiveness.

実施例 2 実施例1と同様にして得られた板厚が約1.9mmの1
1合金板に対して、実施例1と同様にしてビオ6ンプレ
ーテイングを行なって、その両面に純度が99.99%
のAIからなる約IOμmの厚さの高純度A5層をそれ
ぞれ形成した。
Example 2 1 with a plate thickness of about 1.9 mm obtained in the same manner as in Example 1
1 alloy plate was subjected to bio6 plating in the same manner as in Example 1, and the purity was 99.99% on both sides.
A high-purity A5 layer of about IO μm thick made of AI was formed respectively.

次いで、かくして得られた高純度Afiの付着せしめら
れたAd合金板(素板)に対して、砥石による研削、遊
離砥粒によるポリッシングを含む表面研磨を施し、その
表面を平滑化処理して本発明に従うサブストレートAを
得た。
Next, the surface of the Ad alloy plate (base plate) to which the thus obtained high-purity Afi was adhered was subjected to surface polishing including grinding with a whetstone and polishing with free abrasive grains, and the surface was smoothed to form a book. Substrate A according to the invention was obtained.

また、前記A4合金板(素板)に対して、上記順序とは
異なり、先ず前記表面研磨処理を施して合金板の表面を
平滑化せしめた後、前記高純度A4を付着せしめる手法
を採用して、他の一つの本発明に従うサブストレー)B
t[た。
In addition, different from the above order, the A4 alloy plate (base plate) is first subjected to the surface polishing treatment to smooth the surface of the alloy plate, and then the high purity A4 is attached. Another sub-stray according to the present invention)B
t[ta.

なお、比較のために、前記へ4合金板の厳密な濾過処理
を施して得られたものに対して、前述の如き高純度A4
の付着操作を施すことなく、そのまま表面研磨を施して
サブストレートCを得た。
For comparison, the high purity A4 alloy plate as described above was compared with the one obtained by subjecting the A4 alloy plate to strict filtration treatment.
Substrate C was obtained by surface polishing as it was without performing any adhesion operation.

これら得られた3種類のサブストレートについて、それ
ぞれ触針式粗さ計を用いて表面粗さくRa、  Rma
x )を測定すると共に、それらの化成処理後の表面わ
■さについても、同様に粗さ測定を行なった。
For these three types of substrates obtained, the surface roughness Ra and Rma were measured using a stylus roughness meter.
x), and the surface roughness after the chemical conversion treatment was also measured in the same way.

その結果、サブストレートA、Hについては、何れもR
a==Q、Q 187z+n、Rmax = Q、 l
 8μmの表面平滑性を示したのに対し、高純度A4が
付着せしめられなかったサブストレートCについては、
Ra、 = 0.020 p m、Rmax=Q20/
1mとなり、材質中の非金属介在物や金属間化合物の影
響が表面に現われていることが少なからず認められた。
As a result, for both substrates A and H, R
a==Q, Q 187z+n, Rmax = Q, l
Regarding substrate C, which showed a surface smoothness of 8 μm, high purity A4 was not attached.
Ra, = 0.020 p m, Rmax = Q20/
1 m, and it was observed that the surface was affected by nonmetallic inclusions and intermetallic compounds in the material.

また、化成処理後においては、本発明に従うサブストレ
ートA、Bが、それぞれRa = 0.03 ti m
Further, after the chemical conversion treatment, the substrates A and B according to the present invention each have Ra = 0.03 tim
.

■+na、x = 0.3μ田程度となり、これに対し
て比較のサブストレートCでは、Ra= 0.041t
 m、ILmax = Q、 4 p m程度となり、
化成処理によって後者のサブストレートCが前者よりも
化成処理の影響を受けてその表面が粗面化されているこ
とが認められた。
■+na, x = about 0.3μ, whereas for comparison substrate C, Ra = 0.041t
m, ILmax = Q, about 4 p m,
It was observed that the latter Substrate C was more affected by the chemical conversion treatment than the former, and its surface was roughened.

なお、前記イオンブレーティング手法による高純度A4
層の形成に代えて、スパッタリング法やその他の蒸着法
によっても、目的とするAI素板上に良好な高純度A1
層が形成され、そして前記と同様な優れた効果が達成さ
れることが認められた。
In addition, high purity A4 obtained by the ion blating method
Instead of forming a layer, sputtering or other vapor deposition methods can also be used to deposit high-purity A1 onto the target AI base plate.
It was observed that a layer was formed and the same excellent effects as described above were achieved.

このように、本発明に従えば、Ag基合金素板上に新た
に非金属介在物や金属間化合物を含まない高純度なA4
層が形成せしめられ、該素板を覆うこととなるため、該
素板の材質が全く問題とはならなくなり、そしてその表
面平滑性が著しく向上せしめられ得ることとなったので
ある。そして、その結果、本発明に従うサブストレート
を用いることによって、高密度磁気ディスクが有利に製
造され得ることとなったのである。
As described above, according to the present invention, high-purity A4 containing no non-metallic inclusions or intermetallic compounds is newly formed on the Ag-based alloy blank.
Since a layer is formed to cover the base plate, the material of the base plate does not matter at all, and its surface smoothness can be significantly improved. As a result, by using the substrate according to the present invention, a high-density magnetic disk can be advantageously manufactured.

出願人  住友軽金属工業株式会社Applicant: Sumitomo Light Metal Industries, Ltd.

Claims (6)

【特許請求の範囲】[Claims] (1)  所定厚さのアルミニウム基合金素板を用UA
で、表面が平滑な磁気ディスク用アルミニウム基板を製
造するにあたり、該素板に対する機械的若しくは化学的
な表面平滑化処理に先立って或はかかる表面平滑化処理
の後に、該素板の表面に99.0%以上の高純度アルミ
ニウムを所定厚さで伺着せしめたことを特徴とする磁気
ディスク用アルミニウム基板の製造法。
(1) UA using an aluminum-based alloy blank of a specified thickness
When manufacturing an aluminum substrate for a magnetic disk with a smooth surface, the surface of the blank is coated with a 99-90% coating before or after mechanical or chemical surface smoothing treatment. A method for producing an aluminum substrate for a magnetic disk, characterized in that a predetermined thickness of high-purity aluminum of .0% or more is deposited.
(2)前記高純度アルミニウムの付着が、真空蒸着法、
スパッタリング法若しくはイオンブレーティング法によ
って行なわれる特許請求の範囲第1項記載の方法。
(2) The deposition of the high-purity aluminum is performed by a vacuum evaporation method,
The method according to claim 1, which is carried out by a sputtering method or an ion blating method.
(3)前記高純度アルミニウムが、約50μInを越え
ない厚さで付着せしめられる特許請求の範囲第1項また
は第2項記載の方法。
3. The method of claim 1 or claim 2, wherein said high purity aluminum is deposited to a thickness not exceeding about 50 μIn.
(4)前記表面平滑化処理が、研削工程とホ゛す・ンシ
ング1:程とを含む9゛ケ許請求の範囲第1項記・1&
の方法。
(4) The surface smoothing treatment includes a grinding step and a honing step 1.
the method of.
(5)前記表面平?Vk化処理が、ダイヤモンドハイド
を数例けた旋盤による表面鏡面付上げ工程を含む特許請
求の範囲第1項記載の方法。
(5) Is the surface flat? 2. The method according to claim 1, wherein the Vk treatment includes a step of mirror-finishing the surface using a lathe using several diamond hides.
(6)前記素板に対する所定の表面乎1Ijt化処理に
続いて、前記高純度アルミニウムのイ(」着を行ない、
更にその後前記表面平滑化処理を施すことを含む特許請
求の範囲第1項記載の方法。
(6) Following a predetermined surface treatment for the blank plate, applying the high-purity aluminum,
2. The method according to claim 1, further comprising subsequently performing said surface smoothing treatment.
JP57130152A 1982-07-26 1982-07-26 Production of aluminium substrate for magnetic disc Pending JPS5922232A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57130152A JPS5922232A (en) 1982-07-26 1982-07-26 Production of aluminium substrate for magnetic disc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57130152A JPS5922232A (en) 1982-07-26 1982-07-26 Production of aluminium substrate for magnetic disc

Publications (1)

Publication Number Publication Date
JPS5922232A true JPS5922232A (en) 1984-02-04

Family

ID=15027223

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57130152A Pending JPS5922232A (en) 1982-07-26 1982-07-26 Production of aluminium substrate for magnetic disc

Country Status (1)

Country Link
JP (1) JPS5922232A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60182015A (en) * 1984-02-28 1985-09-17 Toshiro Takahashi Vertical magnetic recording medium
JPS6222236A (en) * 1985-07-22 1987-01-30 Showa Alum Corp Aluminum alloy substrate for magnetic disk

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60182015A (en) * 1984-02-28 1985-09-17 Toshiro Takahashi Vertical magnetic recording medium
JPS6222236A (en) * 1985-07-22 1987-01-30 Showa Alum Corp Aluminum alloy substrate for magnetic disk

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