JPS59217693A - Apparatus for pulling semiconductor single crystal - Google Patents

Apparatus for pulling semiconductor single crystal

Info

Publication number
JPS59217693A
JPS59217693A JP9138483A JP9138483A JPS59217693A JP S59217693 A JPS59217693 A JP S59217693A JP 9138483 A JP9138483 A JP 9138483A JP 9138483 A JP9138483 A JP 9138483A JP S59217693 A JPS59217693 A JP S59217693A
Authority
JP
Japan
Prior art keywords
pulling
valve
inlet
chamber
inert gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9138483A
Other languages
Japanese (ja)
Inventor
Takao Takahashi
孝夫 高橋
Shingo Hayashi
信吾 林
Hisataka Sugiyama
杉山 久嵩
Yoshiaki Tada
多田 嘉明
Toshio Oishi
大石 俊夫
Hitoshi Hasebe
長谷部 等
Masato Matsuda
正人 松田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd, Toshiba Ceramics Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP9138483A priority Critical patent/JPS59217693A/en
Publication of JPS59217693A publication Critical patent/JPS59217693A/en
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/10Crucibles or containers for supporting the melt

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Abstract

PURPOSE:To suppress the fluctuation of the atmosphere in the furnace chamber caused by the operation of a valve, in an apparatus for pulling a semiconductor crystal grown under reduced pressure, by attaching a pair of switchable inlets of inert gas at the top of the pulling chamber and under the shut-off valve, respectively. CONSTITUTION:The inert gas inlet 11 is attached to the top of the pulling chamber 5, and the other inlet 12 is attached to the connecting path 3 under the shut-off valve 4. Either the inlet 11 or 12 is selected with the selector valve 13. The inside of the pulling apparatus is maintained to a reduced pressure by evacuating through the exhaust port 16 attached to the bottom of the furnace chamber 1. Maintaining the evacuated state, (i) the shut-off valve 4 is opened (as shown by dotted line), the inlet 12 is closed, the inlet 11 is opened, and the single crystal 9 is grown from the molten liquid 18 in the crucible 2 by conventional process; and when a required amount of the single crystal 9 is formed, (2) the crystal is pulled up completely in the pulling chamber 5, the valve 4 and the inlet 11 are closed, the inlet 12 is opened, the door 10 is opened, and the single crystal is taken out of the pulling chamber 5.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は、半導体単結晶を減圧不活性ガス雰囲囲気のも
とで成長させる方式の半導体結晶引上機に係り、特に炉
室に引上室との曲に設けられているシャットオフバルブ
の開閉に伴なう炉室内の減圧不活性ガ子雰囲気の変化に
よる悪影響の改善した半導体結晶引上機に関するもので
ある0 2W普的背景とその問題点〕 前記の方式の引上機は、一般に炉室の天井に設けた観測
窓部と引上室の上部の両方から適量の不活性ガスを流入
させ、結晶成長中ば互いに連通されている炉室と引上室
を共に減圧不活性ガス雰囲気に置くようになっていたが
、結晶成長後の単結晶取出し時にシャットオフバルブを
閉じると、引上室の上部から供給していた不活性ガスカ
ニ炉室内へ流入しなくなるため、炉室内の不活性ガスの
流れが乱れ、ルツボ内からの蒸介物が炉室内壁により多
く付着したり、また炉室内の真空度が上がってルツボ内
からの蒸発物の訃が増加した9、さらにまたルツボ内の
融液の温度が変化してしまうなどの不都合を生ずる!趨
■を一定に保つため、観測窓部からの不活性ガス流入量
を増加することも考えられるが、不活性ガスの流れの乱
九がさらに大きくなり、また砂1測窓の汚れを生じる原
因ともなる。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a semiconductor crystal pulling machine for growing a semiconductor single crystal in a reduced pressure inert gas atmosphere, and particularly relates to a semiconductor crystal pulling machine for growing a semiconductor single crystal in a vacuum inert gas atmosphere. This article relates to a semiconductor crystal pulling machine that improves the adverse effects caused by changes in the reduced pressure inert gas atmosphere inside the furnace chamber due to the opening and closing of the shut-off valve installed in the chamber. Problem] The above-mentioned type of pulling machine generally allows an appropriate amount of inert gas to flow in from both the observation window installed on the ceiling of the furnace chamber and the upper part of the pulling chamber, which are communicated with each other during crystal growth. Both the furnace chamber and the pulling chamber were placed in a reduced pressure inert gas atmosphere, but when the shutoff valve was closed when taking out the single crystal after crystal growth, the inert gas crab that was being supplied from the top of the pulling chamber Since the inert gas does not flow into the furnace chamber, the flow of inert gas inside the furnace chamber is disturbed, and more vaporized substances from inside the crucible adhere to the walls of the furnace chamber, and the degree of vacuum inside the furnace chamber increases, causing evaporation from inside the crucible. This causes problems such as an increase in the number of materials dying9, and a change in the temperature of the melt in the crucible! In order to keep the trend constant, it may be possible to increase the amount of inert gas inflowing from the observation window, but this would increase the turbulence of the inert gas flow and cause the sand 1 observation window to become dirty. It also becomes.

〔発明の目的〕[Purpose of the invention]

本発明は、前述したような欠点を解決するためなされだ
もので、シャットオフバルブの開閉に伴なう炉室内の減
圧不活性ガス雰囲気の変化をよりノJ−ざ〈押えるよう
にした半導体単結晶引上機べ・捉供するにある。
The present invention was made in order to solve the above-mentioned drawbacks, and it is a semiconductor unit that further suppresses changes in the reduced pressure inert gas atmosphere in the furnace chamber due to the opening and closing of the shutoff valve. A crystal pulling machine is available for use.

〔発明の概要〕[Summary of the invention]

本発明は上記目的を達成すべく、シャットオフバルブの
下方にも不活性ガスの流入口を設け、シャットオフバル
ブを閉じたときには引上室の上部からの不活性ガスの流
入に代えて前記シャツ1〜オフバルブの下方に設けた流
入口から不活性ガスを流入させるように構成したもので
ある。
In order to achieve the above object, the present invention provides an inert gas inlet also below the shut-off valve, and when the shut-off valve is closed, the inert gas is injected from the upper part of the pulling chamber into the shirt. 1. The inert gas is configured to flow in from an inlet provided below the off valve.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面を参照して説明する。図
中1は炉室で、この炉室1の内部にはルツボ2が設けら
れていて、このルツボ2を図示しないヒータにて加熱す
るようになっている。炉室1の天井には連通路3が設け
られ、その上部にシャットオフバルブ4が設けられてい
る。シャットオフバルブ4の士方には引上室5が形成さ
れ、引′J:、室5の上部には引上軸6を回転および昇
降させるための駆動部7が設けられている。引上室5の
前面(図において右側面)には、引上軸6の下端に種結
晶8を取付けたり、引上げられた単結晶9を取出したり
するためのsioが気密に閉じられるように取付けられ
ている〇 引上室5の上部とシャットオフバルブ4の下方の連通路
3中とには、第1.第2の流入口11.12がそれぞれ
開口され、切換弁1.?の切換えにより、図示しない不
活性ガス供給性から所定流量の不活性ガスを交互に流入
させるようになっている。
Hereinafter, one embodiment of the present invention will be described with reference to the drawings. In the figure, 1 is a furnace chamber, and a crucible 2 is provided inside the furnace chamber 1, and the crucible 2 is heated by a heater (not shown). A communication passage 3 is provided on the ceiling of the furnace chamber 1, and a shutoff valve 4 is provided above the communication passage 3. A pull-up chamber 5 is formed on either side of the shut-off valve 4, and a drive section 7 for rotating and raising/lowering the pull-up shaft 6 is provided in the upper part of the pull-up chamber 5. At the front of the pulling chamber 5 (right side in the figure), an sio for attaching a seed crystal 8 to the lower end of the pulling shaft 6 and for taking out the pulled single crystal 9 is installed so as to be airtightly closed. The upper part of the pulling chamber 5 and the communication passage 3 below the shut-off valve 4 are connected to the first. The second inlets 11, 12 are opened, respectively, and the switching valves 1. ? By switching, a predetermined flow rate of inert gas is alternately introduced from an inert gas supply property (not shown).

111f記炉電lの天井には観測窓14が設けられてお
り、この観測窓14の内側にも不活性ガスのθ:L人ロ
ノロ15口されている。炉室lの下部には、炉室lおよ
び引上室5内を減圧状態にするための排気口16が設け
られている。なお、17は扉1O−1¥開くために引上
室5の減圧状態をJ・W<ための開閉弁である。
An observation window 14 is provided on the ceiling of the 111f furnace, and inside this observation window 14, 15 ports of inert gas θ:L are poured. At the lower part of the furnace chamber 1, an exhaust port 16 is provided to bring the inside of the furnace chamber 1 and the pulling chamber 5 into a reduced pressure state. In addition, 17 is an opening/closing valve for reducing the pressure in the pulling chamber 5 to J.W. in order to open the door 1O-1.

次いで、この引上機の作用について説明する。Next, the operation of this pulling machine will be explained.

単結晶引上げ時に1は、屈10および開閉弁17を閉じ
、シャットオフバルブ4を仮想線で示すようにt8mい
て炉室1と引上室5を連通ざぜ、排乞1コ16から排気
すると共に、切換弁13を切儂えて第1の流入口11か
ら不活性ガスを流入ゴせる。なお、観測窓14の内側の
流入口15からけ′帛に不活性カスを流入させておく。
When pulling a single crystal, 1 closes the valve 10 and the on-off valve 17, moves the shut-off valve 4 at t8m as shown by the imaginary line, communicates the furnace chamber 1 and the pulling chamber 5, and exhausts the air from the drain 16. , the switching valve 13 is turned off to allow inert gas to flow in from the first inlet port 11 . Incidentally, inert scum is allowed to flow into the fabric from the inlet 15 inside the observation window 14.

前記第1の流入口11および流入口15がらの不活性ガ
スの流入量は排気口16からの排気量に対して適宜な割
合に設定され、炉室1と引上室5内を所定の減圧状態に
保つようになっている。
The amount of inert gas flowing through the first inlet 11 and the inlet 15 is set at an appropriate ratio to the amount of exhaust from the exhaust port 16, and the pressure inside the furnace chamber 1 and the pulling chamber 5 is reduced to a predetermined level. It is designed to keep it in good condition.

前記の流入口11.15から流入した不活性ガスの流れ
は、融液18からの蒸発物が炉室1観測窓14ならびに
引上室5の内壁に、刺着することを防止する役目を有し
ている。
The flow of inert gas flowing in from the inlet port 11.15 has the role of preventing evaporated matter from the melt 18 from sticking to the observation window 14 of the furnace chamber 1 and the inner wall of the pulling chamber 5. are doing.

ところで、ルツボ2内に融液1Bをダ持したまま何らの
理由で種結晶8を父1カし/とり、単結晶9の引上げが
終了してこね、を機外へ取出したりする場合は、図示の
ようにnM 詰晶8または単結晶9を融液18から離し
て引上室5内へ持ち上げ、シャットオフバルブ4を閉じ
て炉室1内を大気からしゃ断したまま扉10を開く。
By the way, if for some reason you remove the seed crystal 8 with the melt 1B still in the crucible 2 and take it out of the machine after pulling the single crystal 9, As shown in the figure, the nM packed crystal 8 or single crystal 9 is separated from the melt 18 and lifted into the pulling chamber 5, the shutoff valve 4 is closed, and the door 10 is opened while the inside of the furnace chamber 1 is shut off from the atmosphere.

このとき、引上室5の上部の第1の流入口11からの不
活性ガスは、シャットオフバルブ4が閉じられるために
炉室l内へ流入できなくなる。そこで、炉箆l内のXを
度が上がり融液18からの蒸発物の量が増加し、ま/こ
不活性ガスの流れは観測窓14の内側の流入口15がら
のものだけとなるため、蒸発物が炉室1の内壁に付着し
易くなり、さらに不活性ガスの流れが減少することによ
り炉室1内の温度が変化し、こ力に伴なって融液18の
温度が変化してしまうなどの問題を生ずることになる。
At this time, the inert gas from the first inlet 11 in the upper part of the pulling chamber 5 cannot flow into the furnace chamber 1 because the shutoff valve 4 is closed. Therefore, as the temperature of , the evaporated matter tends to adhere to the inner wall of the furnace chamber 1, and the flow of inert gas decreases, causing the temperature inside the furnace chamber 1 to change, and the temperature of the melt 18 to change with this force. This may cause problems such as

しかして本引上機は、前述したシャットオフバルブ4を
Ef’+じる前また(d後、さら(Cはシャットオフバ
ルブ4の閉鎖に連動して切換弁13を図示のように切換
える。この切換えにより第1の流入口11からの不活性
ガスの流入は停止さ〕11、代りにシャットオフバルブ
4の下方の第2の流入口12から不活性ガスが流入する
。このt]32の?:毘入ロJ2からの不活性ガス流入
量は、し」示しない流量調整弁により定められているた
め、第1のδ11人口11からの流入量と同じに保たれ
る。そこで、炉室1に対する不活性ガスのυi[人jq
 (4、シャットオフバルブ4の閉鎖の前も佼も変化な
く、さらに第2の流入口12を図示のように連通路3中
に開口すれば、炉室l内に、、   おける不活・註カ
スの流れもほとんど変化させずにすむ。そこで、シャッ
トオフバルブ4の開閉に関係なく、炉室1内は所望の減
圧不活性ガス雰囲気に保たれ、前記のような開票は生じ
ないOなお、シャットオフバルブ4を閉じた後、扉10
を開ける場合には、引上室lが減圧状態になっているた
め、開閉弁17を聞いて引上室l内を大気圧と同一状態
にしてから開ける0〔発明の効果〕 以上述べたように本発明により、げ、単結晶の引上げ中
は炉室と引上室を所定の減圧不活性ガス雰囲気におくと
共に、シャツトオフノ<バルブを閉じた後は炉室を引上
は中とほとんど変化のない所定の減圧不活性ガス雰囲気
におくことがで外、この炉室的雰囲気の変化による蒸発
物の付着や温度変化などの不都合を押えて長期間にわた
り、良好な引上げが可能になる。
Therefore, in this lifting machine, before the above-mentioned shut-off valve 4 is closed (Ef'+), after (d), and (C), the switching valve 13 is switched as shown in the figure in conjunction with the closing of the shut-off valve 4. By this switching, the inert gas inflow from the first inlet port 11 is stopped, and instead, the inert gas flows in from the second inlet port 12 below the shut-off valve 4. ?: The amount of inert gas inflow from the furnace chamber J2 is determined by the flow rate adjustment valve that does not indicate "", so it is kept the same as the amount of inflow from the first δ11 population 11. υi of inert gas for 1 [person jq
(4. If there is no change in the case before or after closing the shutoff valve 4, and if the second inlet 12 is opened into the communication path 3 as shown in the figure, the There is almost no need to change the flow of waste.Therefore, regardless of whether the shutoff valve 4 is opened or closed, the inside of the furnace chamber 1 is maintained at the desired reduced pressure inert gas atmosphere, and the above-mentioned vote counting does not occur. After closing the shutoff valve 4, the door 10
When opening, since the pulling chamber l is in a reduced pressure state, the opening/closing valve 17 is used to make the inside of the pulling chamber l equal to the atmospheric pressure before opening. [Effects of the Invention] As described above. According to the present invention, during the pulling of a single crystal, the furnace chamber and the pulling chamber are placed in a predetermined reduced pressure inert gas atmosphere, and after the shirt opening valve is closed, the furnace chamber is kept in a state where there is almost no change during pulling. By placing the steel in a predetermined reduced-pressure inert gas atmosphere, it is possible to maintain good pulling over a long period of time while suppressing problems such as deposition of evaporated substances and temperature changes due to changes in the furnace chamber atmosphere.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明による半導体単結晶引上機の一実施例を示
す概略縦断側面図である。 1・・・炉室、2・・・ルツボ、3・・・連通路、4・
・・シャットオフバルブ、5・・・引上オ、6・・・引
上軸、7・・・駆動部、8・・・種結晶、9・・・琴結
晶、10・・・扉、11,12.15・・・流入口、1
3・・・切換弁。 14・・・観、側窓、16・・・排気口、17・・・開
閉弁、18・・・融液。 出顆人代理人 弁理士 鈴  江  武  彦第1頁の
続き 0発 明 者 松田正人 山形県西置賜郡小国町大字小国 町り78東芝セラミックス株式会 社小国製造所内 ■出 願 人 東芝セラミックス株式会社東京都新宿区
西新宿1丁目26番 2号
The drawing is a schematic longitudinal sectional side view showing an embodiment of a semiconductor single crystal pulling machine according to the present invention. 1... Furnace chamber, 2... Crucible, 3... Communication passage, 4...
... Shutoff valve, 5... Pulling o, 6... Pulling shaft, 7... Drive section, 8... Seed crystal, 9... Koto crystal, 10... Door, 11 ,12.15...Inlet, 1
3...Switching valve. 14... View, side window, 16... Exhaust port, 17... Opening/closing valve, 18... Melt liquid. Patent Attorney Takehiko Suzue Continued from page 1 0 Inventor Masato Matsuda Inventor Toshiba Ceramics Co., Ltd. Oguni Factory, 78 Ogunimachi, Nishiokitama-gun, Yamagata Prefecture Applicant Toshiba Ceramics Co., Ltd. Tokyo 1-26-2 Nishi-Shinjuku, Shinjuku-ku

Claims (3)

【特許請求の範囲】[Claims] (1)炉室の天井に設けられた観測窓部および炉室の上
方にシャットオフバルブを介して形成されている引上室
の上部から不活性ガスを流入させ、前記炉室と引上室を
減圧不活性ガス雰囲気にして結晶成長を行なう半導体単
結晶引上機において、前記シャットオフバルブの下方に
も不活性ガスの流入口を設け、引上室の上部刀・らの不
活性ガスの流入と前記流入口からの流入を交互に切換え
可能にしたことを特徴とする半導体単結晶引上機。
(1) Inert gas is introduced from the observation window provided on the ceiling of the furnace chamber and the upper part of the pulling chamber formed above the furnace chamber through a shut-off valve, and In a semiconductor single crystal pulling machine that performs crystal growth in a reduced-pressure inert gas atmosphere, an inert gas inlet is also provided below the shut-off valve, and the inert gas is removed from the upper part of the pulling chamber. A semiconductor single crystal pulling machine, characterized in that the inflow and the inflow from the inlet can be alternately switched.
(2)  流入口が灯室と引上室の間の連通路中に開口
されている特許請求の範囲第(1)項記載の半う、4体
謝結晶引上機。
(2) A half- and four-body crystal pulling machine according to claim (1), wherein the inlet is opened in a communication path between the lamp chamber and the pulling chamber.
(3)  前記切換えがシャットオフバルブの開閉に連
動して行われるように構成、。されている特許請求の範
囲第(1)または第(2)項記載の半導体単結晶引上機
(3) The switching is configured to be performed in conjunction with opening and closing of the shutoff valve. A semiconductor single crystal pulling machine according to claim (1) or (2).
JP9138483A 1983-05-24 1983-05-24 Apparatus for pulling semiconductor single crystal Pending JPS59217693A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9138483A JPS59217693A (en) 1983-05-24 1983-05-24 Apparatus for pulling semiconductor single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9138483A JPS59217693A (en) 1983-05-24 1983-05-24 Apparatus for pulling semiconductor single crystal

Publications (1)

Publication Number Publication Date
JPS59217693A true JPS59217693A (en) 1984-12-07

Family

ID=14024873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9138483A Pending JPS59217693A (en) 1983-05-24 1983-05-24 Apparatus for pulling semiconductor single crystal

Country Status (1)

Country Link
JP (1) JPS59217693A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04160087A (en) * 1990-10-19 1992-06-03 Komatsu Electron Metals Co Ltd Apparatus for producing semiconductor single crystal
CN103993350A (en) * 2014-04-21 2014-08-20 洛阳金诺机械工程有限公司 Silicon core drawing furnace chamber

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04160087A (en) * 1990-10-19 1992-06-03 Komatsu Electron Metals Co Ltd Apparatus for producing semiconductor single crystal
CN103993350A (en) * 2014-04-21 2014-08-20 洛阳金诺机械工程有限公司 Silicon core drawing furnace chamber

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