JPS59187146U - Semiconductor laser device inspection equipment - Google Patents
Semiconductor laser device inspection equipmentInfo
- Publication number
- JPS59187146U JPS59187146U JP8306683U JP8306683U JPS59187146U JP S59187146 U JPS59187146 U JP S59187146U JP 8306683 U JP8306683 U JP 8306683U JP 8306683 U JP8306683 U JP 8306683U JP S59187146 U JPS59187146 U JP S59187146U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor laser
- light
- laser device
- device inspection
- inspection equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
図は本考案による一実施例を示す模型図である。
１：半導体レーザ素子、ｌＡ、 ＩＢ：共振面、３：
受光素子、４：光学ファイバー。The figure is a model diagram showing an embodiment of the present invention. 1: Semiconductor laser element, 1A, IB: Resonance surface, 3:
Photodetector, 4: Optical fiber.
Claims (1)
ザ素子を介して配置され、一方の反射面の出射光を受光
して電流−光出力特性を検知する受光装置と、他方の反
射面の出射光を導いて波長を検知する分光器とを備え、
電流−光出力特性及び波長を同時に測定することができ
ることを特徴とする半導体レーザ素子の検査装置。A light receiving device is arranged through a semiconductor laser element that emits laser light of the same quality from both reflective surfaces, and detects the current-light output characteristics by receiving the light emitted from one reflective surface, and Equipped with a spectrometer that guides the emitted light and detects the wavelength,
1. A semiconductor laser device inspection device characterized by being capable of simultaneously measuring current-light output characteristics and wavelength.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8306683U JPS59187146U (en) | 1983-05-30 | 1983-05-30 | Semiconductor laser device inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8306683U JPS59187146U (en) | 1983-05-30 | 1983-05-30 | Semiconductor laser device inspection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59187146U true JPS59187146U (en) | 1984-12-12 |
Family
ID=30213025
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8306683U Pending JPS59187146U (en) | 1983-05-30 | 1983-05-30 | Semiconductor laser device inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59187146U (en) |
-
1983
- 1983-05-30 JP JP8306683U patent/JPS59187146U/en active Pending
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