JPS59200788A - Striking method - Google Patents

Striking method

Info

Publication number
JPS59200788A
JPS59200788A JP7561783A JP7561783A JPS59200788A JP S59200788 A JPS59200788 A JP S59200788A JP 7561783 A JP7561783 A JP 7561783A JP 7561783 A JP7561783 A JP 7561783A JP S59200788 A JPS59200788 A JP S59200788A
Authority
JP
Japan
Prior art keywords
plating
current density
striking
layer
strike
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7561783A
Other languages
Japanese (ja)
Inventor
Yoshiro Nishiyama
西山 芳朗
Norio Wakabayashi
若林 則男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
Original Assignee
Shinko Electric Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Industries Co Ltd filed Critical Shinko Electric Industries Co Ltd
Priority to JP7561783A priority Critical patent/JPS59200788A/en
Publication of JPS59200788A publication Critical patent/JPS59200788A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve the adhesive strength of a film formed by striking on a material with inferior suitability to electrodeposition by forming a film at a high current density in a short time in the early stage of striking and by carrying out striking at a low current density for a prescribed time. CONSTITUTION:When a metal with inferior suitability to electrodeposition such as Rh is subjected to Au striking, Au striking is carried out on Rh at >=3A/ dm<2> high current density for a short time, and the striking is continued at about 0.2A/dm<2> low current density. The resulting Au layer is electroplated with Au by a conventional method to form an Au layer. Since the under Au layer with superior adhesive strength is formed even on Rh with inferior suitability to electrodeposition, the upper Au layer is not stripped from Rh.

Description

【発明の詳細な説明】 本発明はス1−ライクめっき方法に関し、一層詳細には
、めっき初期に筋電/M、密度でめっきを行って短時間
でめっき皮膜を形成させ、以後は低電流密度に切替える
ごとによって、電着性の悪い被めっき物であっても、密
着性、外観共に優れためっき皮膜を形成することのでき
るストライクめっき方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a 1-like plating method, and more specifically, plating is performed at myoelectric/M density at the initial stage of plating to form a plating film in a short time, and thereafter, a low current The present invention relates to a strike plating method that can form a plating film with excellent adhesion and appearance even on a plated object with poor electrodepositivity by changing the density.

近年、機能めっきは、下地材の拡11にバリアーとして
中間層を設けるなど、複数のめっきによる多層構造のも
のが増えている。しかしながらこれらの素材あるいは下
地めっきの中には、その上層の目的とするめっき析出物
との密着性が悪く、めっき後十分機能しないものもしば
しばある。このためめっき前後の処理工程はより複雑化
し、作業性も低下してきている。このような電着性の屡
い素材あるいば下地めっき上にめっきを施すには、通常
重塔に移行する前にストライクめっきを施して密着性を
改善するようにしている。
In recent years, functional plating has increasingly become multilayered with a plurality of platings, such as by providing an intermediate layer as a barrier on the base material 11. However, some of these materials or base platings have poor adhesion to the target plating deposits on the upper layer, and often do not function satisfactorily after plating. For this reason, the processing steps before and after plating have become more complicated, and workability has also decreased. When plating is applied to such a material that is often electrodepositable, or in other words, a base plating, strike plating is usually applied to improve adhesion before transferring to a multilayer structure.

しかしながらこのストライクめっきにしても、従来は定
電流密度で行っていたため密着性が悪く、外観的にも優
れず、さらに作業性も悪いという難点があった。これを
ロジウムめっき上に金ストライクめっきを施す場合につ
いて説明すると、第1図はその電位一時間曲線図であり
、同図において曲線1および2はそれぞれ電流密度3 
A /ljm’、 0.2A / dm”によってめっ
きした場合の時間による電位変化を示しており、Aおよ
びBは、それぞれの条件による電位が一定になる点、す
なわち被めっき物全面が金めつき皮膜で覆われるに至る
点を示している。曲線1の条件でス1ヘライクめっきを
行った場合、点Aに達する時間は6〜7秒と短く、その
ため密着性は良好であるが、10秒以上めっぎするとヤ
ケめっきとなり、通常ストライクめっきとしては種々の
制約から30秒以上めっきするため特に−トゲかひどく
なり、この−トケめっき上に本めっきを、施した場合、
めっき厚が薄いと外観を損ねてしまう欠点がある。
However, even with this strike plating, since conventionally it was carried out at a constant current density, there were drawbacks such as poor adhesion, poor appearance, and poor workability. To explain this in the case of applying gold strike plating on rhodium plating, Figure 1 is a potential one-hour curve diagram, and in the same figure, curves 1 and 2 are respectively current density 3
A/ljm', 0.2A/dm'' shows the potential change over time when plating is performed, and A and B are the points at which the potential becomes constant under each condition, that is, when the entire surface of the object to be plated is gold plated. This shows the point at which the coating reaches point A. When S1H-like plating is performed under the conditions of curve 1, the time to reach point A is as short as 6 to 7 seconds, so the adhesion is good, but 10 seconds Plating over this period will result in discolored plating, and as strike plating requires plating for more than 30 seconds due to various constraints, the plating will become particularly severe.
Thin plating has the disadvantage of impairing the appearance.

一方曲線2の条件で行うと、良好な外観を示すか、安定
電位に達する時間が約20秒と長く、めっきが付(まで
に時間がかかるために、ふくれ、はがれが生じ、密着性
に劣る難点がある。
On the other hand, if it is performed under the conditions of curve 2, it will not show a good appearance, or it will take a long time to reach a stable potential, about 20 seconds, and the plating will take a long time to develop, causing blistering and peeling, and poor adhesion. There are some difficulties.

本発明は上記難点に鑑めてなされ、その目的とするとご
ろは、ロジウム等の電着性が悪い率4A上であっても、
密着性よ(、かつ外観を損なわずにめっきすることので
きるストライクめっき方法を提供するにあり、その特徴
は、電着性の悪い被めっき物に対するストライクめっき
において、めっき初期に高電流密度でめっきを行って被
めっき物、の表面に短時間でめっき皮膜を形成させ、以
後は低電流密度に切替えて所定時間めっきを行うとこに
ある。
The present invention has been made in view of the above-mentioned drawbacks, and its purpose is to provide a method for electrodepositing rhodium, etc., even if the electrodepositability is above 4A.
The purpose of this method is to provide a strike plating method that can perform plating without impairing adhesion (and appearance).The feature is that in strike plating on objects with poor electrodepositivity, plating can be performed at a high current density in the early stage of plating. The process involves forming a plating film on the surface of the object to be plated in a short time, and then switching to a low current density and plating for a predetermined period of time.

本発明は前記第1図におけるA点、すなわち被めっき物
全面がめつき皮膜で覆われるまでは高電流密度、例えば
ロジウム上に金ストライクめつきを施す場合には3A/
d♂程度の高電流密度で、ある曲線1の条件でめっきを
行い、以後は0.2 A/dm2程度の低電流密度、す
なわち曲線2の条件でめっきを継続するものである。こ
の場合の時間−電流密度図を第2図に示す。また半導体
素子を収容するセラミ、クパッケージに応用しためっき
状態図を第3図に示す。図において10は金の本めっき
層、12は低電流密度によって析出させた金ストライク
層、14は高電流密度によって析出させた金ストライク
層、16はロジウムめっき層、18はニッケルめっき層
、20ばタングステンメタライズ層、22ばセラミック
基板である。表1にワイヤーボンド剥離試験結果を示す
The present invention operates at a high current density at point A in FIG. 1, that is, until the entire surface of the object to be plated is covered with a plating film.
Plating is performed under the conditions of a certain curve 1 at a high current density of about 0.2 A/dm2, and thereafter plating is continued at a low current density of about 0.2 A/dm2, that is, under the conditions of curve 2. A time-current density diagram in this case is shown in FIG. FIG. 3 shows a state diagram of plating applied to a ceramic package housing a semiconductor element. In the figure, 10 is a gold actual plating layer, 12 is a gold strike layer deposited by low current density, 14 is a gold strike layer deposited by high current density, 16 is a rhodium plating layer, 18 is a nickel plating layer, and 20 is a gold strike layer deposited by high current density. Tungsten metallized layer 22 is a ceramic substrate. Table 1 shows the wire bond peel test results.

表1 200℃×50時間加熱後、30μmψアルミニウムワ
イヤーを超音波ボンディングしてその剥離個数を調べた
Table 1 After heating at 200° C. for 50 hours, 30 μm ψ aluminum wires were ultrasonically bonded and the number of pieces peeled off was examined.

表1から、ロジウムに対する金の密着性は著しく向」−
シていることがわかる。
From Table 1, the adhesion of gold to rhodium is significantly improved.
You can see that it is empty.

本発明方法は、ロジウム、モリブデン、ステンレスステ
ィール、アルミニウム、二・ノケルめっきしたタングス
テンメタライズ層など、金めつき等が電着しにくい素材
上のストライクめっきに特に有効である。
The method of the present invention is particularly effective for strike plating on materials to which gold plating and the like are difficult to electrodeposit, such as rhodium, molybdenum, stainless steel, aluminum, and di-Nokel-plated tungsten metallized layers.

以上のように本発明に係るストライクめっき方法によれ
ば、めっき初期に高い電流密度で被めっき物表面全体に
短時間でめっき皮膜を形成させてしまうから、めっき液
によって被めっき物表面が荒れたり、不純物が浮き出る
ことがなく密着性に極めて優れ、また以後は低電流密度
に切替えるからヤケが生じることもな(緻密な、外観の
優れためっき表面を得ることができるという著効を奏す
る。
As described above, according to the strike plating method of the present invention, a plating film is formed over the entire surface of the object to be plated in a short time using a high current density in the early stage of plating, so that the surface of the object to be plated is not roughened by the plating solution. , impurities do not stand out and the adhesion is extremely excellent, and since the current density is switched to a low current density thereafter, there is no possibility of discoloration (it is highly effective in that a dense plating surface with an excellent appearance can be obtained).

以上本発明につき好適な実施例を挙げて種々説明したが
、本発明はこの実施例に限定されるものではなく、発明
の精神を逸脱しない範囲内で多くの改変を施し得るのは
もちろんのことである。
Although the present invention has been variously explained above with reference to preferred embodiments, the present invention is not limited to these embodiments, and it goes without saying that many modifications can be made without departing from the spirit of the invention. It is.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来のストライクめっきの電位一時間曲線図、
第2図は本発明方法の時間−電流密度図、第3図はセラ
ミンクパソケーシムこ応用した場合のめっき状態図であ
る。 10・・・金の本めっき層、  12・・・低電流密度
によって析出させた金ス1−ライク層。 14・・・高電流密度によって析出させた金ストライク
層、  16・・・ロジウムめっき層。 18・・・ニッケルめっき層、  20・・・タングス
テンメタライズ層、  22・・・セラミック基板。 特許出願人 新光電気工業株式会社 代表者光延丈喜夫 第1図 時間(秒) 第2図 市 洗 浮 ル 時間(秒)
Figure 1 is a potential hourly curve diagram of conventional strike plating.
FIG. 2 is a time-current density diagram of the method of the present invention, and FIG. 3 is a diagram of the plating state when applied to a ceramic casing. 10... Authentic gold plating layer, 12... Gold 1-like layer deposited by low current density. 14... Gold strike layer deposited by high current density, 16... Rhodium plating layer. 18... Nickel plating layer, 20... Tungsten metallized layer, 22... Ceramic substrate. Patent applicant Shinko Electric Industry Co., Ltd. Representative Takekio Mitsunobu Figure 1 Time (seconds) Figure 2 Washing time (seconds)

Claims (1)

【特許請求の範囲】[Claims] 1、電着性の悪い被めっき物に対するストライクめっき
において、めっき初期に高電流密度でめっきを行って被
めっき物の表面に短時間でめっき皮膜を形成させ、以後
は低電流密度に切替えて所定時間めっきを行うことを特
徴とするストライクめっき方法。
1. In strike plating for objects with poor electrodepositivity, plating is performed at a high current density in the early stage of plating to form a plating film on the surface of the object in a short time, and thereafter the current density is switched to a lower current density to achieve the specified level. A strike plating method characterized by time plating.
JP7561783A 1983-04-28 1983-04-28 Striking method Pending JPS59200788A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7561783A JPS59200788A (en) 1983-04-28 1983-04-28 Striking method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7561783A JPS59200788A (en) 1983-04-28 1983-04-28 Striking method

Publications (1)

Publication Number Publication Date
JPS59200788A true JPS59200788A (en) 1984-11-14

Family

ID=13581341

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7561783A Pending JPS59200788A (en) 1983-04-28 1983-04-28 Striking method

Country Status (1)

Country Link
JP (1) JPS59200788A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016178372A1 (en) * 2015-05-07 2016-11-10 株式会社日立製作所 Laminated body having corrosion-resistant coating, and method for manufacturing same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016178372A1 (en) * 2015-05-07 2016-11-10 株式会社日立製作所 Laminated body having corrosion-resistant coating, and method for manufacturing same
US10836138B2 (en) 2015-05-07 2020-11-17 Hitachi, Ltd. Laminated body having corrosion-resistant coating, and method for manufacturing same

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