JPH03705B2 - - Google Patents

Info

Publication number
JPH03705B2
JPH03705B2 JP58087462A JP8746283A JPH03705B2 JP H03705 B2 JPH03705 B2 JP H03705B2 JP 58087462 A JP58087462 A JP 58087462A JP 8746283 A JP8746283 A JP 8746283A JP H03705 B2 JPH03705 B2 JP H03705B2
Authority
JP
Japan
Prior art keywords
signal
pulse
detection
circuit
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58087462A
Other languages
Japanese (ja)
Other versions
JPS59215040A (en
Inventor
Juji Sato
Shigetoshi Hirai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP8746283A priority Critical patent/JPS59215040A/en
Publication of JPS59215040A publication Critical patent/JPS59215040A/en
Publication of JPH03705B2 publication Critical patent/JPH03705B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/76Television signal recording
    • H04N5/91Television signal processing therefor
    • H04N5/93Regeneration of the television signal or of selected parts thereof
    • H04N5/94Signal drop-out compensation

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はビデオデイスクの製造工程中における
画像情報円盤欠陥検出装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to an image information disc defect detection apparatus during a video disc manufacturing process.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

近年、映像の記録再生システムとして、画像情
報円盤が用いられるようになつた。これには光読
取り方式、針読取り方式などがあるが、いずれも
従来からあるVTR装置に比べて画像源となる円
盤がプレスによつて安価に大量生産でき、また高
速な画像アクセスができるなどの点で優れたもの
となつている。しかし、いずれも円盤表面や反射
面に凹凸の形状を付ける方法により情報と記録し
ているため、記録面にある形状の欠陥は画質を大
きく悪化させる。そのために記録面に発生した欠
陥を検出する事は特にその製造工程においては重
要となる。
In recent years, image information disks have come into use as video recording and reproducing systems. There are optical reading systems, needle reading systems, etc., but both of them have advantages such as the discs that serve as image sources can be mass-produced at low cost using a press, and high-speed image access is possible compared to conventional VTR devices. It is excellent in many respects. However, in both cases, information is recorded by adding uneven shapes to the disk surface or reflective surface, so any defects in the shape on the recording surface greatly deteriorate the image quality. Therefore, it is important to detect defects occurring on the recording surface, especially in the manufacturing process.

従来、画像情報円盤の欠陥の検出方法として
は、通常の画面再生と同様に1トラツクづつ再生
しその再生信号がFM変調されていることから信
号の包絡線を検出し、それが低下した時点を検知
する方法等が用いられる。しかしこの方法では1
トラツクづつ検査するため検査時間が長くなる欠
点を持つ。そこで数トラツクの情報を例えば円盤
に光ビームを当てるなどの方法により一度に取り
出し、短時間で欠陥を検査する方法が取られる。
しかしこの場合には数トラツクを一度に検出する
ため、検出信号は1トラツクのみを検出した時に
得られるFM変調された信号とは異なり、同期信
号やトラツキングのための制御信号などが欠陥信
号と同様なパルス状信号として現われる。このた
め同期信号や制御信号まで欠陥として誤まつて検
出してしまう欠点があつた。これを改善する方法
として例えば同期信号部では検出を行なわない方
法が考えられる。この場合には同期信号部以外の
欠陥信号は検出可能であるが、同期信号と混在し
て現われる欠陥信号の検出は不可能であつた。ま
た一般には欠陥検出を周波数弁別で行う方法が用
いられるが、画像情報円盤においては同期信号や
制御信号は欠陥信号と非常に近い周波数帯域にあ
るので単に周波数弁別の方法などにより欠陥信号
のみを検出する事も困難であつた。
Conventionally, the method for detecting defects in image information disks was to play back one track at a time in the same way as normal screen playback, detect the envelope of the signal since the playback signal is FM modulated, and then detect the point at which the envelope drops. A detection method etc. is used. However, with this method, 1
This method has the disadvantage that the inspection time is long because each track is inspected. Therefore, a method is used in which information on several tracks is extracted at once by, for example, shining a light beam on the disk, and defects can be inspected in a short period of time.
However, in this case, several tracks are detected at once, so the detection signal is different from the FM modulated signal obtained when only one track is detected, and the synchronization signal and control signal for tracking are similar to the defect signal. It appears as a pulse-like signal. This has resulted in the drawback that even synchronization signals and control signals may be mistakenly detected as defects. As a method to improve this, for example, a method of not performing detection in the synchronization signal section can be considered. In this case, it is possible to detect defective signals other than the synchronizing signal portion, but it is impossible to detect defective signals that appear mixed with the synchronizing signal. Generally, a method of detecting defects by frequency discrimination is used, but in image information disks, the synchronization signal and control signal are in a frequency band very close to the defect signal, so only the defect signal is detected by simply frequency discrimination. It was also difficult to do.

〔発明の目的〕[Purpose of the invention]

本発明の目的は画像情報円盤面上にある欠陥信
号および画像信号中に混在する欠陥信号を短時間
で安定に検出できる画像情報円盤欠陥検出装置を
提供するものである。
SUMMARY OF THE INVENTION An object of the present invention is to provide an image information disc defect detection device that can stably detect defect signals on the image information disc surface and defect signals mixed in the image signals in a short time.

〔発明の概要〕[Summary of the invention]

本発明は画像情報を記録した円盤から得られる
反射ビームよりパルス状欠陥信号を含む検出信号
を取り出し、この検出信号を包絡線検出回路に入
力してその包絡線信号を取り出し、その出力を微
分して比較器に入力して包絡線の立ち上がりを検
出する信号を得る。この包絡線の立ち上がり検出
信号により単安定マルチバイブレータを同期信号
期間より短く欠陥信号期間より長い時間反転させ
る。一方微分信号は別の比較器に入力させ、包絡
線の立ち下がりを検出する信号を得る。この立ち
下がり検出信号と単安定マルチバイブレータの出
力はアンド回路に入力される。通常欠陥信号は同
期信号より短いパルス状の信号である。よつて立
ち上がりの検出信号により反転した単安定マルチ
バイブレータが反転している時間中に得られる立
ち下がり検出信号をアンド回路で選択すると欠陥
を検出できる。
The present invention extracts a detection signal including a pulsed defect signal from a reflected beam obtained from a disk on which image information is recorded, inputs this detection signal to an envelope detection circuit, extracts the envelope signal, and differentiates the output. and input it to a comparator to obtain a signal for detecting the rising edge of the envelope. This envelope rise detection signal causes the monostable multivibrator to be inverted for a period shorter than the synchronization signal period and longer than the defect signal period. On the other hand, the differential signal is input to another comparator to obtain a signal for detecting the fall of the envelope. This falling detection signal and the output of the monostable multivibrator are input to an AND circuit. The defect signal is usually a pulse-like signal shorter than the synchronization signal. Therefore, if the falling detection signal obtained during the time when the monostable multivibrator inverted by the rising detection signal is inverted, is selected by the AND circuit, a defect can be detected.

〔発明の効果〕〔Effect of the invention〕

本発明により画像情報円盤の記録面上の欠陥を
短時間に且つ安定に検出可能となり、特に同期信
号や制御信号上にある欠陥も検出する事が出来る
ので、画像情報円盤、及びその製造工程中に得ら
れる画像情報原盤の欠陥検査を効率良く行なえ
る。
According to the present invention, defects on the recording surface of an image information disk can be detected stably in a short time, and in particular, defects on synchronization signals and control signals can also be detected. The image information obtained can be used to efficiently inspect defects on master discs.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の一実施例を図面を用いて詳細に
説明する。
Hereinafter, one embodiment of the present invention will be described in detail using the drawings.

第1図は画像情報円盤の反射光から再生信号を
得るまでの光学系を示した図である。レーザ発振
装置11より出力されたレーザビームはビームス
プリツタ12を経てレンズ13により画像円盤1
4上に小さな光スポツトを結ぶ。この時、円盤1
4はモータ15により回転している。短時間で検
査を行なうために光スポツトは円盤14上の記録
ビツトおよびトラツクに対して十分大きく集光さ
せ、数トラツク(例えば5本程度)を一度に再生
している。この円盤14面で反射され画像信号や
欠陥の情報を含んだ反射ビームは再度レンズ13
を通りビームスプリツタ12で反射され光検出器
16で受光される。ここで光信号は電気信号とな
り出力端子17に出力される。また常に盤面の光
スポツトの形状が最適な大きさになる様に焦点調
節器18は光検出器16から信号を得てレンズ1
3を動作させる。
FIG. 1 is a diagram showing an optical system from which a reproduction signal is obtained from reflected light from an image information disk. The laser beam output from the laser oscillation device 11 passes through the beam splitter 12 and is sent to the image disk 1 by the lens 13.
4 Connect a small light spot on the top. At this time, disk 1
4 is rotated by a motor 15. In order to perform the inspection in a short time, the light spot is focused sufficiently on the recorded bits and tracks on the disk 14, and several tracks (for example, about five) are reproduced at once. The reflected beam that is reflected by the 14 surfaces of the disk and contains image signals and defect information is returned to the lens 13.
The light is reflected by the beam splitter 12 and received by the photodetector 16. Here, the optical signal becomes an electrical signal and is output to the output terminal 17. In addition, the focus adjuster 18 receives a signal from the photodetector 16 and adjusts the lens 1 so that the shape of the light spot on the board is always the optimal size.
Operate 3.

第2図は本発明に係る欠陥検出回路の一実施例
であり、第3図は第2図の各部波形を示す図であ
る。第2図の再生信号入力端子21には第1図に
示した光学的検出装置からの再生信号が供給され
る。この再生信号の波形を示した図が第3図aで
ある。円盤14の数トラツクを一度に再生すると
同期信号部では常に隣接トラツクに同一信号が記
録されているため同位相で加算されて第3図aの
a1の様な信号が現われる。又、映像信号部では隣
接トラツク間で信号の相関がないため、数トラツ
ク間で平均化され大きな振幅変化は現われない。
更に数トラツクに渡り欠陥が存在すると反射ビー
ム光量が低下したり、増大したりすることにより
第3図aのa2やa3の様な振幅の大きい信号が現わ
れる。この再生信号は包絡線検出回路22で包絡
線検波されるが、この波形を示した図が第3図b
であり、第3図aの上側の包絡線のみ検出され、
下向きの欠陥信号a3は取り除かれる。この包絡線
検出回路22の出力は微分回路23に入力され
る。この微分回路の出力波形は第3図cに示され
る。この出力が比較器24に入力される。比較器
24は第3図cに示す微分回路23の出力とレベ
ルC1を比較し、第3図dに示す様な包絡線の立
ち上がりを検出するパルス列を作る。この比較器
24の出力は単安定マルチバイブレータ25に入
力し、その出力は第3図eに示す巾τsecのパルス
列となる。ここでτは同期信号の長さより短く、
欠陥信号の長さより長くする。一方、微分回路2
3の出力は比較器26にも入力し、第3図cに示
すレベルC2と比較され、第3図fに示す包絡線
の立ち下がりパルスを検出する。この比較器26
の出力は、単安定マルチバイブレータ25の出力
と共にアンド回路27に入力する。このアンド回
路では、包絡線の立ち上がりからτsec以内に立ち
下がりパルスがあつたときのみ、第3図gに示す
信号を出力する。この様にして、第3図aに示す
再生信号上の上向き欠陥信号a2とa4が第3図gに
示す様に検出される。また入力端子21に供給さ
れた再生信号は反転回路28で欠陥パルスの極性
を逆にして、下向き欠陥検出回路29に入力す
る。この下向き欠陥パルス検出回路29は前記包
絡線検出回路、微分回路、2つの比較器、単安定
マルチバイブレータ、アンド回路で構成された回
路30と同様の回路である。この様にして第3図
hに示される再生信号の下向き欠陥パルスa3を検
出する。再生信号の上向きと下向きの欠陥検出信
号はオア回路31で加算され、欠陥検出信号32
を第3図iに示す様に出力する。
FIG. 2 shows an embodiment of the defect detection circuit according to the present invention, and FIG. 3 is a diagram showing waveforms of various parts in FIG. A reproduced signal from the optical detection device shown in FIG. 1 is supplied to the reproduced signal input terminal 21 in FIG. FIG. 3a is a diagram showing the waveform of this reproduced signal. When several tracks on the disk 14 are played back at once, since the same signal is always recorded on adjacent tracks in the synchronization signal section, they are added in the same phase, resulting in the output shown in Figure 3a.
A signal like a 1 appears. Furthermore, in the video signal section, since there is no signal correlation between adjacent tracks, the signals are averaged over several tracks and no large amplitude changes appear.
Furthermore, if defects exist over several tracks, the amount of reflected beam light decreases or increases, resulting in the appearance of signals with large amplitudes such as a 2 and a 3 in FIG. 3a. The envelope of this reproduced signal is detected by the envelope detection circuit 22, and a diagram showing this waveform is shown in FIG. 3b.
, only the upper envelope in Figure 3a is detected,
The downward defect signal a3 is removed. The output of this envelope detection circuit 22 is input to a differentiating circuit 23. The output waveform of this differentiator circuit is shown in FIG. 3c. This output is input to comparator 24. The comparator 24 compares the level C1 with the output of the differentiating circuit 23 shown in FIG. 3c, and creates a pulse train for detecting the rise of the envelope as shown in FIG. 3d. The output of this comparator 24 is input to a monostable multivibrator 25, and its output becomes a pulse train having a width .tau.sec shown in FIG. 3e. Here τ is shorter than the length of the synchronization signal,
Make it longer than the length of the defect signal. On the other hand, differentiator circuit 2
The output of 3 is also input to the comparator 26, where it is compared with the level C2 shown in FIG. 3c, and the falling pulse of the envelope shown in FIG. 3f is detected. This comparator 26
The output is input to the AND circuit 27 together with the output of the monostable multivibrator 25. This AND circuit outputs the signal shown in FIG. 3g only when a falling pulse occurs within .tau.sec from the rising edge of the envelope. In this way, upward defect signals a 2 and a 4 on the reproduced signal shown in FIG. 3a are detected as shown in FIG. 3g. Further, the reproduced signal supplied to the input terminal 21 has the polarity of the defective pulse reversed by the inverting circuit 28 and is inputted to the downward defect detection circuit 29 . This downward defect pulse detection circuit 29 is a circuit similar to the circuit 30 which includes the envelope detection circuit, a differentiation circuit, two comparators, a monostable multivibrator, and an AND circuit. In this way, the downward defective pulse a3 of the reproduced signal shown in FIG. 3h is detected. The upward and downward defect detection signals of the reproduced signal are added by an OR circuit 31, and the defect detection signal 32
is output as shown in Figure 3i.

以上述べた様に本実施例に依れば、微分回路以
降の出力信号をデジタル処理出来るので検出能力
の安定性に優れておりアナログ回路に比べ回路の
製作調整が容易である。また欠陥検出信号が再生
信号の欠陥位置に対しほぼ時間遅れなく出力され
るので実用上都合が良い。
As described above, according to this embodiment, the output signals after the differentiating circuit can be digitally processed, so the stability of the detection ability is excellent, and the manufacturing and adjustment of the circuit is easier than with analog circuits. Furthermore, the defect detection signal is outputted with almost no time delay relative to the defect position of the reproduced signal, which is convenient in practice.

尚、上記実施例に依れば光学的に数トラツクづ
つの情報を読み取る方法を示したが、接触式でも
数トラツクにまたがる大きさの針を用して再生信
号を得ることも出来る。また第2図に於て再生信
号を反転回路で反転することなしに下側の包絡線
を検出する回路を用いて、下向きの欠陥信号のみ
を検出することも出来る。
Although the above embodiment shows a method of optically reading information on several tracks at a time, it is also possible to obtain a reproduction signal using a contact type or using a needle large enough to span several tracks. Further, in FIG. 2, it is also possible to detect only the downward defect signal by using a circuit for detecting the lower envelope without inverting the reproduced signal using an inverting circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は再生信号を得るまでの光学系を示す
図、第2図は本発明の一実施例を示す図、第3図
は第2図における各部の波形を示した図である。 11……レーザ発振装置、12……ビームスプ
リツタ、13……レンズ、14……画像円盤、1
5……モータ、16……光検出器、17……出力
端子、18……焦点調節器、21……再生信号入
力端子、22……包絡線検出回路、23……微分
回路、24,26……比較器、25……単安定マ
ルチバイブレータ、27……アンド回路、28…
…反転回路、29……下向き欠陥パルス検出回
路、30……上向き欠陥パルス検出回路、31…
…オア回路、32……欠陥検出信号。
FIG. 1 is a diagram showing an optical system up to obtaining a reproduced signal, FIG. 2 is a diagram showing an embodiment of the present invention, and FIG. 3 is a diagram showing waveforms at various parts in FIG. 2. 11... Laser oscillation device, 12... Beam splitter, 13... Lens, 14... Image disk, 1
5...Motor, 16...Photodetector, 17...Output terminal, 18...Focus adjuster, 21...Reproduction signal input terminal, 22...Envelope detection circuit, 23...Differential circuit, 24, 26 ... Comparator, 25 ... Monostable multivibrator, 27 ... AND circuit, 28 ...
...Inversion circuit, 29...Downward defective pulse detection circuit, 30...Upward defective pulse detection circuit, 31...
...OR circuit, 32...defect detection signal.

Claims (1)

【特許請求の範囲】[Claims] 1 画像情報を記載した記録媒体から得られるパ
ルス状欠陥信号を含む再生信号の包絡線を検出す
る第1の検出手段と、この第1の検出手段から得
られる包絡線信号を微分する手段と、この微分手
段から得られる微分信号の定められた一方の極性
のパルスを検出する第2の検出手段と、この第2
の検出手段により得られた検出信号により所定の
パルス幅の信号を発生するパルス発生手段と、前
記微分信号の他方の極性のパルスを検出する第3
の検出手段と、前記パルス発生手段から得られる
出力と前記第3の検出手段から得られる出力との
論理積をとるアンド回路とを具備したことを特徴
とする画像情報円盤欠陥検出装置。
1. A first detection means for detecting an envelope of a reproduced signal including a pulse-like defect signal obtained from a recording medium on which image information is recorded; and means for differentiating the envelope signal obtained from the first detection means; a second detection means for detecting a pulse of one predetermined polarity of the differential signal obtained from the differentiation means;
pulse generating means for generating a signal of a predetermined pulse width based on the detection signal obtained by the detection means; and a third pulse generating means for detecting a pulse of the other polarity of the differential signal.
An image information disk defect detection apparatus comprising: a detection means; and an AND circuit that performs a logical product of an output obtained from the pulse generation means and an output obtained from the third detection means.
JP8746283A 1983-05-20 1983-05-20 Device for detecting defect of picture information disc Granted JPS59215040A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8746283A JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8746283A JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Publications (2)

Publication Number Publication Date
JPS59215040A JPS59215040A (en) 1984-12-04
JPH03705B2 true JPH03705B2 (en) 1991-01-08

Family

ID=13915543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8746283A Granted JPS59215040A (en) 1983-05-20 1983-05-20 Device for detecting defect of picture information disc

Country Status (1)

Country Link
JP (1) JPS59215040A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2810592B2 (en) * 1992-07-06 1998-10-15 シャープ株式会社 Digital information reproducing device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832146A (en) * 1981-08-20 1983-02-25 Matsushita Electric Ind Co Ltd Evaluating device for dropout

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832146A (en) * 1981-08-20 1983-02-25 Matsushita Electric Ind Co Ltd Evaluating device for dropout

Also Published As

Publication number Publication date
JPS59215040A (en) 1984-12-04

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