JPS59215040A - Device for detecting defect of picture information disc - Google Patents

Device for detecting defect of picture information disc

Info

Publication number
JPS59215040A
JPS59215040A JP8746283A JP8746283A JPS59215040A JP S59215040 A JPS59215040 A JP S59215040A JP 8746283 A JP8746283 A JP 8746283A JP 8746283 A JP8746283 A JP 8746283A JP S59215040 A JPS59215040 A JP S59215040A
Authority
JP
Japan
Prior art keywords
signal
defect
circuit
envelope
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8746283A
Other languages
Japanese (ja)
Other versions
JPH03705B2 (en
Inventor
Yuji Sato
裕治 佐藤
Shigetoshi Hirai
重利 平井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP8746283A priority Critical patent/JPS59215040A/en
Publication of JPS59215040A publication Critical patent/JPS59215040A/en
Publication of JPH03705B2 publication Critical patent/JPH03705B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/76Television signal recording
    • H04N5/91Television signal processing therefor
    • H04N5/93Regeneration of the television signal or of selected parts thereof
    • H04N5/94Signal drop-out compensation

Abstract

PURPOSE:To detect stably a defect signal existing on a disc face and a defect signal mixed in a picture signal by detecting the envelope from a detected signal including a pulse formed defect signal and detecting the defect signal only through circuits such as differentiation and comparison or the like. CONSTITUTION:A reproducing signal supplied to an input terminal 21 and including a synchronizing signal a1, and defect signals a2, a3 and a4 is envelope- detected by an envelope detecting circuit 22 and outputted as defect detected outputs h1, h2 by an upward defect pulse detecting circuit 30 comprising a differentiation circuit 23, a comparator 24 and a monostable multivibrator 25 or the like. Further, the reproducing signal supplied to the input terminal 21 is inputted also to an inverse circuit 28 and outputted as a defect pulse h3 by a downward defect detecting circuit 29.

Description

【発明の詳細な説明】 〔発明の技術分野〕 不発明はビデオディスクの製造工程中における画像情報
円盤欠陥検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The invention relates to an apparatus for detecting defects in image information discs during the manufacturing process of video discs.

〔発明の技術的背景とその問題点−1 近年、映像の記録再生システムとして、画像情報円盤が
用いられる様になった。これには光読取り方式、針読取
り方式などがあるが、いずれも従来からあるVTR装置
に比べて画像源となる円盤がプレスによって安価に大量
生産でき、また高速な画像アクセスができるなどの点で
優れたものとなっている。しかし、いずれも円盤表面や
反射面に凹凸の形状を付ける方法により情報を記録して
いるだめ、記録面にある形状の欠陥は画質を大きく悪化
させる そのために記録面に発生した欠陥を検出する事
は特にその製造工程においては重要となる。
[Technical background of the invention and its problems-1 In recent years, image information discs have come to be used as video recording and reproducing systems. There are optical reading methods, needle reading methods, etc., but both of them have advantages such as the disks that serve as image sources can be mass-produced at low cost using a press, and high-speed image access is possible compared to conventional VTR devices. It is excellent. However, since information is recorded by adding uneven shapes to the disk surface or reflective surface, any defects in the shape on the recording surface will greatly deteriorate the image quality.Therefore, it is difficult to detect defects that occur on the recording surface. is especially important in the manufacturing process.

従来1画18!情報円盤の欠陥の検出方法としては、通
常の画面再生と同様に1トラツクづつ再生し7その再生
信号がFM変調されていることから信号の包絡線を検出
し、それが低下した時点を検知する方法等が用いられる
。しかしこの方法では1トラツクづつ検査するため検査
時間が長くなる欠点を持つ。そこで数トラツクの情報を
例えば円盤に光ビームを当てるなどの方法により一度に
取り出し、短時間で欠陥を検査する方法が取られる。し
かしこの場合には数トラツクを一度に検出するため、検
出信号は1トラツクのみを検出しプこ時に得られるFM
変調された信号とは異なシ、同期イば号やトラッキング
のだめの制御信号などが欠陥(,4号と同様なパルス状
(8号として現われる。このため同期信号や制御信号ま
で欠陥として哄まって検出してしlう欠点がめった。こ
れを改善する方法として例えば同期信号部では検出を行
なわない方法が考えられる。この場合には同期信号部以
外の欠陥信号は検出可能であるが、同期信号と混在して
現われる欠陥信号の検出は不可能であった。また一般に
は欠陥検出を周波数弁別で行う方法が用いられるが、画
像情報円盤においては同期信号や制御信号は欠陥イぎ号
と非常に近い周波数帯域にあるので単に周波数弁別の方
法などにより欠陥信号のみを検出する事も困難であった
Conventional one stroke 18! The method for detecting defects in the information disk is to play one track at a time in the same way as normal screen playback.7 Since the playback signal is FM modulated, the envelope of the signal is detected, and the point at which it drops is detected. methods etc. are used. However, this method has the disadvantage that the inspection time is long because each track is inspected. Therefore, a method is used in which information on several tracks is extracted at once by, for example, shining a light beam on the disk, and defects can be inspected in a short period of time. However, in this case, since several tracks are detected at once, the detection signal is an FM signal obtained at the time of detection of only one track.
A signal that is different from the modulated signal, such as a synchronization error signal or a control signal for tracking, appears as a defect (and a pulse shape similar to No. 4 (No. 8). Therefore, the synchronization signal and control signal also appear as defects. The defect is that the detection is rarely detected.One possible way to improve this is, for example, to not perform detection in the sync signal section.In this case, defective signals other than the sync signal section can be detected, but the sync signal It has been impossible to detect defect signals that appear mixed with the defect signal.In addition, a method of frequency discrimination is generally used for defect detection, but in image information disks, the synchronization signal and control signal are very similar to the defect signal. Since they are in similar frequency bands, it is difficult to detect only the defective signal using a frequency discrimination method.

〔発明の目的〕[Purpose of the invention]

本発明の目的は画像情報円盤面上にある欠陥(m号およ
び画像信号中に混在する欠陥信号を短時間で安定に検出
できる画像清報円盤欠陥検出装置を提供するものである
SUMMARY OF THE INVENTION An object of the present invention is to provide an image information disc defect detection device that can stably detect defects (mth number) on the surface of an image information disc and defect signals mixed in image signals in a short time.

〔発明の概袂〕[Summary of the invention]

本発明は画像情報を記録した円盤から得られる反射ビー
ムよりパルス状欠陥信号を含む検出信号を取り出し、こ
の検出(,1号を包絡線検出回路に入力してその包絡線
信号を取り出し、その出力を微分して比較器に入力し包
絡線の立ち上がりを検出する信号を得る。この包絡線の
立ち上がり検出信号により単安定マルチバイブレータを
同期信号期間より短く欠陥信号期間より長い時間反転さ
せる。
The present invention extracts a detection signal including a pulsed defect signal from a reflected beam obtained from a disk on which image information is recorded, inputs this detection signal (No. 1) to an envelope detection circuit, extracts the envelope signal, and outputs the detected signal. is differentiated and input to a comparator to obtain a signal for detecting the rise of the envelope.This envelope rise detection signal inverts the monostable multivibrator for a time shorter than the synchronization signal period and longer than the defect signal period.

検出信号と単安定マルチバイブレータの出力はアンド回
路に入力される。通常欠陥信号は同期信号より短いパル
ス状の信号である。よって立ち上がりの検出信号Vこよ
り反転した単安定マルチバイブレータが反転している時
間中に得られる立ち下がり検出信号をアンド回路で選択
すると欠陥を検出でI入る。
The detection signal and the output of the monostable multivibrator are input to an AND circuit. The defect signal is usually a pulse-like signal shorter than the synchronization signal. Therefore, if the falling detection signal obtained during the time when the inverted monostable multivibrator is inverted from the rising detection signal V is selected by the AND circuit, a defect is detected and I is entered.

〔発明の効果〕〔Effect of the invention〕

本発明により画像情報円盤の記録面上の欠陥を短時間に
且つ安定に検出可能となり、特に同期信号や制御信号上
にある欠陥も検出する拳が出来るので、画像情報円盤、
及びその製造工程中に得られる画像情報原盤の欠陥検査
を効率良く行なえる。
According to the present invention, defects on the recording surface of an image information disk can be detected stably in a short time, and in particular, defects on synchronization signals and control signals can also be detected.
And image information obtained during the manufacturing process can be efficiently inspected for defects on the master disk.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面を用いて詳細に説明する
Hereinafter, one embodiment of the present invention will be described in detail using the drawings.

第1図は画像情報円盤の反射光から再生信号を得るまで
の光学系を示した図である。レーザ発振装置aυより出
力されたレーザビームはビームスプリッタ02を経てレ
ンズ+13により画像円盤I上に小さな光スポットを結
ぶ。この時、円盤IはモータOSによし回転している。
FIG. 1 is a diagram showing an optical system from which a reproduction signal is obtained from reflected light from an image information disk. The laser beam output from the laser oscillation device aυ passes through the beam splitter 02 and forms a small light spot on the image disk I by the lens +13. At this time, the disk I is being rotated by the motor OS.

短時間で検査を行なうために光スポットは円盤I上の記
録ビットおよびトラックに対して十分大きく集光させ、
数トラツク(例えば5本程度)を一度に再生している。
In order to perform inspection in a short time, the light spot is focused sufficiently large on the recorded bits and tracks on disk I.
Several tracks (for example, about 5 tracks) are being played at once.

この円盤1141面で反射され画像16号や欠陥の情報
を含んだ反射ビームは再度レンズf131を通りビーム
スプリッタ0渇で反射され光検出器filで受光される
。ここで元信号は電気信号となり出力端子面に出力され
る。また常に盤面の光スポットの形状が最適な大きさに
なる様に焦点調節器1181は光検出器aOから信号を
得てレンズ+131を動作させる。
The reflected beam that is reflected by the surface of the disk 1141 and contains image No. 16 and defect information passes through the lens f131 again, is reflected by the beam splitter 0, and is received by the photodetector fil. Here, the original signal becomes an electrical signal and is output to the output terminal surface. Further, the focus adjuster 1181 receives a signal from the photodetector aO and operates the lens +131 so that the shape of the light spot on the board surface is always the optimum size.

第2図は本発明に係る欠陥検出回路の一笑施例であり、
第3図は第2図の各部波形を示す図である。第2図の再
生信号入力端子C21)には第1図に示した光学的検出
装置からの再生信号が供給される。
FIG. 2 is a simple example of a defect detection circuit according to the present invention,
FIG. 3 is a diagram showing waveforms of various parts in FIG. 2. A reproduced signal from the optical detection device shown in FIG. 1 is supplied to the reproduced signal input terminal C21) in FIG.

この再生信号の波形を示した図が第3図(a)である。FIG. 3(a) is a diagram showing the waveform of this reproduced signal.

円盤0着の数トラツクを一度に再生すると同期信号部で
は常に隣接トラックに同一信号が記録されているため同
位相で加算されて第3図(&)の&1の様な信号が現わ
れる。又、映像信号部では隣接トラック間で信号の相関
がないため、数トラツク間で平均化され大きな振幅変化
は現われない。更に数トラツクに渡り欠陥が存在すると
反射ビーム光量が低下したり、増大したシすることによ
り第3図1c&)のa2やa3の様な振幅の大きい1d
号が現われる。
When several tracks of the 0th place on the disc are reproduced at once, the same signals are always recorded in adjacent tracks in the synchronization signal section, so they are added in the same phase, and a signal like &1 in FIG. 3 (&) appears. Furthermore, in the video signal section, since there is no signal correlation between adjacent tracks, the signals are averaged over several tracks and no large amplitude changes appear. Furthermore, if there are defects over several tracks, the amount of reflected beam light may decrease or increase, resulting in large amplitude 1d such as a2 and a3 in Fig. 3, 1c&).
A number appears.

この再生信号は包絡線検出回路+221で包絡縁検波さ
れるが、この波形を示した図が第3図(b)であり、第
3図(a)の上側の包絡線のみ検出され、下向きの欠陥
Itt号a3は取り除かれろ。この包絡線検出回路(四
の出力は微分回路r!冴に入力される。この微分回路の
出力波形は第3図(c)に示される。この出力が比較器
(2,0に入力される。比較器+24)は第3図(c)
に示す微分回路(慢の出力とレベルC1を比較し、第3
図(d)に示・す様な包絡線の立ち上がりを検出するパ
ルス列を作る。この比較器C4の出力は単安定マルチバ
イブレータ(ハ)に入力し、その出力は第3図(e)に
示frf)7式のパルス列となる。ここでτは同期信号
の長さより短く、欠陥信号の長さより長くする。
This reproduced signal is envelope-detected by the envelope detection circuit +221, and the diagram showing this waveform is shown in FIG. 3(b). Only the upper envelope in FIG. 3(a) is detected, and the downward Please remove defective Itt No. a3. The output of this envelope detection circuit (4) is input to the differentiator circuit r!sae. The output waveform of this differentiator circuit is shown in Figure 3(c). This output is input to the comparator (2, 0). .Comparator +24) is shown in Figure 3(c).
Compare the output of the differential circuit shown in (the output of the arrogance) and level C1, and
Create a pulse train to detect the rising edge of the envelope as shown in Figure (d). The output of this comparator C4 is input to a monostable multivibrator (c), and its output becomes a pulse train of the formula frf)7 shown in FIG. 3(e). Here, τ is shorter than the length of the synchronization signal and longer than the length of the defective signal.

一方、微分回路Q坤の出力は比較器(ハ)にも入力し、
第3図(o)に示すレベルC2と比較され、第3図(f
)に示す包絡線の立ち下がりパルスを検出する。この比
較器t21i)の出力は、単安定マルチバイブレータ(
2!9の出力と共にアンド回路(27)に入力する。こ
のアンド回路では、包絡線の立ち上がりから1式以内に
立ち下がりパルスがあったときのみ、第3図(g)に示
す信号を出力する。この様にして、第3図(a)に示す
再生信号上の上向きの欠陥信号a2とa4が第3図(g
)に示す様に検出式れる。また入力端子CDに供給され
た再生信号は反転回路(至)で欠陥パルスの極性を逆に
して、下向き欠陥検出回路(21に入力する。この下向
き欠陥パルス検出回路01は前記包絡線検出回路、微分
回路、2つの比較器、単安定マルチバイブレータ、アン
ド回路で構成された回路間と同様の回路である。この様
にして第3図(11)に示される再生信号の下向き欠陥
パルスa3を検出する。丙生信号の上向きと下向きの欠
陥検出信号はオア回路01)で加算され、欠陥検出信号
0湯を第3図(1)に示す様に出力する。
On the other hand, the output of the differentiating circuit Qkon is also input to the comparator (c),
It is compared with the level C2 shown in FIG. 3(o), and the level C2 shown in FIG.
Detect the falling pulse of the envelope shown in ). The output of this comparator t21i) is a monostable multivibrator (
It is input to the AND circuit (27) together with the output of 2!9. This AND circuit outputs the signal shown in FIG. 3(g) only when there is a falling pulse within one equation from the rising edge of the envelope. In this way, the upward defect signals a2 and a4 on the reproduced signal shown in FIG.
The detection formula is as shown in ). Further, the reproduced signal supplied to the input terminal CD reverses the polarity of the defective pulse in an inversion circuit (to) and inputs it to the downward defect detection circuit (21).This downward defect pulse detection circuit 01 is connected to the envelope detection circuit, This circuit is similar to the circuit consisting of a differential circuit, two comparators, a monostable multivibrator, and an AND circuit.In this way, the downward defective pulse a3 of the reproduced signal shown in Fig. 3 (11) is detected. The upward and downward defect detection signals of the GE signal are added by an OR circuit 01), and a defect detection signal 0 is output as shown in FIG. 3 (1).

以上述べた様に本実施例に依れば、微分回路以降の出力
信号をデジタル処理出来るので検出能力の安定性に優れ
ておりアナログ回路に比べ回路の製作調整が容易である
。また欠陥検出信号が再生 、 ・信号の欠陥位置に対
しほぼ時間遅れなく出力されるので実用上都合が良い。
As described above, according to this embodiment, the output signals after the differentiating circuit can be digitally processed, so the stability of the detection ability is excellent, and the manufacturing and adjustment of the circuit is easier than with analog circuits. In addition, the defect detection signal is outputted with almost no time delay relative to the defect position of the reproduced signal, which is convenient in practice.

尚、上記実施例に依れば光学的に数トラ・ンクづつの情
報を読み取る方法を示したが、接触式でも数トラツクに
捷たがる大きさの針を使用して再生信号を得ることも出
来る。また第2図に於て再生信号を反転回路で反転する
ことなしに下側の包絡4!!を検出する回路を用いて、
下向きの欠陥信号のみを検出することも出来る。
According to the above embodiment, a method of optically reading information in several tracks each was shown, but even with a contact type, a reproduction signal can be obtained using a needle large enough to be divided into several tracks. You can also do it. Also, in Figure 2, the lower envelope 4! without inverting the reproduced signal with the inverting circuit! ! Using a circuit that detects
It is also possible to detect only downward defect signals.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は外生信号を得る1での光学系を示す図、82図
は本発明の一実施例を示す図、第3図は第2図における
各部の波形を示した図である。 11・・・レーザ発振装置、12・・・ビームスプリッ
タ13・・・レンズ、14・・・画像円盤、15・・・
七−タ、16・・・光検出器、17・・・出力端子、1
8・・・焦点調節器、21・・・再生信号入力端子、2
2・・・包絡線検出回路、23・・・微分回路、24.
26・・・比較器、25・・・単安定マルチバイブレー
タ、27・・・アンド回路、28・・・反転回路、29
・・・下向き欠陥パルス検出回路、30・・・上向き欠
陥パルス検出回路、31・・・オア回路、32・・・欠
陥検出信号。 弓   、Q   ()   り も   も  望   ゛穢
FIG. 1 is a diagram showing an optical system 1 for obtaining an external signal, FIG. 82 is a diagram showing an embodiment of the present invention, and FIG. 3 is a diagram showing waveforms at various parts in FIG. DESCRIPTION OF SYMBOLS 11... Laser oscillation device, 12... Beam splitter 13... Lens, 14... Image disk, 15...
7-tater, 16... photodetector, 17... output terminal, 1
8... Focus adjuster, 21... Playback signal input terminal, 2
2... Envelope detection circuit, 23... Differential circuit, 24.
26... Comparator, 25... Monostable multivibrator, 27... AND circuit, 28... Inverting circuit, 29
... Downward defect pulse detection circuit, 30 ... Upward defect pulse detection circuit, 31 ... OR circuit, 32 ... Defect detection signal. Bow, Q

Claims (1)

【特許請求の範囲】[Claims] 画像情報を記録した記録媒体から得られるパルス状欠陥
信号を含む再生信号の包絡線を検出する手段と、この検
出手段から得られる包絡線信号を微分する手段と、この
微分手段から得られる微分信号の定められた一方の極性
のパルスを検出する第1の検出手段と、この検出手段に
より得られた検出信号によシ所定のパルス幅の信号を発
生するパルス発生手段と、前記微分信号の他方の極性の
パルスを検出する第2の検出手段と、前記パルス発生手
段から得られる出力と前記第2の検出手段から得られる
出力との論理積をとるアンド回路とを具備したことを特
徴とする画像情報円盤欠陥検出装置。
Means for detecting the envelope of a reproduced signal including a pulse-like defect signal obtained from a recording medium on which image information is recorded, means for differentiating the envelope signal obtained from the detecting means, and a differential signal obtained from the differentiating means. a first detection means for detecting a pulse of one predetermined polarity; a pulse generation means for generating a signal of a predetermined pulse width based on the detection signal obtained by the detection means; and the other of the differential signals. and an AND circuit that takes a logical product of the output obtained from the pulse generation means and the output obtained from the second detection means. Image information disk defect detection device.
JP8746283A 1983-05-20 1983-05-20 Device for detecting defect of picture information disc Granted JPS59215040A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8746283A JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8746283A JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Publications (2)

Publication Number Publication Date
JPS59215040A true JPS59215040A (en) 1984-12-04
JPH03705B2 JPH03705B2 (en) 1991-01-08

Family

ID=13915543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8746283A Granted JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Country Status (1)

Country Link
JP (1) JPS59215040A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5377054A (en) * 1992-07-06 1994-12-27 Sharp Kabushiki Kaisha Digital information reproducing apparatus

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832146A (en) * 1981-08-20 1983-02-25 Matsushita Electric Ind Co Ltd Evaluating device for dropout

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832146A (en) * 1981-08-20 1983-02-25 Matsushita Electric Ind Co Ltd Evaluating device for dropout

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5377054A (en) * 1992-07-06 1994-12-27 Sharp Kabushiki Kaisha Digital information reproducing apparatus

Also Published As

Publication number Publication date
JPH03705B2 (en) 1991-01-08

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